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Tim Damon
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Meridian, ID, US
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Patents Grants
last 30 patents
Information
Patent Grant
CAM expected address search testmode
Patent number
7,464,308
Issue date
Dec 9, 2008
Micron Technology, Inc.
Tim Damon
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus and method for testing fuses
Patent number
6,762,608
Issue date
Jul 13, 2004
Micron Technology, Inc.
Tim Damon
G01 - MEASURING TESTING
Information
Patent Grant
Method for detecting or repairing intercell defects in more than on...
Patent number
6,510,533
Issue date
Jan 21, 2003
Micron Technology, Inc.
David D. Siek
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus and method for testing fuses
Patent number
6,424,161
Issue date
Jul 23, 2002
Micron Technology, Inc.
Tim Damon
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for testing fuses
Patent number
6,410,352
Issue date
Jun 25, 2002
Micron Technology, Inc.
Tim Damon
G01 - MEASURING TESTING
Information
Patent Grant
System for evaluating and reporting semiconductor test processes
Patent number
6,256,593
Issue date
Jul 3, 2001
Micron Technology Inc.
Tim Damon
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for detecting or preparing intercell defects in more than on...
Patent number
6,167,541
Issue date
Dec 26, 2000
Micron Technology, Inc.
David D. Siek
G11 - INFORMATION STORAGE
Information
Patent Grant
System for evaluating and reporting semiconductor test processes
Patent number
6,070,131
Issue date
May 30, 2000
Micron Technology, Inc.
Tim Damon
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
CAM expected address search testmode
Publication number
20050166102
Publication date
Jul 28, 2005
Micron Technologies, Inc.
Tim Damon
G11 - INFORMATION STORAGE
Information
Patent Application
Apparatus and method for testing fuses
Publication number
20020163343
Publication date
Nov 7, 2002
Micron Technology, Inc.
Tim Damon
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR TESTING FUSES
Publication number
20020003425
Publication date
Jan 10, 2002
TIM DAMON
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for testing fuses
Publication number
20010034070
Publication date
Oct 25, 2001
Micron Technology, Inc.
Tim Damon
G01 - MEASURING TESTING