Tom Glass

Person

Idaho City, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor constructions
- Patent number 7,825,443
- Issue date Nov 2, 2010
- Micron Technology, Inc.
- Richard Holscher
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Semiconductor constructions having antireflective portions
- Patent number 7,804,115
- Issue date Sep 28, 2010
- Micron Technology, Inc.
- Richard Holscher
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Semiconductor devices having antireflective material
- Patent number 7,626,238
- Issue date Dec 1, 2009
- Micron Technology, Inc.
- Richard Holscher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuitry and gate stacks
- Patent number 7,576,400
- Issue date Aug 18, 2009
- Micron Technology, Inc.
- Zhiping Yin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photolithography process using multiple anti-reflective coatings
- Patent number 7,387,866
- Issue date Jun 17, 2008
- Micron Technology, Inc.
- Philip J. Ireland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Use of DAR coating to modulate the efficiency of laser fuse blows
- Patent number 7,315,074
- Issue date Jan 1, 2008
- Micron Technology, Inc.
- Mark Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photolithographic structures using multiple anti-reflecting coatings
- Patent number 7,250,247
- Issue date Jul 31, 2007
- Micron Technology, Inc.
- Philip J. Ireland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrowetting display
- Patent number 7,167,156
- Issue date Jan 23, 2007
- Micron Technology, Inc.
- Thomas R. Glass
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Solid phase assay for detection of ligands
- Patent number 7,091,050
- Issue date Aug 15, 2006
- Sapidyne Instruments Inc.
- Steve J. Lackie
- G01 - MEASURING TESTING
Information Patent Grant
Use of DAR coating to modulate the efficiency of laser fuse blows
- Patent number 6,900,515
- Issue date May 31, 2005
- Micron Technology, Inc.
- Mark Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor processing methods
- Patent number 6,878,507
- Issue date Apr 12, 2005
- Micron Technology, Inc.
- Richard Holscher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid phase assay for detection of ligands
- Patent number 6,664,114
- Issue date Dec 16, 2003
- Sapidyne Instruments, Inc.
- Steve J. Lackie
- G01 - MEASURING TESTING
Information Patent Grant
Isolation using an antireflective coating
- Patent number 6,605,502
- Issue date Aug 12, 2003
- Micron Technology, Inc.
- Ravi Iyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation using an antireflective coating
- Patent number 6,495,450
- Issue date Dec 17, 2002
- Micron Technology, Inc.
- Ravi Iyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor processing methods, semiconductor circuitry, and gate...
- Patent number 6,461,950
- Issue date Oct 8, 2002
- Micron Technology, Inc.
- Zhiping Yin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation using an antireflective coating
- Patent number 6,423,631
- Issue date Jul 23, 2002
- Micron Technology, Inc.
- Ravi Iyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Use of DAR coating to modulate the efficiency of laser fuse blows
- Patent number 6,423,582
- Issue date Jul 23, 2002
- Micron Technology, Inc.
- Mark Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photo-lithography process using multiple anti-reflective coatings
- Patent number 6,331,379
- Issue date Dec 18, 2001
- Micron Technology, Inc.
- Philip J. Ireland
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor processing methods
- Patent number 6,281,100
- Issue date Aug 28, 2001
- Micron Technology, Inc.
- Zhiping Yin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor processing methods
- Patent number 6,274,292
- Issue date Aug 14, 2001
- Micron Technology, Inc.
- Richard Holscher
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wafer surface treatment methods and systems using electrocapillarity
- Patent number 6,191,040
- Issue date Feb 20, 2001
- Micron Technology, Inc.
- Thomas R. Glass
- B24 - GRINDING POLISHING
Information Patent Grant
Irradiation mask
- Patent number 6,187,484
- Issue date Feb 13, 2001
- Micron Technology, Inc.
- Thomas R. Glass
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Isolation using an antireflective coating
- Patent number 6,174,590
- Issue date Jan 16, 2001
- Micron Technology, Inc.
- Ravi Iyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Isolation using an antireflective coating
- Patent number 6,121,133
- Issue date Sep 19, 2000
- Micron Technology, Inc.
- Ravi Iyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wafer surface treatment methods and systems using electrocapillarity
- Patent number 6,010,964
- Issue date Jan 4, 2000
- Micron Technology, Inc.
- Thomas R. Glass
- B24 - GRINDING POLISHING
Information Patent Grant
Immunoassay system
- Patent number 6,008,057
- Issue date Dec 28, 1999
- Roche Diagnostics Corporation
- Thomas R. Glass
- G01 - MEASURING TESTING
Information Patent Grant
Assay flow apparatus and method
- Patent number 5,565,365
- Issue date Oct 15, 1996
- Sapidyne, Inc.
- Thomas R. Glass
- G01 - MEASURING TESTING
Information Patent Grant
Immunoassay apparatus
- Patent number 4,909,990
- Issue date Mar 20, 1990
- Block; Myron J.
- Myron J. Block
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BINDING ASSAY
- Publication number 20170336402
- Publication date Nov 23, 2017
- Sapidyne Instruments Inc.
- Steve J. Lackie
- G01 - MEASURING TESTING
Information Patent Application
EXPERIMENTAL METHODS FOR CONDUCTING COMPETITIVE BINDING ASSAYS
- Publication number 20160195518
- Publication date Jul 7, 2016
- Sapidyne Instruments Inc.
- Thomas R. Glass
- G01 - MEASURING TESTING
Information Patent Application
CIRCUITRY AND GATE STACKS
- Publication number 20090294878
- Publication date Dec 3, 2009
- Zhiping Yin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor constructions
- Publication number 20070238207
- Publication date Oct 11, 2007
- Richard Holscher
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor constructions
- Publication number 20060269699
- Publication date Nov 30, 2006
- Richard Holscher
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods of forming fusible devices
- Publication number 20060263987
- Publication date Nov 23, 2006
- Micron Technology, Inc.
- Mark Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of forming fusible devices
- Publication number 20060263947
- Publication date Nov 23, 2006
- Micron Technology, Inc.
- Mark Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor constructions
- Publication number 20060220186
- Publication date Oct 5, 2006
- Micron Technology, Inc.
- Richard Holscher
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor processing methods
- Publication number 20060038262
- Publication date Feb 23, 2006
- Richard Holscher
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Electrowetting display
- Publication number 20050285816
- Publication date Dec 29, 2005
- Micron Technology, Inc.
- Thomas R. Glass
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Use of DAR coating to modulate the efficiency of laser fuse blows
- Publication number 20050218474
- Publication date Oct 6, 2005
- Micron Technology, Inc.
- Mark Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Use of DAR coating to modulate the efficiency of laser fuse blows
- Publication number 20050221540
- Publication date Oct 6, 2005
- Micron Technology, Inc.
- Mark Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor processing methods
- Publication number 20050020055
- Publication date Jan 27, 2005
- Richard Holscher
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Solid phase assay for detection of ligands
- Publication number 20040132215
- Publication date Jul 8, 2004
- Steve J. Lackie
- G01 - MEASURING TESTING
Information Patent Application
Photolithography process using multiple anti-reflective coatings
- Publication number 20030155626
- Publication date Aug 21, 2003
- Philip J. Ireland
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor processing methods
- Publication number 20030054294
- Publication date Mar 20, 2003
- Richard Holscher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Use of DAR coating to modulate the efficiency of laser fuse blows
- Publication number 20020179990
- Publication date Dec 5, 2002
- Micron Technology, Inc.
- Mark Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Isolation using an antireflective coating
- Publication number 20020155698
- Publication date Oct 24, 2002
- Micron Technologies, Inc.
- Ravi Lyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Photolithography process using multiple anti-reflective coatings
- Publication number 20020039820
- Publication date Apr 4, 2002
- Philip J. Ireland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor processing methods
- Publication number 20010033997
- Publication date Oct 25, 2001
- Richard Holscher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor processing methods, semiconductor circuitry, and gate...
- Publication number 20010028095
- Publication date Oct 11, 2001
- Zhiping Yin
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Semiconductor constructions

Semiconductor constructions having antireflective portions

Semiconductor devices having antireflective material

Circuitry and gate stacks

Photolithography process using multiple anti-reflective coatings

Use of DAR coating to modulate the efficiency of laser fuse blows

Photolithographic structures using multiple anti-reflecting coatings

Electrowetting display

Solid phase assay for detection of ligands

Use of DAR coating to modulate the efficiency of laser fuse blows

Semiconductor processing methods

Solid phase assay for detection of ligands

Isolation using an antireflective coating

Isolation using an antireflective coating

Semiconductor processing methods, semiconductor circuitry, and gate...

Isolation using an antireflective coating

Use of DAR coating to modulate the efficiency of laser fuse blows

Photo-lithography process using multiple anti-reflective coatings

Semiconductor processing methods

Semiconductor processing methods

Wafer surface treatment methods and systems using electrocapillarity

Irradiation mask

Isolation using an antireflective coating

Isolation using an antireflective coating

Wafer surface treatment methods and systems using electrocapillarity

Immunoassay system

Assay flow apparatus and method

Immunoassay apparatus

Patents Applicationslast 30 patents

BINDING ASSAY

EXPERIMENTAL METHODS FOR CONDUCTING COMPETITIVE BINDING ASSAYS

CIRCUITRY AND GATE STACKS

Semiconductor constructions

Semiconductor constructions

Methods of forming fusible devices

Methods of forming fusible devices

Semiconductor constructions

Semiconductor processing methods

Electrowetting display

Use of DAR coating to modulate the efficiency of laser fuse blows

Use of DAR coating to modulate the efficiency of laser fuse blows

Semiconductor processing methods

Solid phase assay for detection of ligands

Photolithography process using multiple anti-reflective coatings

Semiconductor processing methods

Use of DAR coating to modulate the efficiency of laser fuse blows

Isolation using an antireflective coating

Photolithography process using multiple anti-reflective coatings

Semiconductor processing methods

Semiconductor processing methods, semiconductor circuitry, and gate...