Tom H. Rafferty

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method of separating a template from a shaped film on a substrate
- Patent number 11,442,359
- Issue date Sep 13, 2022
- Canon Kabushiki Kaisha
- Tom H. Rafferty
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Drop placement evaluation
- Patent number 11,036,130
- Issue date Jun 15, 2021
- Canon Kabushiki Kaisha
- Matthew C. Traub
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometric analysis method for the manufacture of nano-scale d...
- Patent number 7,880,872
- Issue date Feb 1, 2011
- Molecular Imprints, Inc.
- Pawan Kumar Nimmakayala
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Enhanced multi channel alignment
- Patent number 7,785,096
- Issue date Aug 31, 2010
- Molecular Imprints, Inc.
- Pawan Kumar Nimmakayala
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Interferometric analysis method for the manufacture of nano-scale d...
- Patent number 7,630,067
- Issue date Dec 8, 2009
- Molecular Imprints, Inc.
- Pawan Kumar Nimmakayala
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric analysis for the manufacture of nano-scale devices
- Patent number 7,292,326
- Issue date Nov 6, 2007
- Molecular Imprints, Inc.
- Pawan Kumar Nimmakayala
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
DEVICES, SYSTEMS, AND METHODS FOR THE TRANSFORMATION AND CROPPING O...
- Publication number 20230033557
- Publication date Feb 2, 2023
- Canon Kabushiki Kaisha
- Tom H. Rafferty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Separating a Template from a Shaped Film on a Substrate
- Publication number 20200292933
- Publication date Sep 17, 2020
- Canon Kabushiki Kaisha
- Tom H. Rafferty
- B82 - NANO-TECHNOLOGY
Information Patent Application
DROP PLACEMENT EVALUATION
- Publication number 20190121231
- Publication date Apr 25, 2019
- Canon Kabushiki Kaisha
- Matthew C. Traub
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Interferometric Analysis Method for the Manufacture of Nano-Scale D...
- Publication number 20100038827
- Publication date Feb 18, 2010
- Molecular Imprints, Inc.
- Pawan Kumar Nimmakayala
- G01 - MEASURING TESTING
Information Patent Application
Enhanced Multi Channel Alignment
- Publication number 20090169662
- Publication date Jul 2, 2009
- Molecular Imprints, Inc.
- Pawan Kumar Nimmakayala
- B82 - NANO-TECHNOLOGY
Information Patent Application
Spatial Phase Feature Location
- Publication number 20090147237
- Publication date Jun 11, 2009
- Molecular Imprints, Inc.
- Philip D. Schumaker
- B82 - NANO-TECHNOLOGY
Information Patent Application
Alignment Using Moire Patterns
- Publication number 20090148032
- Publication date Jun 11, 2009
- Molecular Imprints, Inc.
- Philip D. Schumaker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Enhanced Multi Channel Alignment
- Publication number 20070231421
- Publication date Oct 4, 2007
- Molecular Imprints, Inc.
- Pawan Kumar Nimmakayala
- B82 - NANO-TECHNOLOGY
Information Patent Application
Interferometric analysis for the manufacture of nano-scale devices
- Publication number 20060126058
- Publication date Jun 15, 2006
- Molecular Imprints, Inc.
- Pawan Kumar Nimmakayala
- B82 - NANO-TECHNOLOGY
Information Patent Application
Interferometric analysis method for the manufacture of nano-scale d...
- Publication number 20060114450
- Publication date Jun 1, 2006
- Molecular Imprints, Inc.
- Pawan Kumar Nimmakayala
- G01 - MEASURING TESTING

Tom H. Rafferty

Person

Patents Grantslast 30 patents

Method of separating a template from a shaped film on a substrate

Drop placement evaluation

Interferometric analysis method for the manufacture of nano-scale d...

Enhanced multi channel alignment

Interferometric analysis method for the manufacture of nano-scale d...

Interferometric analysis for the manufacture of nano-scale devices

Patents Applicationslast 30 patents

DEVICES, SYSTEMS, AND METHODS FOR THE TRANSFORMATION AND CROPPING O...

Method of Separating a Template from a Shaped Film on a Substrate

DROP PLACEMENT EVALUATION

Interferometric Analysis Method for the Manufacture of Nano-Scale D...

Enhanced Multi Channel Alignment

Spatial Phase Feature Location

Alignment Using Moire Patterns

Enhanced Multi Channel Alignment

Interferometric analysis for the manufacture of nano-scale devices

Interferometric analysis method for the manufacture of nano-scale d...