Tom Zhong

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
MTJ device performance by controlling device shape
- Patent number 11,963,457
- Issue date Apr 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integration scheme for three terminal spin-orbit-torque (SOT) switc...
- Patent number 11,895,928
- Issue date Feb 6, 2024
- Headway Technologies, Inc.
- Jesmin Haq
- G11 - INFORMATION STORAGE
Information Patent Grant
MTJ device performance by adding stress modulation layer to mtj dev...
- Patent number 11,785,864
- Issue date Oct 10, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- G11 - INFORMATION STORAGE
Information Patent Grant
STT-MRAM heat sink and magnetic shield structure design for more ro...
- Patent number 11,723,286
- Issue date Aug 8, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tom Zhong
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of ultra-fine critical dimension patterning for magnetic hea...
- Patent number 11,715,491
- Issue date Aug 1, 2023
- Headway Technologies, Inc.
- Tom Zhong
- G11 - INFORMATION STORAGE
Information Patent Grant
Etching and encapsulation scheme for magnetic tunnel junction fabri...
- Patent number 11,631,802
- Issue date Apr 18, 2023
- Headway Technologies, Inc.
- Vignesh Sundar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Critical dimension (CD) uniformity of photoresist island patterns u...
- Patent number 11,573,494
- Issue date Feb 7, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
MTJ device performance by controlling device shape
- Patent number 11,527,711
- Issue date Dec 13, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MTJ device performance by adding stress modulation layer to MTJ dev...
- Patent number 11,430,945
- Issue date Aug 30, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- G11 - INFORMATION STORAGE
Information Patent Grant
MTJ device performance by controlling device shape
- Patent number 10,944,049
- Issue date Mar 9, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple hard mask patterning to fabricate 20nm and below MRAM devices
- Patent number 10,868,244
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yi Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
STT-MRAM heat sink and magnetic shield structure design for more ro...
- Patent number 10,854,809
- Issue date Dec 1, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tom Zhong
- G11 - INFORMATION STORAGE
Information Patent Grant
Critical dimension (CD) uniformity of photoresist island patterns u...
- Patent number 10,831,104
- Issue date Nov 10, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Critical dimension (CD) uniformity of photoresist island patterns u...
- Patent number 10,520,818
- Issue date Dec 31, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for fabricating a magnetic tunneling junction (MTJ) structure
- Patent number 10,475,987
- Issue date Nov 12, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple hard mask patterning to fabricate 20nm and below MRAM devices
- Patent number 10,446,741
- Issue date Oct 15, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yi Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to remove sidewall damage after MTJ etching
- Patent number 10,103,322
- Issue date Oct 16, 2018
- Headway Technologies Inc.
- Zhongjian Teng
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory structure having a magnetic tunnel junction (MTJ) self-align...
- Patent number 10,069,064
- Issue date Sep 4, 2018
- Headway Technologies, Inc.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MTJ device process/integration method with pre-patterned seed layer
- Patent number 9,972,777
- Issue date May 15, 2018
- Headway Technologies, Inc.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface treatment method for dielectric anti-reflective coating (DA...
- Patent number 9,880,473
- Issue date Jan 30, 2018
- Headway Technologies, Inc.
- Jesmin Haq
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Hybrid metallic hard mask stack for MTJ etching
- Patent number 9,608,200
- Issue date Mar 28, 2017
- Headway Technologies, Inc.
- Dongna Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of high density memory fabrication
- Patent number 9,343,463
- Issue date May 17, 2016
- Headway Technologies, Inc.
- Tom Zhong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bottom electrode for MRAM device
- Patent number 8,969,982
- Issue date Mar 3, 2015
- Headway Technologies, Inc.
- Rongfu Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to reduce magnetic film stress for better yield
- Patent number 8,933,542
- Issue date Jan 13, 2015
- Headway Technologies, Inc.
- Tom Zhong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to reduce magnetic film stress for better yield
- Patent number 8,803,293
- Issue date Aug 12, 2014
- Headway Technologies, Inc.
- Tom Zhong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication method for embedded magnetic memory
- Patent number 8,772,051
- Issue date Jul 8, 2014
- Headway Technologies, Inc.
- Tom Zhong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite hard mask with upper sacrificial dielectric layer for the...
- Patent number 8,722,543
- Issue date May 13, 2014
- Headway Technologies, Inc.
- Rodolfo Belen
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Process for MEMS scanning mirror with mass remove from mirror backside
- Patent number 8,636,911
- Issue date Jan 28, 2014
- MagIC Technologies, Inc.
- Jun Chen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method to connect a magnetic device to a CMOS transistor
- Patent number 8,524,511
- Issue date Sep 3, 2013
- Headway Technologies, Inc.
- Tom Zhong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High density spin-transfer torque MRAM process
- Patent number 8,324,698
- Issue date Dec 4, 2012
- MagIC Technologies, Inc.
- Tom Zhong
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
STT-MRAM Heat Sink and Magnetic Shield Structure Design for More Ro...
- Publication number 20230380298
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tom Zhong
- G11 - INFORMATION STORAGE
Information Patent Application
MTJ DEVICE PERFORMANCE BY ADDING STRESS MODULATION LAYER TO MTJ DEV...
- Publication number 20230371398
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jesmin Haq
- G11 - INFORMATION STORAGE
Information Patent Application
Method Of Ultra-Fine Critical Dimension Patterning For Magnetic Hea...
- Publication number 20230343362
- Publication date Oct 26, 2023
- HEADWAY TECHNOLOGIES, INC.
- Tom Zhong
- G11 - INFORMATION STORAGE
Information Patent Application
Composite Hard Masks For Ultra-Thin Magnetic Sensors
- Publication number 20230258747
- Publication date Aug 17, 2023
- HEADWAY TECHNOLOGIES, INC.
- Tom Zhong
- B24 - GRINDING POLISHING
Information Patent Application
Etching and Encapsulation Scheme for Magnetic Tunnel Junction Fabri...
- Publication number 20230217834
- Publication date Jul 6, 2023
- HEADWAY TECHNOLOGIES, INC.
- Vignesh Sundar
Information Patent Application
MTJ Device Performance by Controlling Device Shape
- Publication number 20230107977
- Publication date Apr 6, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method Of Ultra-Fine Critical Dimension Patterning For Magnetic Hea...
- Publication number 20230005500
- Publication date Jan 5, 2023
- HEADWAY TECHNOLOGIES, INC.
- Tom Zhong
- G11 - INFORMATION STORAGE
Information Patent Application
MTJ Device Performance by Adding Stress Modulation Layer to MTJ Dev...
- Publication number 20220384713
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MTJ Device Performance by Controlling Device Shape
- Publication number 20210193915
- Publication date Jun 24, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Etching and Encapsulation Scheme for Magnetic Tunnel Junction Fabri...
- Publication number 20210143322
- Publication date May 13, 2021
- HEADWAY TECHNOLOGIES, INC.
- Vignesh Sundar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Novel Integration Scheme for Three Terminal Spin-Orbit-Torque (SOT)...
- Publication number 20210104663
- Publication date Apr 8, 2021
- HEADWAY TECHNOLOGIES, INC.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STT-MRAM Heat Sink and Magnetic Shield Structure Design for More Ro...
- Publication number 20210083172
- Publication date Mar 18, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tom Zhong
- G11 - INFORMATION STORAGE
Information Patent Application
Critical Dimension (CD) Uniformity of Photoresist Island Patterns U...
- Publication number 20210055659
- Publication date Feb 25, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Critical Dimension (CD) Uniformity of Photoresist Island Patterns U...
- Publication number 20200142313
- Publication date May 7, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jesmin Haq
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MTJ Device Performance by Adding Stress Modulation Layer to MTJ Dev...
- Publication number 20200075844
- Publication date Mar 5, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jesmin Haq
- G11 - INFORMATION STORAGE
Information Patent Application
Multiple Hard Mask Patterning to Fabricate 20nm and Below MRAM Devices
- Publication number 20200044147
- Publication date Feb 6, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING A MAGNETIC TUNNELING JUNCTION (MTJ) STRUCTURE
- Publication number 20190341542
- Publication date Nov 7, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STT-MRAM Heat Sink and Magnetic Shield Structure Design for More Ro...
- Publication number 20190207083
- Publication date Jul 4, 2019
- Taiwan Semiconductor Manufacturing company Ltd.
- Tom Zhong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MTJ Device Performance by Controlling Device Shape
- Publication number 20190148630
- Publication date May 16, 2019
- HEADWAY TECHNOLOGIES, INC.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multiple Hard Mask Patterning to Fabricate 20nm and Below MRAM Devices
- Publication number 20190123267
- Publication date Apr 25, 2019
- HEADWAY TECHNOLOGIES, INC.
- Yi Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to Remove Sidewall Damage After MTJ Etching
- Publication number 20180277751
- Publication date Sep 27, 2018
- HEADWAY TECHNOLOGIES, INC.
- Zhongjian Teng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
New Surface Treatment Method for Dielectric Anti-Reflective Coating...
- Publication number 20170371247
- Publication date Dec 28, 2017
- HEADWAY TECHNOLOGIES, INC.
- Jesmin Haq
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Hybrid Metallic Hard Mask Stack for MTJ Etching
- Publication number 20160284985
- Publication date Sep 29, 2016
- HEADWAY TECHNOLOGIES, INC.
- Dongna Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO REDUCE MAGNETIC FILM STRESS FOR BETTER YIELD
- Publication number 20140349414
- Publication date Nov 27, 2014
- Tom Zhong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Metal Protection Layer over SiN Encapsulation for Spin-Torque MRAM...
- Publication number 20140061827
- Publication date Mar 6, 2014
- HEADWAY TECHNOLOGIES, INC.
- Kenlin Huang
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method to Reduce Magnetic Film Stress for Better Yield
- Publication number 20130302912
- Publication date Nov 14, 2013
- HEADWAY TECHNOLOGIES, INC.
- Tom Zhong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Novel process for MEMS scanning mirror with mass remove from mirror...
- Publication number 20120085728
- Publication date Apr 12, 2012
- Advanced NuMicro Systems, Inc.
- Jun Chen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Bi-layer hard mask for the patterning and etching of nanometer size...
- Publication number 20120028373
- Publication date Feb 2, 2012
- MagIC Technologies, Inc.
- Rodolfo Belen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bottom electrode for MRAM device
- Publication number 20110133300
- Publication date Jun 9, 2011
- MagIC Technologies, Inc.
- Rongfu Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High density spin-transfer torque MRAM process
- Publication number 20110129946
- Publication date Jun 2, 2011
- MagIC Technologies, Inc.
- Tom Zhong
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

MTJ device performance by controlling device shape

Integration scheme for three terminal spin-orbit-torque (SOT) switc...

MTJ device performance by adding stress modulation layer to mtj dev...

STT-MRAM heat sink and magnetic shield structure design for more ro...

Method of ultra-fine critical dimension patterning for magnetic hea...

Etching and encapsulation scheme for magnetic tunnel junction fabri...

Critical dimension (CD) uniformity of photoresist island patterns u...

MTJ device performance by controlling device shape

MTJ device performance by adding stress modulation layer to MTJ dev...

MTJ device performance by controlling device shape

Multiple hard mask patterning to fabricate 20nm and below MRAM devices

STT-MRAM heat sink and magnetic shield structure design for more ro...

Critical dimension (CD) uniformity of photoresist island patterns u...

Critical dimension (CD) uniformity of photoresist island patterns u...

Method for fabricating a magnetic tunneling junction (MTJ) structure

Multiple hard mask patterning to fabricate 20nm and below MRAM devices

Method to remove sidewall damage after MTJ etching

Memory structure having a magnetic tunnel junction (MTJ) self-align...

MTJ device process/integration method with pre-patterned seed layer

Surface treatment method for dielectric anti-reflective coating (DA...

Hybrid metallic hard mask stack for MTJ etching

Method of high density memory fabrication

Bottom electrode for MRAM device

Method to reduce magnetic film stress for better yield

Method to reduce magnetic film stress for better yield

Fabrication method for embedded magnetic memory

Composite hard mask with upper sacrificial dielectric layer for the...

Process for MEMS scanning mirror with mass remove from mirror backside

Method to connect a magnetic device to a CMOS transistor

High density spin-transfer torque MRAM process

Patents Applicationslast 30 patents

STT-MRAM Heat Sink and Magnetic Shield Structure Design for More Ro...

MTJ DEVICE PERFORMANCE BY ADDING STRESS MODULATION LAYER TO MTJ DEV...

Method Of Ultra-Fine Critical Dimension Patterning For Magnetic Hea...

Composite Hard Masks For Ultra-Thin Magnetic Sensors

Etching and Encapsulation Scheme for Magnetic Tunnel Junction Fabri...

MTJ Device Performance by Controlling Device Shape

Method Of Ultra-Fine Critical Dimension Patterning For Magnetic Hea...

MTJ Device Performance by Adding Stress Modulation Layer to MTJ Dev...

MTJ Device Performance by Controlling Device Shape

Etching and Encapsulation Scheme for Magnetic Tunnel Junction Fabri...

Novel Integration Scheme for Three Terminal Spin-Orbit-Torque (SOT)...

STT-MRAM Heat Sink and Magnetic Shield Structure Design for More Ro...

Critical Dimension (CD) Uniformity of Photoresist Island Patterns U...

Critical Dimension (CD) Uniformity of Photoresist Island Patterns U...

MTJ Device Performance by Adding Stress Modulation Layer to MTJ Dev...

Multiple Hard Mask Patterning to Fabricate 20nm and Below MRAM Devices

METHOD FOR FABRICATING A MAGNETIC TUNNELING JUNCTION (MTJ) STRUCTURE

STT-MRAM Heat Sink and Magnetic Shield Structure Design for More Ro...

MTJ Device Performance by Controlling Device Shape

Multiple Hard Mask Patterning to Fabricate 20nm and Below MRAM Devices

Method to Remove Sidewall Damage After MTJ Etching

New Surface Treatment Method for Dielectric Anti-Reflective Coating...

Hybrid Metallic Hard Mask Stack for MTJ Etching

METHOD TO REDUCE MAGNETIC FILM STRESS FOR BETTER YIELD

Metal Protection Layer over SiN Encapsulation for Spin-Torque MRAM...

Method to Reduce Magnetic Film Stress for Better Yield

Novel process for MEMS scanning mirror with mass remove from mirror...

Bi-layer hard mask for the patterning and etching of nanometer size...

Bottom electrode for MRAM device

High density spin-transfer torque MRAM process