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Tomohisa Ohtaki

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Method for manufacturing semiconductor device
    • Patent number 11,977,099
    • Issue date May 7, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Tomohisa Ohtaki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Evaluation apparatus for semiconductor device
    • Patent number 11,709,199
    • Issue date Jul 25, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Tomohisa Ohtaki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Probe module and probe
    • Patent number 11,391,756
    • Issue date Jul 19, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Ryo Hirano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Charged particle beam device, method for adjusting charged particle...
    • Patent number 9,673,020
    • Issue date Jun 6, 2017
    • Hitachi High-Technologies Corporation
    • Yusuke Ominami
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam device
    • Patent number 9,263,232
    • Issue date Feb 16, 2016
    • Hitachi High-Technologies Corporation
    • Yusuke Ominami
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Inspection or observation apparatus and sample inspection or observ...
    • Patent number 9,236,217
    • Issue date Jan 12, 2016
    • Hitachi High-Technologies Corporation
    • Yusuke Ominami
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam device, method for adjusting charged particle...
    • Patent number 9,165,741
    • Issue date Oct 20, 2015
    • Hitachi High-Technologies Corporation
    • Yusuke Ominami
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam apparatus
    • Patent number 9,105,442
    • Issue date Aug 11, 2015
    • Hitachi High-Technologies Corporation
    • Yusuke Ominami
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Inspection or observation apparatus and sample inspection or observ...
    • Patent number 8,933,400
    • Issue date Jan 13, 2015
    • Hitachi High-Technologies Corporation
    • Yusuke Ominami
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam apparatus
    • Patent number 8,921,786
    • Issue date Dec 30, 2014
    • Hitachi High-Technologies Corporation
    • Yusuke Ominami
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Scanning electron microscope
    • Patent number 8,921,784
    • Issue date Dec 30, 2014
    • Hitachi High-Technologies Corporation
    • Toru Iwaya
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Scanning electron microscope
    • Patent number 8,809,782
    • Issue date Aug 19, 2014
    • Hitachi High-Technologies Corporation
    • Tomohisa Ohtaki
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    Charged particle beam apparatus
    • Patent number 8,710,439
    • Issue date Apr 29, 2014
    • Hitachi High-Technologies Corporation
    • Yusuke Ominami
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Portion of an electron microscope
    • Patent number D635167
    • Issue date Mar 29, 2011
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D16 - Photography and optical equipment
  • Information Patent Grant

    Portion of an electron microscope
    • Patent number D635168
    • Issue date Mar 29, 2011
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D16 - Photography and optical equipment
  • Information Patent Grant

    Electron microscope
    • Patent number D633537
    • Issue date Mar 1, 2011
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D16 - Photography and optical equipment
  • Information Patent Grant

    Electron microscope
    • Patent number D633538
    • Issue date Mar 1, 2011
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D16 - Photography and optical equipment
  • Information Patent Grant

    Electron microscope
    • Patent number D632323
    • Issue date Feb 8, 2011
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D16 - Photography and optical equipment
  • Information Patent Grant

    Electron microscope
    • Patent number D626579
    • Issue date Nov 2, 2010
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D16 - Photography and optical equipment
  • Information Patent Grant

    Electron microscope
    • Patent number D625749
    • Issue date Oct 19, 2010
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D16 - Photography and optical equipment
  • Information Patent Grant

    Electron microscope
    • Patent number D623211
    • Issue date Sep 7, 2010
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D16 - Photography and optical equipment
  • Information Patent Grant

    Environmental scanning electron microcope
    • Patent number 7,365,323
    • Issue date Apr 29, 2008
    • Hitachi High-Technologies Corporation
    • Tomohisa Ohtaki
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents