Toshinori Hosokawa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Designing of a logic circuit for testability
- Patent number 7,437,340
- Issue date Oct 14, 2008
- Semiconductor Technology Academic Research Center
- Hiroshi Date
- G01 - MEASURING TESTING
Information Patent Grant
Method of design for testability, method of design for integrated c...
- Patent number 6,708,315
- Issue date Mar 16, 2004
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of design for testability, test sequence generation method a...
- Patent number 6,651,206
- Issue date Nov 18, 2003
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of design for testability for integrated circuits
- Patent number 6,510,535
- Issue date Jan 21, 2003
- Matsushita Electric Industrial Co., Inc.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of generating test sequences
- Patent number 6,449,743
- Issue date Sep 10, 2002
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of design for testability and method of test sequence genera...
- Patent number 6,292,915
- Issue date Sep 18, 2001
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit and method for testing the semicon...
- Patent number 6,271,677
- Issue date Aug 7, 2001
- Matsushita Electric Industrial Company, Limited
- Mitsuyasu Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Method of design for testability test sequence generation method an...
- Patent number 6,253,343
- Issue date Jun 26, 2001
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of design for testability at RTL and integrated circuit desi...
- Patent number 6,185,721
- Issue date Feb 6, 2001
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of design for testability, method of design for avoiding bus...
- Patent number 6,016,564
- Issue date Jan 18, 2000
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Design-for-testability method for path delay faults and test patter...
- Patent number 5,748,646
- Issue date May 5, 1998
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of generating test sequence and apparatus for generating tes...
- Patent number 5,737,341
- Issue date Apr 7, 1998
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Test sequence generation method
- Patent number 5,483,543
- Issue date Jan 9, 1996
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing automatic test pattern generation
- Patent number 5,319,647
- Issue date Jun 7, 1994
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of test sequence generation
- Patent number 5,305,328
- Issue date Apr 19, 1994
- Matsushita Electric Industrial Co., Ltd.
- Akira Motohara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Compacted test plan generation for integrated circuit testing, test...
- Publication number 20030188239
- Publication date Oct 2, 2003
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Application
Designing of logic circuit for testability
- Publication number 20030097347
- Publication date May 22, 2003
- Hiroshi Date
- G01 - MEASURING TESTING
Information Patent Application
Method of design for testability for integrated circuits
- Publication number 20030009716
- Publication date Jan 9, 2003
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Application
Method of design for testability, method of design for integrated c...
- Publication number 20020129322
- Publication date Sep 12, 2002
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Application
Method of design for testability, test sequence generation method a...
- Publication number 20020026611
- Publication date Feb 28, 2002
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING

Toshinori Hosokawa

Person

Patents Grantslast 30 patents

Designing of a logic circuit for testability

Method of design for testability, method of design for integrated c...

Method of design for testability, test sequence generation method a...

Method of design for testability for integrated circuits

Method of generating test sequences

Method of design for testability and method of test sequence genera...

Semiconductor integrated circuit and method for testing the semicon...

Method of design for testability test sequence generation method an...

Method of design for testability at RTL and integrated circuit desi...

Method of design for testability, method of design for avoiding bus...

Design-for-testability method for path delay faults and test patter...

Method of generating test sequence and apparatus for generating tes...

Test sequence generation method

Method and apparatus for performing automatic test pattern generation

Method of test sequence generation

Patents Applicationslast 30 patents

Compacted test plan generation for integrated circuit testing, test...

Designing of logic circuit for testability

Method of design for testability for integrated circuits

Method of design for testability, method of design for integrated c...

Method of design for testability, test sequence generation method a...