Ui Suh

Person

Cincinnati, OH, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for eddy current inspection of parts with complex...
- Patent number 8,269,489
- Issue date Sep 18, 2012
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing a component
- Patent number 8,013,599
- Issue date Sep 6, 2011
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Grant
Flexible eddy current array probe and methods of assembling the same
- Patent number 7,952,348
- Issue date May 31, 2011
- General Electric Company
- Haiyan Sun
- G01 - MEASURING TESTING
Information Patent Grant
Omnidirectional eddy current array probes and methods of use
- Patent number 7,948,233
- Issue date May 24, 2011
- General Electric Company
- Aparna Chakrapani Sheila-Vadde
- G01 - MEASURING TESTING
Information Patent Grant
Surface flaw detection system to facilitate nondestructive inspecti...
- Patent number 7,888,932
- Issue date Feb 15, 2011
- General Electric Company
- William Stewart McKnight
- G01 - MEASURING TESTING
Information Patent Grant
Multi-frequency image processing for inspecting parts having comple...
- Patent number 7,817,845
- Issue date Oct 19, 2010
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing a component
- Patent number 7,689,030
- Issue date Mar 30, 2010
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Grant
Method of aligning probe for eddy current inspection
- Patent number 7,657,389
- Issue date Feb 2, 2010
- General Electric Company
- Ui W. Suh
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of non-planar parts using multifrequency eddy current wi...
- Patent number 7,518,359
- Issue date Apr 14, 2009
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing a component
- Patent number 7,436,992
- Issue date Oct 14, 2008
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Grant
Method for performing model based scanplan generation of a componen...
- Patent number 7,337,651
- Issue date Mar 4, 2008
- General Electric Company
- Suneel Tumkur Shankarappa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and system using multifrequency phase analysis
- Patent number 7,206,706
- Issue date Apr 17, 2007
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current probe and inspection method
- Patent number 7,154,265
- Issue date Dec 26, 2006
- General Electric Company
- Mottito Togo
- G01 - MEASURING TESTING
Information Patent Grant
Real time laser shock peening quality assurance by natural frequenc...
- Patent number 6,914,215
- Issue date Jul 5, 2005
- General Electric Company
- Brian Michael Davis
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Eddy current inspection method
- Patent number 6,907,358
- Issue date Jun 14, 2005
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Grant
Laser shock peening quality assurance by acoustic analysis
- Patent number 6,629,464
- Issue date Oct 7, 2003
- Ui Won Suh
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Simultaneous offset dual sided laser shock peening with oblique ang...
- Patent number 6,570,125
- Issue date May 27, 2003
- General Electric Company
- Ui Won Suh
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Simultaneous offset dual sided laser shock peening using low energy...
- Patent number 6,570,126
- Issue date May 27, 2003
- General Electric Company
- Ui Won Suh
- C21 - METALLURGY OF IRON
Information Patent Grant
Laser shock peening quality assurance by ultrasonic analysis
- Patent number 6,422,082
- Issue date Jul 23, 2002
- General Electric Company
- Ui Won Suh
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Simultaneous offset dual sided laser shock peening
- Patent number 6,296,448
- Issue date Oct 2, 2001
- General Electric Company
- Ui W. Suh
- C21 - METALLURGY OF IRON
Information Patent Grant
Aspherical curved element transducer to inspect a part with curved...
- Patent number 6,237,419
- Issue date May 29, 2001
- General Electric Company
- Ui W. Suh
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Method for monitoring and controlling laser shock peening using tem...
- Patent number 6,075,593
- Issue date Jun 13, 2000
- General Electric Company
- Richard L. Trantow
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR COMPENSATION OF RESPONSES FROM EDDY CURRENT PROBES
- Publication number 20110004452
- Publication date Jan 6, 2011
- Sanghamithra Korukonda
- G01 - MEASURING TESTING
Information Patent Application
PROCESS AND APPARATUS FOR TESTING A COMPONENT USING AN OMNI-DIRECTI...
- Publication number 20100312494
- Publication date Dec 9, 2010
- Sanghamithra Korukonda
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION OF PARTS WITH COMPLEX GEOMETRIES
- Publication number 20100127699
- Publication date May 27, 2010
- GENERAL ELECTRIC COMPANY
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Application
Omnidirectional Eddy Current Array Probes and Methods of Use
- Publication number 20100085045
- Publication date Apr 8, 2010
- GENERAL ELECTRIC COMPANY
- Aparna Chakrapani Sheila-Vadde
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE EDDY CURRENT ARRAY PROBE AND METHODS OF ASSEMBLING THE SAME
- Publication number 20090115411
- Publication date May 7, 2009
- Haiyan Sun
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT PROBE AND METHODS OF ASSEMBLING THE SAME
- Publication number 20090115410
- Publication date May 7, 2009
- William Stewart McKnight
- G01 - MEASURING TESTING
Information Patent Application
MULTI-FREQUENCY IMAGE PROCESSING FOR INSPECTING PARTS HAVING COMPLE...
- Publication number 20080159619
- Publication date Jul 3, 2008
- GENERAL ELECTRIC COMPANY
- Ui Won SUH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF ALIGNING PROBE FOR EDDY CURRENT INSPECTION
- Publication number 20070244659
- Publication date Oct 18, 2007
- GENERAL ELECTRIC COMPANY
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing a component
- Publication number 20070140546
- Publication date Jun 21, 2007
- General Electric Company
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Application
Method for performing model based scanplan generation of a componen...
- Publication number 20060224348
- Publication date Oct 5, 2006
- General Electric Company
- Suneel Tumkur Shankarappa
- G01 - MEASURING TESTING
Information Patent Application
Inspection method and system using multifrequency phase analysis
- Publication number 20060217908
- Publication date Sep 28, 2006
- General Electric Company
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Application
Inspection of non-planar parts using multifrequency eddy current wi...
- Publication number 20060202687
- Publication date Sep 14, 2006
- GENERAL ELECTRIC COMPANY
- Changting Wang
- G01 - MEASURING TESTING
Information Patent Application
Eddy current probe and inspection method
- Publication number 20060132124
- Publication date Jun 22, 2006
- General Electric Company
- Mottito Togo
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing a component
- Publication number 20060109001
- Publication date May 25, 2006
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing a component
- Publication number 20060023961
- Publication date Feb 2, 2006
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Application
Real time laser shock peening quality assurance by natural frequenc...
- Publication number 20040262276
- Publication date Dec 30, 2004
- Brian Michael Davis
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
EDDY CURRENT INSPECTION METHOD
- Publication number 20040153260
- Publication date Aug 5, 2004
- Ui Won Suh
- G01 - MEASURING TESTING
Information Patent Application
Laser shock peening quality assurance by acoustic analysis
- Publication number 20030062349
- Publication date Apr 3, 2003
- Ui Won Suh
- C21 - METALLURGY OF IRON
Information Patent Application
Simultaneous offset dual sided laser shock peening using low energy...
- Publication number 20030042234
- Publication date Mar 6, 2003
- Ui Won Suh
- C21 - METALLURGY OF IRON
Information Patent Application
Simultaneous offset dual sided laser shock peening with oblique ang...
- Publication number 20030042235
- Publication date Mar 6, 2003
- Ui Won Suh
- C21 - METALLURGY OF IRON

Person

Patents Grantslast 30 patents

System and method for eddy current inspection of parts with complex...

Methods and apparatus for testing a component

Flexible eddy current array probe and methods of assembling the same

Omnidirectional eddy current array probes and methods of use

Surface flaw detection system to facilitate nondestructive inspecti...

Multi-frequency image processing for inspecting parts having comple...

Methods and apparatus for testing a component

Method of aligning probe for eddy current inspection

Inspection of non-planar parts using multifrequency eddy current wi...

Methods and apparatus for testing a component

Method for performing model based scanplan generation of a componen...

Inspection method and system using multifrequency phase analysis

Eddy current probe and inspection method

Real time laser shock peening quality assurance by natural frequenc...

Eddy current inspection method

Laser shock peening quality assurance by acoustic analysis

Simultaneous offset dual sided laser shock peening with oblique ang...

Simultaneous offset dual sided laser shock peening using low energy...

Laser shock peening quality assurance by ultrasonic analysis

Simultaneous offset dual sided laser shock peening

Aspherical curved element transducer to inspect a part with curved...

Method for monitoring and controlling laser shock peening using tem...

Patents Applicationslast 30 patents

METHOD FOR COMPENSATION OF RESPONSES FROM EDDY CURRENT PROBES

PROCESS AND APPARATUS FOR TESTING A COMPONENT USING AN OMNI-DIRECTI...

SYSTEM AND METHOD FOR INSPECTION OF PARTS WITH COMPLEX GEOMETRIES

Omnidirectional Eddy Current Array Probes and Methods of Use

FLEXIBLE EDDY CURRENT ARRAY PROBE AND METHODS OF ASSEMBLING THE SAME

EDDY CURRENT PROBE AND METHODS OF ASSEMBLING THE SAME

MULTI-FREQUENCY IMAGE PROCESSING FOR INSPECTING PARTS HAVING COMPLE...

METHOD OF ALIGNING PROBE FOR EDDY CURRENT INSPECTION

Methods and apparatus for testing a component

Method for performing model based scanplan generation of a componen...

Inspection method and system using multifrequency phase analysis

Inspection of non-planar parts using multifrequency eddy current wi...

Eddy current probe and inspection method

Methods and apparatus for testing a component

Methods and apparatus for testing a component

Real time laser shock peening quality assurance by natural frequenc...

EDDY CURRENT INSPECTION METHOD

Laser shock peening quality assurance by acoustic analysis

Simultaneous offset dual sided laser shock peening using low energy...

Simultaneous offset dual sided laser shock peening with oblique ang...