William E. Corr

Person

Twickenham, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Determining timing of integrated circuits
- Patent number 7,596,483
- Issue date Sep 29, 2009
- LSI Corporation
- William Eric Corr
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interpolation error minimization for data reduction
- Patent number 7,072,812
- Issue date Jul 4, 2006
- Micron Technology, Inc.
- William E. Corr
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit for measuring on-chip power supply integrity
- Patent number 6,946,846
- Issue date Sep 20, 2005
- Micron Technology, Inc.
- William E. Corr
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for measuring on-chip power supply integrity
- Patent number 6,933,729
- Issue date Aug 23, 2005
- Micron Technology, Inc.
- William E. Corr
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for determining effect of on-chip noise on sig...
- Patent number 6,925,404
- Issue date Aug 2, 2005
- Micron Technology, Inc.
- William E. Corr
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining effect of on-chip noise on sig...
- Patent number 6,807,502
- Issue date Oct 19, 2004
- Micron Technology, Inc.
- William E. Corr
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining effect of on-chip noise on sig...
- Patent number 6,801,870
- Issue date Oct 5, 2004
- Micron Technology, Inc.
- William E. Corr
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining effect of on-chip noise on sig...
- Patent number 6,792,374
- Issue date Sep 14, 2004
- Micron Technology, Inc.
- William E. Corr
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining effect of on-chip noise on sig...
- Patent number 6,785,628
- Issue date Aug 31, 2004
- Micron Technology, Inc.
- William E. Corr
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining effect of on-chip noise on sig...
- Patent number 6,785,627
- Issue date Aug 31, 2004
- Micron Technology, Inc.
- William E. Corr
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining effect of on-chip noise on sig...
- Patent number 6,785,626
- Issue date Aug 31, 2004
- Micron Technology, Inc.
- William E. Corr
- G01 - MEASURING TESTING
Information Patent Grant
Analog to digital converter
- Patent number 5,657,019
- Issue date Aug 12, 1997
- LSI Logic Corporation
- Kenneth Stephen Hunt
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Circuit for measuring on-chip power supply integrity
- Publication number 20050007126
- Publication date Jan 13, 2005
- William E. Corr
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Apparatus and method for determining effect of on-chip noise on sig...
- Publication number 20040162693
- Publication date Aug 19, 2004
- William E. Corr
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for determining effect of on-chip noise on sig...
- Publication number 20030204353
- Publication date Oct 30, 2003
- William E. Corr
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for determining effect of on-chip noise on sig...
- Publication number 20030204354
- Publication date Oct 30, 2003
- William E. Corr
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for determining effect of on-chip noise on sig...
- Publication number 20030204351
- Publication date Oct 30, 2003
- William E. Corr
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for determining effect of on-chip noise on sig...
- Publication number 20030204352
- Publication date Oct 30, 2003
- William E. Corr
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for determining effect of on-chip noise on sig...
- Publication number 20030200046
- Publication date Oct 23, 2003
- William E. Corr
- G01 - MEASURING TESTING
Information Patent Application
System and method for generating high-quality libraries
- Publication number 20030149703
- Publication date Aug 7, 2003
- Micron Technology, Inc.
- William E. Corr
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and method for determining effect of on-chip noise on sig...
- Publication number 20030083840
- Publication date May 1, 2003
- William E. Corr
- G01 - MEASURING TESTING
Information Patent Application
Interpolation error minimization for data reduction
- Publication number 20030025712
- Publication date Feb 6, 2003
- William E. Corr
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Circuit for measuring on-chip power supply integrity
- Publication number 20020133748
- Publication date Sep 19, 2002
- William E. Corr
- G01 - MEASURING TESTING

William E. Corr

Person

Patents Grantslast 30 patents

Determining timing of integrated circuits

Interpolation error minimization for data reduction

Circuit for measuring on-chip power supply integrity

Method and apparatus for measuring on-chip power supply integrity

Apparatus and method for determining effect of on-chip noise on sig...

Apparatus and method for determining effect of on-chip noise on sig...

Apparatus and method for determining effect of on-chip noise on sig...

Apparatus and method for determining effect of on-chip noise on sig...

Apparatus and method for determining effect of on-chip noise on sig...

Apparatus and method for determining effect of on-chip noise on sig...

Apparatus and method for determining effect of on-chip noise on sig...

Analog to digital converter

Patents Applicationslast 30 patents

Circuit for measuring on-chip power supply integrity

Apparatus and method for determining effect of on-chip noise on sig...

Apparatus and method for determining effect of on-chip noise on sig...

Apparatus and method for determining effect of on-chip noise on sig...

Apparatus and method for determining effect of on-chip noise on sig...

Apparatus and method for determining effect of on-chip noise on sig...

Apparatus and method for determining effect of on-chip noise on sig...

System and method for generating high-quality libraries

Apparatus and method for determining effect of on-chip noise on sig...

Interpolation error minimization for data reduction

Circuit for measuring on-chip power supply integrity