Wojciech P. Maly

Person

Pittsburgh, PA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Lithography and associated methods, devices, and systems
- Patent number 8,259,286
- Issue date Sep 4, 2012
- Carnegie Mellon University
- Wojciech P. Maly
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Using neighborhood functions to extract logical models of physical...
- Patent number 7,770,080
- Issue date Aug 3, 2010
- Carnegie Mellon University
- Ronald DeShawn Blanton
- G01 - MEASURING TESTING
Information Patent Grant
Vertex based layout pattern (VEP): a method and apparatus for descr...
- Patent number 6,892,367
- Issue date May 10, 2005
- PDF Solutions, Inc.
- Michal Palusinski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Current signatures for IDDQ testing
- Patent number 6,175,244
- Issue date Jan 16, 2001
- Carnegie Mellon University
- Anne Elizabeth Gattiker
- G01 - MEASURING TESTING
Information Patent Grant
Test pattern generation for an electronic circuit using a transform...
- Patent number 5,528,604
- Issue date Jun 18, 1996
- Carnegie Mellon University
- Aiman H. El-Maleh
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting vertically propagated defects in...
- Patent number 5,051,690
- Issue date Sep 24, 1991
- National Semiconductor Corporation
- Wojciech Maly
- G01 - MEASURING TESTING
Information Patent Grant
Static RAM memory cell using N-channel MOS transistors
- Patent number 5,051,951
- Issue date Sep 24, 1991
- Carnegie Mellon University
- Wojciech Maly
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in current testing of integrated circuits
- Patent number 5,025,344
- Issue date Jun 18, 1991
- Carnegie Mellon University
- Wojciech P. Maly
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting spot defects in integrated circuits
- Patent number 4,835,466
- Issue date May 30, 1989
- Fairchild Semiconductor Corporation
- Wojciech Maly
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Lithography and Associated Methods, Devices, and Systems
- Publication number 20080137051
- Publication date Jun 12, 2008
- Carnegie Mellon University
- Wojciech P. Maly
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Using neighborhood functions to extract logical models of physical...
- Publication number 20070234161
- Publication date Oct 4, 2007
- Ronald DeShawn Blanton
- G01 - MEASURING TESTING
Information Patent Application
Vertex based layout pattern (VEP): a method and apparatus for descr...
- Publication number 20040003357
- Publication date Jan 1, 2004
- Michal Palusinski
- G06 - COMPUTING CALCULATING COUNTING

Wojciech P. Maly

Person

Patents Grantslast 30 patents

Lithography and associated methods, devices, and systems

Using neighborhood functions to extract logical models of physical...

Vertex based layout pattern (VEP): a method and apparatus for descr...

Current signatures for IDDQ testing

Test pattern generation for an electronic circuit using a transform...

Apparatus and method for detecting vertically propagated defects in...

Static RAM memory cell using N-channel MOS transistors

Built-in current testing of integrated circuits

Apparatus and method for detecting spot defects in integrated circuits

Patents Applicationslast 30 patents

Lithography and Associated Methods, Devices, and Systems

Using neighborhood functions to extract logical models of physical...

Vertex based layout pattern (VEP): a method and apparatus for descr...