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Yasuko Hanagama
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Tokyo, JP
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last 30 patents
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Patent Grant
System and method for fault analysis of semiconductor integrated ci...
Patent number
5,703,492
Issue date
Dec 30, 1997
NEC Corporation
Toyokazu Nakamura
G01 - MEASURING TESTING
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Patent Grant
Semiconductor integrated circuit fault analyzing apparatus and meth...
Patent number
5,521,516
Issue date
May 28, 1996
NEC Corporation
Yasuko Hanagama
G01 - MEASURING TESTING
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Patent Grant
Apparatus for diagnosing interconnections of semiconductor integrat...
Patent number
5,422,498
Issue date
Jun 6, 1995
NEC Corporation
Kiyoshi Nikawa
G01 - MEASURING TESTING