Number | Date | Country | Kind |
---|---|---|---|
5-085817 | Apr 1993 | JPX | |
5-313320 | Dec 1993 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
4874251 | Thomas et al. | Oct 1989 | |
5042952 | Opsal et al. | Aug 1991 | |
5049811 | Dreyer et al. | Sep 1991 |
Entry |
---|
By K. Haraguchi, "Detection of defect point and failure analysis in semiconductor devices", pp. 140-144 and English abstract. Date and journal of publication unknown. |
By W. Smith et al., "Direct Measurement of Stress-Induced Void Growth by Thermal Wave Modulated Optical Reflectance Imaging", pp. 200-209; 1990 IRPS, date of publication unknown. |