Yasushi Naito

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Display panel and production method for same
- Patent number 9,236,422
- Issue date Jan 12, 2016
- Joled Inc
- Seiji Nishiyama
- G02 - OPTICS
Information Patent Grant
Method for measuring temperature, annealing method and method for f...
- Patent number 7,037,733
- Issue date May 2, 2006
- Matsushita Electric Industrial Co., Ltd.
- Satoshi Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating a high-density dynamic random-access memory
- Patent number 5,856,219
- Issue date Jan 5, 1999
- Matsushita Electric Industrial Co., Ltd.
- Yasushi Naito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming isolation
- Patent number 5,472,906
- Issue date Dec 5, 1995
- Matsushita Electric Industrial Co., Ltd.
- Norisato Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a semiconductor device comprising a polycide...
- Patent number 5,459,101
- Issue date Oct 17, 1995
- Matsushita Electric Industrial Co., Ltd.
- Toyokazu Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with a dual type polycide layer comprising a u...
- Patent number 5,355,010
- Issue date Oct 11, 1994
- Matsushita Electric Industrial Co., Ltd.
- Toyokazu Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and a method of fabricating the same
- Patent number 5,341,014
- Issue date Aug 23, 1994
- Matsushita Electric Industrial Co., Ltd.
- Toyokazu Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor device using a heat treatm...
- Patent number 5,314,848
- Issue date May 24, 1994
- Matsushita Electric Industrial Co., Ltd.
- Takatoshi Yasui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a semiconductor integrated circuit device in...
- Patent number 5,275,972
- Issue date Jan 4, 1994
- Matsushita Electric Industrial Co., Ltd.
- Hisashi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor memory device
- Patent number 5,242,852
- Issue date Sep 7, 1993
- Matsushita Electric Industrial Co. Ltd.
- Kazuhiro Matsuyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a semiconductor device having a LOCOS insulati...
- Patent number 5,128,274
- Issue date Jul 7, 1992
- Matsushita Electric Industrial Co., Ltd.
- Toshiki Yabu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DISPLAY PANEL AND PRODUCTION METHOD FOR SAME
- Publication number 20140151709
- Publication date Jun 5, 2014
- PANASONIC CORPORATION
- Seiji Nishiyama
- G02 - OPTICS
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20070108530
- Publication date May 17, 2007
- Hisashi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Temperature measuring method, heat treating method, and semiconduct...
- Publication number 20040023421
- Publication date Feb 5, 2004
- Satoshi Shibata
- G01 - MEASURING TESTING

Yasushi Naito

Person

Patents Grantslast 30 patents

Display panel and production method for same

Method for measuring temperature, annealing method and method for f...

Method of fabricating a high-density dynamic random-access memory

Method of forming isolation

Method for fabricating a semiconductor device comprising a polycide...

Semiconductor device with a dual type polycide layer comprising a u...

Semiconductor device and a method of fabricating the same

Method for manufacturing a semiconductor device using a heat treatm...

Method for fabricating a semiconductor integrated circuit device in...

Method for manufacturing a semiconductor memory device

Method for producing a semiconductor device having a LOCOS insulati...

Patents Applicationslast 30 patents

DISPLAY PANEL AND PRODUCTION METHOD FOR SAME

Semiconductor device and method for manufacturing the same

Temperature measuring method, heat treating method, and semiconduct...