Yoshihiko Naito

Person

Nerima, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Locking device for opening and closing lid
- Patent number 10,370,880
- Issue date Aug 6, 2019
- Kabushiki Kaisha Audio-Technica
- Akira Masuda
- E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information Patent Grant
Inspection device
- Patent number 10,157,722
- Issue date Dec 18, 2018
- Ebara Corporation
- Masahiro Hatakeyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen observation method and device using secondary emission ele...
- Patent number 9,966,227
- Issue date May 8, 2018
- Ebara Corporation
- Masahiro Hatakeyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wireless microphone with antenna therein
- Patent number 9,749,725
- Issue date Aug 29, 2017
- Kabushiki Kaisha Audio-Technica
- Yoshihiko Naito
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Microphone
- Patent number 9,615,157
- Issue date Apr 4, 2017
- Kabushiki Kaisha Audio-Technica
- Yoshihiko Naito
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electron beam apparatus and sample observation method using the same
- Patent number 9,194,826
- Issue date Nov 24, 2015
- Ebara Corporation
- Toru Kaga
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical inspection apparatus and method with dust or partic...
- Patent number 9,105,444
- Issue date Aug 11, 2015
- Ebara Corporation
- Kenji Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen observation method and device using secondary emission ele...
- Patent number 8,937,283
- Issue date Jan 20, 2015
- Ebara Corporation
- Masahiro Hatakeyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspecting sample surface
- Patent number 8,859,984
- Issue date Oct 14, 2014
- Ebara Corporation
- Nobuharu Noji
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical inspection apparatus and method with dust or partic...
- Patent number 8,624,182
- Issue date Jan 7, 2014
- Ebara Corporation
- Kenji Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspecting sample surface
- Patent number 8,525,127
- Issue date Sep 3, 2013
- Ebara Corporation
- Nobuharu Noji
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 8,497,476
- Issue date Jul 30, 2013
- Ebara Corporation
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Grant
Substrate surface inspection method and inspection apparatus
- Patent number 8,274,047
- Issue date Sep 25, 2012
- Ebara Corporation
- Yoshihiko Naito
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting sample surface
- Patent number 7,952,071
- Issue date May 31, 2011
- Ebara Corporation
- Nobuharu Noji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample surface observation method
- Patent number 7,829,853
- Issue date Nov 9, 2010
- Ebara Corporation
- Kenji Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Optical disk producing device and producing method
- Patent number 6,960,270
- Issue date Nov 1, 2005
- Origin Electric Company, Limited
- Yutaka Matsumoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Electron beam irradiating apparatus
- Patent number 6,614,037
- Issue date Sep 2, 2003
- Ebara Corporation
- Yoshihiko Naito
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Electron beam irradiation device
- Patent number 6,329,769
- Issue date Dec 11, 2001
- Ebara Corporation
- Yoshihiko Naito
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Disk coating system
- Patent number 5,743,965
- Issue date Apr 28, 1998
- Origin Electric Company, Limited
- Hironobu Nishimura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Magnetic field type mass spectrometer
- Patent number 5,721,428
- Issue date Feb 24, 1998
- Ebara Corporation
- Yoshihiko Naito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High frequency mass spectrometer
- Patent number 5,565,680
- Issue date Oct 15, 1996
- Ebara Corporation
- Yoshihiko Naito
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
THERMAL SPRAYING APPARATUS, METHOD OF DETECTING MOLTEN ADHERED SUBS...
- Publication number 20230265550
- Publication date Aug 24, 2023
- EBARA CORPORATION
- Yoshihiko NAITO
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
INSPECTION DEVICE
- Publication number 20160307726
- Publication date Oct 20, 2016
- EBARA CORPORATION
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Application
LOCKING DEVICE FOR OPENING AND CLOSING LID
- Publication number 20160143166
- Publication date May 19, 2016
- KABUSHIKI KAISHA AUDIO-TECHNICA
- Akira MASUDA
- E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information Patent Application
WIRELESS MICROPHONE
- Publication number 20160142802
- Publication date May 19, 2016
- KABUSHIKI KAISHA AUDIO-TECHNICA
- Yoshihiko NAITO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MICROPHONE
- Publication number 20160142804
- Publication date May 19, 2016
- KABUSHIKI KAISHA AUDIO-TECHNICA
- Yoshihiko NAITO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SPECIMEN OBSERVATION METHOD AND DEVICE USING SECONDARY EMISSION ELE...
- Publication number 20150060666
- Publication date Mar 5, 2015
- EBARA CORPORATION
- Masahiro Hatakeyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRO-OPTICAL INSPECTION APPARATUS AND METHOD WITH DUST OR PARTIC...
- Publication number 20140091215
- Publication date Apr 3, 2014
- EBARA CORPORATION
- Kenji WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION DEVICE
- Publication number 20140014848
- Publication date Jan 16, 2014
- EBARA CORPORATION
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING SAMPLE SURFACE
- Publication number 20130313429
- Publication date Nov 28, 2013
- EBARA CORPORATION
- Nobuharu Noji
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20120235036
- Publication date Sep 20, 2012
- EBARA CORPORATION
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING SAMPLE SURFACE
- Publication number 20120145921
- Publication date Jun 14, 2012
- EBARA CORPORATION
- Nobuharu Noji
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-OPTICAL INSPECTION APPARATUS AND METHOD WITH DUST OR PARTIC...
- Publication number 20120074316
- Publication date Mar 29, 2012
- Kenji WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN OBSERVATION METHOD AND DEVICE, AND INSPECTION METHOD AND D...
- Publication number 20110155905
- Publication date Jun 30, 2011
- EBARA CORPORATION
- Masahiro Hatakeyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE SURFACE INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20100032566
- Publication date Feb 11, 2010
- EBARA CORPORATION
- Yoshihiko Naito
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICES AND METHOD OF TESTING SAME
- Publication number 20090152595
- Publication date Jun 18, 2009
- EBARA CORPORATION
- Toru Kaga
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SURFACE OBSERVATION METHOD
- Publication number 20090090863
- Publication date Apr 9, 2009
- EBARA CORPORATION
- Kenji WATANABE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING SAMPLE SURFACE
- Publication number 20090050802
- Publication date Feb 26, 2009
- EBARA CORPORATION
- Nobuharu Noji
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING SAMPLE SURFACE
- Publication number 20090026368
- Publication date Jan 29, 2009
- Ebara Corporation
- Nobuharu Noji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPARATUS AND SAMPLE OBSERVATION METHOD USING THE SAME
- Publication number 20080251718
- Publication date Oct 16, 2008
- EBARA CORPORATION
- Toru KAGA
- G01 - MEASURING TESTING
Information Patent Application
Optical disk producing device and producing method
- Publication number 20030104097
- Publication date Jun 5, 2003
- Yutaka Matsumoto
- G11 - INFORMATION STORAGE

Yoshihiko Naito

Person

Patents Grantslast 30 patents

Locking device for opening and closing lid

Inspection device

Specimen observation method and device using secondary emission ele...

Wireless microphone with antenna therein

Microphone

Electron beam apparatus and sample observation method using the same

Electro-optical inspection apparatus and method with dust or partic...

Specimen observation method and device using secondary emission ele...

Method and apparatus for inspecting sample surface

Electro-optical inspection apparatus and method with dust or partic...

Method and apparatus for inspecting sample surface

Inspection device

Substrate surface inspection method and inspection apparatus

Apparatus and method for inspecting sample surface

Sample surface observation method

Optical disk producing device and producing method

Electron beam irradiating apparatus

Electron beam irradiation device

Disk coating system

Magnetic field type mass spectrometer

High frequency mass spectrometer

Patents Applicationslast 30 patents

THERMAL SPRAYING APPARATUS, METHOD OF DETECTING MOLTEN ADHERED SUBS...

INSPECTION DEVICE

LOCKING DEVICE FOR OPENING AND CLOSING LID

WIRELESS MICROPHONE

MICROPHONE

SPECIMEN OBSERVATION METHOD AND DEVICE USING SECONDARY EMISSION ELE...

ELECTRO-OPTICAL INSPECTION APPARATUS AND METHOD WITH DUST OR PARTIC...

INSPECTION DEVICE

METHOD AND APPARATUS FOR INSPECTING SAMPLE SURFACE

INSPECTION DEVICE

METHOD AND APPARATUS FOR INSPECTING SAMPLE SURFACE

ELECTRO-OPTICAL INSPECTION APPARATUS AND METHOD WITH DUST OR PARTIC...

SPECIMEN OBSERVATION METHOD AND DEVICE, AND INSPECTION METHOD AND D...

SUBSTRATE SURFACE INSPECTION METHOD AND INSPECTION APPARATUS

SEMICONDUCTOR DEVICES AND METHOD OF TESTING SAME

SAMPLE SURFACE OBSERVATION METHOD

METHOD AND APPARATUS FOR INSPECTING SAMPLE SURFACE

APPARATUS AND METHOD FOR INSPECTING SAMPLE SURFACE

ELECTRON BEAM APPARATUS AND SAMPLE OBSERVATION METHOD USING THE SAME

Optical disk producing device and producing method