TREA

Yoshikazu Ezawa

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  • Kanagawa, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Wafer level burn-in tester
    • Patent number D427088
    • Issue date Jun 27, 2000
    • Matsushita Electric Industrial Co., Ltd.
    • Yoshihiko Asai
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Wafer level burn-in tester
    • Patent number D426785
    • Issue date Jun 20, 2000
    • Matsushita Electric Industrial Co., Ltd.
    • Yoshihiko Asai
    • D10 - Measuring, testing, or signalling instruments