Yukihiro Ushiku

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Process control system, process control method, and method of manuf...
- Patent number 7,831,330
- Issue date Nov 9, 2010
- Kabushiki Kaisha Toshiba
- Junji Sugamoto
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor device manufacturing system and method for manufactur...
- Patent number 7,702,413
- Issue date Apr 20, 2010
- Kabushiki Kaisha Toshiba
- Yukihiro Ushiku
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semiconductor wafer with ID mark, equipment for and method of manuf...
- Patent number 7,700,381
- Issue date Apr 20, 2010
- Kabushikia Kaisha Toshiba
- Tsunetoshi Arikado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device manufacturing system and method for manufactur...
- Patent number 7,623,937
- Issue date Nov 24, 2009
- Kabushiki Kaisha Toshiba
- Yukihiro Ushiku
Information Patent Grant
Process control system, process control method, and method of manuf...
- Patent number 7,596,421
- Issue date Sep 29, 2009
- Kabushik Kaisha Toshiba
- Junji Sugamoto
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 7,588,973
- Issue date Sep 15, 2009
- Kabushiki Kaisha Toshiba
- Yukihiro Ushiku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inspecting semiconductor wafer
- Patent number 7,531,462
- Issue date May 12, 2009
- Kabushiki Kaisha Toshiba
- Katsujiro Tanzawa
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus, and computer program of searching for clustering...
- Patent number 7,529,634
- Issue date May 5, 2009
- Kabushiki Kaisha Toshiba
- Kunihiro Mitsutake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quality control system, quality control method, and method of lot-t...
- Patent number 7,463,941
- Issue date Dec 9, 2008
- Kabushiki Kaisha Toshiba
- Akira Ogawa
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for manufacturing semiconductor device, method...
- Patent number 7,413,914
- Issue date Aug 19, 2008
- Kabushiki Kaisha Toshiba
- Yukihiro Ushiku
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 7,361,960
- Issue date Apr 22, 2008
- Kabushiki Kaisha Toshiba
- Yoshitaka Tsunashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process-state management system, management server and control serv...
- Patent number 7,324,855
- Issue date Jan 29, 2008
- Kabushiki Kaisha Toshiba
- Yukihiro Ushiku
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer treatment method, semiconductor wafer inspectio...
- Patent number 7,314,766
- Issue date Jan 1, 2008
- Kabushiki Kaisha Toshiba
- Junji Sugamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Equipment for and method of detecting faults in semiconductor integ...
- Patent number 7,222,026
- Issue date May 22, 2007
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
System and method for monitoring manufacturing apparatuses
- Patent number 7,221,991
- Issue date May 22, 2007
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
System and method for controlling manufacturing processes, and meth...
- Patent number 7,188,049
- Issue date Mar 6, 2007
- Kabushiki Kaisha Toshiba
- Norihiko Tsuchiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor manufacturing apparatus and semiconductor device manu...
- Patent number 7,082,346
- Issue date Jul 25, 2006
- Kabushiki Kaisha Toshiba
- Kazuo Saki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Manufacturing apparatus and method for predicting life of a manufac...
- Patent number 7,065,469
- Issue date Jun 20, 2006
- Kabushiki Kaisha Toshiba
- Shuichi Samata
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer with ID mark, equipment for and method of manuf...
- Patent number 7,057,259
- Issue date Jun 6, 2006
- Kabushiki Kaisha Toshiba
- Tsunetoshi Arikado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for predicting life of rotary machine and equipment using...
- Patent number 6,944,572
- Issue date Sep 13, 2005
- Kabushiki Kaisha Toshiba
- Yukihiro Ushiku
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Method for avoiding irregular shutoff of production equipment and s...
- Patent number 6,937,963
- Issue date Aug 30, 2005
- Kabushiki Kaisha Toshiba
- Ken Ishii
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 6,930,359
- Issue date Aug 16, 2005
- Kabushiki Kaisha Toshiba
- Yukihiro Ushiku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for diagnosing failure of a manufacturing apparatus and a fa...
- Patent number 6,909,993
- Issue date Jun 21, 2005
- Kabushiki Kaisha Toshiba
- Takashi Nakao
- G05 - CONTROLLING REGULATING
Information Patent Grant
System for predicting life of a rotary machine, method for predicti...
- Patent number 6,898,551
- Issue date May 24, 2005
- Kabushiki Kaisha Toshiba
- Shuichi Samata
- G01 - MEASURING TESTING
Information Patent Grant
Method for predicting life span of rotary machine used in manufactu...
- Patent number 6,885,972
- Issue date Apr 26, 2005
- Kabushiki Kaisha Toshiba
- Shuichi Samata
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method, apparatus, and computer program of searching for clustering...
- Patent number 6,885,950
- Issue date Apr 26, 2005
- Kabushiki Kaisha Toshiba
- Kunihiro Mitsutake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for predicting life of rotary machine and determining repair...
- Patent number 6,865,513
- Issue date Mar 8, 2005
- Kabushiki Kaisha Toshiba
- Yukihiro Ushiku
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Apparatus for diagnosing failure in equipment using signals relatin...
- Patent number 6,782,348
- Issue date Aug 24, 2004
- Kabushiki Kaisha Toshiba
- Yukihiro Ushiku
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for diagnosing life of manufacturing equipment using rotary...
- Patent number 6,766,275
- Issue date Jul 20, 2004
- Kabushiki Kaisha Toshiba
- Shuichi Samata
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 6,724,045
- Issue date Apr 20, 2004
- Kabushiki Kaisha Toshiba
- Yukihiro Ushiku
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Process control system, process control method, and method of manuf...
- Publication number 20090276078
- Publication date Nov 5, 2009
- Kabushiki Kaisha Toshiba
- Junji Sugamoto
- G05 - CONTROLLING REGULATING
Information Patent Application
Process control system, process control method, and method of manuf...
- Publication number 20060287754
- Publication date Dec 21, 2006
- Junji Sugamoto
- G05 - CONTROLLING REGULATING
Information Patent Application
Method of inspecting semiconductor wafer
- Publication number 20060281281
- Publication date Dec 14, 2006
- Katsujiro Tanzawa
- G01 - MEASURING TESTING
Information Patent Application
Quality control system, quality control method, and method of lot-t...
- Publication number 20060235560
- Publication date Oct 19, 2006
- Akira Ogawa
- G05 - CONTROLLING REGULATING
Information Patent Application
Semiconductor manufacturing apparatus and semiconductor device manu...
- Publication number 20060217830
- Publication date Sep 28, 2006
- Kazuo Saki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Semiconductor wafer with ID mark, equipment for and method of manuf...
- Publication number 20060131696
- Publication date Jun 22, 2006
- Kabushiki Kaisha Toshiba
- Tsunetoshi Arikado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for determining a failure of a manufacturing condition, syst...
- Publication number 20060085165
- Publication date Apr 20, 2006
- Yukihiro Ushiku
- G05 - CONTROLLING REGULATING
Information Patent Application
Process-state management system, management server and control serv...
- Publication number 20060064188
- Publication date Mar 23, 2006
- Yukihiro Ushiku
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Processing system and operating method of processing system
- Publication number 20050284575
- Publication date Dec 29, 2005
- TOKYO ELECTRON LIMITED
- Kazuhide Hasebe
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Vacuum pumping system and method for monitoring of the same
- Publication number 20050260081
- Publication date Nov 24, 2005
- Kabushiki Kaisha Toshiba
- Masayuki Tanaka
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20050233508
- Publication date Oct 20, 2005
- Kabushiki Kaisha Toshiba
- Yukihiro Ushiku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for controlling manufacturing processes, and meth...
- Publication number 20050233601
- Publication date Oct 20, 2005
- Norihiko Tsuchiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for controlling manufacturing apparatuses
- Publication number 20050194590
- Publication date Sep 8, 2005
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Application
Manufacturing apparatus and method for predicting life of rotary ma...
- Publication number 20050107984
- Publication date May 19, 2005
- Kabushiki Kaisha Toshiba
- Shuichi Samata
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Semiconductor device manufacturing system and method for manufactur...
- Publication number 20050095774
- Publication date May 5, 2005
- Yukihiro Ushiku
- G05 - CONTROLLING REGULATING
Information Patent Application
Method, apparatus, and computer program of searching for clustering...
- Publication number 20050097481
- Publication date May 5, 2005
- Kabushiki Kaisha Toshiba
- Kunihiro Mitsutake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20040173851
- Publication date Sep 9, 2004
- Kabushiki Kaisha Toshiba
- Yukihiro Ushiku
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for predicting life of rotary machine and equipment using...
- Publication number 20040143418
- Publication date Jul 22, 2004
- Kabushiki Kaisha Toshiba
- Yukihiro Ushiku
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
Semiconductor wafer treatment method, semiconductor wafer inspectio...
- Publication number 20040137752
- Publication date Jul 15, 2004
- Junji Sugamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for predicting life of a rotary machine, method for predicti...
- Publication number 20040064291
- Publication date Apr 1, 2004
- Kabushiki Kaisha Toshiba
- Shuichi Samata
- G05 - CONTROLLING REGULATING
Information Patent Application
Manufacturing apparatus and method for predicting life of rotary ma...
- Publication number 20040064212
- Publication date Apr 1, 2004
- Shuichi Samata
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
Manufacturing apparatus and method for predicting life of a manufac...
- Publication number 20040064277
- Publication date Apr 1, 2004
- Shuichi Samata
- G05 - CONTROLLING REGULATING
Information Patent Application
Semiconductor manufacturing apparatus and semiconductor device manu...
- Publication number 20040044419
- Publication date Mar 4, 2004
- Kazuo Saki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method for avoiding irregular shutoff of production equipment and s...
- Publication number 20030158705
- Publication date Aug 21, 2003
- Ken Ishii
- G05 - CONTROLLING REGULATING
Information Patent Application
Method for diagnosing life of manufacturing equipment using rotary...
- Publication number 20030154052
- Publication date Aug 14, 2003
- Shuichi Samata
- G05 - CONTROLLING REGULATING
Information Patent Application
Method for predicting life span of rotary machine used in manufactu...
- Publication number 20030153997
- Publication date Aug 14, 2003
- Shuichi Samata
- G05 - CONTROLLING REGULATING
Information Patent Application
Method for diagnosing failure of a manufacturing apparatus and a fa...
- Publication number 20030149547
- Publication date Aug 7, 2003
- Takashi Nakao
- G05 - CONTROLLING REGULATING
Information Patent Application
Vacuum pumping system and method for monitoring of the same
- Publication number 20030041802
- Publication date Mar 6, 2003
- Kabushiki Kaisha Toshiba
- Masayuki Tanaka
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Equipment for and method of detecting faults in semiconductor integ...
- Publication number 20030011376
- Publication date Jan 16, 2003
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for predicting life of rotary machine, equipment using th...
- Publication number 20030009311
- Publication date Jan 9, 2003
- Yukihiro Ushiku
- G01 - MEASURING TESTING

Yukihiro Ushiku

Person

Patents Grantslast 30 patents

Process control system, process control method, and method of manuf...

Semiconductor device manufacturing system and method for manufactur...

Semiconductor wafer with ID mark, equipment for and method of manuf...

Semiconductor device manufacturing system and method for manufactur...

Process control system, process control method, and method of manuf...

Semiconductor device and method of manufacturing the same

Method of inspecting semiconductor wafer

Method, apparatus, and computer program of searching for clustering...

Quality control system, quality control method, and method of lot-t...

Method and apparatus for manufacturing semiconductor device, method...

Semiconductor device and method of manufacturing the same

Process-state management system, management server and control serv...

Semiconductor wafer treatment method, semiconductor wafer inspectio...

Equipment for and method of detecting faults in semiconductor integ...

System and method for monitoring manufacturing apparatuses

System and method for controlling manufacturing processes, and meth...

Semiconductor manufacturing apparatus and semiconductor device manu...

Manufacturing apparatus and method for predicting life of a manufac...

Semiconductor wafer with ID mark, equipment for and method of manuf...

Apparatus for predicting life of rotary machine and equipment using...

Method for avoiding irregular shutoff of production equipment and s...

Semiconductor device and method of manufacturing the same

Method for diagnosing failure of a manufacturing apparatus and a fa...

System for predicting life of a rotary machine, method for predicti...

Method for predicting life span of rotary machine used in manufactu...

Method, apparatus, and computer program of searching for clustering...

Method for predicting life of rotary machine and determining repair...

Apparatus for diagnosing failure in equipment using signals relatin...

Method for diagnosing life of manufacturing equipment using rotary...

Semiconductor device and method of manufacturing the same

Patents Applicationslast 30 patents

Process control system, process control method, and method of manuf...

Process control system, process control method, and method of manuf...

Method of inspecting semiconductor wafer

Quality control system, quality control method, and method of lot-t...

Semiconductor manufacturing apparatus and semiconductor device manu...

Semiconductor wafer with ID mark, equipment for and method of manuf...

Method for determining a failure of a manufacturing condition, syst...

Process-state management system, management server and control serv...

Processing system and operating method of processing system

Vacuum pumping system and method for monitoring of the same

Semiconductor device and method of manufacturing the same

System and method for controlling manufacturing processes, and meth...

System and method for controlling manufacturing apparatuses

Manufacturing apparatus and method for predicting life of rotary ma...

Semiconductor device manufacturing system and method for manufactur...

Method, apparatus, and computer program of searching for clustering...

Semiconductor device and method of manufacturing the same

Apparatus for predicting life of rotary machine and equipment using...

Semiconductor wafer treatment method, semiconductor wafer inspectio...

System for predicting life of a rotary machine, method for predicti...

Manufacturing apparatus and method for predicting life of rotary ma...

Manufacturing apparatus and method for predicting life of a manufac...

Semiconductor manufacturing apparatus and semiconductor device manu...

Method for avoiding irregular shutoff of production equipment and s...

Method for diagnosing life of manufacturing equipment using rotary...

Method for predicting life span of rotary machine used in manufactu...

Method for diagnosing failure of a manufacturing apparatus and a fa...

Vacuum pumping system and method for monitoring of the same

Equipment for and method of detecting faults in semiconductor integ...

Apparatus for predicting life of rotary machine, equipment using th...