YUSUKE ABE

Person

SHIMADA-SHI, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern measurement device and pattern measurement method
- Patent number 12,174,551
- Issue date Dec 24, 2024
- Hitachi High-Technologies Corporation
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system
- Patent number 12,068,128
- Issue date Aug 20, 2024
- HITACHI HIGH-TECH CORPORATION
- Yusuke Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and method of adjusting focus of electron micro...
- Patent number 11,670,479
- Issue date Jun 6, 2023
- HITACHI HIGH-TECH CORPORATION
- Takeyoshi Ohashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 11,626,266
- Issue date Apr 11, 2023
- HITACHI HIGH-TECH CORPORATION
- Keiichiro Hitomi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration sample, electron beam adjustment method and electron be...
- Patent number 11,435,178
- Issue date Sep 6, 2022
- HITACHI HIGH-TECH CORPORATION
- Yasunari Sohda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measurement device and pattern measurement method
- Patent number 11,353,798
- Issue date Jun 7, 2022
- Hitachi High-Technologies Corporation
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Screening method of anticancer agent focused on function of HP1 and...
- Patent number 11,340,215
- Issue date May 24, 2022
- Japanese Foundation for Cancer Research
- Toru Hirota
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Physical quantity measurement including improved corrosion protection
- Patent number 11,293,820
- Issue date Apr 5, 2022
- Nagano Keiki Co., Ltd.
- Yusuke Abe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and method for measuring pattern
- Patent number 11,276,554
- Issue date Mar 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Takeyoshi Ohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 11,251,018
- Issue date Feb 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Yasunari Sohda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern cross-sectional shape estimation system and program
- Patent number 11,211,226
- Issue date Dec 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and calculation method for three-dimen...
- Patent number 11,164,720
- Issue date Nov 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Kenji Yasui
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,636,618
- Issue date Apr 28, 2020
- Hitachi High-Technologies Corporation
- Kaori Bizen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Physical quantity measuring device including a sensor module and a...
- Patent number 10,145,749
- Issue date Dec 4, 2018
- Nagano Keiki Co., Ltd.
- Yusuke Abe
- G01 - MEASURING TESTING
Information Patent Grant
Ceramic sensor module including diaphragm and cylindrical portion i...
- Patent number 10,113,926
- Issue date Oct 30, 2018
- Nagano Keiki Co., Ltd.
- Hironori Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity measuring sensor including an O-ring between a cy...
- Patent number 9,772,242
- Issue date Sep 26, 2017
- Nagano Keiki Co., Ltd.
- Hironori Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Power converter installed between an electric power system and an e...
- Patent number 9,680,368
- Issue date Jun 13, 2017
- Hitachi, Ltd.
- Yusuke Abe
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Charged particle beam apparatus and image forming method
- Patent number 9,245,711
- Issue date Jan 26, 2016
- Hitachi High-Technologies Corporation
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer cleaning device and tray for use in wafer cleaning device
- Patent number 6,616,774
- Issue date Sep 9, 2003
- SPC Electronics
- Haruki Sonoda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-step flow cleaning method and multi-step flow cleaning apparatus
- Patent number 6,432,218
- Issue date Aug 13, 2002
- SPC Electronics Corporation
- Masatoshi Hirokawa
- B08 - CLEANING

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam System
- Publication number 20240371601
- Publication date Nov 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Yusuke NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD, AND I...
- Publication number 20240193666
- Publication date Jun 13, 2024
- Rakuten Asia Pte. Ltd.
- Yusuke ABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20230290606
- Publication date Sep 14, 2023
- Hitachi High-Tech Corporation
- Yusuke ABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20230064202
- Publication date Mar 2, 2023
- HITACHI HIGH-TECH CORPORATION
- Kazuo OOTSUGA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System
- Publication number 20220351938
- Publication date Nov 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Yusuke NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Measurement Device and Pattern Measurement Method
- Publication number 20220260930
- Publication date Aug 18, 2022
- HITACHI HIGH-TECH CORPORATION
- Takuma Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220130638
- Publication date Apr 28, 2022
- HITACHI HIGH-TECH CORPORATION
- Keiichiro HITOMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE AND METHOD OF ADJUSTING FOCUS OF ELECTRON MICRO...
- Publication number 20210384006
- Publication date Dec 9, 2021
- HITACHI HIGH-TECH CORPORATION
- Takeyoshi Ohashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scanning Electron Microscope
- Publication number 20210272770
- Publication date Sep 2, 2021
- Hitachi High-Tech Corporation
- Yasunari SOHDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALIBRATION SAMPLE, ELECTRON BEAM ADJUSTMENT METHOD AND ELECTRON BE...
- Publication number 20210131801
- Publication date May 6, 2021
- Hitachi High-Technologies Corporation
- Yasunari SOHDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND METHOD FOR MEASURING PATTERN
- Publication number 20210043420
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Takeyoshi Ohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN CROSS-SECTIONAL SHAPE ESTIMATION SYSTEM AND PROGRAM
- Publication number 20200321189
- Publication date Oct 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki YOKOSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHYSICAL QUANTITY MEASURING DEVICE AND MANUFACTURING METHOD OF PHYS...
- Publication number 20200309627
- Publication date Oct 1, 2020
- NAGANO KEIKI CO., LTD.
- Yusuke Abe
- G01 - MEASURING TESTING
Information Patent Application
Pattern Measurement Device and Pattern Measurement Method
- Publication number 20200278615
- Publication date Sep 3, 2020
- Hitachi High-Technologies Corporation
- Takuma YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND CALCULATION METHOD FOR THREE-DIMEN...
- Publication number 20200234916
- Publication date Jul 23, 2020
- Hitachi High-Technologies Corporation
- Kenji YASUI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCREENING METHOD OF ANTICANCER AGENT FOCUSED ON FUNCTION OF HP1 AND...
- Publication number 20190094207
- Publication date Mar 28, 2019
- Japanese Foundation for Cancer Research
- Toru Hirota
- C07 - ORGANIC CHEMISTRY
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20190066969
- Publication date Feb 28, 2019
- Hitachi High-Technologies Corporation
- Kaori BIZEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHYSICAL QUANTITY MEASURING SENSOR AND SENSOR MODULE
- Publication number 20170299453
- Publication date Oct 19, 2017
- NAGANO KEIKI CO., LTD.
- Hironori Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL QUANTITY MEASURING DEVICE
- Publication number 20170153157
- Publication date Jun 1, 2017
- NAGANO KEIKI CO., LTD.
- Yusuke Abe
- G01 - MEASURING TESTING
Information Patent Application
POWER CONVERTER
- Publication number 20150365010
- Publication date Dec 17, 2015
- Hitachi, Ltd
- Yusuke ABE
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Charged Particle Beam Apparatus and Image Forming Method
- Publication number 20150221471
- Publication date Aug 6, 2015
- Hitachi High-Technologies Corporation
- Michio HATANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHYSICAL QUANTITY MEASURING SENSOR AND SENSOR MODULE
- Publication number 20150160085
- Publication date Jun 11, 2015
- NAGANO KEIKI CO., LTD.
- Hironori Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
Method for filling blind via holes
- Publication number 20030221969
- Publication date Dec 4, 2003
- Manabu Tomisaka
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Plating device and plating method
- Publication number 20030051995
- Publication date Mar 20, 2003
- Hirotaka Nobata
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Wafer cleaning device and tray for use in wafer cleaning device
- Publication number 20020066472
- Publication date Jun 6, 2002
- Haruki Sonoda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER CLEANING DEVICE AND TRAY FOR USE IN WAFER CLEANING DEVICE
- Publication number 20010047817
- Publication date Dec 6, 2001
- HARUKI SONODA
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Pattern measurement device and pattern measurement method

Charged particle beam system

Electron microscope and method of adjusting focus of electron micro...

Charged particle beam device

Calibration sample, electron beam adjustment method and electron be...

Pattern measurement device and pattern measurement method

Screening method of anticancer agent focused on function of HP1 and...

Physical quantity measurement including improved corrosion protection

Scanning electron microscope and method for measuring pattern

Scanning electron microscope

Pattern cross-sectional shape estimation system and program

Scanning electron microscope and calculation method for three-dimen...

Charged particle beam apparatus

Physical quantity measuring device including a sensor module and a...

Ceramic sensor module including diaphragm and cylindrical portion i...

Physical quantity measuring sensor including an O-ring between a cy...

Power converter installed between an electric power system and an e...

Charged particle beam apparatus and image forming method

Wafer cleaning device and tray for use in wafer cleaning device

Multi-step flow cleaning method and multi-step flow cleaning apparatus

Patents Applicationslast 30 patents

Charged Particle Beam System

INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD, AND I...

Charged Particle Beam Device

CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam System

Pattern Measurement Device and Pattern Measurement Method

CHARGED PARTICLE BEAM DEVICE

ELECTRON MICROSCOPE AND METHOD OF ADJUSTING FOCUS OF ELECTRON MICRO...

Scanning Electron Microscope

CALIBRATION SAMPLE, ELECTRON BEAM ADJUSTMENT METHOD AND ELECTRON BE...

SCANNING ELECTRON MICROSCOPE AND METHOD FOR MEASURING PATTERN

PATTERN CROSS-SECTIONAL SHAPE ESTIMATION SYSTEM AND PROGRAM

PHYSICAL QUANTITY MEASURING DEVICE AND MANUFACTURING METHOD OF PHYS...

Pattern Measurement Device and Pattern Measurement Method

SCANNING ELECTRON MICROSCOPE AND CALCULATION METHOD FOR THREE-DIMEN...

SCREENING METHOD OF ANTICANCER AGENT FOCUSED ON FUNCTION OF HP1 AND...

CHARGED PARTICLE BEAM APPARATUS

PHYSICAL QUANTITY MEASURING SENSOR AND SENSOR MODULE

PHYSICAL QUANTITY MEASURING DEVICE

POWER CONVERTER

Charged Particle Beam Apparatus and Image Forming Method

PHYSICAL QUANTITY MEASURING SENSOR AND SENSOR MODULE

Method for filling blind via holes

Plating device and plating method

Wafer cleaning device and tray for use in wafer cleaning device

WAFER CLEANING DEVICE AND TRAY FOR USE IN WAFER CLEANING DEVICE