Zengtao T. Liu

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Arrays of memory cells and methods of forming an array of verticall...
- Patent number 12,167,615
- Issue date Dec 10, 2024
- Micron Technology, Inc.
- Zengtao T. Liu
Information Patent Grant
Asymmetric junctions of high voltage transistor in NAND flash memory
- Patent number 11,653,496
- Issue date May 16, 2023
- Intel Corporation
- Chang Wan Ha
- G11 - INFORMATION STORAGE
Information Patent Grant
Cross-point memory compensation
- Patent number 11,587,615
- Issue date Feb 21, 2023
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Arrays of memory cells and methods of forming an array of verticall...
- Patent number 11,276,733
- Issue date Mar 15, 2022
- Micron Technology, Inc.
- Zengtao T. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-point memory compensation
- Patent number 11,004,510
- Issue date May 11, 2021
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory arrays
- Patent number 10,859,661
- Issue date Dec 8, 2020
- Micron Technology, Inc.
- Zengtao T. Liu
- G01 - MEASURING TESTING
Information Patent Grant
Memory arrays
- Patent number 10,746,835
- Issue date Aug 18, 2020
- Micron Technology, Inc.
- Zengtao T. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-point memory compensation
- Patent number 10,679,696
- Issue date Jun 9, 2020
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-contact measurement of memory cell threshold voltage
- Patent number 10,672,500
- Issue date Jun 2, 2020
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory Arrays
- Patent number 10,656,231
- Issue date May 19, 2020
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-contact electron beam probing techniques and related structures
- Patent number 10,650,891
- Issue date May 12, 2020
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory arrays
- Patent number 10,613,184
- Issue date Apr 7, 2020
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit structures comprising conductive vias and method...
- Patent number 10,559,531
- Issue date Feb 11, 2020
- Micron Technology, Inc.
- Zengtao T. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-contact electron beam probing techniques and related structures
- Patent number 10,403,359
- Issue date Sep 3, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-contact measurement of memory cell threshold voltage
- Patent number 10,381,101
- Issue date Aug 13, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrays of memory cells and methods of forming an array of verticall...
- Patent number 10,256,275
- Issue date Apr 9, 2019
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory arrays
- Patent number 10,241,185
- Issue date Mar 26, 2019
- Micron Technology, Inc.
- Zengtao T. Liu
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit structures comprising conductive vias and method...
- Patent number 10,121,745
- Issue date Nov 6, 2018
- Micron Technology, Inc.
- Zengtao T. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
NAND memory array with mismatched cell and bitline pitch
- Patent number 10,090,313
- Issue date Oct 2, 2018
- Intel Corporation
- Zengtao Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory arrays
- Patent number 9,989,616
- Issue date Jun 5, 2018
- Micron Technology, Inc.
- Zengtao T. Liu
- G01 - MEASURING TESTING
Information Patent Grant
Memory arrays
- Patent number 9,887,239
- Issue date Feb 6, 2018
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit structures comprising conductive vias and method...
- Patent number 9,704,802
- Issue date Jul 11, 2017
- Micron Technology, Inc.
- Zengtao T. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory arrays
- Patent number 9,697,873
- Issue date Jul 4, 2017
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Cross-point memory compensation
- Patent number 9,679,642
- Issue date Jun 13, 2017
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
NAND memory array with mismatched cell and bitline pitch
- Patent number 9,659,952
- Issue date May 23, 2017
- Intel Corporation
- Zengtao Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device having a different source line coupled to each of a p...
- Patent number 9,564,227
- Issue date Feb 7, 2017
- Micron Technology, Inc.
- Akira Goda
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and operation methods associated with resistive memory...
- Patent number 9,548,335
- Issue date Jan 17, 2017
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory arrays
- Patent number 9,412,421
- Issue date Aug 9, 2016
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit fabrication
- Patent number 9,412,594
- Issue date Aug 9, 2016
- Micron Technology, Inc.
- Luan C. Tran
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Apparatuses and operation methods associated with resistive memory...
- Patent number 9,378,818
- Issue date Jun 28, 2016
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS TO SELECT A PLANE IN A NAND FLASH DIE TO STORE...
- Publication number 20230266910
- Publication date Aug 24, 2023
- Intel NDTM US LLC
- Chang Wan HA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
3D NAND WITH IO CONTACTS IN ISOLATION TRENCH
- Publication number 20230076831
- Publication date Mar 9, 2023
- Intel Corporation
- Praveen Kumar Kalsani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Arrays of Memory Cells and Methods of Forming an Array of Verticall...
- Publication number 20220157888
- Publication date May 19, 2022
- Micron Technology, Inc.
- Zengtao T. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ASYMMETRIC JUNCTIONS OF HIGH VOLTAGE TRANSISTOR IN NAND FLASH MEMORY
- Publication number 20220102365
- Publication date Mar 31, 2022
- Intel Corporation
- Chang Wan HA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS-POINT MEMORY COMPENSATION
- Publication number 20210335420
- Publication date Oct 28, 2021
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Application
CROSS-POINT MEMORY COMPENSATION
- Publication number 20200381044
- Publication date Dec 3, 2020
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Arrays
- Publication number 20200341105
- Publication date Oct 29, 2020
- Micron Technology, Inc.
- Zengtao T. Liu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Memory Arrays
- Publication number 20200249307
- Publication date Aug 6, 2020
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Application
NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES
- Publication number 20190355418
- Publication date Nov 21, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Application
NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE
- Publication number 20190341122
- Publication date Nov 7, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE
- Publication number 20190189237
- Publication date Jun 20, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES
- Publication number 20190189209
- Publication date Jun 20, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Application
Arrays of Memory Cells and Methods of Forming an Array of Verticall...
- Publication number 20190189689
- Publication date Jun 20, 2019
- Micron Technology, Inc.
- Zengtao T. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory Arrays
- Publication number 20190178969
- Publication date Jun 13, 2019
- Micron Technology, Inc.
- Zengtao T. Liu
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit Structures Comprising Conductive Vias And Method...
- Publication number 20180350742
- Publication date Dec 6, 2018
- Micron Technology, Inc.
- Zengtao T. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory Arrays
- Publication number 20180275239
- Publication date Sep 27, 2018
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Arrays
- Publication number 20180120405
- Publication date May 3, 2018
- Micron Technology, Inc.
- Zengtao T. Liu
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit Structures Comprising Conductive Vias And Method...
- Publication number 20170338181
- Publication date Nov 23, 2017
- Micron Technology, Inc.
- Zengtao T. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory Arrays
- Publication number 20170301733
- Publication date Oct 19, 2017
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Application
CROSS-POINT MEMORY COMPENSATION
- Publication number 20170278568
- Publication date Sep 28, 2017
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Application
NAND MEMORY ARRAY WITH MISMATCHED CELL AND BITLINE PITCH
- Publication number 20170236832
- Publication date Aug 17, 2017
- Intel Corporation
- Zengtao Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit Structures Comprising Conductive Vias And Method...
- Publication number 20170062338
- Publication date Mar 2, 2017
- Micron Technology, Inc.
- Zengtao T. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory Arrays
- Publication number 20160336046
- Publication date Nov 17, 2016
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND OPERATION METHODS ASSOCIATED WITH RESISTIVE MEMORY...
- Publication number 20160276409
- Publication date Sep 22, 2016
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Application
NAND MEMORY ARRAY WITH MISMATCHED CELL AND BITLINE PITCH
- Publication number 20160118393
- Publication date Apr 28, 2016
- Intel Corporation
- Zengtao Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE HAVING A DIFFERENT SOURCE LINE COUPLED TO EACH OF A P...
- Publication number 20160064085
- Publication date Mar 3, 2016
- Micron Technology, Inc.
- Akira Goda
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT FABRICATION
- Publication number 20160005601
- Publication date Jan 7, 2016
- Micron Technology, Inc.
- Luan C. Tran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Constructions and Methods of Forming Electrically Con...
- Publication number 20150303100
- Publication date Oct 22, 2015
- Micron Technology, Inc.
- Zengtao T. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS-POINT MEMORY COMPENSATION
- Publication number 20150279460
- Publication date Oct 1, 2015
- Micron Technology, Inc.
- Zengtao T. Liu
- G11 - INFORMATION STORAGE
Information Patent Application
Arrays Of Memory Cells And Methods Of Forming An Array Of Verticall...
- Publication number 20150123070
- Publication date May 7, 2015
- Micron Technology, Inc.
- Zengtao T. Liu
- H01 - BASIC ELECTRIC ELEMENTS

Zengtao T. Liu

Person

Patents Grantslast 30 patents

Arrays of memory cells and methods of forming an array of verticall...

Asymmetric junctions of high voltage transistor in NAND flash memory

Cross-point memory compensation

Arrays of memory cells and methods of forming an array of verticall...

Cross-point memory compensation

Memory arrays

Memory arrays

Cross-point memory compensation

Non-contact measurement of memory cell threshold voltage

Memory Arrays

Non-contact electron beam probing techniques and related structures

Memory arrays

Integrated circuit structures comprising conductive vias and method...

Non-contact electron beam probing techniques and related structures

Non-contact measurement of memory cell threshold voltage

Arrays of memory cells and methods of forming an array of verticall...

Memory arrays

Integrated circuit structures comprising conductive vias and method...

NAND memory array with mismatched cell and bitline pitch

Memory arrays

Memory arrays

Integrated circuit structures comprising conductive vias and method...

Memory arrays

Cross-point memory compensation

NAND memory array with mismatched cell and bitline pitch

Memory device having a different source line coupled to each of a p...

Apparatuses and operation methods associated with resistive memory...

Memory arrays

Integrated circuit fabrication

Apparatuses and operation methods associated with resistive memory...

Patents Applicationslast 30 patents

METHOD AND APPARATUS TO SELECT A PLANE IN A NAND FLASH DIE TO STORE...

3D NAND WITH IO CONTACTS IN ISOLATION TRENCH

Arrays of Memory Cells and Methods of Forming an Array of Verticall...

ASYMMETRIC JUNCTIONS OF HIGH VOLTAGE TRANSISTOR IN NAND FLASH MEMORY

CROSS-POINT MEMORY COMPENSATION

CROSS-POINT MEMORY COMPENSATION

Memory Arrays

Memory Arrays

NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES

NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE

NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE

NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES

Arrays of Memory Cells and Methods of Forming an Array of Verticall...

Memory Arrays

Integrated Circuit Structures Comprising Conductive Vias And Method...

Memory Arrays

Memory Arrays

Integrated Circuit Structures Comprising Conductive Vias And Method...

Memory Arrays

CROSS-POINT MEMORY COMPENSATION

NAND MEMORY ARRAY WITH MISMATCHED CELL AND BITLINE PITCH

Integrated Circuit Structures Comprising Conductive Vias And Method...

Memory Arrays

APPARATUSES AND OPERATION METHODS ASSOCIATED WITH RESISTIVE MEMORY...

NAND MEMORY ARRAY WITH MISMATCHED CELL AND BITLINE PITCH

MEMORY DEVICE HAVING A DIFFERENT SOURCE LINE COUPLED TO EACH OF A P...

INTEGRATED CIRCUIT FABRICATION

Semiconductor Constructions and Methods of Forming Electrically Con...

CROSS-POINT MEMORY COMPENSATION

Arrays Of Memory Cells And Methods Of Forming An Array Of Verticall...