Zhijian Yang

Person

Stormville, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
On-chip randomness generation
- Patent number 9,985,615
- Issue date May 29, 2018
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Physical unclonable interconnect function array
- Patent number 9,768,110
- Issue date Sep 19, 2017
- International Business Machines Corporation
- Kai D. Feng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Structure and method for in-line defect non-contact tests
- Patent number 9,721,854
- Issue date Aug 1, 2017
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Physical unclonable interconnect function array
- Patent number 9,391,014
- Issue date Jul 12, 2016
- International Business Machines Corporation
- Kai D. Feng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor memory device employing a ferromagnetic gate
- Patent number 9,337,334
- Issue date May 10, 2016
- GLOBALFOUNDRIES Inc.
- Hari V. Mallela
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for fabricating a physical unclonable interconnect function...
- Patent number 9,331,012
- Issue date May 3, 2016
- International Business Machines Corporation
- Kai D. Feng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Embedded on-chip security
- Patent number 9,281,236
- Issue date Mar 8, 2016
- GLOBALFOUNDRIES Inc.
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Ring oscillator testing with power sensing resistor
- Patent number 9,217,769
- Issue date Dec 22, 2015
- International Business Machines Corporation
- Hanyi Ding
- G01 - MEASURING TESTING
Information Patent Grant
Photoresist collapse method for forming a physical unclonable function
- Patent number 9,190,360
- Issue date Nov 17, 2015
- GLOBALFOUNDRIES Inc.
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including enhanced variability
- Patent number 9,166,588
- Issue date Oct 20, 2015
- GLOBALFOUNDIRES INC.
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Embedded on-chip security
- Patent number 9,117,824
- Issue date Aug 25, 2015
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Clock phase shift detector
- Patent number 9,077,319
- Issue date Jul 7, 2015
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Methodology and apparatus for tuning driving current of semiconduct...
- Patent number 9,059,204
- Issue date Jun 16, 2015
- International Business Machines Corporation
- Kai D. Feng
- G01 - MEASURING TESTING
Information Patent Grant
Test structure for determination of TSV depth
- Patent number 8,853,693
- Issue date Oct 7, 2014
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Random coded integrated circuit structures and methods of making ra...
- Patent number 8,803,328
- Issue date Aug 12, 2014
- International Business Machines Corporation
- Yunsheng Song
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methodology and apparatus for tuning driving current of semiconduct...
- Patent number 8,779,838
- Issue date Jul 15, 2014
- International Business Machines Corporation
- Zhijian Yang
- G01 - MEASURING TESTING
Information Patent Grant
Flash memory structure with enhanced capacitive coupling coefficien...
- Patent number 8,759,175
- Issue date Jun 24, 2014
- International Business Machines Corporation
- Louis C. Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-repair integrated circuit and repair method
- Patent number 8,687,445
- Issue date Apr 1, 2014
- International Business Machines Corporation
- Louis L. C. Hsu
- G11 - INFORMATION STORAGE
Information Patent Grant
Clock phase shift detector
- Patent number 8,669,786
- Issue date Mar 11, 2014
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Clock phase shift detector
- Patent number 8,638,124
- Issue date Jan 28, 2014
- International Business Machines Corporation
- Kai D. Feng
- G01 - MEASURING TESTING
Information Patent Grant
Physical unclonable function cell and array
- Patent number 8,525,549
- Issue date Sep 3, 2013
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for preventing circuit failure
- Patent number 8,493,075
- Issue date Jul 23, 2013
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Self-repair integrated circuit and repair method
- Patent number 8,422,322
- Issue date Apr 16, 2013
- International Business Machines Corporation
- Louis L. C. Hsu
- G11 - INFORMATION STORAGE
Information Patent Grant
On-chip accelerated failure indicator
- Patent number 8,274,301
- Issue date Sep 25, 2012
- International Business Machines Corporation
- Kai D. Feng
- G01 - MEASURING TESTING
Information Patent Grant
Test structure for determination of TSV depth
- Patent number 8,232,115
- Issue date Jul 31, 2012
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D chip-stack with fuse-type through silicon via
- Patent number 8,211,756
- Issue date Jul 3, 2012
- International Business Machines Corporation
- Kai Di Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flash memory structure with enhanced capacitive coupling coefficien...
- Patent number 8,193,575
- Issue date Jun 5, 2012
- International Business Machines Corporation
- Louis C. Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating transistors and structures thereof for improved...
- Patent number 8,159,814
- Issue date Apr 17, 2012
- International Business Machines Corporation
- Ping-Chuan Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active inductor for ASIC application
- Patent number 8,115,575
- Issue date Feb 14, 2012
- International Business Machines Corporation
- Louis Lu-Chen Hsu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Self-repair integrated circuit and repair method
- Patent number 8,098,536
- Issue date Jan 17, 2012
- International Business Machines Corporation
- Louis L. C. Hsu
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
ON-CHIP RANDOMNESS GENERATION
- Publication number 20170141771
- Publication date May 18, 2017
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PHYSICAL UNCLONABLE INTERCONNECT FUNCTION ARRAY
- Publication number 20160190005
- Publication date Jun 30, 2016
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTORESIST COLLAPSE METHOD FOR FORMING A PHYSICAL UNCLONABLE FUNCTION
- Publication number 20160071742
- Publication date Mar 10, 2016
- GLOBALFOUNDRIES INC.
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHYSICAL UNCLONABLE INTERCONNECT FUNCTION ARRAY
- Publication number 20150348899
- Publication date Dec 3, 2015
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE EMPLOYING A FERROMAGNETIC GATE
- Publication number 20150303313
- Publication date Oct 22, 2015
- International Business Machines Corporation
- Hari V. Mallela
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMBEDDED ON-CHIP SECURITY
- Publication number 20150255326
- Publication date Sep 10, 2015
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTORESIST COLLAPSE METHOD FOR FORMING A PHYSICAL UNCLONABLE FUNCTION
- Publication number 20150235964
- Publication date Aug 20, 2015
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING ENHANCED VARIABILITY
- Publication number 20150207505
- Publication date Jul 23, 2015
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMBEDDED ON-CHIP SECURITY
- Publication number 20150084193
- Publication date Mar 26, 2015
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methodology and Apparatus for Tuning Driving Current of Semiconduct...
- Publication number 20140234990
- Publication date Aug 21, 2014
- International Business Machines Corporation
- Kai D. Feng
- G01 - MEASURING TESTING
Information Patent Application
RANDOM CODED INTEGRATED CIRCUIT STRUCTURES AND METHODS OF MAKING RA...
- Publication number 20140203448
- Publication date Jul 24, 2014
- International Business Machines Corporation
- Yunsheng Song
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ON-CHIP RANDOMNESS GENERATION
- Publication number 20140197865
- Publication date Jul 17, 2014
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CLOCK PHASE SHIFT DETECTOR
- Publication number 20140159775
- Publication date Jun 12, 2014
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
STRUCTURE AND METHOD FOR IN-LINE DEFECT NON-CONTACT TESTS
- Publication number 20140152337
- Publication date Jun 5, 2014
- International Business Machines Corporation
- Hanyi Ding
- G01 - MEASURING TESTING
Information Patent Application
RING OSCILLATOR TESTING WITH POWER SENSING RESISTOR
- Publication number 20140097858
- Publication date Apr 10, 2014
- International Business Machines Corporation
- Hanyi Ding
- G01 - MEASURING TESTING
Information Patent Application
Physical Unclonable Interconnect Function Array
- Publication number 20130233608
- Publication date Sep 12, 2013
- International Business Machines Corporation
- Kai D. Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHYSICAL UNCLONABLE FUNCTION CELL AND ARRAY
- Publication number 20130222013
- Publication date Aug 29, 2013
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SELF-REPAIR INTEGRATED CIRCUIT AND REPAIR METHOD
- Publication number 20130223172
- Publication date Aug 29, 2013
- International Business Machines Corporation
- Louis L. C. Hsu
- G11 - INFORMATION STORAGE
Information Patent Application
METHODOLOGY AND APPARATUS FOR TUNING DRIVING CURRENT OF SEMICONDUCT...
- Publication number 20130099853
- Publication date Apr 25, 2013
- International Business Machines Corporation
- Zhijian Yang
- G01 - MEASURING TESTING
Information Patent Application
FLASH MEMORY STRUCTURE WITH ENHANCED CAPACITIVE COUPLING COEFFICIEN...
- Publication number 20120184076
- Publication date Jul 19, 2012
- International Business Machines Corporation
- Louis C. Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE FOR DETERMINATION OF TSV DEPTH
- Publication number 20120175612
- Publication date Jul 12, 2012
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR PREVENTING CIRCUIT FAILURE
- Publication number 20120056667
- Publication date Mar 8, 2012
- International Business Machines Corporation
- Kai D. Feng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SELF-REPAIR INTEGRATED CIRCUIT AND REPAIR METHOD
- Publication number 20120051166
- Publication date Mar 1, 2012
- International Business Machines Corporation
- Louis L. C. Hsu
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF AND STRUCTURE FOR RECOVERING GAIN IN A BIPOLAR TRANSISTOR
- Publication number 20110128069
- Publication date Jun 2, 2011
- International Business Machines Corporation
- Zhijian Yang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
On-Chip Accelerated Failure Indicator
- Publication number 20110102005
- Publication date May 5, 2011
- International Business Machines Corporation
- Kai D. Feng
- G01 - MEASURING TESTING
Information Patent Application
Test Structure for Determination of TSV Depth
- Publication number 20110073858
- Publication date Mar 31, 2011
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROGRAMMABLE THROUGH SILICON VIA
- Publication number 20110034021
- Publication date Feb 10, 2011
- International Business Machines Corporation
- Kai Di Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Leakage Current Mitigation in a Semiconductor Device
- Publication number 20100327958
- Publication date Dec 30, 2010
- Jong-Ru Guo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
3D CHIP-STACK WITH FUSE-TYPE THROUGH SILICON VIA
- Publication number 20100261318
- Publication date Oct 14, 2010
- International Business Machines Corporation
- Kai Di Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-LINE DEPTH MEASUREMENT OF THRU SILICON VIA
- Publication number 20100210043
- Publication date Aug 19, 2010
- International Business Machines Corporation
- Qizhi Liu
- H01 - BASIC ELECTRIC ELEMENTS

Zhijian Yang

Person

Patents Grantslast 30 patents

On-chip randomness generation

Physical unclonable interconnect function array

Structure and method for in-line defect non-contact tests

Physical unclonable interconnect function array

Semiconductor memory device employing a ferromagnetic gate

Method for fabricating a physical unclonable interconnect function...

Embedded on-chip security

Ring oscillator testing with power sensing resistor

Photoresist collapse method for forming a physical unclonable function

Semiconductor device including enhanced variability

Embedded on-chip security

Clock phase shift detector

Methodology and apparatus for tuning driving current of semiconduct...

Test structure for determination of TSV depth

Random coded integrated circuit structures and methods of making ra...

Methodology and apparatus for tuning driving current of semiconduct...

Flash memory structure with enhanced capacitive coupling coefficien...

Self-repair integrated circuit and repair method

Clock phase shift detector

Clock phase shift detector

Physical unclonable function cell and array

Method and apparatus for preventing circuit failure

Self-repair integrated circuit and repair method

On-chip accelerated failure indicator

Test structure for determination of TSV depth

3D chip-stack with fuse-type through silicon via

Flash memory structure with enhanced capacitive coupling coefficien...

Method of operating transistors and structures thereof for improved...

Active inductor for ASIC application

Self-repair integrated circuit and repair method

Patents Applicationslast 30 patents

ON-CHIP RANDOMNESS GENERATION

PHYSICAL UNCLONABLE INTERCONNECT FUNCTION ARRAY

PHOTORESIST COLLAPSE METHOD FOR FORMING A PHYSICAL UNCLONABLE FUNCTION

PHYSICAL UNCLONABLE INTERCONNECT FUNCTION ARRAY

SEMICONDUCTOR MEMORY DEVICE EMPLOYING A FERROMAGNETIC GATE

EMBEDDED ON-CHIP SECURITY

PHOTORESIST COLLAPSE METHOD FOR FORMING A PHYSICAL UNCLONABLE FUNCTION

SEMICONDUCTOR DEVICE INCLUDING ENHANCED VARIABILITY

EMBEDDED ON-CHIP SECURITY

Methodology and Apparatus for Tuning Driving Current of Semiconduct...

RANDOM CODED INTEGRATED CIRCUIT STRUCTURES AND METHODS OF MAKING RA...

ON-CHIP RANDOMNESS GENERATION

CLOCK PHASE SHIFT DETECTOR

STRUCTURE AND METHOD FOR IN-LINE DEFECT NON-CONTACT TESTS

RING OSCILLATOR TESTING WITH POWER SENSING RESISTOR

Physical Unclonable Interconnect Function Array

PHYSICAL UNCLONABLE FUNCTION CELL AND ARRAY

SELF-REPAIR INTEGRATED CIRCUIT AND REPAIR METHOD

METHODOLOGY AND APPARATUS FOR TUNING DRIVING CURRENT OF SEMICONDUCT...

FLASH MEMORY STRUCTURE WITH ENHANCED CAPACITIVE COUPLING COEFFICIEN...

TEST STRUCTURE FOR DETERMINATION OF TSV DEPTH

METHOD AND APPARATUS FOR PREVENTING CIRCUIT FAILURE

SELF-REPAIR INTEGRATED CIRCUIT AND REPAIR METHOD

METHOD OF AND STRUCTURE FOR RECOVERING GAIN IN A BIPOLAR TRANSISTOR

On-Chip Accelerated Failure Indicator

Test Structure for Determination of TSV Depth

PROGRAMMABLE THROUGH SILICON VIA

Leakage Current Mitigation in a Semiconductor Device

3D CHIP-STACK WITH FUSE-TYPE THROUGH SILICON VIA

IN-LINE DEPTH MEASUREMENT OF THRU SILICON VIA