Zhongjian Teng

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
MTJ device performance by controlling device shape
- Patent number 11,963,457
- Issue date Apr 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integration scheme for three terminal spin-orbit-torque (SOT) switc...
- Patent number 11,895,928
- Issue date Feb 6, 2024
- Headway Technologies, Inc.
- Jesmin Haq
- G11 - INFORMATION STORAGE
Information Patent Grant
MTJ device performance by adding stress modulation layer to mtj dev...
- Patent number 11,785,864
- Issue date Oct 10, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- G11 - INFORMATION STORAGE
Information Patent Grant
STT-MRAM heat sink and magnetic shield structure design for more ro...
- Patent number 11,723,286
- Issue date Aug 8, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tom Zhong
- G11 - INFORMATION STORAGE
Information Patent Grant
Etching and encapsulation scheme for magnetic tunnel junction fabri...
- Patent number 11,631,802
- Issue date Apr 18, 2023
- Headway Technologies, Inc.
- Vignesh Sundar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Critical dimension (CD) uniformity of photoresist island patterns u...
- Patent number 11,573,494
- Issue date Feb 7, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
CMP stop layer and sacrifice layer for high yield small size MRAM d...
- Patent number 11,545,622
- Issue date Jan 3, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yi Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
MTJ device performance by controlling device shape
- Patent number 11,527,711
- Issue date Dec 13, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MTJ device performance by adding stress modulation layer to MTJ dev...
- Patent number 11,430,945
- Issue date Aug 30, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- G11 - INFORMATION STORAGE
Information Patent Grant
Ion beam etching fabricated sub 30nm Vias to reduce conductive mate...
- Patent number 11,217,746
- Issue date Jan 4, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yi Yang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fabrication of large height top metal electrode for sub-60nm magnet...
- Patent number 11,088,320
- Issue date Aug 10, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yi Yang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
MTJ device performance by controlling device shape
- Patent number 10,944,049
- Issue date Mar 9, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
STT-MRAM heat sink and magnetic shield structure design for more ro...
- Patent number 10,854,809
- Issue date Dec 1, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tom Zhong
- G11 - INFORMATION STORAGE
Information Patent Grant
Critical dimension (CD) uniformity of photoresist island patterns u...
- Patent number 10,831,104
- Issue date Nov 10, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
CMP stop layer and sacrifice layer for high yield small size MRAM d...
- Patent number 10,714,679
- Issue date Jul 14, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yi Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Ion beam etching fabricated sub 30nm vias to reduce conductive mate...
- Patent number 10,680,168
- Issue date Jun 9, 2020
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Yi Yang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Critical dimension (CD) uniformity of photoresist island patterns u...
- Patent number 10,520,818
- Issue date Dec 31, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Fabrication of large height top metal electrode for sub-60nm magnet...
- Patent number 10,475,991
- Issue date Nov 12, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yi Yang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for fabricating a magnetic tunneling junction (MTJ) structure
- Patent number 10,475,987
- Issue date Nov 12, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to remove sidewall damage after MTJ etching
- Patent number 10,103,322
- Issue date Oct 16, 2018
- Headway Technologies Inc.
- Zhongjian Teng
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory structure having a magnetic tunnel junction (MTJ) self-align...
- Patent number 10,069,064
- Issue date Sep 4, 2018
- Headway Technologies, Inc.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MTJ device process/integration method with pre-patterned seed layer
- Patent number 9,972,777
- Issue date May 15, 2018
- Headway Technologies, Inc.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to connect a magnetic device to a CMOS transistor
- Patent number 8,524,511
- Issue date Sep 3, 2013
- Headway Technologies, Inc.
- Tom Zhong
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
STT-MRAM Heat Sink and Magnetic Shield Structure Design for More Ro...
- Publication number 20230380298
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tom Zhong
- G11 - INFORMATION STORAGE
Information Patent Application
MTJ DEVICE PERFORMANCE BY ADDING STRESS MODULATION LAYER TO MTJ DEV...
- Publication number 20230371398
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jesmin Haq
- G11 - INFORMATION STORAGE
Information Patent Application
Etching and Encapsulation Scheme for Magnetic Tunnel Junction Fabri...
- Publication number 20230217834
- Publication date Jul 6, 2023
- HEADWAY TECHNOLOGIES, INC.
- Vignesh Sundar
Information Patent Application
MTJ Device Performance by Controlling Device Shape
- Publication number 20230107977
- Publication date Apr 6, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MTJ Device Performance by Adding Stress Modulation Layer to MTJ Dev...
- Publication number 20220384713
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MTJ Device Performance by Controlling Device Shape
- Publication number 20210193915
- Publication date Jun 24, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Etching and Encapsulation Scheme for Magnetic Tunnel Junction Fabri...
- Publication number 20210143322
- Publication date May 13, 2021
- HEADWAY TECHNOLOGIES, INC.
- Vignesh Sundar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Novel Integration Scheme for Three Terminal Spin-Orbit-Torque (SOT)...
- Publication number 20210104663
- Publication date Apr 8, 2021
- HEADWAY TECHNOLOGIES, INC.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STT-MRAM Heat Sink and Magnetic Shield Structure Design for More Ro...
- Publication number 20210083172
- Publication date Mar 18, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tom Zhong
- G11 - INFORMATION STORAGE
Information Patent Application
Critical Dimension (CD) Uniformity of Photoresist Island Patterns U...
- Publication number 20210055659
- Publication date Feb 25, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMP Stop Layer and Sacrifice Layer for High Yield Small Size MRAM D...
- Publication number 20200343444
- Publication date Oct 29, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi Yang
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
Ion Beam Etching Fabricated Sub 30nm Vias to Reduce Conductive Mate...
- Publication number 20200303636
- Publication date Sep 24, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi Yang
- B82 - NANO-TECHNOLOGY
Information Patent Application
Critical Dimension (CD) Uniformity of Photoresist Island Patterns U...
- Publication number 20200142313
- Publication date May 7, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jesmin Haq
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MTJ Device Performance by Adding Stress Modulation Layer to MTJ Dev...
- Publication number 20200075844
- Publication date Mar 5, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jesmin Haq
- G11 - INFORMATION STORAGE
Information Patent Application
Fabrication of Large Height Top Metal Electrode for Sub-60nm Magnet...
- Publication number 20200075847
- Publication date Mar 5, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi Yang
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR FABRICATING A MAGNETIC TUNNELING JUNCTION (MTJ) STRUCTURE
- Publication number 20190341542
- Publication date Nov 7, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam Etching Fabricated Sub 30nm Vias to Reduce Conductive Mate...
- Publication number 20190312197
- Publication date Oct 10, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi Yang
- B82 - NANO-TECHNOLOGY
Information Patent Application
Fabrication of Large Height Top Metal Electrode for Sub-60nm Magnet...
- Publication number 20190259941
- Publication date Aug 22, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi Yang
- G11 - INFORMATION STORAGE
Information Patent Application
CMP Stop Layer and Sacrifice Layer for High Yield Small Size MRAM D...
- Publication number 20190245141
- Publication date Aug 8, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STT-MRAM Heat Sink and Magnetic Shield Structure Design for More Ro...
- Publication number 20190207083
- Publication date Jul 4, 2019
- Taiwan Semiconductor Manufacturing company Ltd.
- Tom Zhong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MTJ Device Performance by Controlling Device Shape
- Publication number 20190148630
- Publication date May 16, 2019
- HEADWAY TECHNOLOGIES, INC.
- Jesmin Haq
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to Remove Sidewall Damage After MTJ Etching
- Publication number 20180277751
- Publication date Sep 27, 2018
- HEADWAY TECHNOLOGIES, INC.
- Zhongjian Teng
- H01 - BASIC ELECTRIC ELEMENTS

Zhongjian Teng

Person

Patents Grantslast 30 patents

MTJ device performance by controlling device shape

Integration scheme for three terminal spin-orbit-torque (SOT) switc...

MTJ device performance by adding stress modulation layer to mtj dev...

STT-MRAM heat sink and magnetic shield structure design for more ro...

Etching and encapsulation scheme for magnetic tunnel junction fabri...

Critical dimension (CD) uniformity of photoresist island patterns u...

CMP stop layer and sacrifice layer for high yield small size MRAM d...

MTJ device performance by controlling device shape

MTJ device performance by adding stress modulation layer to MTJ dev...

Ion beam etching fabricated sub 30nm Vias to reduce conductive mate...

Fabrication of large height top metal electrode for sub-60nm magnet...

MTJ device performance by controlling device shape

STT-MRAM heat sink and magnetic shield structure design for more ro...

Critical dimension (CD) uniformity of photoresist island patterns u...

CMP stop layer and sacrifice layer for high yield small size MRAM d...

Ion beam etching fabricated sub 30nm vias to reduce conductive mate...

Critical dimension (CD) uniformity of photoresist island patterns u...

Fabrication of large height top metal electrode for sub-60nm magnet...

Method for fabricating a magnetic tunneling junction (MTJ) structure

Method to remove sidewall damage after MTJ etching

Memory structure having a magnetic tunnel junction (MTJ) self-align...

MTJ device process/integration method with pre-patterned seed layer

Method to connect a magnetic device to a CMOS transistor

Patents Applicationslast 30 patents

STT-MRAM Heat Sink and Magnetic Shield Structure Design for More Ro...

MTJ DEVICE PERFORMANCE BY ADDING STRESS MODULATION LAYER TO MTJ DEV...

Etching and Encapsulation Scheme for Magnetic Tunnel Junction Fabri...

MTJ Device Performance by Controlling Device Shape

MTJ Device Performance by Adding Stress Modulation Layer to MTJ Dev...

MTJ Device Performance by Controlling Device Shape

Etching and Encapsulation Scheme for Magnetic Tunnel Junction Fabri...

Novel Integration Scheme for Three Terminal Spin-Orbit-Torque (SOT)...

STT-MRAM Heat Sink and Magnetic Shield Structure Design for More Ro...

Critical Dimension (CD) Uniformity of Photoresist Island Patterns U...

CMP Stop Layer and Sacrifice Layer for High Yield Small Size MRAM D...

Ion Beam Etching Fabricated Sub 30nm Vias to Reduce Conductive Mate...

Critical Dimension (CD) Uniformity of Photoresist Island Patterns U...

MTJ Device Performance by Adding Stress Modulation Layer to MTJ Dev...

Fabrication of Large Height Top Metal Electrode for Sub-60nm Magnet...

METHOD FOR FABRICATING A MAGNETIC TUNNELING JUNCTION (MTJ) STRUCTURE

Ion Beam Etching Fabricated Sub 30nm Vias to Reduce Conductive Mate...

Fabrication of Large Height Top Metal Electrode for Sub-60nm Magnet...

CMP Stop Layer and Sacrifice Layer for High Yield Small Size MRAM D...

STT-MRAM Heat Sink and Magnetic Shield Structure Design for More Ro...

MTJ Device Performance by Controlling Device Shape

Method to Remove Sidewall Damage After MTJ Etching