Accessories, mechanical or electrical features

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G01N2223/30

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/30Accessories, mechanical or electrical features

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Specimen radiography system comprising a cabinet and a specimen dra...
- Patent number 12,364,443
- Issue date Jul 22, 2025
- Hologic, Inc.
- Kenneth Defreitas
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray radioscope
- Patent number 12,360,061
- Issue date Jul 15, 2025
- BEAMSENSE Co., Ltd.
- Sueki Baba
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for K-edge-based X-ray imaging having improved...
- Patent number 12,360,060
- Issue date Jul 15, 2025
- Redlen Technologies, Inc.
- Krzysztof Iniewski
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for regularizing the optimization of applicatio...
- Patent number 12,360,062
- Issue date Jul 15, 2025
- KLA Corporation
- Christopher D. Liman
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing device for x-ray analysis
- Patent number 12,352,710
- Issue date Jul 8, 2025
- Shimadzu Corporation
- Yuta Saito
- G01 - MEASURING TESTING
Information Patent Grant
Quantum mechanical X-ray crystallography and Cryo-EM diagnostic for...
- Patent number 12,347,524
- Issue date Jul 1, 2025
- QuantumBio Inc.
- Lance Michael Westerhoff
- G01 - MEASURING TESTING
Information Patent Grant
X-ray identification of connections in a tubular string
- Patent number 12,345,664
- Issue date Jul 1, 2025
- Weatherford Technology Holdings, LLC
- Benjamin Sachtleben
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection system, an x-ray imaging accessory, a sample suppo...
- Patent number 12,332,189
- Issue date Jun 17, 2025
- Nordson Corporation
- Bill Walker
- G01 - MEASURING TESTING
Information Patent Grant
Electron spectroscopy based techniques for determining various chem...
- Patent number 12,326,410
- Issue date Jun 10, 2025
- COZAI LTD
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Radiation imaging system, radiation imaging apparatus, control meth...
- Patent number 12,324,698
- Issue date Jun 10, 2025
- Canon Kabushiki Kaisha
- Yutaka Ishinari
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Sample component determination method, sample component determinati...
- Patent number 12,326,409
- Issue date Jun 10, 2025
- Shimadzu Corporation
- Akira Ogoshi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for quantitatively characterizing dendrite segregation and d...
- Patent number 12,326,434
- Issue date Jun 10, 2025
- NCS TESTING TECHNOLOGY CO., LTD
- Dongling Li
- G01 - MEASURING TESTING
Information Patent Grant
Full beam metrology for x-ray scatterometry systems
- Patent number 12,320,763
- Issue date Jun 3, 2025
- KLA Corporation
- Antonio Arion Gellineau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shielding mask for scattered ionizing radiation and method for prod...
- Patent number 12,315,647
- Issue date May 27, 2025
- Schott AG
- Oliver Sohr
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection apparatus and X-ray inspection method
- Patent number 12,313,572
- Issue date May 27, 2025
- Anritsu Corporation
- Masaru Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Backscatter X-ray system
- Patent number 12,306,118
- Issue date May 20, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Customizable axes of rotation for industrial radiography systems
- Patent number 12,298,260
- Issue date May 13, 2025
- Illinois Tool Works Inc.
- Joseph Schlecht
- G01 - MEASURING TESTING
Information Patent Grant
Device for closing the input opening in the sample chamber in an x-...
- Patent number 12,298,262
- Issue date May 13, 2025
- Wolfgang Gehrlein
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for computed tomography system calibration
- Patent number 12,292,394
- Issue date May 6, 2025
- Baker Hughes Holdings LLC
- Alexander Suppes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Correction amount specifying apparatus, method, program, and jig
- Patent number 12,287,301
- Issue date Apr 29, 2025
- Rigaku Corporation
- Takuya Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Single piece droplet generation and injection device for serial cry...
- Patent number 12,287,299
- Issue date Apr 29, 2025
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for analyzing diffraction pattern of mixture, and...
- Patent number 12,287,300
- Issue date Apr 29, 2025
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
System and method for a specimen container for use in cabinet x-ray...
- Patent number 12,281,971
- Issue date Apr 22, 2025
- Kub Technologies Inc
- Vikram Butani
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 12,281,893
- Issue date Apr 22, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,270,774
- Issue date Apr 8, 2025
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
X ray fluorescence analyzer
- Patent number 12,270,773
- Issue date Apr 8, 2025
- Shimadzu Corporation
- Yuji Morihisa
- G01 - MEASURING TESTING
Information Patent Grant
Thin film damage detection function and charged particle beam device
- Patent number 12,265,041
- Issue date Apr 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Michio Hatano
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,265,042
- Issue date Apr 1, 2025
- Shimadzu Corporation
- Yasuyuki Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
Computed tomography scatter and crosstalk correction
- Patent number 12,266,036
- Issue date Apr 1, 2025
- General Electric Company
- Mingye Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Handheld inspection device and method of inspecting an infrastructu...
- Patent number 12,259,342
- Issue date Mar 25, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTION SYSTEM AND METHOD
- Publication number 20250237620
- Publication date Jul 24, 2025
- Purdue Research Foundation
- Aaron James Specht
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM THICKNESS MEASURING DEVICE AND THIN FILM THICKNESS MEASUR...
- Publication number 20250237621
- Publication date Jul 24, 2025
- SAMSUNG DISPLAY CO., LTD.
- Won Hyuk JANG
- G01 - MEASURING TESTING
Information Patent Application
ELEMENTAL IDENTIFICATION BASED ON PHASE ANALYSIS
- Publication number 20250231127
- Publication date Jul 17, 2025
- FEI Company
- Marek Vanatka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VI...
- Publication number 20250231132
- Publication date Jul 17, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM
- Publication number 20250216346
- Publication date Jul 3, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ron MEIRY
- G01 - MEASURING TESTING
Information Patent Application
RADIO/MICROWAVE FREQUENCY SENSOR FOR ANALYZING AGRICULTURAL EQUIPMENT
- Publication number 20250208069
- Publication date Jun 26, 2025
- Know Labs, Inc.
- Dominic KLYVE
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
RADIATION IMAGING APPARATUS, RADIATION IMAGING METHOD, AND STORAGE...
- Publication number 20250208067
- Publication date Jun 26, 2025
- Canon Kabushiki Kaisha
- TAKANORI TAYA
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD, PROGR...
- Publication number 20250208068
- Publication date Jun 26, 2025
- Rigaku Corporation
- Shota TAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION METHOD, EVALUATION APPARATUS, AND STORAGE MEDIUM
- Publication number 20250208073
- Publication date Jun 26, 2025
- Konica Minolta, Inc.
- Shota Hashimoto
- G01 - MEASURING TESTING
Information Patent Application
RECORDING APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20250208071
- Publication date Jun 26, 2025
- Rigaku Corporation
- Yuji HATAYAMA
- G01 - MEASURING TESTING
Information Patent Application
CHANGING THE ORIENTATION OF THE X-RAY EMITTER IN ORDER TO VARY THE...
- Publication number 20250203744
- Publication date Jun 19, 2025
- Siemens Healthineers AG
- Joerg FREUDENBERGER
- G01 - MEASURING TESTING
Information Patent Application
MULTI-ROTATIONAL FIXTURES FOR RADIOGRAPHY SYSTEMS AND RADIOGRAPHY S...
- Publication number 20250198950
- Publication date Jun 19, 2025
- Illinois Tool Works Inc.
- Nicole Wilson
- G01 - MEASURING TESTING
Information Patent Application
Analysis System, Analysis Method, and Analysis Program
- Publication number 20250189468
- Publication date Jun 12, 2025
- Hitachi High-Tech Corporation
- Keiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
Multi-Pulse Flash X-ray for Pulsed X-ray Cineradiography
- Publication number 20250193990
- Publication date Jun 12, 2025
- U.S. Army DEVCOM, Army Research Laboratory
- Michael B. Zellner
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEMS AND METHODS FOR MOBILE ELEMENTAL ANALYSIS
- Publication number 20250189467
- Publication date Jun 12, 2025
- IXRF, Inc.
- Robert Clayton Tisdale
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CABINET RADIOGRAPHY INCORPORATING A GAMMA OR...
- Publication number 20250191586
- Publication date Jun 12, 2025
- KUB TECHNOLOGIES, INC. DBA KUBTEC
- Vikram Butani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANIPULATOR HEAD AND VACUUM SYSTEM
- Publication number 20250180496
- Publication date Jun 5, 2025
- SPECS SURFACE NANO ANALYSIS GMBH
- Kai KUNZE
- G01 - MEASURING TESTING
Information Patent Application
COMPUTED TOMOGRAPHY SCATTER AND CROSSTALK CORRECTION
- Publication number 20250173924
- Publication date May 29, 2025
- GENERAL ELECTRIC COMPANY
- Mingye Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Handheld X-ray fluorescence, XRF, analyzer and a method for element...
- Publication number 20250172513
- Publication date May 29, 2025
- BRUKER NANO GMBH
- Tim Heek
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY WELD INSPECTION
- Publication number 20250164420
- Publication date May 22, 2025
- Varex Imaging Sweden AB
- Tuomas Pantsar
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND STORAGE MEDIA FOR OBTAINING ENERGY SPECTRA
- Publication number 20250164653
- Publication date May 22, 2025
- Shanghai United Imaging Healthcare Co., Ltd.
- Zhi SHI
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHY SYSTEM
- Publication number 20250164414
- Publication date May 22, 2025
- FUJIFILM CORPORATION
- Hisatsugu HORIUCHI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20250164415
- Publication date May 22, 2025
- Rayence Co., Ltd.
- Seungman YUN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRODE PLATE TESTING METHOD AND APPARATUS
- Publication number 20250155346
- Publication date May 15, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Bingyang Zhan
- G01 - MEASURING TESTING
Information Patent Application
Object Manipulator for an X-ray Inspection System
- Publication number 20250155385
- Publication date May 15, 2025
- Comet Yxlon GmbH
- Laurenz Rosemann
- G01 - MEASURING TESTING
Information Patent Application
RADIATION-MEASUREMENT-INSTRUMENT SUPPORT DEVICE, RADIATION MEASUREM...
- Publication number 20250146956
- Publication date May 8, 2025
- Kabushiki Kaisha Toshiba
- Ryoutaro MASUDA
- G01 - MEASURING TESTING
Information Patent Application
FIDUCIALS FOR X-RAY DEVICE
- Publication number 20250146959
- Publication date May 8, 2025
- Lumafield, Inc.
- Adam P. Damiano
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...
- Publication number 20250146960
- Publication date May 8, 2025
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED BACKSCATTER X-RAY ASSEMBLIES FOR DETECTING BACKSCATTER X...
- Publication number 20250137946
- Publication date May 1, 2025
- The Boeing Company
- Morteza Safai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPARATUS FOR ANALYZING COMPOSITION AND METHOD THEREOF
- Publication number 20250137948
- Publication date May 1, 2025
- Hyundai Motor Company
- Jun Young Shin
- G01 - MEASURING TESTING

Accessories, mechanical or electrical features

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Specimen radiography system comprising a cabinet and a specimen dra...

X-ray radioscope

Systems and methods for K-edge-based X-ray imaging having improved...

Methods and systems for regularizing the optimization of applicatio...

Signal processing device for x-ray analysis

Quantum mechanical X-ray crystallography and Cryo-EM diagnostic for...

X-ray identification of connections in a tubular string

X-ray inspection system, an x-ray imaging accessory, a sample suppo...

Electron spectroscopy based techniques for determining various chem...

Radiation imaging system, radiation imaging apparatus, control meth...

Sample component determination method, sample component determinati...

Method for quantitatively characterizing dendrite segregation and d...

Full beam metrology for x-ray scatterometry systems

Shielding mask for scattered ionizing radiation and method for prod...

X-ray inspection apparatus and X-ray inspection method

Backscatter X-ray system

Customizable axes of rotation for industrial radiography systems

Device for closing the input opening in the sample chamber in an x-...

Apparatus and method for computed tomography system calibration

Correction amount specifying apparatus, method, program, and jig

Single piece droplet generation and injection device for serial cry...

Device and method for analyzing diffraction pattern of mixture, and...

System and method for a specimen container for use in cabinet x-ray...

Characterizing and measuring in small boxes using XPS with multiple...

System to inspect, modify or analyze a region of interest of a samp...

X ray fluorescence analyzer

Thin film damage detection function and charged particle beam device

X-ray fluorescence analyzer

Computed tomography scatter and crosstalk correction

Handheld inspection device and method of inspecting an infrastructu...

Patents Applicationslast 30 patents

DETECTION SYSTEM AND METHOD

THIN FILM THICKNESS MEASURING DEVICE AND THIN FILM THICKNESS MEASUR...

ELEMENTAL IDENTIFICATION BASED ON PHASE ANALYSIS

NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VI...

DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM

RADIO/MICROWAVE FREQUENCY SENSOR FOR ANALYZING AGRICULTURAL EQUIPMENT

RADIATION IMAGING APPARATUS, RADIATION IMAGING METHOD, AND STORAGE...

INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD, PROGR...

EVALUATION METHOD, EVALUATION APPARATUS, AND STORAGE MEDIUM

RECORDING APPARATUS, SYSTEM, METHOD, AND PROGRAM

CHANGING THE ORIENTATION OF THE X-RAY EMITTER IN ORDER TO VARY THE...

MULTI-ROTATIONAL FIXTURES FOR RADIOGRAPHY SYSTEMS AND RADIOGRAPHY S...

Analysis System, Analysis Method, and Analysis Program

Multi-Pulse Flash X-ray for Pulsed X-ray Cineradiography

SYSTEMS AND METHODS FOR MOBILE ELEMENTAL ANALYSIS

SYSTEM AND METHOD FOR CABINET RADIOGRAPHY INCORPORATING A GAMMA OR...

MANIPULATOR HEAD AND VACUUM SYSTEM

COMPUTED TOMOGRAPHY SCATTER AND CROSSTALK CORRECTION

Handheld X-ray fluorescence, XRF, analyzer and a method for element...

X-RAY WELD INSPECTION

METHODS, SYSTEMS, AND STORAGE MEDIA FOR OBTAINING ENERGY SPECTRA

RADIOGRAPHY SYSTEM

X-RAY IMAGING APPARATUS

ELECTRODE PLATE TESTING METHOD AND APPARATUS

Object Manipulator for an X-ray Inspection System

RADIATION-MEASUREMENT-INSTRUMENT SUPPORT DEVICE, RADIATION MEASUREM...

FIDUCIALS FOR X-RAY DEVICE

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...

INTEGRATED BACKSCATTER X-RAY ASSEMBLIES FOR DETECTING BACKSCATTER X...

APPARATUS FOR ANALYZING COMPOSITION AND METHOD THEREOF