Accessories, mechanical or electrical features

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/30Accessories, mechanical or electrical features

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Calibration component for a turbomachine having representative qual...
- Patent number 12,246,380
- Issue date Mar 11, 2025
- GE INFRASTRUCTURE TECHNOLOGY LLC
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Detecting downhole fluid composition utilizing photon emission
- Patent number 12,221,884
- Issue date Feb 11, 2025
- Halliburton Energy Services, Inc.
- Christopher Michael Jones
- G01 - MEASURING TESTING
Information Patent Grant
Industrial x-ray workpiece measuring system and method for operatin...
- Patent number 12,203,876
- Issue date Jan 21, 2025
- Intom GmbH
- Severin Ebner
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative analysis apparatus, method and program and manufacturi...
- Patent number 12,174,131
- Issue date Dec 24, 2024
- Rigaku Corporation
- Takahiro Kuzumaki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray-based test device and method for plugging removal effect of s...
- Patent number 12,174,133
- Issue date Dec 24, 2024
- SOUTHWEST PETROLEUM UNIVERSITY
- Xiao Guo
- G01 - MEASURING TESTING
Information Patent Grant
Scattering measurement analysis method, scattering measurement anal...
- Patent number 12,175,173
- Issue date Dec 24, 2024
- Rigaku Corporation
- Tomoyuki Iwata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray tomography systems and methods for imaging an aircraft part
- Patent number 12,174,129
- Issue date Dec 24, 2024
- The Boeing Company
- Donald Duane Palmer
- G01 - MEASURING TESTING
Information Patent Grant
X-ray weld inspection
- Patent number 12,163,902
- Issue date Dec 10, 2024
- Varex Imaging Sweden AB
- Tuomas Pantsar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
High throughput 3D x-ray imaging system using a transmission x-ray...
- Patent number 12,153,001
- Issue date Nov 26, 2024
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Grant
Component residual stress testing platform based on neutron diffrac...
- Patent number 12,146,845
- Issue date Nov 19, 2024
- NCS TESTING TECHNOLOGY CO., LTD
- Lixia Yang
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic imaging quality control device, storage medium, and dynamic...
- Patent number 12,140,552
- Issue date Nov 12, 2024
- Konica Minolta, Inc.
- Sumiya Nagatsuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation imaging apparatus, radiation imaging system, control meth...
- Patent number 12,102,468
- Issue date Oct 1, 2024
- Canon Kabushiki Kaisha
- Kazuaki Umekawa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer and pulse height prediction program
- Patent number 12,105,035
- Issue date Oct 1, 2024
- Rigaku Corporation
- Tsutomu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Multi-axis specimen imaging device with embedded orientation markers
- Patent number 12,104,997
- Issue date Oct 1, 2024
- FAXITRON BIOPTICS, LLC
- Donogh O'Driscoll
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Scan procedure generation systems and methods to generate scan proc...
- Patent number 12,092,591
- Issue date Sep 17, 2024
- Illinois Tool Works Inc.
- Jackson Turner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample rotation system and method
- Patent number 12,085,522
- Issue date Sep 10, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Kuojung Chiu
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
- Patent number 12,078,604
- Issue date Sep 3, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 12,066,391
- Issue date Aug 20, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Battery holder device and battery test system including the same
- Patent number 12,061,157
- Issue date Aug 13, 2024
- SK ON CO., LTD.
- Hye Ju Jang
- G01 - MEASURING TESTING
Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,044,638
- Issue date Jul 23, 2024
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
System and method for multi-axis imaging of specimens
- Patent number 12,030,058
- Issue date Jul 9, 2024
- FAXITRON BIOPTICS, LLC
- Ciaran Purdy
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Systems, apparatuses, and methods for measuring submerged surfaces
- Patent number 12,025,573
- Issue date Jul 2, 2024
- DELTA SUBSEA LLC
- Scott P. Dingman
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Methods and systems for compact, small spot size soft x-ray scatter...
- Patent number 12,013,355
- Issue date Jun 18, 2024
- KLA Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tomography
- Patent number 12,004,885
- Issue date Jun 11, 2024
- XenseLab, LLC
- Ying Zhao
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Sample holder, system and method
- Patent number 12,007,339
- Issue date Jun 11, 2024
- Carl Zeiss SMT Inc.
- Thomas Anthony Case
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MANUFACTURING A COMPONENT TO REDUCE RISK OF COLD DWELL FA...
- Publication number 20250076227
- Publication date Mar 6, 2025
- Rolls-Royce Corporation
- Michael Glavicic
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
ANALYSIS SYSTEM, ANALYSIS DEVICE, AND CONTROL METHOD
- Publication number 20250067690
- Publication date Feb 27, 2025
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE BEAM ANALYZER AND PARTICLE BEAM ANALYSIS METHOD
- Publication number 20250067688
- Publication date Feb 27, 2025
- Hitachi, Ltd
- Akinori ASAHARA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATING DETECTORS IN A DETECTOR ARRAY
- Publication number 20250067687
- Publication date Feb 27, 2025
- Thermo EGS Gauging LLC
- Carter Watson
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...
- Publication number 20250067685
- Publication date Feb 27, 2025
- Thermo EGS Gauging LLC
- Carter WATSON
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20250052704
- Publication date Feb 13, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Wei Ti LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALIBRATION ASSEMBLY, CALIBRATION PHANTOM AND CALIBRATION METHOD
- Publication number 20250045984
- Publication date Feb 6, 2025
- Nuctech Company Limited
- Li ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20250027889
- Publication date Jan 23, 2025
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Application
PHOTOELECTRON EMISSION MICROSCOPE
- Publication number 20250020604
- Publication date Jan 16, 2025
- HITACHI HIGH-TECH CORPORATION
- Momoyo ENYAMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...
- Publication number 20250020602
- Publication date Jan 16, 2025
- LG ENERGY SOLUTION, LTD.
- Joon Hyeon KANG
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL STRUCTURE ANALYSIS METHOD, CRYSTAL STRUCTURE ANALYSIS DEVIC...
- Publication number 20250003896
- Publication date Jan 2, 2025
- Rigaku Corporation
- Akihito YAMANO
- G01 - MEASURING TESTING
Information Patent Application
Magnetic Deflector and Methods of Use Thereof
- Publication number 20240418662
- Publication date Dec 19, 2024
- University of North Texas
- Gary Alan Glass
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC IMAGING CALIBRATION METHOD
- Publication number 20240402099
- Publication date Dec 5, 2024
- EMvision Medical Devices Ltd
- Amin ABBOSH
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...
- Publication number 20240402098
- Publication date Dec 5, 2024
- Rapiscan Holdings, Inc.
- Brendan Edward Allman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
- Publication number 20240401940
- Publication date Dec 5, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS
- Publication number 20240402102
- Publication date Dec 5, 2024
- FEI Company
- Scott Connors
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20240393266
- Publication date Nov 28, 2024
- Sigray, Inc.
- David Vine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20240385127
- Publication date Nov 21, 2024
- Samsung SDI Co.,Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODELLING AND PREDICTION OF VIRTUAL QUALITY CONTROL DATA INCORPORAT...
- Publication number 20240387295
- Publication date Nov 21, 2024
- SANDISK TECHNOLOGIES, INC.
- Tsuyoshi Sendoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR CT DETECTOR CALIBRATION USING A WIRE PHANTOM
- Publication number 20240374223
- Publication date Nov 14, 2024
- GE Precision Healthcare LLC
- Björn Cederström
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
- Publication number 20240377340
- Publication date Nov 14, 2024
- Greyscale AI
- Brian Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR MULTI-AXIS IMAGING OF SPECIMENS
- Publication number 20240359187
- Publication date Oct 31, 2024
- Faxitron Bioptics, LLC
- Ciaran Purdy
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240361258
- Publication date Oct 31, 2024
- VAREX IMAGING CORPORATION
- Rajashekar Venkatachalam
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL
- Publication number 20240361255
- Publication date Oct 31, 2024
- VIDERAY TECHNOLOGIES, INC.
- Paul Bradshaw
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
BATTERY HOLDER DEVICE AND BATTERY TEST SYSTEM INCLUDING THE SAME
- Publication number 20240345004
- Publication date Oct 17, 2024
- SK On Co., Ltd.
- Hye Ju JANG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR FULLY AUTOMATED X-RAY TOMOGRAPHY SYSTEM PERFORMANCE V...
- Publication number 20240328965
- Publication date Oct 3, 2024
- Baker Hughes Holdings LLC
- Thomas Mayer
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER
- Publication number 20240328971
- Publication date Oct 3, 2024
- Shimadzu Corporation
- Yuji MORIHISA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20240319117
- Publication date Sep 26, 2024
- ISHIDA CO., LTD.
- Kota TOMINAGA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...
- Publication number 20240319123
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Achim WOESSNER
- G01 - MEASURING TESTING

Accessories, mechanical or electrical features

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Calibration component for a turbomachine having representative qual...

Detecting downhole fluid composition utilizing photon emission

Industrial x-ray workpiece measuring system and method for operatin...

Quantitative analysis apparatus, method and program and manufacturi...

X-ray-based test device and method for plugging removal effect of s...

Scattering measurement analysis method, scattering measurement anal...

X-ray tomography systems and methods for imaging an aircraft part

X-ray weld inspection

High throughput 3D x-ray imaging system using a transmission x-ray...

Component residual stress testing platform based on neutron diffrac...

Dynamic imaging quality control device, storage medium, and dynamic...

Radiation imaging apparatus, radiation imaging system, control meth...

X-ray spectrometer and pulse height prediction program

Multi-axis specimen imaging device with embedded orientation markers

Device and method for measuring short-wavelength characteristic X-r...

Scan procedure generation systems and methods to generate scan proc...

Sample rotation system and method

Monitoring properties of X-ray beam during X-ray analysis

Method and system for non-destructive metrology of thin layers

Rotational X-ray inspection system and method

Battery holder device and battery test system including the same

System to inspect, modify or analyze a region of interest of a samp...

X-ray automated calibration and monitoring

System and method for multi-axis imaging of specimens

Systems, apparatuses, and methods for measuring submerged surfaces

Methods and systems for compact, small spot size soft x-ray scatter...

X-ray tomography

Sample holder, system and method

X-ray beam shaping apparatus and method

Apparatus and method for x-ray fluorescence analysis

Patents Applicationslast 30 patents

METHOD OF MANUFACTURING A COMPONENT TO REDUCE RISK OF COLD DWELL FA...

ANALYSIS SYSTEM, ANALYSIS DEVICE, AND CONTROL METHOD

PARTICLE BEAM ANALYZER AND PARTICLE BEAM ANALYSIS METHOD

METHOD AND SYSTEM FOR CALIBRATING DETECTORS IN A DETECTOR ARRAY

METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

CALIBRATION ASSEMBLY, CALIBRATION PHANTOM AND CALIBRATION METHOD

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

PHOTOELECTRON EMISSION MICROSCOPE

METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...

CRYSTAL STRUCTURE ANALYSIS METHOD, CRYSTAL STRUCTURE ANALYSIS DEVIC...

Magnetic Deflector and Methods of Use Thereof

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

ELECTROMAGNETIC IMAGING CALIBRATION METHOD

Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...

AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

MODELLING AND PREDICTION OF VIRTUAL QUALITY CONTROL DATA INCORPORAT...

SYSTEMS AND METHODS FOR CT DETECTOR CALIBRATION USING A WIRE PHANTOM

CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD

SYSTEM AND METHOD FOR MULTI-AXIS IMAGING OF SPECIMENS

INSPECTION SYSTEM

HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL

BATTERY HOLDER DEVICE AND BATTERY TEST SYSTEM INCLUDING THE SAME

APPARATUS FOR FULLY AUTOMATED X-RAY TOMOGRAPHY SYSTEM PERFORMANCE V...

X-RAY FLUORESCENCE ANALYZER

X-RAY INSPECTION APPARATUS

SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...