Accessories, mechanical or electrical features

Industry

CPC
G01N2223/30

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/30Accessories, mechanical or electrical features

Industries

Patents Grantslast 30 patents

Information Patent Grant
Quantitative analysis apparatus, method and program and manufacturi...
- Patent number 12,174,131
- Issue date Dec 24, 2024
- Rigaku Corporation
- Takahiro Kuzumaki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray-based test device and method for plugging removal effect of s...
- Patent number 12,174,133
- Issue date Dec 24, 2024
- SOUTHWEST PETROLEUM UNIVERSITY
- Xiao Guo
- G01 - MEASURING TESTING
Information Patent Grant
Scattering measurement analysis method, scattering measurement anal...
- Patent number 12,175,173
- Issue date Dec 24, 2024
- Rigaku Corporation
- Tomoyuki Iwata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray tomography systems and methods for imaging an aircraft part
- Patent number 12,174,129
- Issue date Dec 24, 2024
- The Boeing Company
- Donald Duane Palmer
- G01 - MEASURING TESTING
Information Patent Grant
X-ray weld inspection
- Patent number 12,163,902
- Issue date Dec 10, 2024
- Varex Imaging Sweden AB
- Tuomas Pantsar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
High throughput 3D x-ray imaging system using a transmission x-ray...
- Patent number 12,153,001
- Issue date Nov 26, 2024
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Grant
Component residual stress testing platform based on neutron diffrac...
- Patent number 12,146,845
- Issue date Nov 19, 2024
- NCS TESTING TECHNOLOGY CO., LTD
- Lixia Yang
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic imaging quality control device, storage medium, and dynamic...
- Patent number 12,140,552
- Issue date Nov 12, 2024
- Konica Minolta, Inc.
- Sumiya Nagatsuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation imaging apparatus, radiation imaging system, control meth...
- Patent number 12,102,468
- Issue date Oct 1, 2024
- Canon Kabushiki Kaisha
- Kazuaki Umekawa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer and pulse height prediction program
- Patent number 12,105,035
- Issue date Oct 1, 2024
- Rigaku Corporation
- Tsutomu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Multi-axis specimen imaging device with embedded orientation markers
- Patent number 12,104,997
- Issue date Oct 1, 2024
- FAXITRON BIOPTICS, LLC
- Donogh O'Driscoll
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Scan procedure generation systems and methods to generate scan proc...
- Patent number 12,092,591
- Issue date Sep 17, 2024
- Illinois Tool Works Inc.
- Jackson Turner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample rotation system and method
- Patent number 12,085,522
- Issue date Sep 10, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Kuojung Chiu
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
- Patent number 12,078,604
- Issue date Sep 3, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 12,066,391
- Issue date Aug 20, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Battery holder device and battery test system including the same
- Patent number 12,061,157
- Issue date Aug 13, 2024
- SK ON CO., LTD.
- Hye Ju Jang
- G01 - MEASURING TESTING
Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,044,638
- Issue date Jul 23, 2024
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
System and method for multi-axis imaging of specimens
- Patent number 12,030,058
- Issue date Jul 9, 2024
- FAXITRON BIOPTICS, LLC
- Ciaran Purdy
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Systems, apparatuses, and methods for measuring submerged surfaces
- Patent number 12,025,573
- Issue date Jul 2, 2024
- DELTA SUBSEA LLC
- Scott P. Dingman
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Methods and systems for compact, small spot size soft x-ray scatter...
- Patent number 12,013,355
- Issue date Jun 18, 2024
- KLA Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tomography
- Patent number 12,004,885
- Issue date Jun 11, 2024
- XenseLab, LLC
- Ying Zhao
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Sample holder, system and method
- Patent number 12,007,339
- Issue date Jun 11, 2024
- Carl Zeiss SMT Inc.
- Thomas Anthony Case
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Grant
X-ray baggage and parcel inspection system with efficient third-par...
- Patent number 12,007,341
- Issue date Jun 11, 2024
- Battelle Memorial Institute
- Rodney Arthur Hallgren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
CT scanner calibration
- Patent number 11,988,616
- Issue date May 21, 2024
- James R. Glidewell Dental Ceramics, Inc.
- Sergey Nikolskiy
- G01 - MEASURING TESTING
Information Patent Grant
Medical x-ray imaging systems and methods
- Patent number 11,986,327
- Issue date May 21, 2024
- MOBIUS IMAGING, LLC
- Eugene A. Gregerson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CRYSTAL STRUCTURE ANALYSIS METHOD, CRYSTAL STRUCTURE ANALYSIS DEVIC...
- Publication number 20250003896
- Publication date Jan 2, 2025
- Rigaku Corporation
- Akihito YAMANO
- G01 - MEASURING TESTING
Information Patent Application
Magnetic Deflector and Methods of Use Thereof
- Publication number 20240418662
- Publication date Dec 19, 2024
- University of North Texas
- Gary Alan Glass
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC IMAGING CALIBRATION METHOD
- Publication number 20240402099
- Publication date Dec 5, 2024
- EMvision Medical Devices Ltd
- Amin ABBOSH
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...
- Publication number 20240402098
- Publication date Dec 5, 2024
- Rapiscan Holdings, Inc.
- Brendan Edward Allman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
- Publication number 20240401940
- Publication date Dec 5, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS
- Publication number 20240402102
- Publication date Dec 5, 2024
- FEI Company
- Scott Connors
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20240393266
- Publication date Nov 28, 2024
- Sigray, Inc.
- David Vine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20240385127
- Publication date Nov 21, 2024
- Samsung SDI Co.,Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODELLING AND PREDICTION OF VIRTUAL QUALITY CONTROL DATA INCORPORAT...
- Publication number 20240387295
- Publication date Nov 21, 2024
- SANDISK TECHNOLOGIES, INC.
- Tsuyoshi Sendoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR CT DETECTOR CALIBRATION USING A WIRE PHANTOM
- Publication number 20240374223
- Publication date Nov 14, 2024
- GE Precision Healthcare LLC
- Björn Cederström
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
- Publication number 20240377340
- Publication date Nov 14, 2024
- Greyscale AI
- Brian Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR MULTI-AXIS IMAGING OF SPECIMENS
- Publication number 20240359187
- Publication date Oct 31, 2024
- Faxitron Bioptics, LLC
- Ciaran Purdy
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240361258
- Publication date Oct 31, 2024
- VAREX IMAGING CORPORATION
- Rajashekar Venkatachalam
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL
- Publication number 20240361255
- Publication date Oct 31, 2024
- VIDERAY TECHNOLOGIES, INC.
- Paul Bradshaw
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
BATTERY HOLDER DEVICE AND BATTERY TEST SYSTEM INCLUDING THE SAME
- Publication number 20240345004
- Publication date Oct 17, 2024
- SK On Co., Ltd.
- Hye Ju JANG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR FULLY AUTOMATED X-RAY TOMOGRAPHY SYSTEM PERFORMANCE V...
- Publication number 20240328965
- Publication date Oct 3, 2024
- Baker Hughes Holdings LLC
- Thomas Mayer
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER
- Publication number 20240328971
- Publication date Oct 3, 2024
- Shimadzu Corporation
- Yuji MORIHISA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20240319117
- Publication date Sep 26, 2024
- ISHIDA CO., LTD.
- Kota TOMINAGA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...
- Publication number 20240319123
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Achim WOESSNER
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Monitoring Output Energy of a High-Energy X...
- Publication number 20240310300
- Publication date Sep 19, 2024
- Rapiscan Holdings, Inc.
- James Ollier
- G01 - MEASURING TESTING
Information Patent Application
Manipulating and Inspecting Large and Heavy Components
- Publication number 20240310303
- Publication date Sep 19, 2024
- Baker Hughes Holdings LLC
- Michael Wüstenbecker
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
X-RAY INSPECTION APPARATUS AND SENSITIVITY CORRECTION METHOD FOR X-...
- Publication number 20240310302
- Publication date Sep 19, 2024
- ISHIDA CO., LTD.
- Kazuyuki SUGIMOTO
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTORS HAVING IMPROVED OUTPUT COUNT RATE EQUALIZATION...
- Publication number 20240302549
- Publication date Sep 12, 2024
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
PIPELINE INSPECTION APPARATUS
- Publication number 20240302295
- Publication date Sep 12, 2024
- Under Cover Technologies Corp.
- RICHARD MAIKLEM
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS AND METHOD
- Publication number 20240298400
- Publication date Sep 5, 2024
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...
- Publication number 20240295512
- Publication date Sep 5, 2024
- AKTSIONERNOE OBSHCHESTVO "CHEPETSKIJ MEKHANICHESKIJ ZAVOD
- Olga Alekseevna KARAVAEVA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...
- Publication number 20240288391
- Publication date Aug 29, 2024
- Carl Zeiss SMT GMBH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
RAY SCANNING APPARATUS AND RAY SCANNING SYSTEM
- Publication number 20240288385
- Publication date Aug 29, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHIC IMAGING APPARATUS AND RADIOGRAPHIC IMAGING
- Publication number 20240288386
- Publication date Aug 29, 2024
- Canon Kabushiki Kaisha
- HIROKAZU OHGURI
- G01 - MEASURING TESTING

Accessories, mechanical or electrical features

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Quantitative analysis apparatus, method and program and manufacturi...

X-ray-based test device and method for plugging removal effect of s...

Scattering measurement analysis method, scattering measurement anal...

X-ray tomography systems and methods for imaging an aircraft part

X-ray weld inspection

High throughput 3D x-ray imaging system using a transmission x-ray...

Component residual stress testing platform based on neutron diffrac...

Dynamic imaging quality control device, storage medium, and dynamic...

Radiation imaging apparatus, radiation imaging system, control meth...

X-ray spectrometer and pulse height prediction program

Multi-axis specimen imaging device with embedded orientation markers

Device and method for measuring short-wavelength characteristic X-r...

Scan procedure generation systems and methods to generate scan proc...

Sample rotation system and method

Monitoring properties of X-ray beam during X-ray analysis

Method and system for non-destructive metrology of thin layers

Rotational X-ray inspection system and method

Battery holder device and battery test system including the same

System to inspect, modify or analyze a region of interest of a samp...

X-ray automated calibration and monitoring

System and method for multi-axis imaging of specimens

Systems, apparatuses, and methods for measuring submerged surfaces

Methods and systems for compact, small spot size soft x-ray scatter...

X-ray tomography

Sample holder, system and method

X-ray beam shaping apparatus and method

Apparatus and method for x-ray fluorescence analysis

X-ray baggage and parcel inspection system with efficient third-par...

CT scanner calibration

Medical x-ray imaging systems and methods

Patents Applicationslast 30 patents

CRYSTAL STRUCTURE ANALYSIS METHOD, CRYSTAL STRUCTURE ANALYSIS DEVIC...

Magnetic Deflector and Methods of Use Thereof

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

ELECTROMAGNETIC IMAGING CALIBRATION METHOD

Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...

AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

MODELLING AND PREDICTION OF VIRTUAL QUALITY CONTROL DATA INCORPORAT...

SYSTEMS AND METHODS FOR CT DETECTOR CALIBRATION USING A WIRE PHANTOM

CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD

SYSTEM AND METHOD FOR MULTI-AXIS IMAGING OF SPECIMENS

INSPECTION SYSTEM

HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL

BATTERY HOLDER DEVICE AND BATTERY TEST SYSTEM INCLUDING THE SAME

APPARATUS FOR FULLY AUTOMATED X-RAY TOMOGRAPHY SYSTEM PERFORMANCE V...

X-RAY FLUORESCENCE ANALYZER

X-RAY INSPECTION APPARATUS

SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...

Systems and Methods for Monitoring Output Energy of a High-Energy X...

Manipulating and Inspecting Large and Heavy Components

X-RAY INSPECTION APPARATUS AND SENSITIVITY CORRECTION METHOD FOR X-...

RADIATION DETECTORS HAVING IMPROVED OUTPUT COUNT RATE EQUALIZATION...

PIPELINE INSPECTION APPARATUS

X-RAY ANALYSIS APPARATUS AND METHOD

METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...

SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...

RAY SCANNING APPARATUS AND RAY SCANNING SYSTEM

RADIOGRAPHIC IMAGING APPARATUS AND RADIOGRAPHIC IMAGING