Accessories, mechanical or electrical features

Industry

CPC
G01N2223/30

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/30Accessories, mechanical or electrical features

Industries

Patents Grantslast 30 patents

Information Patent Grant
Component residual stress testing platform based on neutron diffrac...
- Patent number 12,146,845
- Issue date Nov 19, 2024
- NCS TESTING TECHNOLOGY CO., LTD
- Lixia Yang
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic imaging quality control device, storage medium, and dynamic...
- Patent number 12,140,552
- Issue date Nov 12, 2024
- Konica Minolta, Inc.
- Sumiya Nagatsuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation imaging apparatus, radiation imaging system, control meth...
- Patent number 12,102,468
- Issue date Oct 1, 2024
- Canon Kabushiki Kaisha
- Kazuaki Umekawa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer and pulse height prediction program
- Patent number 12,105,035
- Issue date Oct 1, 2024
- Rigaku Corporation
- Tsutomu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Multi-axis specimen imaging device with embedded orientation markers
- Patent number 12,104,997
- Issue date Oct 1, 2024
- FAXITRON BIOPTICS, LLC
- Donogh O'Driscoll
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Scan procedure generation systems and methods to generate scan proc...
- Patent number 12,092,591
- Issue date Sep 17, 2024
- Illinois Tool Works Inc.
- Jackson Turner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample rotation system and method
- Patent number 12,085,522
- Issue date Sep 10, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Kuojung Chiu
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
- Patent number 12,078,604
- Issue date Sep 3, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 12,066,391
- Issue date Aug 20, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Battery holder device and battery test system including the same
- Patent number 12,061,157
- Issue date Aug 13, 2024
- SK ON CO., LTD.
- Hye Ju Jang
- G01 - MEASURING TESTING
Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,044,638
- Issue date Jul 23, 2024
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
System and method for multi-axis imaging of specimens
- Patent number 12,030,058
- Issue date Jul 9, 2024
- FAXITRON BIOPTICS, LLC
- Ciaran Purdy
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Systems, apparatuses, and methods for measuring submerged surfaces
- Patent number 12,025,573
- Issue date Jul 2, 2024
- DELTA SUBSEA LLC
- Scott P. Dingman
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Methods and systems for compact, small spot size soft x-ray scatter...
- Patent number 12,013,355
- Issue date Jun 18, 2024
- KLA Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tomography
- Patent number 12,004,885
- Issue date Jun 11, 2024
- XenseLab, LLC
- Ying Zhao
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Sample holder, system and method
- Patent number 12,007,339
- Issue date Jun 11, 2024
- Carl Zeiss SMT Inc.
- Thomas Anthony Case
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Grant
X-ray baggage and parcel inspection system with efficient third-par...
- Patent number 12,007,341
- Issue date Jun 11, 2024
- Battelle Memorial Institute
- Rodney Arthur Hallgren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
CT scanner calibration
- Patent number 11,988,616
- Issue date May 21, 2024
- James R. Glidewell Dental Ceramics, Inc.
- Sergey Nikolskiy
- G01 - MEASURING TESTING
Information Patent Grant
Medical x-ray imaging systems and methods
- Patent number 11,986,327
- Issue date May 21, 2024
- MOBIUS IMAGING, LLC
- Eugene A. Gregerson
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 11,988,502
- Issue date May 21, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing signal of neutral atom imaging unit
- Patent number 11,982,633
- Issue date May 14, 2024
- Peking University
- Yongfu Wang
- G01 - MEASURING TESTING
Information Patent Grant
Radiation imaging system including a radiation imaging apparatus, a...
- Patent number 11,974,871
- Issue date May 7, 2024
- Canon Kabushiki Kaisha
- Shimpei Tezuka
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Radiographic imaging apparatus, method of controlling the same, rad...
- Patent number 11,969,284
- Issue date Apr 30, 2024
- Canon Kabushiki Kaisha
- Tadahiko Iijima
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems of testing formation samples using a rock hydro...
- Patent number 11,971,369
- Issue date Apr 30, 2024
- Halliburton Energy Services, Inc.
- Abraham S. Grader
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for operating a measurement system
- Patent number 11,959,865
- Issue date Apr 16, 2024
- RAYSCAN TECHNOLOGIES GMBH
- Christoph Sauerwein
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20240385127
- Publication date Nov 21, 2024
- Samsung SDI Co.,Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODELLING AND PREDICTION OF VIRTUAL QUALITY CONTROL DATA INCORPORAT...
- Publication number 20240387295
- Publication date Nov 21, 2024
- SANDISK TECHNOLOGIES, INC.
- Tsuyoshi Sendoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR CT DETECTOR CALIBRATION USING A WIRE PHANTOM
- Publication number 20240374223
- Publication date Nov 14, 2024
- GE Precision Healthcare LLC
- Björn Cederström
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
- Publication number 20240377340
- Publication date Nov 14, 2024
- Greyscale AI
- Brian Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR MULTI-AXIS IMAGING OF SPECIMENS
- Publication number 20240359187
- Publication date Oct 31, 2024
- Faxitron Bioptics, LLC
- Ciaran Purdy
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240361258
- Publication date Oct 31, 2024
- VAREX IMAGING CORPORATION
- Rajashekar Venkatachalam
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL
- Publication number 20240361255
- Publication date Oct 31, 2024
- VIDERAY TECHNOLOGIES, INC.
- Paul Bradshaw
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
BATTERY HOLDER DEVICE AND BATTERY TEST SYSTEM INCLUDING THE SAME
- Publication number 20240345004
- Publication date Oct 17, 2024
- SK On Co., Ltd.
- Hye Ju JANG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR FULLY AUTOMATED X-RAY TOMOGRAPHY SYSTEM PERFORMANCE V...
- Publication number 20240328965
- Publication date Oct 3, 2024
- Baker Hughes Holdings LLC
- Thomas Mayer
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER
- Publication number 20240328971
- Publication date Oct 3, 2024
- Shimadzu Corporation
- Yuji MORIHISA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20240319117
- Publication date Sep 26, 2024
- ISHIDA CO., LTD.
- Kota TOMINAGA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...
- Publication number 20240319123
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Achim WOESSNER
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Monitoring Output Energy of a High-Energy X...
- Publication number 20240310300
- Publication date Sep 19, 2024
- Rapiscan Holdings, Inc.
- James Ollier
- G01 - MEASURING TESTING
Information Patent Application
Manipulating and Inspecting Large and Heavy Components
- Publication number 20240310303
- Publication date Sep 19, 2024
- Baker Hughes Holdings LLC
- Michael Wüstenbecker
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
X-RAY INSPECTION APPARATUS AND SENSITIVITY CORRECTION METHOD FOR X-...
- Publication number 20240310302
- Publication date Sep 19, 2024
- ISHIDA CO., LTD.
- Kazuyuki SUGIMOTO
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTORS HAVING IMPROVED OUTPUT COUNT RATE EQUALIZATION...
- Publication number 20240302549
- Publication date Sep 12, 2024
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
PIPELINE INSPECTION APPARATUS
- Publication number 20240302295
- Publication date Sep 12, 2024
- Under Cover Technologies Corp.
- RICHARD MAIKLEM
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS AND METHOD
- Publication number 20240298400
- Publication date Sep 5, 2024
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...
- Publication number 20240295512
- Publication date Sep 5, 2024
- AKTSIONERNOE OBSHCHESTVO "CHEPETSKIJ MEKHANICHESKIJ ZAVOD
- Olga Alekseevna KARAVAEVA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...
- Publication number 20240288391
- Publication date Aug 29, 2024
- Carl Zeiss SMT GMBH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
RAY SCANNING APPARATUS AND RAY SCANNING SYSTEM
- Publication number 20240288385
- Publication date Aug 29, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHIC IMAGING APPARATUS AND RADIOGRAPHIC IMAGING
- Publication number 20240288386
- Publication date Aug 29, 2024
- Canon Kabushiki Kaisha
- HIROKAZU OHGURI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...
- Publication number 20240280514
- Publication date Aug 22, 2024
- Battelle Memorial Institute
- Rodney Arthur Hallgren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TWO-STAGE PIXEL DEVICE WITH ADAPTIVE FRAME GRABBING FOR X-RAY IMAGI...
- Publication number 20240272094
- Publication date Aug 15, 2024
- Anastasiia Mishchenko
- G01 - MEASURING TESTING
Information Patent Application
CT SCANNER CALIBRATION
- Publication number 20240272095
- Publication date Aug 15, 2024
- JAMES R. GLIDEWELL DENTAL CERAMICS, INC.
- Sergey Nikolskiy
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND PROCESS FOR DETERMINING THE WATER EQUIVALENT CONTENT OF...
- Publication number 20240272092
- Publication date Aug 15, 2024
- FINAPP S.r.l.
- Luca STEVANATO
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE DETECTOR AND IMAGING DEVICE INCLUDING THE SAME
- Publication number 20240272315
- Publication date Aug 15, 2024
- VIEWORKS CO., LTD.
- Jungmin CHOI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR COMPUTED TOMOGRAPHY SYSTEM CALIBRATION
- Publication number 20240264096
- Publication date Aug 8, 2024
- Baker Hughes Holdings LLC
- Alexander Suppes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM
- Publication number 20240264098
- Publication date Aug 8, 2024
- Rigaku Corporation
- Tsutomu TADA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TRANSMISSION INSPECTION APPARATUS AND X-RAY TRANSMISSION INSP...
- Publication number 20240255443
- Publication date Aug 1, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi MATSUBARA
- G01 - MEASURING TESTING

Accessories, mechanical or electrical features

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Component residual stress testing platform based on neutron diffrac...

Dynamic imaging quality control device, storage medium, and dynamic...

Radiation imaging apparatus, radiation imaging system, control meth...

X-ray spectrometer and pulse height prediction program

Multi-axis specimen imaging device with embedded orientation markers

Device and method for measuring short-wavelength characteristic X-r...

Scan procedure generation systems and methods to generate scan proc...

Sample rotation system and method

Monitoring properties of X-ray beam during X-ray analysis

Method and system for non-destructive metrology of thin layers

Rotational X-ray inspection system and method

Battery holder device and battery test system including the same

System to inspect, modify or analyze a region of interest of a samp...

X-ray automated calibration and monitoring

System and method for multi-axis imaging of specimens

Systems, apparatuses, and methods for measuring submerged surfaces

Methods and systems for compact, small spot size soft x-ray scatter...

X-ray tomography

Sample holder, system and method

X-ray beam shaping apparatus and method

Apparatus and method for x-ray fluorescence analysis

X-ray baggage and parcel inspection system with efficient third-par...

CT scanner calibration

Medical x-ray imaging systems and methods

Characterizing and measuring in small boxes using XPS with multiple...

Method for analyzing signal of neutral atom imaging unit

Radiation imaging system including a radiation imaging apparatus, a...

Radiographic imaging apparatus, method of controlling the same, rad...

Methods and systems of testing formation samples using a rock hydro...

Measurement system and method for operating a measurement system

Patents Applicationslast 30 patents

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

MODELLING AND PREDICTION OF VIRTUAL QUALITY CONTROL DATA INCORPORAT...

SYSTEMS AND METHODS FOR CT DETECTOR CALIBRATION USING A WIRE PHANTOM

CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD

SYSTEM AND METHOD FOR MULTI-AXIS IMAGING OF SPECIMENS

INSPECTION SYSTEM

HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL

BATTERY HOLDER DEVICE AND BATTERY TEST SYSTEM INCLUDING THE SAME

APPARATUS FOR FULLY AUTOMATED X-RAY TOMOGRAPHY SYSTEM PERFORMANCE V...

X-RAY FLUORESCENCE ANALYZER

X-RAY INSPECTION APPARATUS

SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...

Systems and Methods for Monitoring Output Energy of a High-Energy X...

Manipulating and Inspecting Large and Heavy Components

X-RAY INSPECTION APPARATUS AND SENSITIVITY CORRECTION METHOD FOR X-...

RADIATION DETECTORS HAVING IMPROVED OUTPUT COUNT RATE EQUALIZATION...

PIPELINE INSPECTION APPARATUS

X-RAY ANALYSIS APPARATUS AND METHOD

METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...

SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...

RAY SCANNING APPARATUS AND RAY SCANNING SYSTEM

RADIOGRAPHIC IMAGING APPARATUS AND RADIOGRAPHIC IMAGING

X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...

TWO-STAGE PIXEL DEVICE WITH ADAPTIVE FRAME GRABBING FOR X-RAY IMAGI...

CT SCANNER CALIBRATION

SYSTEM AND PROCESS FOR DETERMINING THE WATER EQUIVALENT CONTENT OF...

FLEXIBLE DETECTOR AND IMAGING DEVICE INCLUDING THE SAME

APPARATUS AND METHOD FOR COMPUTED TOMOGRAPHY SYSTEM CALIBRATION

X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM

X-RAY TRANSMISSION INSPECTION APPARATUS AND X-RAY TRANSMISSION INSP...