adapted for measuring in circuits having distributed constants

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CPC
G01R23/163

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R23/00Arrangements for measuring frequencies Arrangements for analysing frequency spectra

Current Industry

G01R23/163adapted for measuring in circuits having distributed constants

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Patents Grantslast 30 patents

Information Patent Grant
Measuring apparatus and a measuring method of electromagnetic inter...
- Patent number 12,163,993
- Issue date Dec 10, 2024
- EMZER TECHNOLOGICAL SOLUTIONS, S.L.
- Albert Miquel Sanchez Delgado
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus and method for testing coupled AC circuit
- Patent number 11,656,268
- Issue date May 23, 2023
- GM CRUISE HOLDINGS LLC
- Vladimir Ilchenko
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing an integrated circuit involving performing...
- Patent number 11,650,237
- Issue date May 16, 2023
- Samsung Electronics Co., Ltd.
- Bonggyu Kang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for sideband corrected noise-power measurement
- Patent number 11,639,953
- Issue date May 2, 2023
- Rohde & Schwarz GmbH & Co. KG
- Daniel Müeller
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for frequency analysis of a signal
- Patent number 11,415,609
- Issue date Aug 16, 2022
- Thales
- Thierry Debuisschert
- G01 - MEASURING TESTING
Information Patent Grant
Adjusting system and adjusting method for equalization processing
- Patent number 11,019,439
- Issue date May 25, 2021
- Acer Incorporated
- Po-Jen Tu
- G01 - MEASURING TESTING
Information Patent Grant
Nonlinear distortion detection
- Patent number 10,845,401
- Issue date Nov 24, 2020
- Keysight Technologies, Inc.
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for processing spectrum
- Patent number 10,794,942
- Issue date Oct 6, 2020
- Samsung Electronics Co., Ltd.
- Yun S Park
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Expanded detail graphical display for spectrum analyzers
- Patent number 10,705,127
- Issue date Jul 7, 2020
- Research Electronics International, LLC
- Bruce R. Barsumian
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus
- Patent number 10,591,522
- Issue date Mar 17, 2020
- Rohde & Schwarz GmbH & Co. KG
- Werner Held
- G01 - MEASURING TESTING
Information Patent Grant
System for analysis of a microwave frequency signal by imaging
- Patent number 10,571,498
- Issue date Feb 25, 2020
- Thales
- Mayeul Chipaux
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating device including noise source
- Patent number 10,551,422
- Issue date Feb 4, 2020
- Rohm Co., Ltd.
- Noriaki Hiraga
- G01 - MEASURING TESTING
Information Patent Grant
Analog spectrum analyzer
- Patent number 10,408,867
- Issue date Sep 10, 2019
- Thales
- Julien Kermorvant
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting signals in a frequency-ambiguous digital recei...
- Patent number 10,386,397
- Issue date Aug 20, 2019
- Thales
- Pascal Cornic
- G01 - MEASURING TESTING
Information Patent Grant
Logical triggering in the frequency domain
- Patent number 9,784,776
- Issue date Oct 10, 2017
- Tektronix, Inc.
- John A. Dement
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Replaceable internal open-short-load (OSL) calibrator and power mon...
- Patent number 9,696,403
- Issue date Jul 4, 2017
- Anritsu Company
- George Elder-Groebe
- G01 - MEASURING TESTING
Information Patent Grant
Minimal reconfiguration spectrum stitching with overlapped bands
- Patent number 9,557,358
- Issue date Jan 31, 2017
- Tektronix, Inc.
- Benjamin A. Ward
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multi-channel frequency domain test and measurement instrument
- Patent number 9,157,943
- Issue date Oct 13, 2015
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Grant
Architectures for universal or software radio
- Patent number 8,498,366
- Issue date Jul 30, 2013
- Massachusetts Institute of Technology
- Soumyajit Mandal
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Frequency characteristics measuring device
- Patent number 8,446,144
- Issue date May 21, 2013
- Advantest Corporation
- Shinji Kuniie
- G01 - MEASURING TESTING
Information Patent Grant
Frequency characteristics measuring device
- Patent number 8,368,382
- Issue date Feb 5, 2013
- Advantest Corporation
- Satoru Aoyama
- G01 - MEASURING TESTING
Information Patent Grant
Extraction of component models from PCB channel scattering paramete...
- Patent number 8,234,096
- Issue date Jul 31, 2012
- Oracle America, Inc.
- Juyoung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Automatic generation of frequency domain mask
- Patent number 8,199,149
- Issue date Jun 12, 2012
- Tektronix, Inc.
- Ian S. Dees
- G01 - MEASURING TESTING
Information Patent Grant
Amplitude discrimination using the frequency mask trigger
- Patent number 8,180,586
- Issue date May 15, 2012
- Tektronix, Inc.
- Alfred K. Hillman, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Architectures for universal or software radio
- Patent number 8,121,223
- Issue date Feb 21, 2012
- Massachusetts Institute of Technology
- Soumyajit Mandal
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Sensor for detecting high frequency signals
- Patent number 8,115,693
- Issue date Feb 14, 2012
- Scenterra, Inc.
- Kenneth E. Salsman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for artifact signal reduction in systems of mi...
- Patent number 7,386,409
- Issue date Jun 10, 2008
- LeCroy Corporation
- James Mueller
- G01 - MEASURING TESTING
Information Patent Grant
Signal observation system
- Patent number 7,317,765
- Issue date Jan 8, 2008
- The Johns Hopkins University
- Steven D. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Sensor for detecting high frequency signals
- Patent number 7,280,078
- Issue date Oct 9, 2007
- Scenterra, Inc.
- Kenneth E. Salsman
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring system and method implementing failure time spectrum scan
- Patent number 7,003,414
- Issue date Feb 21, 2006
- Agilent Technologies, Inc.
- James Wichelman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FILTER BANK CIRCUIT, SPECTRUM ANALYZER, SIGNAL ANALYZER, SIGNAL GEN...
- Publication number 20240319241
- Publication date Sep 26, 2024
- Anritsu Corporation
- Yuji KISHI
- G01 - MEASURING TESTING
Information Patent Application
Spectrum Analyzer, System and Method for Outputting Data from a Spe...
- Publication number 20240003946
- Publication date Jan 4, 2024
- AARONIA AG
- Thorsten Chmielus
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE DETERMINATION OF RADIO FREQUENCY POWER THROUGH DIGITAL INV...
- Publication number 20230341448
- Publication date Oct 26, 2023
- LAM RESEARCH CORPORATION
- Ashish Saurabh
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR SIDEBAND CORRECTED NOISE-POWER MEASUREMENT
- Publication number 20220252651
- Publication date Aug 11, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Daniel MUELLER
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT INVOLVING PERFORMING...
- Publication number 20220091171
- Publication date Mar 24, 2022
- Samsung Electronics Co., Ltd.
- Bonggyu Kang
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTING SYSTEM AND ADJUSTING METHOD FOR EQUALIZATION PROCESSING
- Publication number 20210092539
- Publication date Mar 25, 2021
- ACER INCORPORATED
- Po-Jen Tu
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR FREQUENCY ANALYSIS OF A SIGNAL
- Publication number 20210048463
- Publication date Feb 18, 2021
- Thierry DEBUISSCHERT
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETERMINING A TEMPERATURE-DEPENDENT IMPEDANCE...
- Publication number 20200241059
- Publication date Jul 30, 2020
- LEONI KABEL GMBH
- SERGEY INTELMAN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR PROCESSING SPECTRUM
- Publication number 20190128934
- Publication date May 2, 2019
- Samsung Electronics Co., Ltd.
- Yun S PARK
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING SIGNALS IN A FREQUENCY-AMBIGUOUS DIGITAL RECEI...
- Publication number 20170336450
- Publication date Nov 23, 2017
- Pascal CORNIC
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR ANALYSIS OF A MICROWAVE FREQUENCY SIGNAL BY IMAGING
- Publication number 20170322244
- Publication date Nov 9, 2017
- THALES
- Mayeul CHIPAUX
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS
- Publication number 20170160321
- Publication date Jun 8, 2017
- Rohde& Schwarz GmbH & Co. KG
- Werner Held
- G01 - MEASURING TESTING
Information Patent Application
ANALOG SPECTRUM ANALYZER
- Publication number 20160305994
- Publication date Oct 20, 2016
- THALES
- Julien KERMORVANT
- G01 - MEASURING TESTING
Information Patent Application
LOGICAL TRIGGERING IN THE FREQUENCY DOMAIN
- Publication number 20140012526
- Publication date Jan 9, 2014
- Tektronix, Inc.
- John A. Dement
- G01 - MEASURING TESTING
Information Patent Application
Minimal Reconfiguration Spectrum Stitching with Overlapped Bands
- Publication number 20120269252
- Publication date Oct 25, 2012
- Tektronix, Inc.
- Benjamin A. WARD
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL ANALYZING SYSTEM AND METHOD USING CONTINUOUS SHIFTED TRANSFORM
- Publication number 20120265465
- Publication date Oct 18, 2012
- Chin-Shiong TSAI
- G01 - MEASURING TESTING
Information Patent Application
Architectures For Universal Or Software Radio
- Publication number 20120114081
- Publication date May 10, 2012
- Massachusetts Institute of Technology
- Soumyajit Mandal
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MULTI-CHANNEL FREQUENCY DOMAIN TEST AND MEASUREMENT INSTRUMENT
- Publication number 20120036947
- Publication date Feb 16, 2012
- Tektronix, Inc.
- Kenneth P. DOBYNS
- G01 - MEASURING TESTING
Information Patent Application
SENSOR FOR DETECTING HIGH FREQUENCY SIGNALS
- Publication number 20120007585
- Publication date Jan 12, 2012
- Kenneth E. Salsman
- G01 - MEASURING TESTING
Information Patent Application
LOGICAL TRIGGERING IN THE FREQUENCY DOMAIN
- Publication number 20110274150
- Publication date Nov 10, 2011
- Tektronix, Inc.
- JOHN A. DEMENT
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Extraction of Component Models from PCB Channel Scattering Paramete...
- Publication number 20110107292
- Publication date May 5, 2011
- SUN MICROSYSTEMS, INC.
- Juyoung Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FREQUENCY CHARACTERISTICS MEASURING DEVICE
- Publication number 20110001468
- Publication date Jan 6, 2011
- Advantest Corporation
- Satoru Aoyama
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY CHARACTERISTICS MEASURING DEVICE
- Publication number 20100259245
- Publication date Oct 14, 2010
- ADVANTEST CORPORATION
- Shinji Kunie
- G01 - MEASURING TESTING
Information Patent Application
AMPLITUDE DISCRIMINATION USING THE FREQUENCY MASK TRIGGER
- Publication number 20100204938
- Publication date Aug 12, 2010
- Tektronix, Inc.
- Alfred K. HILLMAN, JR.
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC GENERATION OF FREQUENCY DOMAIN MASK
- Publication number 20090153559
- Publication date Jun 18, 2009
- Tektronix, Inc.
- Ian S. Dees
- G01 - MEASURING TESTING
Information Patent Application
ARCHITECTURES FOR UNIVERSAL OR SOFTWARE RADIO
- Publication number 20080240301
- Publication date Oct 2, 2008
- Soumyajit Mandal
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
RF measurement system incorporating a ream assembly and method of u...
- Publication number 20080238405
- Publication date Oct 2, 2008
- Todd Steven Marshall
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM ANALYZER, SPECTRUM ANALYSIS METHOD AND RECORDING MEDIUM
- Publication number 20080231254
- Publication date Sep 25, 2008
- Advantest Corporation
- Eiji Kanoh
- G01 - MEASURING TESTING
Information Patent Application
Device for identifying consumer devices in an electric network and...
- Publication number 20080208496
- Publication date Aug 28, 2008
- Thomas Habath
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Sensor for detecting high frequency signals
- Publication number 20060284774
- Publication date Dec 21, 2006
- Kenneth E. Salsman
- G01 - MEASURING TESTING

adapted for measuring in circuits having distributed constants

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Measuring apparatus and a measuring method of electromagnetic inter...

Apparatus and method for testing coupled AC circuit

Method of manufacturing an integrated circuit involving performing...

Method and system for sideband corrected noise-power measurement

Device and method for frequency analysis of a signal

Adjusting system and adjusting method for equalization processing

Nonlinear distortion detection

Apparatus and method for processing spectrum

Expanded detail graphical display for spectrum analyzers

Measurement apparatus

System for analysis of a microwave frequency signal by imaging

Method of evaluating device including noise source

Analog spectrum analyzer

Method for detecting signals in a frequency-ambiguous digital recei...

Logical triggering in the frequency domain

Replaceable internal open-short-load (OSL) calibrator and power mon...

Minimal reconfiguration spectrum stitching with overlapped bands

Multi-channel frequency domain test and measurement instrument

Architectures for universal or software radio

Frequency characteristics measuring device

Frequency characteristics measuring device

Extraction of component models from PCB channel scattering paramete...

Automatic generation of frequency domain mask

Amplitude discrimination using the frequency mask trigger

Architectures for universal or software radio

Sensor for detecting high frequency signals

Method and apparatus for artifact signal reduction in systems of mi...

Signal observation system

Sensor for detecting high frequency signals

Monitoring system and method implementing failure time spectrum scan

Patents Applicationslast 30 patents

FILTER BANK CIRCUIT, SPECTRUM ANALYZER, SIGNAL ANALYZER, SIGNAL GEN...

Spectrum Analyzer, System and Method for Outputting Data from a Spe...

ACCURATE DETERMINATION OF RADIO FREQUENCY POWER THROUGH DIGITAL INV...

METHOD AND SYSTEM FOR SIDEBAND CORRECTED NOISE-POWER MEASUREMENT

METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT INVOLVING PERFORMING...

ADJUSTING SYSTEM AND ADJUSTING METHOD FOR EQUALIZATION PROCESSING

DEVICE AND METHOD FOR FREQUENCY ANALYSIS OF A SIGNAL

DEVICE AND METHOD FOR DETERMINING A TEMPERATURE-DEPENDENT IMPEDANCE...

APPARATUS AND METHOD FOR PROCESSING SPECTRUM

METHOD FOR DETECTING SIGNALS IN A FREQUENCY-AMBIGUOUS DIGITAL RECEI...

SYSTEM FOR ANALYSIS OF A MICROWAVE FREQUENCY SIGNAL BY IMAGING

MEASUREMENT APPARATUS

ANALOG SPECTRUM ANALYZER

LOGICAL TRIGGERING IN THE FREQUENCY DOMAIN

Minimal Reconfiguration Spectrum Stitching with Overlapped Bands

SIGNAL ANALYZING SYSTEM AND METHOD USING CONTINUOUS SHIFTED TRANSFORM

Architectures For Universal Or Software Radio

MULTI-CHANNEL FREQUENCY DOMAIN TEST AND MEASUREMENT INSTRUMENT

SENSOR FOR DETECTING HIGH FREQUENCY SIGNALS

LOGICAL TRIGGERING IN THE FREQUENCY DOMAIN

Extraction of Component Models from PCB Channel Scattering Paramete...

FREQUENCY CHARACTERISTICS MEASURING DEVICE

FREQUENCY CHARACTERISTICS MEASURING DEVICE

AMPLITUDE DISCRIMINATION USING THE FREQUENCY MASK TRIGGER

AUTOMATIC GENERATION OF FREQUENCY DOMAIN MASK

ARCHITECTURES FOR UNIVERSAL OR SOFTWARE RADIO

RF measurement system incorporating a ream assembly and method of u...

SPECTRUM ANALYZER, SPECTRUM ANALYSIS METHOD AND RECORDING MEDIUM

Device for identifying consumer devices in an electric network and...

Sensor for detecting high frequency signals