Analysis of test coverage or failure detectability

Industry

CPC
G01R31/31835

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31835Analysis of test coverage or failure detectability

Industries

Patents Grantslast 30 patents

Information Patent Grant
System and method for predicting compatibility of a new unit for an...
- Patent number 12,153,092
- Issue date Nov 26, 2024
- Rohde & Schwarz GmbH & Co. KG
- Chow Han Ding
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrating machine learning delay estimation in FPGA-based emulati...
- Patent number 12,140,628
- Issue date Nov 12, 2024
- Synopsys, Inc.
- Yanhua Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Virtual quality control interpolation and process feedback in the p...
- Patent number 12,105,137
- Issue date Oct 1, 2024
- SanDisk Technologies LLC
- Yusuke Ikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for device under test (DUT) validation reuse acro...
- Patent number 12,078,676
- Issue date Sep 3, 2024
- MARVELL ASIA PTE. LTD.
- Nimalan Siva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for semiconductor device interface circuitry functionality a...
- Patent number 12,025,663
- Issue date Jul 2, 2024
- Celerint, LLC
- Howard H. Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Tests for integrated circuit (IC) chips
- Patent number 11,994,559
- Issue date May 28, 2024
- Texas Instruments Incorporated
- Lakshmanan Balasubramanian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Connecting random variables to coverage targets using an ensemble o...
- Patent number 11,983,474
- Issue date May 14, 2024
- Synopsys, Inc.
- Parijat Biswas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods of testing adverse device conditions
- Patent number 11,965,927
- Issue date Apr 23, 2024
- Apple Inc.
- Jay Mayur Khandhar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test method and apparatus of communication chip, device and medium
- Patent number 11,927,631
- Issue date Mar 12, 2024
- MORNINGCORE TECHNOLOGY CO., CHINA
- Shanzhi Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simulation method and system of verifying operation of semiconducto...
- Patent number 11,906,584
- Issue date Feb 20, 2024
- Samsung Electronics Co., Ltd.
- Seaeun Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method to weight defects with co-located modeled faults
- Patent number 11,899,065
- Issue date Feb 13, 2024
- KLA Corporation
- David W. Price
- G01 - MEASURING TESTING
Information Patent Grant
Early detection of quality control test failures for manufacturing...
- Patent number 11,892,507
- Issue date Feb 6, 2024
- Exfo Inc.
- Jonathan Plante
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning delay estimation for emulation systems
- Patent number 11,860,227
- Issue date Jan 2, 2024
- Synopsys, Inc.
- Yanhua Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit simulation test method and apparatus, device, and medium
- Patent number 11,846,674
- Issue date Dec 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Feng Lin
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus and non-transitory computer-readable storage m...
- Patent number 11,841,398
- Issue date Dec 12, 2023
- Silicon Motion, Inc.
- Yu-Lin Jiang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for formal fault propagation analysis
- Patent number 11,816,410
- Issue date Nov 14, 2023
- Siemens Electronic Design Automation Gmbh
- Dominik Strasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single-pass diagnosis for multiple chain defects
- Patent number 11,789,077
- Issue date Oct 17, 2023
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
Parameter space reduction for device testing
- Patent number 11,789,074
- Issue date Oct 17, 2023
- National Instruments Corporation
- James C. Nagle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-rate sampling for hierarchical system analysis
- Patent number 11,774,498
- Issue date Oct 3, 2023
- International Business Machines Corporation
- David Wells Winston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, apparatus and method for functional testing of one or more...
- Patent number 11,686,767
- Issue date Jun 27, 2023
- Intel Corporation
- Lakshminarayana Pappu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Converting formal verification testbench drivers with nondeterminis...
- Patent number 11,675,009
- Issue date Jun 13, 2023
- International Business Machines Corporation
- Bradley Donald Bingham
- G01 - MEASURING TESTING
Information Patent Grant
Verification of hardware design for data transformation pipeline
- Patent number 11,663,385
- Issue date May 30, 2023
- Imagination Technologies Limited
- Sam Elliott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determination and correction of physical circuit event related erro...
- Patent number 11,630,152
- Issue date Apr 18, 2023
- International Business Machines Corporation
- Pradip Bose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trajectory-optimized test pattern generation for built-in self-test
- Patent number 11,585,853
- Issue date Feb 21, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Grzegorz Mrugalski
- G01 - MEASURING TESTING
Information Patent Grant
System and method for formal fault propagation analysis
- Patent number 11,520,963
- Issue date Dec 6, 2022
- OneSpin Solutions GmbH
- Dominik Strasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated assisted circuit validation
- Patent number 11,520,966
- Issue date Dec 6, 2022
- Tektronix, Inc.
- David Everett Burgess
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Area-aware test pattern coverage optimization
- Patent number 11,500,019
- Issue date Nov 15, 2022
- Apple Inc.
- Edgardo F. Klass
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for efficient testing of digital integrated circuits
- Patent number 11,494,537
- Issue date Nov 8, 2022
- Palo Alto Research Center Incorporated
- Aleksandar B. Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Emulation system supporting computation of four-state combinational...
- Patent number 11,461,522
- Issue date Oct 4, 2022
- Cadence Design Systems, Inc.
- Mitchell G. Poplack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
SDD ATPG using fault rules files, SDF and node slack for testing an...
- Patent number 11,461,520
- Issue date Oct 4, 2022
- Cadence Design Systems, Inc.
- Arvind Chokhani
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR SEMICONDUCTOR DEVICE INTERFACE CIRCUITRY FUNCTIONALITY A...
- Publication number 20240361386
- Publication date Oct 31, 2024
- CELERINT, LLC.
- Howard H. ROBERTS
- G01 - MEASURING TESTING
Information Patent Application
Integrating Machine Learning Delay Estimation in FPGA-Based Emulati...
- Publication number 20240094290
- Publication date Mar 21, 2024
- Synopsys, Inc.
- Yanhua Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACRO MODEL OF A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, A CIRCUIT...
- Publication number 20240012052
- Publication date Jan 11, 2024
- Rohm Co., Ltd.
- Kyoji MARUMOTO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS OF ANALYZING DATA, AND STORAGE MEDIUM
- Publication number 20230288476
- Publication date Sep 14, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Huan LU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD TO WEIGHT DEFECTS WITH CO-LOCATED MODELED FAULTS
- Publication number 20230280399
- Publication date Sep 7, 2023
- David W. Price
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INTERFACING A TESTBENCH TO CIRCUIT SIMULATION
- Publication number 20230169226
- Publication date Jun 1, 2023
- Xilinx, Inc.
- Saikat Bandyopadhyay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTS FOR INTEGRATED CIRCUIT (IC) CHIPS
- Publication number 20230143500
- Publication date May 11, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Lakshmanan Balasubramanian
- G01 - MEASURING TESTING
Information Patent Application
SIMULATION METHOD AND SYSTEM OF VERIFYING OPERATION OF SEMICONDUCTO...
- Publication number 20230097405
- Publication date Mar 30, 2023
- Samsung Electronics Co., Ltd.
- Seaeun PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR AUTOMATIC WAVEFORM ANALYSIS
- Publication number 20230074806
- Publication date Mar 9, 2023
- Yangtze Memory Technologies Co., Ltd.
- Liqiang NI
- G01 - MEASURING TESTING
Information Patent Application
EARLY DETECTION OF QUALITY CONTROL TEST FAILURES FOR MANUFACTURING...
- Publication number 20230060909
- Publication date Mar 2, 2023
- EXFO INC.
- Jonathan PLANTE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT SIMULATION TEST METHOD AND APPARATUS, DEVICE, AND MEDIUM
- Publication number 20230032066
- Publication date Feb 2, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Feng Lin
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR FORMAL FAULT PROPAGATION ANALYSIS
- Publication number 20220414306
- Publication date Dec 29, 2022
- Onespin Solutions GmbH
- Dominik Strasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS AND NON-TRANSITORY COMPUTER-READABLE STORAGE M...
- Publication number 20220413047
- Publication date Dec 29, 2022
- SILICON MOTION, INC.
- Yu-Lin JIANG
- G01 - MEASURING TESTING
Information Patent Application
VIRTUAL QUALITY CONTROL INTERPOLATION AND PROCESS FEEDBACK IN THE P...
- Publication number 20220413036
- Publication date Dec 29, 2022
- SANDISK TECHNOLOGIES LLC
- Yusuke Ikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION METHOD AND APPARATUS OF COMMUNICATION CHIP, AND DEVICE AN...
- Publication number 20220397605
- Publication date Dec 15, 2022
- MORNINGCORE TECHNOLOGY CO., CHINA
- Shanzhi CHEN
- G01 - MEASURING TESTING
Information Patent Application
MULTI-RATE SAMPLING FOR HIERARCHICAL SYSTEM ANALYSIS
- Publication number 20220390514
- Publication date Dec 8, 2022
- International Business Machines Corporation
- David Wells Winston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR EFFICIENT TESTING OF DIGITAL INTEGRATED CIRCUITS
- Publication number 20220365136
- Publication date Nov 17, 2022
- Palo Alto Research Center Incorporated
- Aleksandar B. Feldman
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC CIRCUIT SIMULATION BASED ON RANDOM TELEGRAPH SIGNAL NOISE
- Publication number 20220357390
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Chien-Ming HUNG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST AND MEASUREMENT SYSTEM
- Publication number 20220268839
- Publication date Aug 25, 2022
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
CONVERTING FORMAL VERIFICATION TESTBENCH DRIVERS WITH NONDETERMINIS...
- Publication number 20220187368
- Publication date Jun 16, 2022
- International Business Machines Corporation
- Bradley Donald Bingham
- G01 - MEASURING TESTING
Information Patent Application
MACHINE LEARNING DELAY ESTIMATION FOR EMULATION SYSTEMS
- Publication number 20220187367
- Publication date Jun 16, 2022
- Synopsys, Inc.
- Yanhua Yi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SINGLE-PASS DIAGNOSIS FOR MULTIPLE CHAIN DEFECTS
- Publication number 20220128628
- Publication date Apr 28, 2022
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Application
SUSPECT RESOLUTION FOR SCAN CHAIN DEFECT DIAGNOSIS
- Publication number 20220065932
- Publication date Mar 3, 2022
- Mentor Graphics Corporation
- Grzegorz Mrugalski
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR VERIFYING ELECTRONIC CIRCUITS
- Publication number 20220043958
- Publication date Feb 10, 2022
- BQR RELIABILITY ENGINEERING LTD.
- Yizhak BOT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC SIGNAL VERIFICATION USING A TRANSLATED SIMULATED WAVEFORM
- Publication number 20220012394
- Publication date Jan 13, 2022
- Tektronix, Inc.
- David Everett Burgess
- G01 - MEASURING TESTING
Information Patent Application
Verification of Hardware Design for Data Transformation Pipeline
- Publication number 20220004690
- Publication date Jan 6, 2022
- Imagination Technologies Limited
- Sam Elliott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AREA-AWARE TEST PATTERN COVERAGE OPTIMIZATION
- Publication number 20210356523
- Publication date Nov 18, 2021
- Apple Inc.
- Edgardo F. Klass
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR OPTIMIZING FAULT COVERAGE BASED ON OPTIMIZED...
- Publication number 20210318379
- Publication date Oct 14, 2021
- Auburn University
- Spencer Millican
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION AND CORRECTION OF PHYSICAL CIRCUIT EVENT RELATED ERRO...
- Publication number 20210270897
- Publication date Sep 2, 2021
- International Business Machines Corporation
- Pradip Bose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR SEMICONDUCTOR DEVICE INTERFACE CIRCUITRY FUNCTIONALITY A...
- Publication number 20210181252
- Publication date Jun 17, 2021
- CELERINT, LLC.
- Howard H. ROBERTS
- G01 - MEASURING TESTING

Analysis of test coverage or failure detectability

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for predicting compatibility of a new unit for an...

Integrating machine learning delay estimation in FPGA-based emulati...

Virtual quality control interpolation and process feedback in the p...

System and method for device under test (DUT) validation reuse acro...

Method for semiconductor device interface circuitry functionality a...

Tests for integrated circuit (IC) chips

Connecting random variables to coverage targets using an ensemble o...

Systems and methods of testing adverse device conditions

Test method and apparatus of communication chip, device and medium

Simulation method and system of verifying operation of semiconducto...

System and method to weight defects with co-located modeled faults

Early detection of quality control test failures for manufacturing...

Machine learning delay estimation for emulation systems

Circuit simulation test method and apparatus, device, and medium

Method and apparatus and non-transitory computer-readable storage m...

System and method for formal fault propagation analysis

Single-pass diagnosis for multiple chain defects

Parameter space reduction for device testing

Multi-rate sampling for hierarchical system analysis

System, apparatus and method for functional testing of one or more...

Converting formal verification testbench drivers with nondeterminis...

Verification of hardware design for data transformation pipeline

Determination and correction of physical circuit event related erro...

Trajectory-optimized test pattern generation for built-in self-test

System and method for formal fault propagation analysis

Automated assisted circuit validation

Area-aware test pattern coverage optimization

Method and system for efficient testing of digital integrated circuits

Emulation system supporting computation of four-state combinational...

SDD ATPG using fault rules files, SDF and node slack for testing an...

Patents Applicationslast 30 patents

METHOD FOR SEMICONDUCTOR DEVICE INTERFACE CIRCUITRY FUNCTIONALITY A...

Integrating Machine Learning Delay Estimation in FPGA-Based Emulati...

MACRO MODEL OF A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, A CIRCUIT...

METHOD AND APPARATUS OF ANALYZING DATA, AND STORAGE MEDIUM

SYSTEM AND METHOD TO WEIGHT DEFECTS WITH CO-LOCATED MODELED FAULTS

METHOD AND SYSTEM FOR INTERFACING A TESTBENCH TO CIRCUIT SIMULATION

TESTS FOR INTEGRATED CIRCUIT (IC) CHIPS

SIMULATION METHOD AND SYSTEM OF VERIFYING OPERATION OF SEMICONDUCTO...

METHODS AND SYSTEMS FOR AUTOMATIC WAVEFORM ANALYSIS

EARLY DETECTION OF QUALITY CONTROL TEST FAILURES FOR MANUFACTURING...

CIRCUIT SIMULATION TEST METHOD AND APPARATUS, DEVICE, AND MEDIUM

SYSTEM AND METHOD FOR FORMAL FAULT PROPAGATION ANALYSIS

METHOD AND APPARATUS AND NON-TRANSITORY COMPUTER-READABLE STORAGE M...

VIRTUAL QUALITY CONTROL INTERPOLATION AND PROCESS FEEDBACK IN THE P...

DETECTION METHOD AND APPARATUS OF COMMUNICATION CHIP, AND DEVICE AN...

MULTI-RATE SAMPLING FOR HIERARCHICAL SYSTEM ANALYSIS

METHOD AND SYSTEM FOR EFFICIENT TESTING OF DIGITAL INTEGRATED CIRCUITS

ELECTRONIC CIRCUIT SIMULATION BASED ON RANDOM TELEGRAPH SIGNAL NOISE

TEST AND MEASUREMENT SYSTEM

CONVERTING FORMAL VERIFICATION TESTBENCH DRIVERS WITH NONDETERMINIS...

MACHINE LEARNING DELAY ESTIMATION FOR EMULATION SYSTEMS

SINGLE-PASS DIAGNOSIS FOR MULTIPLE CHAIN DEFECTS

SUSPECT RESOLUTION FOR SCAN CHAIN DEFECT DIAGNOSIS

METHOD AND APPARATUS FOR VERIFYING ELECTRONIC CIRCUITS

ELECTRONIC SIGNAL VERIFICATION USING A TRANSLATED SIMULATED WAVEFORM

Verification of Hardware Design for Data Transformation Pipeline

AREA-AWARE TEST PATTERN COVERAGE OPTIMIZATION

SYSTEM AND METHOD FOR OPTIMIZING FAULT COVERAGE BASED ON OPTIMIZED...

DETERMINATION AND CORRECTION OF PHYSICAL CIRCUIT EVENT RELATED ERRO...

METHOD FOR SEMICONDUCTOR DEVICE INTERFACE CIRCUITRY FUNCTIONALITY A...