Apparatus or methods therefor

Industry

CPC
G01R31/2601

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2601Apparatus or methods therefor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Controlling alignment during a thermal cycle
- Patent number 12,298,328
- Issue date May 13, 2025
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Test system and test device
- Patent number 12,287,364
- Issue date Apr 29, 2025
- LEADPOWER-SEMI CO., LTD.
- Cheng-Jyun Wang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing with lead extender
- Patent number 12,270,850
- Issue date Apr 8, 2025
- Infineon Technologies AG
- Soon Lai Kho
- G01 - MEASURING TESTING
Information Patent Grant
Digital loop dual-stage source measure unit
- Patent number 12,265,115
- Issue date Apr 1, 2025
- KEITHLEY INSTRUMENTS, LLC
- Wayne C. Goeke
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor laser inspection apparatus
- Patent number 12,259,408
- Issue date Mar 25, 2025
- Mitsubishi Electric Corporation
- Yohei Mikami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus
- Patent number 12,241,926
- Issue date Mar 4, 2025
- Advantest Corporation
- Naoyoshi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Wafer metrology technologies
- Patent number 12,241,924
- Issue date Mar 4, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite intermediary device using vertical probe for wafer testing
- Patent number 12,235,313
- Issue date Feb 25, 2025
- SYU GUANG TECHNOLOGY CO., LTD.
- Kun Yu Wu
- G01 - MEASURING TESTING
Information Patent Grant
Model parameter test structures for transistors and preparation met...
- Patent number 12,224,216
- Issue date Feb 11, 2025
- Changxin Memory Technologies, Inc.
- Guochao Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate drive circuit, test device, and switching method
- Patent number 12,206,390
- Issue date Jan 21, 2025
- Sintokogio, Ltd.
- Masayoshi Takinami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Two-domain two-stage sensing front-end circuits and systems
- Patent number 12,196,801
- Issue date Jan 14, 2025
- Samsung Display Co., Ltd.
- Ali Fazli Yeknami
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for testing wafer, electronic device and storage...
- Patent number 12,181,511
- Issue date Dec 31, 2024
- Saimeite Technology Co., Ltd.
- Lincheng Han
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for testing power devices under high temperature and hig...
- Patent number 12,158,481
- Issue date Dec 3, 2024
- MAXONE SEMICONDUCTOR (SUZHOU) CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for determining characteristics of semiconducto...
- Patent number 12,158,492
- Issue date Dec 3, 2024
- FemtoMetrix, Inc.
- Ming Lei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast RF power measurement apparatus for production testing
- Patent number 12,146,935
- Issue date Nov 19, 2024
- Silicon Laboratories Inc.
- Anant Verma
- G01 - MEASURING TESTING
Information Patent Grant
Distributed control system and semiconductor inspection apparatus i...
- Patent number 12,147,374
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Kazushi Yamashina
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing apparatus
- Patent number 12,140,623
- Issue date Nov 12, 2024
- Global Unichip Corporation
- Chih-Chieh Liao
- G01 - MEASURING TESTING
Information Patent Grant
Docking device and method for coupling second devices for interface...
- Patent number 12,135,349
- Issue date Nov 5, 2024
- Turbodynamics GmbH
- Stefan Thurmaier
- G01 - MEASURING TESTING
Information Patent Grant
Light emitting device including base and base cap
- Patent number 12,126,144
- Issue date Oct 22, 2024
- Nichia Corporation
- Tomokazu Taji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device inspection apparatus
- Patent number 12,123,906
- Issue date Oct 22, 2024
- Mitsubishi Electric Corporation
- Kazuya Itose
- G01 - MEASURING TESTING
Information Patent Grant
Crack detector units and the related semiconductor dies and methods
- Patent number 12,111,346
- Issue date Oct 8, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Huan-Neng Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining material parameters of a multilayer test sample
- Patent number 12,105,136
- Issue date Oct 1, 2024
- KLA Corporation
- Alberto Cagliani
- G01 - MEASURING TESTING
Information Patent Grant
Probe-holder support and corresponding probes with facilitated moun...
- Patent number 12,099,087
- Issue date Sep 24, 2024
- Giuseppe Amelio
- G01 - MEASURING TESTING
Information Patent Grant
Conductive particle-disposed film having conductive particles dispo...
- Patent number 12,066,458
- Issue date Aug 20, 2024
- Dexerials Corporation
- Shinichi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Air blow guide member, test device unit, test device, electrical co...
- Patent number 12,066,480
- Issue date Aug 20, 2024
- Enplas Corporation
- Mineto Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Safety container for high power device testing over a range of temp...
- Patent number 12,050,243
- Issue date Jul 30, 2024
- KEITHLEY INSTRUMENTS, LLC
- Aaron Ferguson
- G01 - MEASURING TESTING
Information Patent Grant
Vertical convolute metal bellows for rotary motion, vacuum sealing,...
- Patent number 12,044,701
- Issue date Jul 23, 2024
- KLA Corporation
- Bruce Borchers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring current-voltage characteristic
- Patent number 12,038,468
- Issue date Jul 16, 2024
- Rohm Co., Ltd.
- Tatsuya Yanagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-user test instrument
- Patent number 12,038,456
- Issue date Jul 16, 2024
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Detection unit, semiconductor film layer inspection apparatus inclu...
- Patent number 12,032,012
- Issue date Jul 9, 2024
- En Vigth Co., Ltd.
- Kook Chul Moon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Pixel Comparison
- Publication number 20250164544
- Publication date May 22, 2025
- Imagination Technologies Limited
- Marcin JASINSKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME
- Publication number 20250164543
- Publication date May 22, 2025
- ATECO INC.
- Taek Seon LEE
- G01 - MEASURING TESTING
Information Patent Application
TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME
- Publication number 20250164552
- Publication date May 22, 2025
- ATECO INC.
- Taek Seon LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING SEMICONDUCTOR DEVICE, METHOD FOR PRODUCING SE...
- Publication number 20250155489
- Publication date May 15, 2025
- Mitsubishi Electric Corporation
- Akio MATSUSHITA
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20250155486
- Publication date May 15, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
TEST JIG, TESTING METHOD, AND METHOD OF MANUFACTURING SEMICONDUCTOR...
- Publication number 20250155490
- Publication date May 15, 2025
- Fuji Electric Co., Ltd.
- Mitsuru YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
Module for exchanging an interface unit, testing system with such a...
- Publication number 20250155497
- Publication date May 15, 2025
- Turbodynamics GmbH
- Florian Hartl
- G01 - MEASURING TESTING
Information Patent Application
Methods, Apparatuses and Composite Power Switch Capable of Detectin...
- Publication number 20250130267
- Publication date Apr 24, 2025
- Weltrend Semiconductor Inc.
- Hui-Yuan HSU
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST APPARATUS
- Publication number 20250130268
- Publication date Apr 24, 2025
- Samsung Electronics Co., Ltd.
- Chunghyun KIM
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Module Inspection Device
- Publication number 20250130252
- Publication date Apr 24, 2025
- Nippon Telegraph and Telephone Corporation
- Masayuki Takahashi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20250118687
- Publication date Apr 10, 2025
- Fuji Electric Co., Ltd.
- Daisuke ISOBE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE VARIATION EXTRACTION CHIP
- Publication number 20250102556
- Publication date Mar 27, 2025
- Shanghai Huali Integrated Circuit Corporation
- Pinhan CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING APPARATUS FOR POWER MODULE WITH INTEGRATED DC TEST AND WITH...
- Publication number 20250076390
- Publication date Mar 6, 2025
- Hyundai Motor Company
- Tae Woo KWANG
- G01 - MEASURING TESTING
Information Patent Application
Inspection Apparatus and Mounting Base
- Publication number 20250076232
- Publication date Mar 6, 2025
- TOKYO ELECTRON LIMITED
- Shigeru KASAI
- G01 - MEASURING TESTING
Information Patent Application
ORGANIC LIGHT-EMITTING ELEMENT, METHOD FOR EVALUATING DELAYED FLUOR...
- Publication number 20250081714
- Publication date Mar 6, 2025
- KYULUX, INC.
- Hayato KAKIZOE
- G01 - MEASURING TESTING
Information Patent Application
CHIP TURRET SORTING APPARATUS AND FORMATION METHOD THEREOF
- Publication number 20250051104
- Publication date Feb 13, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Renwei TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAST RF POWER MEASUREMENT APPARATUS FOR PRODUCTION TESTING
- Publication number 20250044393
- Publication date Feb 6, 2025
- Silicon Laboratories Inc.
- Anant Verma
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING FOR CURRENT PROPERTY OF A POWER TRANSISTOR
- Publication number 20250020712
- Publication date Jan 16, 2025
- GAN SYSTEMS INC.
- Iman ABDALI MASHHADI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR VOLTAGE DRIFT MONITORING
- Publication number 20250020710
- Publication date Jan 16, 2025
- STMicroelectronics International N.V.
- Francesco Rundo
- G01 - MEASURING TESTING
Information Patent Application
Method for monitoring a semiconductor switch for failure and invert...
- Publication number 20250020711
- Publication date Jan 16, 2025
- SEG Automotive Germany GmbH
- Nima SAADAT
- G01 - MEASURING TESTING
Information Patent Application
LIGHT EMITTING DEVICE INCLUDING BASE AND BASE CAP
- Publication number 20250015565
- Publication date Jan 9, 2025
- Nichia Corporation.
- Tomokazu TAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHORT-CIRCUIT DETECTION CIRCUIT FOR SEMICONDUCTOR SWITCH
- Publication number 20250012843
- Publication date Jan 9, 2025
- DENSO CORPORATION
- Akira TOKUMASU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR CHARACTERIZING IN PULSE MODE A III-V SEMICONDUCTOR TRANS...
- Publication number 20240410931
- Publication date Dec 12, 2024
- AMCAD Engineering
- Christophe CHARBONNIAUD
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CALIBRATION SYSTEM, INSPECTION APPARATUS, AND TEMPERATU...
- Publication number 20240402021
- Publication date Dec 5, 2024
- TOKYO ELECTRON LIMITED
- Tomohiro OTA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESUL...
- Publication number 20240393383
- Publication date Nov 28, 2024
- Advantest Corporation
- Kosuke IKEDA
- G01 - MEASURING TESTING
Information Patent Application
YIELD EVALUATION METHOD AND YIELD EVALUATION APPARATUS
- Publication number 20240377450
- Publication date Nov 14, 2024
- WINBOND ELECTRONICS CORP.
- Tzi-Wen Pan
- G01 - MEASURING TESTING
Information Patent Application
CRACK DETECTOR UNITS AND THE RELATED SEMICONDUCTOR DIES AND METHODS
- Publication number 20240369613
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- HUAN-NENG CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT SYSTEM FOR RADIO FREQUENCY MOS DEVICE MODELING AND MODE...
- Publication number 20240369612
- Publication date Nov 7, 2024
- Shanghai IC R&D Center Co., Ltd.
- Linlin LIU
- G01 - MEASURING TESTING
Information Patent Application
Probe-holder support and corresponding probes with facilitated moun...
- Publication number 20240353481
- Publication date Oct 24, 2024
- Microtest S.p.A.
- Giuseppe Amelio
- G01 - MEASURING TESTING
Information Patent Application
MOUNTING SYSTEM, AND METHODS THEREOF
- Publication number 20240337681
- Publication date Oct 10, 2024
- Ferroelectric Memory GmbH
- Michael BATHON
- H01 - BASIC ELECTRIC ELEMENTS

Apparatus or methods therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Controlling alignment during a thermal cycle

Test system and test device

Semiconductor device testing with lead extender

Digital loop dual-stage source measure unit

Semiconductor laser inspection apparatus

Test apparatus

Wafer metrology technologies

Composite intermediary device using vertical probe for wafer testing

Model parameter test structures for transistors and preparation met...

Gate drive circuit, test device, and switching method

Two-domain two-stage sensing front-end circuits and systems

Method and device for testing wafer, electronic device and storage...

Probe card for testing power devices under high temperature and hig...

Systems and methods for determining characteristics of semiconducto...

Fast RF power measurement apparatus for production testing

Distributed control system and semiconductor inspection apparatus i...

Testing apparatus

Docking device and method for coupling second devices for interface...

Light emitting device including base and base cap

Electronic device inspection apparatus

Crack detector units and the related semiconductor dies and methods

Method for determining material parameters of a multilayer test sample

Probe-holder support and corresponding probes with facilitated moun...

Conductive particle-disposed film having conductive particles dispo...

Air blow guide member, test device unit, test device, electrical co...

Safety container for high power device testing over a range of temp...

Vertical convolute metal bellows for rotary motion, vacuum sealing,...

Method for measuring current-voltage characteristic

Multi-user test instrument

Detection unit, semiconductor film layer inspection apparatus inclu...

Patents Applicationslast 30 patents

Pixel Comparison

TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME

TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME

METHOD FOR EVALUATING SEMICONDUCTOR DEVICE, METHOD FOR PRODUCING SE...

WAFER METROLOGY TECHNOLOGIES

TEST JIG, TESTING METHOD, AND METHOD OF MANUFACTURING SEMICONDUCTOR...

Module for exchanging an interface unit, testing system with such a...

Methods, Apparatuses and Composite Power Switch Capable of Detectin...

SEMICONDUCTOR TEST APPARATUS

Semiconductor Module Inspection Device

SEMICONDUCTOR DEVICE

DEVICE VARIATION EXTRACTION CHIP

TESTING APPARATUS FOR POWER MODULE WITH INTEGRATED DC TEST AND WITH...

Inspection Apparatus and Mounting Base

ORGANIC LIGHT-EMITTING ELEMENT, METHOD FOR EVALUATING DELAYED FLUOR...

CHIP TURRET SORTING APPARATUS AND FORMATION METHOD THEREOF

FAST RF POWER MEASUREMENT APPARATUS FOR PRODUCTION TESTING

WAFER TESTING FOR CURRENT PROPERTY OF A POWER TRANSISTOR

SYSTEM AND METHOD FOR VOLTAGE DRIFT MONITORING

Method for monitoring a semiconductor switch for failure and invert...

LIGHT EMITTING DEVICE INCLUDING BASE AND BASE CAP

SHORT-CIRCUIT DETECTION CIRCUIT FOR SEMICONDUCTOR SWITCH

METHOD FOR CHARACTERIZING IN PULSE MODE A III-V SEMICONDUCTOR TRANS...

TEMPERATURE CALIBRATION SYSTEM, INSPECTION APPARATUS, AND TEMPERATU...

SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESUL...

YIELD EVALUATION METHOD AND YIELD EVALUATION APPARATUS

CRACK DETECTOR UNITS AND THE RELATED SEMICONDUCTOR DIES AND METHODS

MEASUREMENT SYSTEM FOR RADIO FREQUENCY MOS DEVICE MODELING AND MODE...

Probe-holder support and corresponding probes with facilitated moun...

MOUNTING SYSTEM, AND METHODS THEREOF