Apparatus or methods therefor

Industry

CPC
G01R31/2601

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2601Apparatus or methods therefor

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Test apparatus
- Patent number 12,241,926
- Issue date Mar 4, 2025
- Advantest Corporation
- Naoyoshi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Wafer metrology technologies
- Patent number 12,241,924
- Issue date Mar 4, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite intermediary device using vertical probe for wafer testing
- Patent number 12,235,313
- Issue date Feb 25, 2025
- SYU GUANG TECHNOLOGY CO., LTD.
- Kun Yu Wu
- G01 - MEASURING TESTING
Information Patent Grant
Model parameter test structures for transistors and preparation met...
- Patent number 12,224,216
- Issue date Feb 11, 2025
- Changxin Memory Technologies, Inc.
- Guochao Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate drive circuit, test device, and switching method
- Patent number 12,206,390
- Issue date Jan 21, 2025
- Sintokogio, Ltd.
- Masayoshi Takinami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Two-domain two-stage sensing front-end circuits and systems
- Patent number 12,196,801
- Issue date Jan 14, 2025
- Samsung Display Co., Ltd.
- Ali Fazli Yeknami
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for testing wafer, electronic device and storage...
- Patent number 12,181,511
- Issue date Dec 31, 2024
- Saimeite Technology Co., Ltd.
- Lincheng Han
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for testing power devices under high temperature and hig...
- Patent number 12,158,481
- Issue date Dec 3, 2024
- MAXONE SEMICONDUCTOR (SUZHOU) CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for determining characteristics of semiconducto...
- Patent number 12,158,492
- Issue date Dec 3, 2024
- FemtoMetrix, Inc.
- Ming Lei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast RF power measurement apparatus for production testing
- Patent number 12,146,935
- Issue date Nov 19, 2024
- Silicon Laboratories Inc.
- Anant Verma
- G01 - MEASURING TESTING
Information Patent Grant
Distributed control system and semiconductor inspection apparatus i...
- Patent number 12,147,374
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Kazushi Yamashina
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing apparatus
- Patent number 12,140,623
- Issue date Nov 12, 2024
- Global Unichip Corporation
- Chih-Chieh Liao
- G01 - MEASURING TESTING
Information Patent Grant
Docking device and method for coupling second devices for interface...
- Patent number 12,135,349
- Issue date Nov 5, 2024
- Turbodynamics GmbH
- Stefan Thurmaier
- G01 - MEASURING TESTING
Information Patent Grant
Light emitting device including base and base cap
- Patent number 12,126,144
- Issue date Oct 22, 2024
- Nichia Corporation
- Tomokazu Taji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device inspection apparatus
- Patent number 12,123,906
- Issue date Oct 22, 2024
- Mitsubishi Electric Corporation
- Kazuya Itose
- G01 - MEASURING TESTING
Information Patent Grant
Crack detector units and the related semiconductor dies and methods
- Patent number 12,111,346
- Issue date Oct 8, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Huan-Neng Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining material parameters of a multilayer test sample
- Patent number 12,105,136
- Issue date Oct 1, 2024
- KLA Corporation
- Alberto Cagliani
- G01 - MEASURING TESTING
Information Patent Grant
Probe-holder support and corresponding probes with facilitated moun...
- Patent number 12,099,087
- Issue date Sep 24, 2024
- Giuseppe Amelio
- G01 - MEASURING TESTING
Information Patent Grant
Conductive particle-disposed film having conductive particles dispo...
- Patent number 12,066,458
- Issue date Aug 20, 2024
- Dexerials Corporation
- Shinichi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Air blow guide member, test device unit, test device, electrical co...
- Patent number 12,066,480
- Issue date Aug 20, 2024
- Enplas Corporation
- Mineto Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Safety container for high power device testing over a range of temp...
- Patent number 12,050,243
- Issue date Jul 30, 2024
- KEITHLEY INSTRUMENTS, LLC
- Aaron Ferguson
- G01 - MEASURING TESTING
Information Patent Grant
Vertical convolute metal bellows for rotary motion, vacuum sealing,...
- Patent number 12,044,701
- Issue date Jul 23, 2024
- KLA Corporation
- Bruce Borchers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring current-voltage characteristic
- Patent number 12,038,468
- Issue date Jul 16, 2024
- Rohm Co., Ltd.
- Tatsuya Yanagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-user test instrument
- Patent number 12,038,456
- Issue date Jul 16, 2024
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Detection unit, semiconductor film layer inspection apparatus inclu...
- Patent number 12,032,012
- Issue date Jul 9, 2024
- En Vigth Co., Ltd.
- Kook Chul Moon
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection device and substrate inspection method
- Patent number 12,032,013
- Issue date Jul 9, 2024
- Jusung Engineering Co., Ltd.
- Gu Hyun Jung
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for optical devices
- Patent number 12,025,650
- Issue date Jul 2, 2024
- Lumentum Operations LLC
- Albert Yuen
- G01 - MEASURING TESTING
Information Patent Grant
Thermoelectric device with Seebeck effect
- Patent number 12,025,648
- Issue date Jul 2, 2024
- Hutchinson
- Fabrice Chopard
- G01 - MEASURING TESTING
Information Patent Grant
Maintenance apparatus, maintenance method, and recording medium hav...
- Patent number 12,014,335
- Issue date Jun 18, 2024
- Advantest Corporation
- Hajime Sugimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor test apparatus and semiconductor test method
- Patent number 12,007,414
- Issue date Jun 11, 2024
- Mitsubishi Electric Corporation
- Yoshiyuki Ueda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING APPARATUS FOR POWER MODULE WITH INTEGRATED DC TEST AND WITH...
- Publication number 20250076390
- Publication date Mar 6, 2025
- Hyundai Motor Company
- Tae Woo KWANG
- G01 - MEASURING TESTING
Information Patent Application
Inspection Apparatus and Mounting Base
- Publication number 20250076232
- Publication date Mar 6, 2025
- TOKYO ELECTRON LIMITED
- Shigeru KASAI
- G01 - MEASURING TESTING
Information Patent Application
ORGANIC LIGHT-EMITTING ELEMENT, METHOD FOR EVALUATING DELAYED FLUOR...
- Publication number 20250081714
- Publication date Mar 6, 2025
- KYULUX, INC.
- Hayato KAKIZOE
- G01 - MEASURING TESTING
Information Patent Application
CHIP TURRET SORTING APPARATUS AND FORMATION METHOD THEREOF
- Publication number 20250051104
- Publication date Feb 13, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Renwei TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAST RF POWER MEASUREMENT APPARATUS FOR PRODUCTION TESTING
- Publication number 20250044393
- Publication date Feb 6, 2025
- Silicon Laboratories Inc.
- Anant Verma
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING FOR CURRENT PROPERTY OF A POWER TRANSISTOR
- Publication number 20250020712
- Publication date Jan 16, 2025
- GAN SYSTEMS INC.
- Iman ABDALI MASHHADI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR VOLTAGE DRIFT MONITORING
- Publication number 20250020710
- Publication date Jan 16, 2025
- STMicroelectronics International N.V.
- Francesco Rundo
- G01 - MEASURING TESTING
Information Patent Application
Method for monitoring a semiconductor switch for failure and invert...
- Publication number 20250020711
- Publication date Jan 16, 2025
- SEG Automotive Germany GmbH
- Nima SAADAT
- G01 - MEASURING TESTING
Information Patent Application
LIGHT EMITTING DEVICE INCLUDING BASE AND BASE CAP
- Publication number 20250015565
- Publication date Jan 9, 2025
- Nichia Corporation.
- Tomokazu TAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHORT-CIRCUIT DETECTION CIRCUIT FOR SEMICONDUCTOR SWITCH
- Publication number 20250012843
- Publication date Jan 9, 2025
- DENSO CORPORATION
- Akira TOKUMASU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR CHARACTERIZING IN PULSE MODE A III-V SEMICONDUCTOR TRANS...
- Publication number 20240410931
- Publication date Dec 12, 2024
- AMCAD Engineering
- Christophe CHARBONNIAUD
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CALIBRATION SYSTEM, INSPECTION APPARATUS, AND TEMPERATU...
- Publication number 20240402021
- Publication date Dec 5, 2024
- TOKYO ELECTRON LIMITED
- Tomohiro OTA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESUL...
- Publication number 20240393383
- Publication date Nov 28, 2024
- Advantest Corporation
- Kosuke IKEDA
- G01 - MEASURING TESTING
Information Patent Application
YIELD EVALUATION METHOD AND YIELD EVALUATION APPARATUS
- Publication number 20240377450
- Publication date Nov 14, 2024
- WINBOND ELECTRONICS CORP.
- Tzi-Wen Pan
- G01 - MEASURING TESTING
Information Patent Application
CRACK DETECTOR UNITS AND THE RELATED SEMICONDUCTOR DIES AND METHODS
- Publication number 20240369613
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- HUAN-NENG CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT SYSTEM FOR RADIO FREQUENCY MOS DEVICE MODELING AND MODE...
- Publication number 20240369612
- Publication date Nov 7, 2024
- Shanghai IC R&D Center Co., Ltd.
- Linlin LIU
- G01 - MEASURING TESTING
Information Patent Application
Probe-holder support and corresponding probes with facilitated moun...
- Publication number 20240353481
- Publication date Oct 24, 2024
- Microtest S.p.A.
- Giuseppe Amelio
- G01 - MEASURING TESTING
Information Patent Application
MOUNTING SYSTEM, AND METHODS THEREOF
- Publication number 20240337681
- Publication date Oct 10, 2024
- Ferroelectric Memory GmbH
- Michael BATHON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD AND CALIBRATION METHOD FOR PROBER
- Publication number 20240337678
- Publication date Oct 10, 2024
- United Microelectronics Corp.
- Huan-Chen Peng
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING CURRENT-VOLTAGE CHARACTERISTIC
- Publication number 20240329111
- Publication date Oct 3, 2024
- Rohm Co., Ltd.
- Tatsuya YANAGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Power-Semiconductor-Device Test Apparatus Facilitating Test-Connect...
- Publication number 20240310426
- Publication date Sep 19, 2024
- Qualtec Co., Ltd.
- Shigeo Sakata
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Semiconductor Device Testing with Lead Extender
- Publication number 20240302426
- Publication date Sep 12, 2024
- INFINEON TECHNOLOGIES AG
- Soon Lai Kho
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND TEST DEVICE
- Publication number 20240302427
- Publication date Sep 12, 2024
- Leadpower-semi CO., LTD.
- Cheng-Jyun WANG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING APPARATUS AND METHOD OF MANUFACTURING SEMICON...
- Publication number 20240295599
- Publication date Sep 5, 2024
- Mitsubishi Electric Corporation
- Noritsugu NOMURA
- G01 - MEASURING TESTING
Information Patent Application
Computer-Implemented Method for Optimizing a Detection Threshold of...
- Publication number 20240280626
- Publication date Aug 22, 2024
- ROBERT BOSCH GmbH
- Daniel Zander
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE
- Publication number 20240272221
- Publication date Aug 15, 2024
- FUJI CORPORATION
- Toshiyuki SAWADA
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD FOR SEMICONDUCTOR TESTING AND METHOD OF MANUFACTURING...
- Publication number 20240264219
- Publication date Aug 8, 2024
- MPI Corporation
- SHIH-CHING CHEN
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
INSPECTION DEVICE FOR OPTICAL SEMICONDUCTOR DEVICE
- Publication number 20240241169
- Publication date Jul 18, 2024
- Mitsubishi Electric Corporation
- Tomohito TANIUCHI
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLING ALIGNMENT DURING A THERMAL CYCLE
- Publication number 20240230714
- Publication date Jul 11, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST APPARATUS AND SEMICONDUCTOR TEST METHOD
- Publication number 20240219426
- Publication date Jul 4, 2024
- Mitsubishi Electric Corporation
- Yoshiyuki Ueda
- G01 - MEASURING TESTING

Apparatus or methods therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Test apparatus

Wafer metrology technologies

Composite intermediary device using vertical probe for wafer testing

Model parameter test structures for transistors and preparation met...

Gate drive circuit, test device, and switching method

Two-domain two-stage sensing front-end circuits and systems

Method and device for testing wafer, electronic device and storage...

Probe card for testing power devices under high temperature and hig...

Systems and methods for determining characteristics of semiconducto...

Fast RF power measurement apparatus for production testing

Distributed control system and semiconductor inspection apparatus i...

Testing apparatus

Docking device and method for coupling second devices for interface...

Light emitting device including base and base cap

Electronic device inspection apparatus

Crack detector units and the related semiconductor dies and methods

Method for determining material parameters of a multilayer test sample

Probe-holder support and corresponding probes with facilitated moun...

Conductive particle-disposed film having conductive particles dispo...

Air blow guide member, test device unit, test device, electrical co...

Safety container for high power device testing over a range of temp...

Vertical convolute metal bellows for rotary motion, vacuum sealing,...

Method for measuring current-voltage characteristic

Multi-user test instrument

Detection unit, semiconductor film layer inspection apparatus inclu...

Substrate inspection device and substrate inspection method

Testing apparatus for optical devices

Thermoelectric device with Seebeck effect

Maintenance apparatus, maintenance method, and recording medium hav...

Semiconductor test apparatus and semiconductor test method

Patents Applicationslast 30 patents

TESTING APPARATUS FOR POWER MODULE WITH INTEGRATED DC TEST AND WITH...

Inspection Apparatus and Mounting Base

ORGANIC LIGHT-EMITTING ELEMENT, METHOD FOR EVALUATING DELAYED FLUOR...

CHIP TURRET SORTING APPARATUS AND FORMATION METHOD THEREOF

FAST RF POWER MEASUREMENT APPARATUS FOR PRODUCTION TESTING

WAFER TESTING FOR CURRENT PROPERTY OF A POWER TRANSISTOR

SYSTEM AND METHOD FOR VOLTAGE DRIFT MONITORING

Method for monitoring a semiconductor switch for failure and invert...

LIGHT EMITTING DEVICE INCLUDING BASE AND BASE CAP

SHORT-CIRCUIT DETECTION CIRCUIT FOR SEMICONDUCTOR SWITCH

METHOD FOR CHARACTERIZING IN PULSE MODE A III-V SEMICONDUCTOR TRANS...

TEMPERATURE CALIBRATION SYSTEM, INSPECTION APPARATUS, AND TEMPERATU...

SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESUL...

YIELD EVALUATION METHOD AND YIELD EVALUATION APPARATUS

CRACK DETECTOR UNITS AND THE RELATED SEMICONDUCTOR DIES AND METHODS

MEASUREMENT SYSTEM FOR RADIO FREQUENCY MOS DEVICE MODELING AND MODE...

Probe-holder support and corresponding probes with facilitated moun...

MOUNTING SYSTEM, AND METHODS THEREOF

PROBE CARD AND CALIBRATION METHOD FOR PROBER

METHOD FOR MEASURING CURRENT-VOLTAGE CHARACTERISTIC

Power-Semiconductor-Device Test Apparatus Facilitating Test-Connect...

Semiconductor Device Testing with Lead Extender

TEST SYSTEM AND TEST DEVICE

SEMICONDUCTOR TESTING APPARATUS AND METHOD OF MANUFACTURING SEMICON...

Computer-Implemented Method for Optimizing a Detection Threshold of...

MEASURING DEVICE

CIRCUIT BOARD FOR SEMICONDUCTOR TESTING AND METHOD OF MANUFACTURING...

INSPECTION DEVICE FOR OPTICAL SEMICONDUCTOR DEVICE

CONTROLLING ALIGNMENT DURING A THERMAL CYCLE

SEMICONDUCTOR TEST APPARATUS AND SEMICONDUCTOR TEST METHOD