Apparatus or methods therefor

Industry

CPC
G01R31/2601

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2601Apparatus or methods therefor

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring dynamic on-resistance of nitride...
- Patent number 12,352,800
- Issue date Jul 8, 2025
- INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., LTD.
- Chang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing for current property of a power transistor
- Patent number 12,352,801
- Issue date Jul 8, 2025
- Infineon Technologies Canada Inc.
- Iman Abdali Mashhadi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test apparatus and semiconductor test method
- Patent number 12,345,739
- Issue date Jul 1, 2025
- Mitsubishi Electric Corporation
- Yoshiyuki Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus, manufacturing method of integrated circuit, a...
- Patent number 12,347,708
- Issue date Jul 1, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tsung-Fu Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for adapting temperatures of semiconductor compon...
- Patent number 12,339,312
- Issue date Jun 24, 2025
- Robert Bosch GmbH
- Karl Oberdieck
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing a component, method of testing the component,...
- Patent number 12,339,308
- Issue date Jun 24, 2025
- Advantest Corporation
- Frank Mielke
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection system
- Patent number 12,332,295
- Issue date Jun 17, 2025
- CHROMA ATE INC.
- Wei-Chih Chen
- G01 - MEASURING TESTING
Information Patent Grant
Controlling alignment during a thermal cycle
- Patent number 12,298,328
- Issue date May 13, 2025
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Test system and test device
- Patent number 12,287,364
- Issue date Apr 29, 2025
- LEADPOWER-SEMI CO., LTD.
- Cheng-Jyun Wang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing with lead extender
- Patent number 12,270,850
- Issue date Apr 8, 2025
- Infineon Technologies AG
- Soon Lai Kho
- G01 - MEASURING TESTING
Information Patent Grant
Digital loop dual-stage source measure unit
- Patent number 12,265,115
- Issue date Apr 1, 2025
- KEITHLEY INSTRUMENTS, LLC
- Wayne C. Goeke
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor laser inspection apparatus
- Patent number 12,259,408
- Issue date Mar 25, 2025
- Mitsubishi Electric Corporation
- Yohei Mikami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus
- Patent number 12,241,926
- Issue date Mar 4, 2025
- Advantest Corporation
- Naoyoshi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Wafer metrology technologies
- Patent number 12,241,924
- Issue date Mar 4, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite intermediary device using vertical probe for wafer testing
- Patent number 12,235,313
- Issue date Feb 25, 2025
- SYU GUANG TECHNOLOGY CO., LTD.
- Kun Yu Wu
- G01 - MEASURING TESTING
Information Patent Grant
Model parameter test structures for transistors and preparation met...
- Patent number 12,224,216
- Issue date Feb 11, 2025
- Changxin Memory Technologies, Inc.
- Guochao Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate drive circuit, test device, and switching method
- Patent number 12,206,390
- Issue date Jan 21, 2025
- Sintokogio, Ltd.
- Masayoshi Takinami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Two-domain two-stage sensing front-end circuits and systems
- Patent number 12,196,801
- Issue date Jan 14, 2025
- Samsung Display Co., Ltd.
- Ali Fazli Yeknami
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for testing wafer, electronic device and storage...
- Patent number 12,181,511
- Issue date Dec 31, 2024
- Saimeite Technology Co., Ltd.
- Lincheng Han
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for testing power devices under high temperature and hig...
- Patent number 12,158,481
- Issue date Dec 3, 2024
- MAXONE SEMICONDUCTOR (SUZHOU) CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for determining characteristics of semiconducto...
- Patent number 12,158,492
- Issue date Dec 3, 2024
- FemtoMetrix, Inc.
- Ming Lei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast RF power measurement apparatus for production testing
- Patent number 12,146,935
- Issue date Nov 19, 2024
- Silicon Laboratories Inc.
- Anant Verma
- G01 - MEASURING TESTING
Information Patent Grant
Distributed control system and semiconductor inspection apparatus i...
- Patent number 12,147,374
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Kazushi Yamashina
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing apparatus
- Patent number 12,140,623
- Issue date Nov 12, 2024
- Global Unichip Corporation
- Chih-Chieh Liao
- G01 - MEASURING TESTING
Information Patent Grant
Docking device and method for coupling second devices for interface...
- Patent number 12,135,349
- Issue date Nov 5, 2024
- Turbodynamics GmbH
- Stefan Thurmaier
- G01 - MEASURING TESTING
Information Patent Grant
Light emitting device including base and base cap
- Patent number 12,126,144
- Issue date Oct 22, 2024
- Nichia Corporation
- Tomokazu Taji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device inspection apparatus
- Patent number 12,123,906
- Issue date Oct 22, 2024
- Mitsubishi Electric Corporation
- Kazuya Itose
- G01 - MEASURING TESTING
Information Patent Grant
Crack detector units and the related semiconductor dies and methods
- Patent number 12,111,346
- Issue date Oct 8, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Huan-Neng Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining material parameters of a multilayer test sample
- Patent number 12,105,136
- Issue date Oct 1, 2024
- KLA Corporation
- Alberto Cagliani
- G01 - MEASURING TESTING
Information Patent Grant
Probe-holder support and corresponding probes with facilitated moun...
- Patent number 12,099,087
- Issue date Sep 24, 2024
- Giuseppe Amelio
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DIE AND WAFER BONDING CRACK DETECTOR STRUCTURES AND M...
- Publication number 20250239495
- Publication date Jul 24, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- Ming Jun Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR EVALUATING INFLUENCE OF PROCESS ON SEMICON...
- Publication number 20250233027
- Publication date Jul 17, 2025
- SK HYNIX INC.
- Seong Joo Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING SEMICONDUCTOR MODULES
- Publication number 20250224438
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Sunhee Kim
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20250224423
- Publication date Jul 10, 2025
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE, INSPECTION METHOD, AND PROGRAM
- Publication number 20250216438
- Publication date Jul 3, 2025
- Kabushiki Kaisha Toshiba
- Ryusei MASUDA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD FOR LIGHT EMITTING ELEMENT, MANUFACTURING METHOD...
- Publication number 20250208189
- Publication date Jun 26, 2025
- SAMSUNG DISPLAY CO., LTD.
- Chan Woo JOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System-Level Testing of a Processing Device Incorporated in a Silic...
- Publication number 20250208210
- Publication date Jun 26, 2025
- Google LLC
- Bhaskar Narayana Talatam
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF THE TEMPERATURE DEPENDENCY OF A FORWARD RESISTANCE
- Publication number 20250172606
- Publication date May 29, 2025
- ZF Friedrichshafen AG
- Fabian Gross
- B60 - VEHICLES IN GENERAL
Information Patent Application
Pixel Comparison
- Publication number 20250164544
- Publication date May 22, 2025
- Imagination Technologies Limited
- Marcin JASINSKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME
- Publication number 20250164543
- Publication date May 22, 2025
- ATECO INC.
- Taek Seon LEE
- G01 - MEASURING TESTING
Information Patent Application
TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME
- Publication number 20250164552
- Publication date May 22, 2025
- ATECO INC.
- Taek Seon LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING SEMICONDUCTOR DEVICE, METHOD FOR PRODUCING SE...
- Publication number 20250155489
- Publication date May 15, 2025
- Mitsubishi Electric Corporation
- Akio MATSUSHITA
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20250155486
- Publication date May 15, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
TEST JIG, TESTING METHOD, AND METHOD OF MANUFACTURING SEMICONDUCTOR...
- Publication number 20250155490
- Publication date May 15, 2025
- Fuji Electric Co., Ltd.
- Mitsuru YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
Module for exchanging an interface unit, testing system with such a...
- Publication number 20250155497
- Publication date May 15, 2025
- Turbodynamics GmbH
- Florian Hartl
- G01 - MEASURING TESTING
Information Patent Application
Methods, Apparatuses and Composite Power Switch Capable of Detectin...
- Publication number 20250130267
- Publication date Apr 24, 2025
- Weltrend Semiconductor Inc.
- Hui-Yuan HSU
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST APPARATUS
- Publication number 20250130268
- Publication date Apr 24, 2025
- Samsung Electronics Co., Ltd.
- Chunghyun KIM
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Module Inspection Device
- Publication number 20250130252
- Publication date Apr 24, 2025
- Nippon Telegraph and Telephone Corporation
- Masayuki Takahashi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20250118687
- Publication date Apr 10, 2025
- Fuji Electric Co., Ltd.
- Daisuke ISOBE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE VARIATION EXTRACTION CHIP
- Publication number 20250102556
- Publication date Mar 27, 2025
- Shanghai Huali Integrated Circuit Corporation
- Pinhan CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING APPARATUS FOR POWER MODULE WITH INTEGRATED DC TEST AND WITH...
- Publication number 20250076390
- Publication date Mar 6, 2025
- Hyundai Motor Company
- Tae Woo KWANG
- G01 - MEASURING TESTING
Information Patent Application
Inspection Apparatus and Mounting Base
- Publication number 20250076232
- Publication date Mar 6, 2025
- TOKYO ELECTRON LIMITED
- Shigeru KASAI
- G01 - MEASURING TESTING
Information Patent Application
ORGANIC LIGHT-EMITTING ELEMENT, METHOD FOR EVALUATING DELAYED FLUOR...
- Publication number 20250081714
- Publication date Mar 6, 2025
- KYULUX, INC.
- Hayato KAKIZOE
- G01 - MEASURING TESTING
Information Patent Application
CHIP TURRET SORTING APPARATUS AND FORMATION METHOD THEREOF
- Publication number 20250051104
- Publication date Feb 13, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Renwei TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAST RF POWER MEASUREMENT APPARATUS FOR PRODUCTION TESTING
- Publication number 20250044393
- Publication date Feb 6, 2025
- Silicon Laboratories Inc.
- Anant Verma
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING FOR CURRENT PROPERTY OF A POWER TRANSISTOR
- Publication number 20250020712
- Publication date Jan 16, 2025
- GAN SYSTEMS INC.
- Iman ABDALI MASHHADI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR VOLTAGE DRIFT MONITORING
- Publication number 20250020710
- Publication date Jan 16, 2025
- STMicroelectronics International N.V.
- Francesco Rundo
- G01 - MEASURING TESTING
Information Patent Application
Method for monitoring a semiconductor switch for failure and invert...
- Publication number 20250020711
- Publication date Jan 16, 2025
- SEG Automotive Germany GmbH
- Nima SAADAT
- G01 - MEASURING TESTING
Information Patent Application
LIGHT EMITTING DEVICE INCLUDING BASE AND BASE CAP
- Publication number 20250015565
- Publication date Jan 9, 2025
- Nichia Corporation.
- Tomokazu TAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHORT-CIRCUIT DETECTION CIRCUIT FOR SEMICONDUCTOR SWITCH
- Publication number 20250012843
- Publication date Jan 9, 2025
- DENSO CORPORATION
- Akira TOKUMASU
- H03 - BASIC ELECTRONIC CIRCUITRY

Apparatus or methods therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus and method for measuring dynamic on-resistance of nitride...

Wafer testing for current property of a power transistor

Semiconductor test apparatus and semiconductor test method

Inspection apparatus, manufacturing method of integrated circuit, a...

Method and device for adapting temperatures of semiconductor compon...

Apparatus for testing a component, method of testing the component,...

Wafer inspection system

Controlling alignment during a thermal cycle

Test system and test device

Semiconductor device testing with lead extender

Digital loop dual-stage source measure unit

Semiconductor laser inspection apparatus

Test apparatus

Wafer metrology technologies

Composite intermediary device using vertical probe for wafer testing

Model parameter test structures for transistors and preparation met...

Gate drive circuit, test device, and switching method

Two-domain two-stage sensing front-end circuits and systems

Method and device for testing wafer, electronic device and storage...

Probe card for testing power devices under high temperature and hig...

Systems and methods for determining characteristics of semiconducto...

Fast RF power measurement apparatus for production testing

Distributed control system and semiconductor inspection apparatus i...

Testing apparatus

Docking device and method for coupling second devices for interface...

Light emitting device including base and base cap

Electronic device inspection apparatus

Crack detector units and the related semiconductor dies and methods

Method for determining material parameters of a multilayer test sample

Probe-holder support and corresponding probes with facilitated moun...

Patents Applicationslast 30 patents

SEMICONDUCTOR DIE AND WAFER BONDING CRACK DETECTOR STRUCTURES AND M...

METHOD AND APPARATUS FOR EVALUATING INFLUENCE OF PROCESS ON SEMICON...

TESTING SEMICONDUCTOR MODULES

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

INSPECTION DEVICE, INSPECTION METHOD, AND PROGRAM

INSPECTION METHOD FOR LIGHT EMITTING ELEMENT, MANUFACTURING METHOD...

System-Level Testing of a Processing Device Incorporated in a Silic...

DETERMINATION OF THE TEMPERATURE DEPENDENCY OF A FORWARD RESISTANCE

Pixel Comparison

TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME

TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME

METHOD FOR EVALUATING SEMICONDUCTOR DEVICE, METHOD FOR PRODUCING SE...

WAFER METROLOGY TECHNOLOGIES

TEST JIG, TESTING METHOD, AND METHOD OF MANUFACTURING SEMICONDUCTOR...

Module for exchanging an interface unit, testing system with such a...

Methods, Apparatuses and Composite Power Switch Capable of Detectin...

SEMICONDUCTOR TEST APPARATUS

Semiconductor Module Inspection Device

SEMICONDUCTOR DEVICE

DEVICE VARIATION EXTRACTION CHIP

TESTING APPARATUS FOR POWER MODULE WITH INTEGRATED DC TEST AND WITH...

Inspection Apparatus and Mounting Base

ORGANIC LIGHT-EMITTING ELEMENT, METHOD FOR EVALUATING DELAYED FLUOR...

CHIP TURRET SORTING APPARATUS AND FORMATION METHOD THEREOF

FAST RF POWER MEASUREMENT APPARATUS FOR PRODUCTION TESTING

WAFER TESTING FOR CURRENT PROPERTY OF A POWER TRANSISTOR

SYSTEM AND METHOD FOR VOLTAGE DRIFT MONITORING

Method for monitoring a semiconductor switch for failure and invert...

LIGHT EMITTING DEVICE INCLUDING BASE AND BASE CAP

SHORT-CIRCUIT DETECTION CIRCUIT FOR SEMICONDUCTOR SWITCH