Membership
Tour
Register
Log in
Apparatus or methods therefor
Follow
Industry
CPC
G01R31/2601
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/2601
Apparatus or methods therefor
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
System for testing an integrated circuit of a device and its method...
Patent number
11,977,098
Issue date
May 7, 2024
AEHR Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Grant
Pull out-assisting linkage device for test load board of automatic...
Patent number
11,977,111
Issue date
May 7, 2024
Zhijie Bao
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus having a contactor for inspecting electrical c...
Patent number
11,965,911
Issue date
Apr 23, 2024
Kabushiki Kaisha Nihon Micronics
Satoshi Narita
G01 - MEASURING TESTING
Information
Patent Grant
Switching matrix system and operating method thereof for semiconduc...
Patent number
11,953,518
Issue date
Apr 9, 2024
Star Technologies, Inc.
Choon Leong Lou
G01 - MEASURING TESTING
Information
Patent Grant
Test device and test method thereof
Patent number
11,953,537
Issue date
Apr 9, 2024
YUNGU (GU'AN) TECHNOLOGY CO., LTD.
Zhaoyang Xi
G01 - MEASURING TESTING
Information
Patent Grant
Inspection jig, and inspection device
Patent number
11,933,837
Issue date
Mar 19, 2024
Nidec-Read Corporation
Minoru Kato
G01 - MEASURING TESTING
Information
Patent Grant
Test method, adjustment method, test system, and storage medium for...
Patent number
11,935,797
Issue date
Mar 19, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Xiaodong Luo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor wafer evaluation apparatus and semiconductor wafer ma...
Patent number
11,906,569
Issue date
Feb 20, 2024
Showa Denko K.K.
Koichi Murata
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Parasitic capacitance detection method, memory and readable storage...
Patent number
11,867,745
Issue date
Jan 9, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Shibing Qian
G01 - MEASURING TESTING
Information
Patent Grant
Techniques for isolating interfaces while testing semiconductor dev...
Patent number
11,867,744
Issue date
Jan 9, 2024
NVIDIA Corporation
Animesh Khare
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Circuit board for semiconductor test
Patent number
11,852,679
Issue date
Dec 26, 2023
MPI Corporation
Shih-Ching Chen
G01 - MEASURING TESTING
Information
Patent Grant
Electrical test structure, semiconductor structure and electrical t...
Patent number
11,854,915
Issue date
Dec 26, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
Hai Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pump and probe type second harmonic generation metrology
Patent number
11,821,911
Issue date
Nov 21, 2023
FemtoMetrix, Inc.
Viktor Koldiaev
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device for testing components under elevated gas pressure
Patent number
11,815,542
Issue date
Nov 14, 2023
Rainer Gaggl
G01 - MEASURING TESTING
Information
Patent Grant
Lifetime estimating system and method for heating source, and inspe...
Patent number
11,796,400
Issue date
Oct 24, 2023
Tokyo Electron Limited
Masahito Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for semiconductor adaptive testing using inline...
Patent number
11,798,827
Issue date
Oct 24, 2023
KLA Corporation
Robert J. Rathert
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Connecting device for inspection
Patent number
11,762,008
Issue date
Sep 19, 2023
Kabushiki Kaisha Nihon Micronics
Minoru Sato
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and analyzing method thereof
Patent number
11,754,614
Issue date
Sep 12, 2023
Taiwan Semiconductor Manufacturing Company Ltd.
Wei-Jhih Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for manufacturing electronic apparatus, adhesive film for ma...
Patent number
11,747,388
Issue date
Sep 5, 2023
Mitsui Chemicals Tohcello, Inc.
Eiji Hayashishita
G01 - MEASURING TESTING
Information
Patent Grant
Temperature controlled high power tuner
Patent number
11,742,833
Issue date
Aug 29, 2023
Christos Tsironis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Two-port on-wafer calibration piece circuit model and method for de...
Patent number
11,733,298
Issue date
Aug 22, 2023
THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
Yibang Wang
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor fabricating apparatus including a probe station
Patent number
11,733,269
Issue date
Aug 22, 2023
SK Hynix Inc.
Jun-Kyu Cho
G01 - MEASURING TESTING
Information
Patent Grant
Substrate inspection device and substrate inspection method
Patent number
11,726,134
Issue date
Aug 15, 2023
JUSUNG ENGINEERING CO., LTD.
Gu Hyun Jung
G01 - MEASURING TESTING
Information
Patent Grant
Connecting device for connecting an electrical device under test to...
Patent number
11,726,110
Issue date
Aug 15, 2023
Jabil Circuit (Singapore) Pte. Ltd.
Xiang-Lin Xiang
G01 - MEASURING TESTING
Information
Patent Grant
Two-domain two-stage sensing front-end circuits and systems
Patent number
11,719,738
Issue date
Aug 8, 2023
Samsung Display Co., Ltd.
Ali Fazli Yeknami
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Board-like connector, dual-arm bridge of board-like connector, and...
Patent number
11,699,871
Issue date
Jul 11, 2023
CHUNGHWA PRECISION TEST TECH. CO., LTD.
Kai-Chieh Hsieh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test head assembly for semiconductor device
Patent number
11,693,043
Issue date
Jul 4, 2023
Powertech Technology Inc.
Ying-Tang Chao
G01 - MEASURING TESTING
Information
Patent Grant
Probe device, test device, and test method for semiconductor device
Patent number
11,693,030
Issue date
Jul 4, 2023
Samsung Electronics Co., Ltd.
Hyungmin Jin
G01 - MEASURING TESTING
Information
Patent Grant
Light emitting device including base and base cap
Patent number
11,695,255
Issue date
Jul 4, 2023
Nichia Corporation
Tomokazu Taji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for online monitoring of health status of insulat...
Patent number
11,656,266
Issue date
May 23, 2023
WUHAN UNIVERSITY
Yigang He
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Handling device for transporting interface units for a test device...
Publication number
20240153804
Publication date
May 9, 2024
Turbodynamics GmbH
Stefan Thurmaier
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMPOSITE INTERMEDIARY DEVICE USING VERTICAL PROBE FOR WAFER TESTING
Publication number
20240151764
Publication date
May 9, 2024
SYU GUANG TECHNOLOGY CO., LTD.
KUN YU WU
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR TESTING AND EVALUATING SHORT-CIRCUIT WITHSTAND CAPABILIT...
Publication number
20240142546
Publication date
May 2, 2024
CHONGQING UNIVERSITY
Hui LI
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE TESTING
Publication number
20240142512
Publication date
May 2, 2024
TEXAS INSTRUMENTS INCORPORATED
Zhi Peng Feng
G01 - MEASURING TESTING
Information
Patent Application
TEST DEVICE FOR DETERMINING AN EFFECTIVE WORK FUNCTION, METHOD OF M...
Publication number
20240118332
Publication date
Apr 11, 2024
SK HYNIX INC.
Gyeong Ho HYUN
G01 - MEASURING TESTING
Information
Patent Application
SYNCHRONOUS SUBSTRATE TRANSPORT AND ELECTRICAL PROBING
Publication number
20240112935
Publication date
Apr 4, 2024
Photon Dynamics, Inc.
Neil Dang Nguyen
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPO...
Publication number
20240094278
Publication date
Mar 21, 2024
FemtoMetrix, Inc.
Anatoly A. Shtykov
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR NON-INVASIVE, NON-INTRUSIVE, AND UN-GROUND...
Publication number
20240085470
Publication date
Mar 14, 2024
FemtoMetrix, Inc.
Timothy M. Wong
G01 - MEASURING TESTING
Information
Patent Application
FAST RF POWER MEASUREMENT APPARATUS FOR PRODUCTION TESTING
Publication number
20240069140
Publication date
Feb 29, 2024
Silicon Laboratories Inc.
Anant Verma
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC VERTICAL SIGNAL CALIBRATION IN A TEST AND MEASUREMENT INSTR...
Publication number
20240036143
Publication date
Feb 1, 2024
Tektronix, Inc.
Shubha B
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MONITORING A SEMICONDUCTOR COMPONENT
Publication number
20240019482
Publication date
Jan 18, 2024
Robert Bosch GmbH
Daniel Monteiro Diniz Reis
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR STRUCTURE FOR INSPECTION
Publication number
20240014081
Publication date
Jan 11, 2024
ROHM CO., LTD.
Toshiro TAKAO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONTACT PIN AND TEST SOCKET HAVING THE SAME
Publication number
20240003938
Publication date
Jan 4, 2024
LST Co., Ltd
Gwanhyung LEE
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR DETERMINING EXISTENCE OF DAMAGE IN SEMICONDUCTOR DEVICE...
Publication number
20230369244
Publication date
Nov 16, 2023
MELLANOX TECHNOLOGIES LTD.
Allan GREEN-PETERSEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SUBSTRATE INSPECTION DEVICE AND SUBSTRATE INSPECTION METHOD
Publication number
20230341454
Publication date
Oct 26, 2023
JUSUNG ENGINEERING CO., LTD.
Gu Hyun JUNG
G01 - MEASURING TESTING
Information
Patent Application
GATE DRIVE CIRCUIT, TEST DEVICE, AND SWITCHING METHOD
Publication number
20230318592
Publication date
Oct 5, 2023
SINTOKOGIO, LTD.
Masayoshi TAKINAMI
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
DISTRIBUTED CONTROL SYSTEM AND SEMICONDUCTOR INSPECTION APPARATUS I...
Publication number
20230315673
Publication date
Oct 5, 2023
Hitachi High-Tech Corporation
Kazushi YAMASHINA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CRACK DETECTOR UNITS AND THE RELATED SEMICONDUCTOR DIES AND METHODS
Publication number
20230296659
Publication date
Sep 21, 2023
Taiwan Semiconductor Manufacturing company Ltd.
HUAN-NENG CHEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DIGITAL LOOP DUAL-STAGE SOURCE MEASURE UNIT
Publication number
20230296660
Publication date
Sep 21, 2023
KEITHLEY INSTRUMENTS, LLC
Wayne C. Goeke
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS, MANUFACTURING METHOD OF INTEGRATED CIRCUIT, A...
Publication number
20230298917
Publication date
Sep 21, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Tsung-Fu Tsai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LIGHT EMITTING DEVICE INCLUDING BASE AND BASE CAP
Publication number
20230291181
Publication date
Sep 14, 2023
Nichia Corporation.
Tomokazu TAJI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR LASER INSPECTION APPARATUS
Publication number
20230273241
Publication date
Aug 31, 2023
Mitsubishi Electric Corporation
Yohei MIKAMI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHIP REMOVING APPARATUS FOR REPAIR PROCESS OF MICRO-LED DISPLAY
Publication number
20230266379
Publication date
Aug 24, 2023
LG ELECTRONICS INC.
Inbum YANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
A PROBE CARD FOR TESTING POWER DEVICES UNDER HIGH TEMPERATURE AND H...
Publication number
20230258690
Publication date
Aug 17, 2023
MAXONE SEMICONDUCTOR CO., LTD.
Liangyu ZHAO
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD FOR CONNECTING TO CONTACT PADS CONFIGURED TO ACT AS PROB...
Publication number
20230253270
Publication date
Aug 10, 2023
Skyworks Solutions, Inc.
Guillaume Alexandre Blin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND DEVICE FOR ADAPTING TEMPERATURES OF SEMICONDUCTOR COMPO...
Publication number
20230228810
Publication date
Jul 20, 2023
ROBERT BOSCH GmbH
Karl Oberdieck
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR TESTING WAFER, ELECTRONIC DEVICE AND STORAGE...
Publication number
20230213573
Publication date
Jul 6, 2023
Saimeite Technology Co., Ltd.
Lincheng HAN
G01 - MEASURING TESTING
Information
Patent Application
A probe-holder support and corresponding probes with facilitated mo...
Publication number
20230213576
Publication date
Jul 6, 2023
MICROTEST S.R.L.
GIUSEPPE AMELIO
G01 - MEASURING TESTING
Information
Patent Application
TESTING APPARATUS AND TESTING METHOD FOR A/D CONVERTER
Publication number
20230176107
Publication date
Jun 8, 2023
ROHM CO., LTD.
Keno SATO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHO...
Publication number
20230168277
Publication date
Jun 1, 2023
AEHR TEST SYSTEMS
Scott E. Lindsey
G01 - MEASURING TESTING