Apparatus therefor

Industry

CPC
G01R31/2806

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2806Apparatus therefor

Industries

Patents Grantslast 30 patents

Information Patent Grant
Sensor device for detecting electrical defects based on resonance f...
- Patent number 12,055,582
- Issue date Aug 6, 2024
- Keysight Technologies, Inc.
- Tie Qiu
- G01 - MEASURING TESTING
Information Patent Grant
Wireless electronic-control system
- Patent number 12,000,887
- Issue date Jun 4, 2024
- Lam Research Corporation
- Christopher-James Parker
- G01 - MEASURING TESTING
Information Patent Grant
Functional tester for printed circuit boards, and associated system...
- Patent number 11,686,759
- Issue date Jun 27, 2023
- CheckSum, LLC
- Jonathan Allen Feucht
- G01 - MEASURING TESTING
Information Patent Grant
Marking device for marking circuit boards tested by means of a test...
- Patent number 11,622,450
- Issue date Apr 4, 2023
- Ingun Prüfmittelbau GmbH
- Bernd Boscher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Through-silicon via crack detecting apparatus, detecting method, an...
- Patent number 11,531,057
- Issue date Dec 20, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- You-Hsien Lin
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting device of display panel and inspecting method of display...
- Patent number 11,328,637
- Issue date May 10, 2022
- Samsung Display Co., Ltd.
- Dae Hong Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for electrical testing of an electrical assembly...
- Patent number 11,320,477
- Issue date May 3, 2022
- ATEIP GMBH
- Ulrich Pohl
- G01 - MEASURING TESTING
Information Patent Grant
Functional tester for printed circuit boards, and associated system...
- Patent number 11,262,396
- Issue date Mar 1, 2022
- CheckSum, LLC
- Jonathan Allen Feucht
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing a device-under-test
- Patent number 11,255,898
- Issue date Feb 22, 2022
- Rohde & Schwarz GmbH & Co. KG
- Thomas Winkler
- G01 - MEASURING TESTING
Information Patent Grant
Method for identification of proper probe placement on printed circ...
- Patent number 11,181,549
- Issue date Nov 23, 2021
- International Business Machines Corporation
- Jason T. Albert
- G01 - MEASURING TESTING
Information Patent Grant
Automatic circuit board test system and automatic circuit board tes...
- Patent number 11,162,997
- Issue date Nov 2, 2021
- Cheng Uei Precision Industry Co., Ltd.
- James Cheng Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection device and inspection method for inspecting connected pa...
- Patent number 11,143,695
- Issue date Oct 12, 2021
- Denso Corporation
- Hisashi Kato
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus with projected user interface
- Patent number 10,983,144
- Issue date Apr 20, 2021
- Rohde & Schwarz GmbH & Co. KG
- Bernhard Sterzbach
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test probe and apparatus for testing printed circuit board
- Patent number 10,718,807
- Issue date Jul 21, 2020
- BOE Technology Group Co., Ltd.
- Kai Wang
- G01 - MEASURING TESTING
Information Patent Grant
Test system and method for measuring beam characteristics
- Patent number 10,677,831
- Issue date Jun 9, 2020
- Rohde & Schwarz GmbH & Co. KG
- Corbett Rowell
- G01 - MEASURING TESTING
Information Patent Grant
Granular dynamic test systems and methods
- Patent number 10,545,189
- Issue date Jan 28, 2020
- NVIDIA Corporation
- Milind Sonawane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test interface with access across isolation barrier
- Patent number 10,488,456
- Issue date Nov 26, 2019
- Silicon Laboratories Inc.
- Ernest T. Stroud
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board testing device and chassis for same
- Patent number 10,481,197
- Issue date Nov 19, 2019
- NANNING FUGUI PRECISION INDUSTRIAL CO., LTD.
- Sheng-Yen Lin
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic independent test partition clock
- Patent number 10,473,720
- Issue date Nov 12, 2019
- NVIDIA Corporation
- Pavan Kumar Datla Jagannadha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for dynamic standard test access (DSTA) for a log...
- Patent number 10,451,676
- Issue date Oct 22, 2019
- NVIDIA Corporation
- Milind Sonawane
- G01 - MEASURING TESTING
Information Patent Grant
Independent test partition clock coordination across multiple test...
- Patent number 10,444,280
- Issue date Oct 15, 2019
- NVIDIA Corporation
- Dheepakkumaran Jayaraman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Printed circuit board test coupon for electrical testing during the...
- Patent number 10,379,153
- Issue date Aug 13, 2019
- Greater Asia Pacific Limited
- Robert Neves
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for introspection and annotation of electronic circuit desig...
- Patent number 10,380,311
- Issue date Aug 13, 2019
- Massachusetts Institute of Technology
- Pragun Goyal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for identification of proper probe placement on printed circ...
- Patent number 10,371,718
- Issue date Aug 6, 2019
- International Business Machines Corporation
- Jason T. Albert
- G01 - MEASURING TESTING
Information Patent Grant
Scan system interface (SSI) module
- Patent number 10,317,463
- Issue date Jun 11, 2019
- NVIDIA Corporation
- Milind Sonawane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test partition external input/output interface control for test par...
- Patent number 10,281,524
- Issue date May 7, 2019
- NVIDIA Corporation
- Sailendra Chadalavda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing device
- Patent number 10,247,771
- Issue date Apr 2, 2019
- Fu Tai Hua Industry (Shenzhen) Co., Ltd.
- Xing Duan
- G01 - MEASURING TESTING
Information Patent Grant
Test system and method
- Patent number 10,241,146
- Issue date Mar 26, 2019
- Advantest Corporation
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Grant
Method for managing assembling process of electrical product
- Patent number 10,234,489
- Issue date Mar 19, 2019
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Norihiro Suzuki
- G05 - CONTROLLING REGULATING
Information Patent Grant
Conveying arrangement for testing system
- Patent number 10,173,843
- Issue date Jan 8, 2019
- JOT Automation Oy
- Mika Puttonen
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR TIN WHISKER ISOLATION AND DETECTION
- Publication number 20240219450
- Publication date Jul 4, 2024
- International Business Machines Corporation
- MATTHEW DOYLE
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND TEST SYSTEM FOR SEMICONDUCTOR DEVICES
- Publication number 20240175912
- Publication date May 30, 2024
- Samsung Electronics Co., Ltd.
- Seong Seob SHIN
- G01 - MEASURING TESTING
Information Patent Application
PRODUCT LINE TESTING METHOD AND SYSTEM
- Publication number 20240103064
- Publication date Mar 28, 2024
- Luxsan Technology (Kunshan) Co., Ltd.
- Junfeng YANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD, SYSTEM AND PROBE FOR MEASURING AND VISUALIZING VALUES OF AN...
- Publication number 20230417821
- Publication date Dec 28, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Gerd BRESSER
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE FOR DETECTING ELECTRICAL DEFECTS BASED ON RESONANCE F...
- Publication number 20230136914
- Publication date May 4, 2023
- KEYSIGHT TECHNOLOGIES, INC.
- Tie Qiu
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL TESTER FOR PRINTED CIRCUIT BOARDS, AND ASSOCIATED SYSTEM...
- Publication number 20220236315
- Publication date Jul 28, 2022
- CheckSum, LLC
- Jonathan Allen Feucht
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS AND NON-TRANSITORY COMPUTER READAB...
- Publication number 20220178986
- Publication date Jun 9, 2022
- FUJIFILM Business Innovation Corp.
- Yuta YAMAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WIRELESS ELECTRONIC-CONTROL SYSTEM
- Publication number 20220011364
- Publication date Jan 13, 2022
- LAM RESEARCH CORPORATION
- Christopher-James Parker
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL TESTING DEVICE AND SIGNAL TESTING METHOD
- Publication number 20210373069
- Publication date Dec 2, 2021
- Wiwynn Corporation
- Kuan-Wei Chen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING A DEVICE-UNDER-TEST
- Publication number 20210349142
- Publication date Nov 11, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Thomas WINKLER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ELECTRICAL TESTING OF AN ELECTRICAL ASSEMBLY
- Publication number 20210181248
- Publication date Jun 17, 2021
- ATEIP GMBH
- Ulrich POHL
- G01 - MEASURING TESTING
Information Patent Application
MARKING DEVICE FOR MARKING CIRCUIT BOARDS TESTED BY MEANS OF A TEST...
- Publication number 20210136920
- Publication date May 6, 2021
- Ingun Prüfmittelbau GmbH
- Bernd Boscher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THROUGH-SILICON VIA CRACK DETECTING APPARATUS, DETECTING METHOD, AN...
- Publication number 20210088576
- Publication date Mar 25, 2021
- Changxin Memory Technologies, Inc.
- You-Hsien LIN
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC CIRCUIT BOARD TEST SYSTEM AND AUTOMATIC CIRCUIT BOARD TES...
- Publication number 20210033661
- Publication date Feb 4, 2021
- Cheng Uei Precision Industry Co., LTD.
- James Cheng Lee
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING DEVICE OF DISPLAY PANEL AND INSPECTING METHOD OF DISPLAY...
- Publication number 20200135073
- Publication date Apr 30, 2020
- SAMSUNG DISPLAY CO., LTD.
- Dae Hong KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FUNCTIONAL TESTER FOR PRINTED CIRCUIT BOARDS, AND ASSOCIATED SYSTEM...
- Publication number 20200033396
- Publication date Jan 30, 2020
- CheckSum, LLC
- Jonathan Allen Feucht
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20200025819
- Publication date Jan 23, 2020
- Toyota Jidosha Kabushiki Kaisha
- Hisashi KATO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IDENTIFICATION OF PROPER PROBE PLACEMENT ON PRINTED CIRC...
- Publication number 20190285665
- Publication date Sep 19, 2019
- International Business Machines Corporation
- Jason T. Albert
- G01 - MEASURING TESTING
Information Patent Application
TEST PROBE AND APPARATUS FOR TESTING PRINTED CIRCUIT BOARD
- Publication number 20190011494
- Publication date Jan 10, 2019
- BOE TECHNOLOGY GROUP CO., LTD.
- Kai Wang
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND METHOD FOR MEASURING BEAM CHARACTERISTICS
- Publication number 20180340967
- Publication date Nov 29, 2018
- ROHDE & SCHWARZ GMBH & CO. KG
- Corbett ROWELL
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND METHOD
- Publication number 20180313889
- Publication date Nov 1, 2018
- Advantest Corporation
- Mei-Mei SU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IDENTIFICATION OF PROPER PROBE PLACEMENT ON PRINTED CIRC...
- Publication number 20180136255
- Publication date May 17, 2018
- International Business Machines Corporation
- Jason T. Albert
- G01 - MEASURING TESTING
Information Patent Application
TEST FIXTURE
- Publication number 20180095109
- Publication date Apr 5, 2018
- Teradyne, Inc.
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND COMPUTER PROGRAM PRODUCT FOR PERFORMING COMPREHENSIVE FU...
- Publication number 20180059169
- Publication date Mar 1, 2018
- Huntron, Inc.
- Alan Howard
- G01 - MEASURING TESTING
Information Patent Application
TEST PARTITION EXTERNAL INPUT/OUTPUT INTERFACE CONTROL
- Publication number 20170115338
- Publication date Apr 27, 2017
- Sailendra Chadalavda
- G01 - MEASURING TESTING
Information Patent Application
PRINTED CIRCUIT BOARDS HAVING BLIND VIAS, METHOD OF TESTING ELECTRI...
- Publication number 20160351534
- Publication date Dec 1, 2016
- SK HYNIX INC.
- Ki Yong LEE
- G01 - MEASURING TESTING
Information Patent Application
System for Introspection and Annotation of Electronic Circuit Desig...
- Publication number 20160350472
- Publication date Dec 1, 2016
- Massachusetts Institute of Technology
- Pragun Goyal
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD TESTING APPARATUS AND CIRCUIT BOARD TESTING METHOD
- Publication number 20160103172
- Publication date Apr 14, 2016
- NIDEC-READ CORPORATION
- Munehiro Yamashita
- G01 - MEASURING TESTING
Information Patent Application
TEST CONTROL DEVICE AND METHOD FOR TESTING SIGNAL INTEGRITIES OF EL...
- Publication number 20140375346
- Publication date Dec 25, 2014
- MING-SHIU OU YANG
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD INSPECTION APPARATUS, CIRCUIT BOARD INSPECTION METHOD...
- Publication number 20140354317
- Publication date Dec 4, 2014
- NIDEC-READ CORPORATION
- Munehiro Yamashita
- G01 - MEASURING TESTING

Apparatus therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Sensor device for detecting electrical defects based on resonance f...

Wireless electronic-control system

Functional tester for printed circuit boards, and associated system...

Marking device for marking circuit boards tested by means of a test...

Through-silicon via crack detecting apparatus, detecting method, an...

Inspecting device of display panel and inspecting method of display...

Method and device for electrical testing of an electrical assembly...

Functional tester for printed circuit boards, and associated system...

System and method for testing a device-under-test

Method for identification of proper probe placement on printed circ...

Automatic circuit board test system and automatic circuit board tes...

Inspection device and inspection method for inspecting connected pa...

Measurement apparatus with projected user interface

Test probe and apparatus for testing printed circuit board

Test system and method for measuring beam characteristics

Granular dynamic test systems and methods

Test interface with access across isolation barrier

Circuit board testing device and chassis for same

Dynamic independent test partition clock

Method and system for dynamic standard test access (DSTA) for a log...

Independent test partition clock coordination across multiple test...

Printed circuit board test coupon for electrical testing during the...

System for introspection and annotation of electronic circuit desig...

Method for identification of proper probe placement on printed circ...

Scan system interface (SSI) module

Test partition external input/output interface control for test par...

Testing device

Test system and method

Method for managing assembling process of electrical product

Conveying arrangement for testing system

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR TIN WHISKER ISOLATION AND DETECTION

TEST DEVICE AND TEST SYSTEM FOR SEMICONDUCTOR DEVICES

PRODUCT LINE TESTING METHOD AND SYSTEM

METHOD, SYSTEM AND PROBE FOR MEASURING AND VISUALIZING VALUES OF AN...

SENSOR DEVICE FOR DETECTING ELECTRICAL DEFECTS BASED ON RESONANCE F...

FUNCTIONAL TESTER FOR PRINTED CIRCUIT BOARDS, AND ASSOCIATED SYSTEM...

INFORMATION PROCESSING APPARATUS AND NON-TRANSITORY COMPUTER READAB...

WIRELESS ELECTRONIC-CONTROL SYSTEM

SIGNAL TESTING DEVICE AND SIGNAL TESTING METHOD

SYSTEM AND METHOD FOR TESTING A DEVICE-UNDER-TEST

METHOD AND DEVICE FOR ELECTRICAL TESTING OF AN ELECTRICAL ASSEMBLY

MARKING DEVICE FOR MARKING CIRCUIT BOARDS TESTED BY MEANS OF A TEST...

THROUGH-SILICON VIA CRACK DETECTING APPARATUS, DETECTING METHOD, AN...

AUTOMATIC CIRCUIT BOARD TEST SYSTEM AND AUTOMATIC CIRCUIT BOARD TES...

INSPECTING DEVICE OF DISPLAY PANEL AND INSPECTING METHOD OF DISPLAY...

FUNCTIONAL TESTER FOR PRINTED CIRCUIT BOARDS, AND ASSOCIATED SYSTEM...

INSPECTION DEVICE AND INSPECTION METHOD

METHOD FOR IDENTIFICATION OF PROPER PROBE PLACEMENT ON PRINTED CIRC...

TEST PROBE AND APPARATUS FOR TESTING PRINTED CIRCUIT BOARD

TEST SYSTEM AND METHOD FOR MEASURING BEAM CHARACTERISTICS

TEST SYSTEM AND METHOD

METHOD FOR IDENTIFICATION OF PROPER PROBE PLACEMENT ON PRINTED CIRC...

TEST FIXTURE

SYSTEM AND COMPUTER PROGRAM PRODUCT FOR PERFORMING COMPREHENSIVE FU...

TEST PARTITION EXTERNAL INPUT/OUTPUT INTERFACE CONTROL

PRINTED CIRCUIT BOARDS HAVING BLIND VIAS, METHOD OF TESTING ELECTRI...

System for Introspection and Annotation of Electronic Circuit Desig...

CIRCUIT BOARD TESTING APPARATUS AND CIRCUIT BOARD TESTING METHOD

TEST CONTROL DEVICE AND METHOD FOR TESTING SIGNAL INTEGRITIES OF EL...

CIRCUIT BOARD INSPECTION APPARATUS, CIRCUIT BOARD INSPECTION METHOD...