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Arrangements for altering the indicating characteristic

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  • G01R1/38
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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

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G01R1/38Arrangements for altering the indicating characteristic
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Patents Grantslast 30 patents

  • Information Patent Grant

    Multimeter
    • Patent number 8,981,759
    • Issue date Mar 17, 2015
    • Hioki E.E. Corporation
    • Toshio Heishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electric power meter adjustment and indication method and apparatus
    • Patent number 5,079,508
    • Issue date Jan 7, 1992
    • General Electric Company
    • Joseph N. Corain
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Transducer linearizing system
    • Patent number 4,912,397
    • Issue date Mar 27, 1990
    • Eaton Corporation
    • Allan R. Gale
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Moving iron instrument
    • Patent number 4,912,398
    • Issue date Mar 27, 1990
    • Yuji Kawai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor conditioning method and apparatus
    • Patent number 4,873,655
    • Issue date Oct 10, 1989
    • Board of Regents, The University of Texas System
    • George V. Kondraske
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Transducer linearizing system
    • Patent number 4,812,747
    • Issue date Mar 14, 1989
    • Eaton Corporation
    • Allan R. Gale
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Moving-coil measuring system with a large pointer deflection
    • Patent number 4,050,021
    • Issue date Sep 20, 1977
    • VDO Adolf Schindling AG
    • Hans-Georg Flach
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3764910
    • Patent number 3,764,910
    • Issue date Oct 9, 1973
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3711776
    • Patent number 3,711,776
    • Issue date Jan 16, 1973
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3405359
    • Patent number 3,405,359
    • Issue date Oct 8, 1968
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3005952
    • Patent number 3,005,952
    • Issue date Oct 24, 1961
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2924759
    • Patent number 2,924,759
    • Issue date Feb 9, 1960
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2866939
    • Patent number 2,866,939
    • Issue date Dec 30, 1958
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2615085
    • Patent number 2,615,085
    • Issue date Oct 21, 1952
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2137066
    • Patent number 2,137,066
    • Issue date Nov 15, 1938
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1857196
    • Patent number 1,857,196
    • Issue date May 10, 1932
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1564933
    • Patent number 1,564,933
    • Issue date Dec 8, 1925
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1363964
    • Patent number 1,363,964
    • Issue date Dec 28, 1920
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    MULTIMETER
    • Publication number 20140002059
    • Publication date Jan 2, 2014
    • HIOKI E.E. CORPORATION
    • Toshio HEISHI
    • G01 - MEASURING TESTING