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Arrangements for modifying the output characteristic
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G01K7/14
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PHYSICS
G01
Measuring instruments
G01K
MEASURING TEMPERATURE MEASURING QUANTITY OF HEAT THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
G01K7/00
Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat; Power supply
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G01K7/14
Arrangements for modifying the output characteristic
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Patents Grants
last 30 patents
Information
Patent Grant
Temperature sensor and heater unit
Patent number
12,000,737
Issue date
Jun 4, 2024
NHK Spring Co., Ltd.
Naoya Kida
G01 - MEASURING TESTING
Information
Patent Grant
Process-insensitive sensor circuit
Patent number
11,988,565
Issue date
May 21, 2024
Apple Inc.
Ali Mesgarani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for implementing Vptat multiplier in high accuracy thermal s...
Patent number
11,867,572
Issue date
Jan 9, 2024
STMicroelectron nternational N.V.
Pijush Kanti Panja
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Systems and methods for smart thermocouple temperature probe
Patent number
11,703,394
Issue date
Jul 18, 2023
Emerson Digital Cold Chain, Inc.
Philip Goulis
G01 - MEASURING TESTING
Information
Patent Grant
Chip wiring layer temperature sensing circuit, temperature sensing...
Patent number
11,686,624
Issue date
Jun 27, 2023
Zhejiang Johar Technology Co., Ltd.
Bo Wang
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for smart thermocouple temperature probe
Patent number
11,274,973
Issue date
Mar 15, 2022
Emerson Digital Cold Chain, Inc.
Philip Goulis
G01 - MEASURING TESTING
Information
Patent Grant
Thermal mass flow sensor with improved accuracy
Patent number
11,209,298
Issue date
Dec 28, 2021
Hitachi Metals, Ltd.
Alexei V. Smirnov
G01 - MEASURING TESTING
Information
Patent Grant
Uncalibrated thermocouple system
Patent number
10,993,758
Issue date
May 4, 2021
Biosense Webster (Israel) Ltd.
Assaf Govari
G01 - MEASURING TESTING
Information
Patent Grant
Linearization circuit and method for linearizing a measurement signal
Patent number
10,700,698
Issue date
Jun 30, 2020
Micro-Epsilon Messtechnik GmbH & Co. KG
Harald Haas
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Accurate and fast response temperature measurement
Patent number
10,591,363
Issue date
Mar 17, 2020
Rosemount Aerospace Inc.
Richard William Phillips
G01 - MEASURING TESTING
Information
Patent Grant
Uncalibrated thermocouple system
Patent number
10,390,870
Issue date
Aug 27, 2019
BIOSENSE WEBSTER (ISRAEL) LTD.
Assaf Govari
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for single temperature subthreshold factor tri...
Patent number
10,367,518
Issue date
Jul 30, 2019
Intel Corporation
Cho-Ying Lu
G01 - MEASURING TESTING
Information
Patent Grant
Uncalibrated thermocouple system
Patent number
10,098,684
Issue date
Oct 16, 2018
BIOSENSE WEBSTER (ISRAEL) LTD.
Assaf Govari
G01 - MEASURING TESTING
Information
Patent Grant
Systems, devices, and/or methods for managing a thermocouple module
Patent number
9,995,640
Issue date
Jun 12, 2018
Siemens Industry, Inc.
Stephen Mowry
G01 - MEASURING TESTING
Information
Patent Grant
Device for the detection of the profile of a rolling surface of a r...
Patent number
9,983,098
Issue date
May 29, 2018
Tire Profiles LLC
Cesare Santanera
G01 - MEASURING TESTING
Information
Patent Grant
Circuit device, temperature detection device, electronic device, an...
Patent number
9,915,568
Issue date
Mar 13, 2018
Seiko Epson Corporation
Kota Onishi
G01 - MEASURING TESTING
Information
Patent Grant
Temperature sensing circuit
Patent number
9,086,330
Issue date
Jul 21, 2015
Taiwan Semiconductor Manufacturing Company, Ltd.
Chan-Hong Chern
G01 - MEASURING TESTING
Information
Patent Grant
Systems, devices, and/or methods for managing a thermocouple module
Patent number
8,702,306
Issue date
Apr 22, 2014
Siemens Industry, Inc.
Stephen Weeks Mowry
G01 - MEASURING TESTING
Information
Patent Grant
Thermocouple electromotive force voltage to temperature converter w...
Patent number
8,485,724
Issue date
Jul 16, 2013
Microchip Technology Incorporated
Ezana Hailekiros Aberra
G01 - MEASURING TESTING
Information
Patent Grant
Providing linear relationship between temperature and digital code
Patent number
8,475,039
Issue date
Jul 2, 2013
Taiwan Semiconductor Manufacturing Company, Ltd.
Chan-Hong Chern
G01 - MEASURING TESTING
Information
Patent Grant
System for difference calculation using a quad slope converter
Patent number
6,717,393
Issue date
Apr 6, 2004
Texas Instruments Incorporated
Barry Jon Male
G01 - MEASURING TESTING
Information
Patent Grant
Thermocouple temperature probe adapter
Patent number
5,735,605
Issue date
Apr 7, 1998
DeRoyal Industries, Inc.
Allen V. Blalock
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for digitally measuring a voltage varying within...
Patent number
5,611,624
Issue date
Mar 18, 1997
Siemens Aktiengesellschaft
Jean-Marc Tornare
F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information
Patent Grant
Method and apparatus for measuring temperature using thermocouple
Patent number
5,038,303
Issue date
Aug 6, 1991
Yamari Industries, Limited
Hideo Kimura
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring temperature using thermocouple
Patent number
4,990,193
Issue date
Feb 5, 1991
Yamari Industries, Limited
Hideo Kimura
G01 - MEASURING TESTING
Information
Patent Grant
Soldering iron testing method and apparatus
Patent number
4,878,016
Issue date
Oct 31, 1989
Wahl Instruments, Inc.
William Wahl
G01 - MEASURING TESTING
Information
Patent Grant
Thermocouple biasing circuit
Patent number
4,674,901
Issue date
Jun 23, 1987
Allied Corporation
William Lorenz
G01 - MEASURING TESTING
Information
Patent Grant
Analog signal conditioner for thermal coupled signals
Patent number
4,590,472
Issue date
May 20, 1986
General Electric Company
Michael R. Benson
G01 - MEASURING TESTING
Information
Patent Grant
Electronic thermometer
Patent number
4,537,516
Issue date
Aug 27, 1985
Saul Epstein
G01 - MEASURING TESTING
Information
Patent Grant
Detector-transducer for sensing temperatures in an engine
Patent number
4,440,508
Issue date
Apr 3, 1984
United Technologies Corporation
Joseph J. Haloburdo
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TEMPERATURE SENSOR LINEARIZATION TECHNIQUES
Publication number
20240240995
Publication date
Jul 18, 2024
Micron Technology, Inc.
Luiza Souza Correa
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE CONTROLLER
Publication number
20230215746
Publication date
Jul 6, 2023
SEMES CO., LTD.
Dong Ok AHN
G01 - MEASURING TESTING
Information
Patent Application
Real-Time Onboard Standalone Sensor Thermal Compensation (RToB SSTC...
Publication number
20220299346
Publication date
Sep 22, 2022
The Boeing Company
Amir Leon Liaghati
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR SIGNALING THE STATUS OF A PRODUCT TO BE MONITORED AS OR...
Publication number
20220205849
Publication date
Jun 30, 2022
BRAINSTREAM GMBH
Rupprecht GABRIEL
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IMPLEMENTING VPTAT MULTIPLIER IN HIGH ACCURACY THERMAL S...
Publication number
20220196485
Publication date
Jun 23, 2022
STMicroelectronics International N.V.
Pijush Kanti PANJA
G01 - MEASURING TESTING
Information
Patent Application
Systems And Methods For Smart Thermocouple Temperature Probe
Publication number
20220146328
Publication date
May 12, 2022
Emerson Digital Cold Chain, Inc.
Philip GOULIS
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE CALIBRATION DEVICE AND TEMPERATURE MEASUREMENT DEVICE
Publication number
20210116309
Publication date
Apr 22, 2021
GEOMATEC CO., LTD.
Yoshiharu YAMAZAKI
G01 - MEASURING TESTING
Information
Patent Application
CHIP WIRING LAYER TEMPERATURE SENSING CIRCUIT, TEMPERATURE SENSING...
Publication number
20210072095
Publication date
Mar 11, 2021
Zhejiang Johar Technology Co., Ltd.
Bo WANG
G01 - MEASURING TESTING
Information
Patent Application
DUAL THERMOELECTRIC COMPONENT APPARATUS WITH THERMAL TRANSFER COMPO...
Publication number
20200194650
Publication date
Jun 18, 2020
Micron Technology, Inc.
Daniel G. Scobee
G01 - MEASURING TESTING
Information
Patent Application
METHOD
Publication number
20200166414
Publication date
May 28, 2020
Johnson Matthey Public Limited Company
Roger WILKINSON
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LINEARIZATION CIRCUIT AND METHOD FOR LINEARIZING A MEASUREMENT SIGNAL
Publication number
20200021306
Publication date
Jan 16, 2020
MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
Harald HAAS
G01 - MEASURING TESTING
Information
Patent Application
UNCALIBRATED THERMOCOUPLE SYSTEM
Publication number
20190374274
Publication date
Dec 12, 2019
BIOSENSE WEBSTER (ISRAEL) LTD.
Assaf Govari
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Systems And Methods For Smart Thermocouple Temperature Probe
Publication number
20190301948
Publication date
Oct 3, 2019
Cooper-Atkins Corporation
Philip GOULIS
G01 - MEASURING TESTING
Information
Patent Application
THERMISTOR DRIVE CIRCUIT
Publication number
20190242759
Publication date
Aug 8, 2019
DENSO CORPORATION
Shogo HIKOSAKA
G01 - MEASURING TESTING
Information
Patent Application
ACCURATE AND FAST RESPONSE TEMPERATURE MEASUREMENT
Publication number
20190101456
Publication date
Apr 4, 2019
Rosemount Aerospace Inc.
Richard William Phillips
G01 - MEASURING TESTING
Information
Patent Application
UNCALIBRATED THERMOCOUPLE SYSTEM
Publication number
20190076178
Publication date
Mar 14, 2019
BIOSENSE WEBSTER (ISRAEL) LTD.
Assaf Govari
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
UNCALIBRATED THERMOCOUPLE SYSTEM
Publication number
20170290616
Publication date
Oct 12, 2017
BIOSENSE WEBSTER (ISRAEL) LTD.
Assaf Govari
G01 - MEASURING TESTING
Information
Patent Application
Cooking Appliance Comprising An Electrical Adapter
Publication number
20170199086
Publication date
Jul 13, 2017
Electrolux Appliances Aktiebolag
Paolo Faraldi
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT DEVICE, TEMPERATURE DETECTION DEVICE, ELECTRONIC DEVICE, AN...
Publication number
20150276499
Publication date
Oct 1, 2015
SEIKO EPSON CORPORATION
Kota ONISHI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS, DEVICES, AND/OR METHODS FOR MANAGING A THERMOCOUPLE MODULE
Publication number
20140185646
Publication date
Jul 3, 2014
Siemens Industry, Inc.
Stephen Mowry
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE SENSING CIRCUIT
Publication number
20130272340
Publication date
Oct 17, 2013
Chan-Hong CHERN
G01 - MEASURING TESTING
Information
Patent Application
THERMOCOUPLE ELECTROMOTIVE FORCE VOLTAGE TO TEMPERATURE CONVERTER W...
Publication number
20110243188
Publication date
Oct 6, 2011
MICROCHIP TECHNOLOGY INCORPORATED
Ezana Hailekiros Aberra
G01 - MEASURING TESTING
Information
Patent Application
PROVIDING LINEAR RELATIONSHIP BETWEEN TEMPERATURE AND DIGITAL CODE
Publication number
20100271246
Publication date
Oct 28, 2010
Taiwan Semiconductor Manufacturing Company, Ltd.
Chan-Hong CHERN
G01 - MEASURING TESTING
Information
Patent Application
Systems, Devices, and/or Methods for Managing a Thermocouple Module
Publication number
20090080490
Publication date
Mar 26, 2009
SIEMENS ENERGY & AUTOMATION, INC.
Stephen Weeks Mowry, JR.
G01 - MEASURING TESTING
Information
Patent Application
Temperature measuring system and method
Publication number
20060153276
Publication date
Jul 13, 2006
Jens Hartmann
G01 - MEASURING TESTING
Information
Patent Application
System for difference calculation using a quad slope converter
Publication number
20030193324
Publication date
Oct 16, 2003
TEXAS INSTRUMENTS INCORPORATED
Barry Jon Male
H03 - BASIC ELECTRONIC CIRCUITRY