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Arrangements of electrodes and associated parts for generating or controlling the discharge
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ELECTRICITY
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Electric elements
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ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J37/00
Discharge tubes with provision for introducing objects or material to be exposed to the discharge
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H01J37/04
Arrangements of electrodes and associated parts for generating or controlling the discharge
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Method of etching and apparatus for plasma processing
Patent number
11,955,342
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Apr 9, 2024
Tokyo Electron Limited
Masanori Hosoya
H01 - BASIC ELECTRIC ELEMENTS
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Systems and methods for charged particle flooding to enhance voltag...
Patent number
11,929,232
Issue date
Mar 12, 2024
ASML Netherlands B.V.
Frank Nan Zhang
H01 - BASIC ELECTRIC ELEMENTS
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Two piece electrode assembly with gap for plasma control
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11,915,911
Issue date
Feb 27, 2024
Applied Materials, Inc.
Tien Fak Tan
H01 - BASIC ELECTRIC ELEMENTS
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Non-contact angle measuring apparatus
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11,903,755
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Feb 20, 2024
Weng-Dah Ken
H01 - BASIC ELECTRIC ELEMENTS
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11,906,450
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Feb 20, 2024
FEI Company
Alexander Henstra
H01 - BASIC ELECTRIC ELEMENTS
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11,908,659
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Feb 20, 2024
NuFlare Technology, Inc.
Toshiki Kimura
H01 - BASIC ELECTRIC ELEMENTS
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Multi-charged-particle-beam writing apparatus and multi-charged-par...
Patent number
11,901,156
Issue date
Feb 13, 2024
NuFlare Technology, Inc.
Ryosuke Ueba
H01 - BASIC ELECTRIC ELEMENTS
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Apparatus for and method of controlling an energy spread of a charg...
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11,881,374
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Jan 23, 2024
ASML Netherlands B.V.
Shakeeb Bin Hasan
H01 - BASIC ELECTRIC ELEMENTS
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Blanking aperture array unit
Patent number
11,837,429
Issue date
Dec 5, 2023
NuFlare Technology, Inc.
Shuji Yoshino
H01 - BASIC ELECTRIC ELEMENTS
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Plasma processing apparatus and control method
Patent number
11,830,704
Issue date
Nov 28, 2023
Tokyo Electron Limited
Chishio Koshimizu
H01 - BASIC ELECTRIC ELEMENTS
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Multi charged particle beam adjustment method, multi charged partic...
Patent number
11,804,360
Issue date
Oct 31, 2023
NuFlare Technology, Inc.
Tsubasa Nanao
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Time-resolved cathodoluminescence sample probing
Patent number
11,798,778
Issue date
Oct 24, 2023
ATTOLIGHT AG
Christian Monachon
H01 - BASIC ELECTRIC ELEMENTS
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Charged particle beam writing apparatus and charged particle beam w...
Patent number
11,756,766
Issue date
Sep 12, 2023
NuFlare Technology, Inc.
Takahito Nakayama
H01 - BASIC ELECTRIC ELEMENTS
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Charged-particle source
Patent number
11,735,391
Issue date
Aug 22, 2023
IMS Nanofabrication GmbH
Stefan Gerhold
H01 - BASIC ELECTRIC ELEMENTS
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Charged particle blocking element, exposure apparatus comprising su...
Patent number
11,728,123
Issue date
Aug 15, 2023
ASML Netherlands B.V.
Alexander Hendrik Vincent Van Veen
H01 - BASIC ELECTRIC ELEMENTS
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Semiconductor device, multi-charged-particle beam writing apparatus...
Patent number
11,721,520
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Aug 8, 2023
NuFlare Technology, Inc.
Kei Obara
H01 - BASIC ELECTRIC ELEMENTS
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System and method for reducing the charging effect in a transmissio...
Patent number
11,715,618
Issue date
Aug 1, 2023
FEI Company
Yuchen Deng
H01 - BASIC ELECTRIC ELEMENTS
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Apparatus of plural charged-particle beams
Patent number
11,688,580
Issue date
Jun 27, 2023
ASML Netherlands B.V.
Xuedong Liu
H01 - BASIC ELECTRIC ELEMENTS
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Charged particle beam device
Patent number
11,676,796
Issue date
Jun 13, 2023
Jeol Ltd.
Kazuki Yagi
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Electron beam irradiation apparatus and electron beam irradiation m...
Patent number
11,664,191
Issue date
May 30, 2023
NuFlare Technology, Inc.
Taku Yamada
H01 - BASIC ELECTRIC ELEMENTS
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Method for scanning a sample by a charged particle beam system
Patent number
11,658,004
Issue date
May 23, 2023
ASML Netherlands B.V.
Adam Lyons
H01 - BASIC ELECTRIC ELEMENTS
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Multiple electron beam writing apparatus and multiple electron beam...
Patent number
11,621,140
Issue date
Apr 4, 2023
NuFlare Technology, Inc.
Kota Iwasaki
H01 - BASIC ELECTRIC ELEMENTS
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Electron optical system and multi-beam image acquiring apparatus
Patent number
11,621,144
Issue date
Apr 4, 2023
NuFlare Technology, Inc.
John Hartley
G06 - COMPUTING CALCULATING COUNTING
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Fill pattern to enhance ebeam process margin
Patent number
11,581,162
Issue date
Feb 14, 2023
Intel Corporation
Shakul Tandon
H01 - BASIC ELECTRIC ELEMENTS
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Plasma processing apparatus and control method
Patent number
11,574,798
Issue date
Feb 7, 2023
Tokyo Electron Limited
Chishio Koshimizu
H01 - BASIC ELECTRIC ELEMENTS
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Multiple-charged particle-beam irradiation apparatus and multiple-c...
Patent number
11,574,797
Issue date
Feb 7, 2023
NuFlare Technology, Inc.
Mitsuhiro Okazawa
H01 - BASIC ELECTRIC ELEMENTS
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Charged particle source module
Patent number
11,557,455
Issue date
Jan 17, 2023
ASML Netherlands B.V.
Laura Dinu-Gurtler
H01 - BASIC ELECTRIC ELEMENTS
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Time-gated detection, dual-layer SPAD-based electron detection
Patent number
11,551,906
Issue date
Jan 10, 2023
FEI Company
Bart Jozef Janssen
H01 - BASIC ELECTRIC ELEMENTS
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SNR for x-ray detectors in SEM systems by using polarization filter
Patent number
11,525,791
Issue date
Dec 13, 2022
Applied Materials Israel Ltd.
Yehuda Zur
H01 - BASIC ELECTRIC ELEMENTS
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Side inject designs for improved radical concentrations
Patent number
11,501,945
Issue date
Nov 15, 2022
Applied Materials, Inc.
Eric Kihara Shono
H01 - BASIC ELECTRIC ELEMENTS
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last 30 patents
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SELF CLEANING ION GENERATOR DEVICE
Publication number
20240123472
Publication date
Apr 18, 2024
Global Plasma Solutions, Inc.
Charles Houston WADDELL
B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
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CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD OF ALIGNING A SAMPLE...
Publication number
20240128045
Publication date
Apr 18, 2024
ASML NETHERLANDS B.V.
Erwin SLOT
H01 - BASIC ELECTRIC ELEMENTS
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ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS
Publication number
20240115222
Publication date
Apr 11, 2024
Weng-Dah Ken
G04 - HOROLOGY
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CHARGED PARTICLE BEAM WRITING APPARATUS AND CHARGED PARTICLE BEAM W...
Publication number
20240055218
Publication date
Feb 15, 2024
NuFlare Technology, Inc.
Yasuo SENGOKU
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
BLANKING APERTURE ARRAY SYSTEM AND MULTI CHARGED PARTICLE BEAM WRIT...
Publication number
20240029999
Publication date
Jan 25, 2024
NuFlare Technology, Inc.
Hiroshi Yamashita
H01 - BASIC ELECTRIC ELEMENTS
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MOUNTING SUBSTRATE, BLANKING APERTURE ARRAY CHIP, BLANKING APERTURE...
Publication number
20240013999
Publication date
Jan 11, 2024
NuFlare Technology, Inc.
Toshiki KIMURA
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
MULTI CHARGED PARTICLE BEAM EVALUATION METHOD, MULTI CHARGED PARTIC...
Publication number
20230402253
Publication date
Dec 14, 2023
NuFlare Technology, Inc.
Hirofumi MORITA
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
COVERAGE CALCULATING METHOD, CHARGED PARTICLE BEAM WRITING METHOD,...
Publication number
20230369015
Publication date
Nov 16, 2023
NuFlare Technology, Inc.
Kenichi YASUI
H01 - BASIC ELECTRIC ELEMENTS
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Multi-Beam Pattern Definition Device
Publication number
20230360880
Publication date
Nov 9, 2023
IMS Nanofabrication GmbH
Stefan Eder-Kapl
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
CHARGED PARTICLE BLOCKING ELEMENT, EXPOSURE APPARATUS COMPRISING SU...
Publication number
20230335366
Publication date
Oct 19, 2023
ASML NETHERLANDS B.V.
Alexander Hendrik Vincent VAN VEEN
H01 - BASIC ELECTRIC ELEMENTS
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Charged Particle Beam Device
Publication number
20230317399
Publication date
Oct 5, 2023
HITACHI HIGH-TECH CORPORATION
Toshimasa KAMEDA
H01 - BASIC ELECTRIC ELEMENTS
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Charged Particle Beam Apparatus
Publication number
20230268158
Publication date
Aug 24, 2023
Hitachi High-Tech Corporation
Hideki TSUSHIMA
H01 - BASIC ELECTRIC ELEMENTS
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ION IMPLANTER AND ION IMPLANTATION METHOD
Publication number
20230260741
Publication date
Aug 17, 2023
Sumitomo Heavy Industries Ion Technology Co., Ltd.
Tetsuya Kudo
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
PARTICLE BEAM IRRADIATION SYSTEM, CONTROL METHOD FOR PARTICLE BEAM...
Publication number
20230253175
Publication date
Aug 10, 2023
Hitachi, Ltd
Kenta TAKAHASHI
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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MULTI-CHARGED PARTICLE BEAM WRITING APPARATUS, AND MULTI-CHARGED PA...
Publication number
20230187172
Publication date
Jun 15, 2023
NuFlare Technology, Inc.
Yasuo KATO
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
PLASMA PROCESSING APPARATUS AND CONTROL METHOD
Publication number
20230162946
Publication date
May 25, 2023
TOKYO ELECTRON LIMITED
Chishio KOSHIMIZU
H01 - BASIC ELECTRIC ELEMENTS
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CHARGED PARTICLE SOURCE MODULE
Publication number
20230154719
Publication date
May 18, 2023
ASML NETHERLANDS B.V.
Laura DINU-GURTLER
H01 - BASIC ELECTRIC ELEMENTS
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CONTROL METHOD OF WRITING APPARATUS AND WRITING APPARATUS
Publication number
20230111566
Publication date
Apr 13, 2023
NuFlare Technology, Inc.
Eita FUJISAKI
H01 - BASIC ELECTRIC ELEMENTS
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Charged Particle Beam System and Control Method Therefor
Publication number
20230115486
Publication date
Apr 13, 2023
JEOL Ltd.
Takeshi Kaneko
H01 - BASIC ELECTRIC ELEMENTS
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METHOD FOR FOCUSING AND OPERATING A PARTICLE BEAM MICROSCOPE
Publication number
20230078510
Publication date
Mar 16, 2023
CARL ZEISS MICROSCOPY GMBH
Simon Diemer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
MULTI-CHARGED-PARTICLE-BEAM WRITING METHOD, MULTI-CHARGED-PARTICLE-...
Publication number
20230078311
Publication date
Mar 16, 2023
NuFlare Technology, Inc.
Taku YAMADA
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
MULTI-CHARGED-PARTICLE-BEAM WRITING APPARATUS AND MULTI-CHARGED-PAR...
Publication number
20230081240
Publication date
Mar 16, 2023
NuFlare Technology, Inc.
Ryosuke UEBA
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
TRANSMISSION ELECTRON MICROSCOPE IN-SITU CHIP AND PREPARATION METHO...
Publication number
20230072075
Publication date
Mar 9, 2023
Xiamen Chip-Nova Technology Co., Ltd.
Honggang Liao
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Charged Particle Beam Device and Image Generation Method
Publication number
20230072991
Publication date
Mar 9, 2023
JEOL Ltd.
Hiroki Hashiguchi
H01 - BASIC ELECTRIC ELEMENTS
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MEMORY DEVICE WITH PREDETERMINED START-UP VALUE
Publication number
20230048507
Publication date
Feb 16, 2023
ASML NETHERLANDS B.V.
Marcel Nicolaas Jacobus VAN KERVINCK
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
SYSTEM AND METHOD FOR REDUCING THE CHARGING EFFECT IN A TRANSMISSIO...
Publication number
20230040558
Publication date
Feb 9, 2023
FEI Company
Yuchen Deng
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
MULTI-MODAL OPERATIONS FOR MULTI-BEAM INSPECTION SYSTEM
Publication number
20230019113
Publication date
Jan 19, 2023
ASML NETHERLANDS B.V.
Martinus Gerardus Johannes Maria MAASSEN
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
CHARGED PARTICLE BEAM DEVICE
Publication number
20230010272
Publication date
Jan 12, 2023
Hitachi High-Tech Corporation
Shinichi MURAKAMI
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
TIME-GATED DETECTION, DUAL-LAYER SPAD-BASED ELECTRON DETECTION
Publication number
20230005705
Publication date
Jan 5, 2023
FEI Company
Bart Jozef Janssen
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
APERTURE BODY, FLOOD COLUMN AND CHARGED PARTICLE TOOL
Publication number
20230005699
Publication date
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ASML NETHERLANDS B.V.
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H01 - BASIC ELECTRIC ELEMENTS