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G01N2223/053

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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Patents Grantslast 30 patents

Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for temperature monitoring in cryo-electron microscopy
- Patent number 12,070,753
- Issue date Aug 27, 2024
- FEI Company
- Jakub Drahotsky
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Locating mining sites using neutron detection
- Patent number 12,044,636
- Issue date Jul 23, 2024
- LUNAR HELIUM-3 MINING, LLC
- Chris Salvino
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Materials classifier
- Patent number 12,044,635
- Issue date Jul 23, 2024
- BAE Systems plc
- Lionel William John Kent
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for cosmogenic neutron sensing moisture detecti...
- Patent number 11,927,552
- Issue date Mar 12, 2024
- QUAESTA INSTRUMENTS, LLC
- Peter Shifflett
- G01 - MEASURING TESTING
Information Patent Grant
Lateral recess measurement in a semiconductor specimen
- Patent number 11,921,063
- Issue date Mar 5, 2024
- Applied Materials Israel Ltd.
- Michael Chemama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Backscattered electron detector, apparatus of charged-particle beam...
- Patent number 11,854,763
- Issue date Dec 26, 2023
- BORRIES PTE. LTD.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Through-tubing, cased-hole sealed material density evaluation using...
- Patent number 11,815,478
- Issue date Nov 14, 2023
- Halliburton Energy Services, Inc.
- Pablo Vieira Rego
- E21 - EARTH DRILLING MINING
Information Patent Grant
Method of examining a sample using a charged particle beam apparatus
- Patent number 11,815,479
- Issue date Nov 14, 2023
- FEI Company
- Oleksii Kaplenko
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection device, defect detection method, and defect observ...
- Patent number 11,802,841
- Issue date Oct 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuji Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for eliminating cross-talk signals in one or mo...
- Patent number 11,796,489
- Issue date Oct 24, 2023
- Rapiscan Systems, Inc.
- Neil Duncan Carrington
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspection system comprising neutron radiation sour...
- Patent number 11,747,288
- Issue date Sep 5, 2023
- Topcon Corporation
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging apparatus and method
- Patent number 11,681,068
- Issue date Jun 20, 2023
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Beam alignment systems and method
- Patent number 11,665,806
- Issue date May 30, 2023
- Schlumberger Technology Corporation
- Jani Reijonen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Handheld backscatter imaging systems with primary and secondary det...
- Patent number 11,579,327
- Issue date Feb 14, 2023
- American Science and Engineering, Inc.
- Aaron J. Couture
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Additive manufacturing system with x-ray backscatter imaging system...
- Patent number 11,554,544
- Issue date Jan 17, 2023
- The Boeing Company
- Gary E. Georgeson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,519,871
- Issue date Dec 6, 2022
- FEI Company
- Jan Klusácek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Combined scanning x-ray generator, composite inspection apparatus,...
- Patent number 11,467,105
- Issue date Oct 11, 2022
- Nuctech Company Limited
- Zhiqiang Chen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System, kit, and method for x-ray imaging with removably attachable...
- Patent number 11,448,606
- Issue date Sep 20, 2022
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope apparatus, inspection system using electron mic...
- Patent number 11,302,513
- Issue date Apr 12, 2022
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi source backscattering
- Patent number 11,293,884
- Issue date Apr 5, 2022
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Grant
Scatter X-ray imaging with adaptive scanning beam intensity
- Patent number 11,175,245
- Issue date Nov 16, 2021
- American Science and Engineering, Inc.
- Martin Rommel
- G01 - MEASURING TESTING
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 11,169,098
- Issue date Nov 9, 2021
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Grant
Reconfigurable backscatter detector
- Patent number 11,112,370
- Issue date Sep 7, 2021
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector
- Patent number 11,096,638
- Issue date Aug 24, 2021
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Methods and means for casing integrity evaluation using backscatter...
- Patent number 11,035,220
- Issue date Jun 15, 2021
- VISURAY INTECH LTD (BVI)
- Philip Teague
- G01 - MEASURING TESTING
Information Patent Grant
Human body security inspection apparatus and method of operating th...
- Patent number 10,983,243
- Issue date Apr 20, 2021
- Tsinghua University
- Zhiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Flexible aperture x-ray inspection
- Patent number 10,908,100
- Issue date Feb 2, 2021
- The Boeing Company
- Morteza Safai
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...
- Publication number 20240369500
- Publication date Nov 7, 2024
- Robert Koch
- G01 - MEASURING TESTING
Information Patent Application
Laue Measurement System With Turntable And Method Of Operating The...
- Publication number 20240151662
- Publication date May 9, 2024
- PROTO PATENTS LTD.
- Mohammed BELASSEL
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
- Publication number 20240094150
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...
- Publication number 20240060913
- Publication date Feb 22, 2024
- Rapiscan Systems, Inc.
- Neil Duncan Carrington
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...
- Publication number 20230296540
- Publication date Sep 21, 2023
- GATAN INC.
- Johannes ÖSTERREICHER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR REAL-TIME CONFIGURABLE BACKSCATTER SCANNERS
- Publication number 20230236141
- Publication date Jul 27, 2023
- SMITHS DETECTION INC.
- Joseph BENDAHAN
- G01 - MEASURING TESTING
Information Patent Application
Handheld Backscatter Scanning Systems With Different Detector Panel...
- Publication number 20230221457
- Publication date Jul 13, 2023
- American Science and Engineering, Inc.
- Aaron J. Couture
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION
- Publication number 20230112447
- Publication date Apr 13, 2023
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD
- Publication number 20230096574
- Publication date Mar 30, 2023
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- G01 - MEASURING TESTING
Information Patent Application
LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230023363
- Publication date Jan 26, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Michael CHEMAMA
- G01 - MEASURING TESTING
Information Patent Application
THROUGH-TUBING, CASED-HOLE SEALED MATERIAL DENSITY EVALUATION USING...
- Publication number 20220373484
- Publication date Nov 24, 2022
- Halliburton Energy Services, Inc.
- Pablo Vieira Rego
- E21 - EARTH DRILLING MINING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
- Publication number 20220365006
- Publication date Nov 17, 2022
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Application
BACKSCATTER IMAGING SYSTEM
- Publication number 20220357289
- Publication date Nov 10, 2022
- VAREX IMAGING CORPORATION
- Daniel Shedlock
- G01 - MEASURING TESTING
Information Patent Application
MATERIALS CLASSIFIER
- Publication number 20220334071
- Publication date Oct 20, 2022
- BAE Systems plc
- Lionel William John Kent
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...
- Publication number 20220268713
- Publication date Aug 25, 2022
- Rapiscan Systems, Inc.
- Neil Duncan Carrington
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IMPROVING AN EBSD/TKD MAP
- Publication number 20220221412
- Publication date Jul 14, 2022
- BRUKER NANO GMBH
- Daniel Radu GORAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System, Kit, and Method for X-Ray Imaging with Removably Attachable...
- Publication number 20220091054
- Publication date Mar 24, 2022
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE BEAM APPARATUS
- Publication number 20220065804
- Publication date Mar 3, 2022
- FEI Company
- Oleksii Kaplenko
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING SYSTEM, NEUTRON RADIATION SOURCE, AND NEU...
- Publication number 20210396688
- Publication date Dec 23, 2021
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
PREPARATION METHOD FOR IRON-BASED ALLOY POWDER EBSD TEST SAMPLE
- Publication number 20210270706
- Publication date Sep 2, 2021
- Central South University
- Zuming LIU
- G01 - MEASURING TESTING
Information Patent Application
MULTI SOURCE BACKSCATTERING
- Publication number 20210208086
- Publication date Jul 8, 2021
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Application
FATIGUE ESTIMATING METHOD, AND METHOD OF CREATING DATABASE FOR FATI...
- Publication number 20210172890
- Publication date Jun 10, 2021
- JTEKT Corporation
- Yousuke NAGANO
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR
- Publication number 20210161488
- Publication date Jun 3, 2021
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan CAO
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION DEVICE, DEFECT DETECTION METHOD, AND DEFECT OBSERV...
- Publication number 20210109035
- Publication date Apr 15, 2021
- Hitachi High-Tech Corporation
- Yuji Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam System and Overlay Shift Amount Measurement M...
- Publication number 20210055098
- Publication date Feb 25, 2021
- HITACHI HIGH-TECH CORPORATION
- Takuma YAMAKI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE APPARATUS, INSPECTION SYSTEM USING ELECTRON MIC...
- Publication number 20210012998
- Publication date Jan 14, 2021
- Hitachi High-Tech Corporation
- Takahiro Nishihata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200355633
- Publication date Nov 12, 2020
- FEI Company
- Jan Klusácek
- G01 - MEASURING TESTING
Information Patent Application
System and Method for X-Ray Backscatter Imaging with Removable Dete...
- Publication number 20200326291
- Publication date Oct 15, 2020
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
RECONFIGURABLE BACKSCATTER DETECTOR
- Publication number 20200217808
- Publication date Jul 9, 2020
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING

back scatter

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System, method, and apparatus for x-ray backscatter inspection of p...

Method for temperature monitoring in cryo-electron microscopy

Rotational X-ray inspection system and method

Locating mining sites using neutron detection

Materials classifier

Method for improving an EBSD/TKD map

Systems and methods for cosmogenic neutron sensing moisture detecti...

Lateral recess measurement in a semiconductor specimen

Backscattered electron detector, apparatus of charged-particle beam...

Through-tubing, cased-hole sealed material density evaluation using...

Method of examining a sample using a charged particle beam apparatus

Defect detection device, defect detection method, and defect observ...

Systems and methods for eliminating cross-talk signals in one or mo...

Non-destructive inspection system comprising neutron radiation sour...

X-ray imaging apparatus and method

Beam alignment systems and method

Handheld backscatter imaging systems with primary and secondary det...

Additive manufacturing system with x-ray backscatter imaging system...

Method of examining a sample using a charged particle microscope

Combined scanning x-ray generator, composite inspection apparatus,...

System, kit, and method for x-ray imaging with removably attachable...

Electron microscope apparatus, inspection system using electron mic...

Multi source backscattering

Scatter X-ray imaging with adaptive scanning beam intensity

System, method, and apparatus for x-ray backscatter inspection of p...

Reconfigurable backscatter detector

Radiation detector

Methods and means for casing integrity evaluation using backscatter...

Human body security inspection apparatus and method of operating th...

Flexible aperture x-ray inspection

Patents Applicationslast 30 patents

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...

Laue Measurement System With Turntable And Method Of Operating The...

NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES

Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...

COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...

SYSTEMS AND METHODS FOR REAL-TIME CONFIGURABLE BACKSCATTER SCANNERS

Handheld Backscatter Scanning Systems With Different Detector Panel...

SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION

CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD

LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN

THROUGH-TUBING, CASED-HOLE SEALED MATERIAL DENSITY EVALUATION USING...

SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...

BACKSCATTER IMAGING SYSTEM

MATERIALS CLASSIFIER

Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...

METHOD FOR IMPROVING AN EBSD/TKD MAP

System, Kit, and Method for X-Ray Imaging with Removably Attachable...

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE BEAM APPARATUS

NONDESTRUCTIVE INSPECTING SYSTEM, NEUTRON RADIATION SOURCE, AND NEU...

PREPARATION METHOD FOR IRON-BASED ALLOY POWDER EBSD TEST SAMPLE

MULTI SOURCE BACKSCATTERING

FATIGUE ESTIMATING METHOD, AND METHOD OF CREATING DATABASE FOR FATI...

RADIATION DETECTOR

DEFECT DETECTION DEVICE, DEFECT DETECTION METHOD, AND DEFECT OBSERV...

Charged Particle Beam System and Overlay Shift Amount Measurement M...

ELECTRON MICROSCOPE APPARATUS, INSPECTION SYSTEM USING ELECTRON MIC...

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

System and Method for X-Ray Backscatter Imaging with Removable Dete...

RECONFIGURABLE BACKSCATTER DETECTOR