by beating two waves of a same source but of different frequency and measuring the phase shift of the lower frequency obtained

Industry

CPC
G01J9/04

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Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J9/00Measuring optical phase difference Determining degree of coherence Measuring optical wavelength

Current Industry

G01J9/04by beating two waves of a same source but of different frequency and measuring the phase shift of the lower frequency obtained

Industries

Patents Grantslast 30 patents

Information Patent Grant
Atmospheric characterization systems and methods
- Patent number 11,879,981
- Issue date Jan 23, 2024
- BLUEHALO, LLC
- Levi Judah Smolin
- G01 - MEASURING TESTING
Information Patent Grant
Atmospheric characterization systems and methods
- Patent number 11,487,015
- Issue date Nov 1, 2022
- BLUEHALO, LLC
- Levi J. Smolin
- G01 - MEASURING TESTING
Information Patent Grant
Laser system
- Patent number 11,329,447
- Issue date May 10, 2022
- M SQUARED LASERS LIMITED
- Gareth Thomas Maker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical spectral line width calculation method, device, and program
- Patent number 11,300,455
- Issue date Apr 12, 2022
- Nippon Telegraph and Telephone Corporation
- Shingo Ono
- G01 - MEASURING TESTING
Information Patent Grant
Wavefront detector
- Patent number 11,215,511
- Issue date Jan 4, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Rudolf Saathof
- G01 - MEASURING TESTING
Information Patent Grant
Dual-comb spectroscopy
- Patent number 11,112,310
- Issue date Sep 7, 2021
- Dublin City University
- Prince Anandarajah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for optical angle modulation measurement by a...
- Patent number 11,098,998
- Issue date Aug 24, 2021
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Hidemi Tsuchida
- G01 - MEASURING TESTING
Information Patent Grant
Optical fiber strain and temperature measurement apparatus and opti...
- Patent number 10,871,406
- Issue date Dec 22, 2020
- Oki Electric Industry Co., Ltd.
- Kengo Koizumi
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for spectral analysis
- Patent number 10,866,141
- Issue date Dec 15, 2020
- Technische Universität Darmstadt
- Sascha Preu
- G01 - MEASURING TESTING
Information Patent Grant
General noise suppression scheme with reference detection in optica...
- Patent number 10,809,128
- Issue date Oct 20, 2020
- The Regents of the University of California
- Nien-Hui Ge
- G01 - MEASURING TESTING
Information Patent Grant
Computationally-assisted multi-heterodyne spectroscopy
- Patent number 10,656,016
- Issue date May 19, 2020
- Massachusetts Institute of Technology
- David Burghoff
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the frequency modulation of a laser source
- Patent number 10,317,288
- Issue date Jun 11, 2019
- Thales
- Jean Minet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Generating laser pulses and spectroscopy using the temporal talbot...
- Patent number 10,297,974
- Issue date May 21, 2019
- Max-Planck Gesellschaft zur Foerderung der Wissenschaften e.V.
- Thomas Udem
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectral shearing ladar
- Patent number 10,274,377
- Issue date Apr 30, 2019
- The United States of America as represented by the Secretary of the Air Force
- David J. Rabb
- G01 - MEASURING TESTING
Information Patent Grant
Laser frequency measurement method using optical frequency comb
- Patent number 10,161,805
- Issue date Dec 25, 2018
- Mitutoyo Corporation
- Kazuhiko Kawasaki
- G02 - OPTICS
Information Patent Grant
Laser frequency measurement method and device using optical frequen...
- Patent number 9,995,634
- Issue date Jun 12, 2018
- Mitutoyo Corporation
- Kazuhiko Kawasaki
- G02 - OPTICS
Information Patent Grant
Measuring apparatus and measuring method
- Patent number 9,983,069
- Issue date May 29, 2018
- Oki Electric Industry Co., Ltd.
- Kengo Koizumi
- G01 - MEASURING TESTING
Information Patent Grant
Optical interferometric system for measurement of a full-field thic...
- Patent number 9,952,034
- Issue date Apr 24, 2018
- National Tsing Hua University
- Wei-Chung Wang
- G01 - MEASURING TESTING
Information Patent Grant
Signal detection systems and methods on a fiber carrying multiple w...
- Patent number 9,806,808
- Issue date Oct 31, 2017
- Ciena Corporation
- Vipul Bhatnagar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
High efficiency coherent imager
- Patent number 9,696,212
- Issue date Jul 4, 2017
- BAE Systems Information and Electronic Systems Integration Inc.
- Philip R. Staver
- G01 - MEASURING TESTING
Information Patent Grant
Optical interferometer, data acquisition device, and data acquisiti...
- Patent number 9,599,454
- Issue date Mar 21, 2017
- Tokyo University of Science Foundation
- Hiroharu Yui
- G01 - MEASURING TESTING
Information Patent Grant
High speed high resolution heterodyne interferometric method and sy...
- Patent number 9,587,927
- Issue date Mar 7, 2017
- HARBIN INSTITUTE OF TECHNOLOGY
- Jiubin Tan
- G02 - OPTICS
Information Patent Grant
Systems and methods for phase measurements
- Patent number 9,528,817
- Issue date Dec 27, 2016
- Massachusetts Institute of Technology
- Christopher Fang-Yen
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical frequency tracking and stabilization based on extra-cavity...
- Patent number 9,528,875
- Issue date Dec 27, 2016
- Ram Photonics, LLC
- Ping Piu Kuo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beating signal monitoring module, terahertz wave generation device...
- Patent number 9,410,851
- Issue date Aug 9, 2016
- Electronics and Telecommunications Research Institute
- Namje Kim
- G01 - MEASURING TESTING
Information Patent Grant
Coherence switching
- Patent number 9,297,702
- Issue date Mar 29, 2016
- Phase Sensitive Innovations, Inc.
- Richard D. Martin
- G01 - MEASURING TESTING
Information Patent Grant
Periodically resetting integration angle demodulation device and me...
- Patent number 9,048,785
- Issue date Jun 2, 2015
- National Chiao Tung University
- Hao-Chiao Hong
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring a wavelength-resolved state of pola...
- Patent number 9,013,694
- Issue date Apr 21, 2015
- Aragon Photonics Labs S.L.U.
- Pascual Sevillano Reyes
- G01 - MEASURING TESTING
Information Patent Grant
Ultrafast chirped optical waveform recorder using a time microscope
- Patent number 9,013,705
- Issue date Apr 21, 2015
- Lawrence Livermore National Security, LLC
- Corey Vincent Bennett
- G01 - MEASURING TESTING
Information Patent Grant
System for generating a beat signal
- Patent number 8,995,796
- Issue date Mar 31, 2015
- Menlo Systems GmbH
- Ronald Holzwarth
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR PHOTONIC SAMPLING OF A TEST WAVE-FORM
- Publication number 20240201017
- Publication date Jun 20, 2024
- Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
- Dmitry Zimin
- G01 - MEASURING TESTING
Information Patent Application
ATMOSPHERIC CHARACTERIZATION SYSTEMS AND METHODS
- Publication number 20240168170
- Publication date May 23, 2024
- BlueHalo, LLC
- Levi Judah Smolin
- G01 - MEASURING TESTING
Information Patent Application
PHASE SHIFT MEASURING DEVICE AND PHASE SHIFT MEASURING METHOD
- Publication number 20230366741
- Publication date Nov 16, 2023
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Il Min LEE
- G01 - MEASURING TESTING
Information Patent Application
Conformal imaging vibrometer using adaptive optics with scene-based...
- Publication number 20230175893
- Publication date Jun 8, 2023
- David Mort Pepper
- G01 - MEASURING TESTING
Information Patent Application
ATMOSPHERIC CHARACTERIZATION SYSTEMS AND METHODS
- Publication number 20230084209
- Publication date Mar 16, 2023
- BlueHalo, LLC
- Levi Judah Smolin
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ACQUIRING THREE-DOMAIN INFORMATION OF ULTRAFA...
- Publication number 20220299374
- Publication date Sep 22, 2022
- SOUTH CHINA UNIVERSITY OF TECHNOLOGY
- Zhongmin YANG
- G01 - MEASURING TESTING
Information Patent Application
DUAL-COMB SPECTROSCOPY
- Publication number 20210063243
- Publication date Mar 4, 2021
- Dublin City University
- Prince Anandarajah
- G01 - MEASURING TESTING
Information Patent Application
Optical Spectral Line Width Calculation Method, Device, and Program
- Publication number 20210018372
- Publication date Jan 21, 2021
- Nippon Telegraph and Telephone Corporation
- Shingo Ono
- G01 - MEASURING TESTING
Information Patent Application
LASER SYSTEM
- Publication number 20200295525
- Publication date Sep 17, 2020
- M Squared Lasers Limited
- Gareth Thomas MAKER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVEFRONT DETECTOR
- Publication number 20200284661
- Publication date Sep 10, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Rudolf Saathof
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR SPECTRAL ANALYSIS
- Publication number 20200025614
- Publication date Jan 23, 2020
- TECHNISCHE UNIVERSITAT DARMSTADT
- Sascha Preu
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FIBER STRAIN AND TEMPERATURE MEASUREMENT APPARATUS AND OPTI...
- Publication number 20190094082
- Publication date Mar 28, 2019
- Oki Electric Industry Co., Ltd.
- Kengo KOIZUMI
- G01 - MEASURING TESTING
Information Patent Application
Computationally-Assisted Multi-Heterodyne Spectroscopy
- Publication number 20190041267
- Publication date Feb 7, 2019
- Massachusetts Institute of Technology
- David Burghoff
- G01 - MEASURING TESTING
Information Patent Application
ATMOSPHERIC CHARACTERIZATION SYSTEMS AND METHODS
- Publication number 20180348375
- Publication date Dec 6, 2018
- Orange Spring Labs, LLC
- Levi J. Smolin
- G01 - MEASURING TESTING
Information Patent Application
LASER FREQUENCY MEASUREMENT METHOD USING OPTICAL FREQUENCY COMB
- Publication number 20180224335
- Publication date Aug 9, 2018
- Mitutoyo Corporation
- Kazuhiko Kawasaki
- G02 - OPTICS
Information Patent Application
Sweep Control of an Optical Heterodyne Measurement System
- Publication number 20180195905
- Publication date Jul 12, 2018
- FINISAR CORPORATION
- Simon Poole
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING THE FREQUENCY MODULATION OF A LASER SOURCE
- Publication number 20180073932
- Publication date Mar 15, 2018
- THALES
- Jean MINET
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFEROMETRIC SYSTEM FOR MEASUREMENT OF A FULL-FIELD THIC...
- Publication number 20170370703
- Publication date Dec 28, 2017
- National Tsing-Hua University
- Wei-Chung WANG
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND MEASURING METHOD
- Publication number 20160290857
- Publication date Oct 6, 2016
- Oki Electric Industry Co., Ltd.
- Kengo KOIZUMI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FREQUENCY TRACKING AND STABILIZATION BASED ON EXTRA-CAVITY...
- Publication number 20150241271
- Publication date Aug 27, 2015
- RAM Photonics, LLC
- Ping Piu Kuo
- G01 - MEASURING TESTING
Information Patent Application
PERIODICALLY RESETTING INTEGRATION ANGLE DEMODULATION DEVICE AND ME...
- Publication number 20140347122
- Publication date Nov 27, 2014
- NATIONAL CHIAO-TUNG UNIVERSITY
- HAO-CHIAO HONG
- G01 - MEASURING TESTING
Information Patent Application
Optical Interferometer, Data Acquisition Device, and Data Acquisiti...
- Publication number 20140253919
- Publication date Sep 11, 2014
- Hiroharu Yui
- G01 - MEASURING TESTING
Information Patent Application
BEATING SIGNAL MONITORING MODULE, TERAHERTZ WAVE GENERATION DEVICE...
- Publication number 20140175306
- Publication date Jun 26, 2014
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Namje KIM
- G01 - MEASURING TESTING
Information Patent Application
THREE-FREQUENCY PHASE DIGITIZING SYSTEM AND METHOD OF THREE-PHASE D...
- Publication number 20140085116
- Publication date Mar 27, 2014
- AGILENT TECHNOLOGIES, INC.
- Daniel White
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FREQUENCY TRACKING AND STABILIZATION BASED ON EXTRA-CAVITY...
- Publication number 20140070072
- Publication date Mar 13, 2014
- RAM Photonics, LLC
- Ping Piu Kuo
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING A WAVELENGTH-RESOLVED STATE OF POLA...
- Publication number 20130314706
- Publication date Nov 28, 2013
- FIBERCOM, S.L.
- Pascual Sevillano Reyes
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT METHOD AND SYSTEM
- Publication number 20130302027
- Publication date Nov 14, 2013
- Dublin City University
- Stuart Murdoch
- G01 - MEASURING TESTING
Information Patent Application
REFERENCING OF THE BEATING SPECTRA OF FREQUENCY COMBS
- Publication number 20130286402
- Publication date Oct 31, 2013
- Philippe Giaccari
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PHASE MEASUREMENTS
- Publication number 20130265585
- Publication date Oct 10, 2013
- Christopher Fang-Yen
- G01 - MEASURING TESTING
Information Patent Application
WAVEFRONT COMPENSATION FOR DEEP TISSUE OPTICAL MICROSCOPY
- Publication number 20130182253
- Publication date Jul 18, 2013
- HOWARD HUGHES MEDICAL INSTITUTE
- Meng Cui
- G02 - OPTICS

by beating two waves of a same source but of different frequency and measuring the phase shift of the lower frequency obtained

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Atmospheric characterization systems and methods

Atmospheric characterization systems and methods

Laser system

Optical spectral line width calculation method, device, and program

Wavefront detector

Dual-comb spectroscopy

Apparatus and method for optical angle modulation measurement by a...

Optical fiber strain and temperature measurement apparatus and opti...

Device and method for spectral analysis

General noise suppression scheme with reference detection in optica...

Computationally-assisted multi-heterodyne spectroscopy

Method for measuring the frequency modulation of a laser source

Generating laser pulses and spectroscopy using the temporal talbot...

Spectral shearing ladar

Laser frequency measurement method using optical frequency comb

Laser frequency measurement method and device using optical frequen...

Measuring apparatus and measuring method

Optical interferometric system for measurement of a full-field thic...

Signal detection systems and methods on a fiber carrying multiple w...

High efficiency coherent imager

Optical interferometer, data acquisition device, and data acquisiti...

High speed high resolution heterodyne interferometric method and sy...

Systems and methods for phase measurements

Optical frequency tracking and stabilization based on extra-cavity...

Beating signal monitoring module, terahertz wave generation device...

Coherence switching

Periodically resetting integration angle demodulation device and me...

System and method for measuring a wavelength-resolved state of pola...

Ultrafast chirped optical waveform recorder using a time microscope

System for generating a beat signal

Patents Applicationslast 30 patents

METHOD AND DEVICE FOR PHOTONIC SAMPLING OF A TEST WAVE-FORM

ATMOSPHERIC CHARACTERIZATION SYSTEMS AND METHODS

PHASE SHIFT MEASURING DEVICE AND PHASE SHIFT MEASURING METHOD

Conformal imaging vibrometer using adaptive optics with scene-based...

ATMOSPHERIC CHARACTERIZATION SYSTEMS AND METHODS

METHOD AND SYSTEM FOR ACQUIRING THREE-DOMAIN INFORMATION OF ULTRAFA...

DUAL-COMB SPECTROSCOPY

Optical Spectral Line Width Calculation Method, Device, and Program

LASER SYSTEM

WAVEFRONT DETECTOR

DEVICE AND METHOD FOR SPECTRAL ANALYSIS

OPTICAL FIBER STRAIN AND TEMPERATURE MEASUREMENT APPARATUS AND OPTI...

Computationally-Assisted Multi-Heterodyne Spectroscopy

ATMOSPHERIC CHARACTERIZATION SYSTEMS AND METHODS

LASER FREQUENCY MEASUREMENT METHOD USING OPTICAL FREQUENCY COMB

Sweep Control of an Optical Heterodyne Measurement System

METHOD FOR MEASURING THE FREQUENCY MODULATION OF A LASER SOURCE

OPTICAL INTERFEROMETRIC SYSTEM FOR MEASUREMENT OF A FULL-FIELD THIC...

MEASURING APPARATUS AND MEASURING METHOD

OPTICAL FREQUENCY TRACKING AND STABILIZATION BASED ON EXTRA-CAVITY...

PERIODICALLY RESETTING INTEGRATION ANGLE DEMODULATION DEVICE AND ME...

Optical Interferometer, Data Acquisition Device, and Data Acquisiti...

BEATING SIGNAL MONITORING MODULE, TERAHERTZ WAVE GENERATION DEVICE...

THREE-FREQUENCY PHASE DIGITIZING SYSTEM AND METHOD OF THREE-PHASE D...

OPTICAL FREQUENCY TRACKING AND STABILIZATION BASED ON EXTRA-CAVITY...

SYSTEM AND METHOD FOR MEASURING A WAVELENGTH-RESOLVED STATE OF POLA...

OPTICAL MEASUREMENT METHOD AND SYSTEM

REFERENCING OF THE BEATING SPECTRA OF FREQUENCY COMBS

SYSTEMS AND METHODS FOR PHASE MEASUREMENTS

WAVEFRONT COMPENSATION FOR DEEP TISSUE OPTICAL MICROSCOPY