by capacitive methods

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G01R31/312

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/312by capacitive methods

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor doping characterization method using photoneutralizat...
- Patent number 12,154,833
- Issue date Nov 26, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modular wireless communication device testing system
- Patent number 12,146,913
- Issue date Nov 19, 2024
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor doping characterization method using photoneutralizat...
- Patent number 12,027,430
- Issue date Jul 2, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring container, measuring system and measuring method
- Patent number 11,994,487
- Issue date May 28, 2024
- Toyo Corporation
- Masaru Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Testing of microelectronics device and method
- Patent number 11,879,935
- Issue date Jan 23, 2024
- NOKOMIS, INC.
- Todd Eric Chornenky
- G01 - MEASURING TESTING
Information Patent Grant
Determining electric field distributions
- Patent number 11,860,207
- Issue date Jan 2, 2024
- Hewlett-Packard Development Company, L.P.
- David Plaquin
- G01 - MEASURING TESTING
Information Patent Grant
Modular wireless communication device testing system
- Patent number 11,828,802
- Issue date Nov 28, 2023
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive test needle for measuring electrically conductive layers...
- Patent number 11,774,495
- Issue date Oct 3, 2023
- ATG LUTHER & MAELZER GMBH
- Stefan Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Electrical current measurement system
- Patent number 11,650,248
- Issue date May 16, 2023
- MEDTRONIC MINIMED, INC.
- Seth N. Kazarians
- G01 - MEASURING TESTING
Information Patent Grant
Modular wireless communication device testing system
- Patent number 11,506,712
- Issue date Nov 22, 2022
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
System and method for die crack detection in a CMOS bonded array
- Patent number 11,450,575
- Issue date Sep 20, 2022
- Western Digital Technologies, Inc.
- Jayavel Pachamuthu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Frequency detection circuit and method
- Patent number 11,327,098
- Issue date May 10, 2022
- GRACE CONNECTION MICROELECTRONICS LIMITED
- Pei Wei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Contactless testing of electronic circuits
- Patent number 11,137,417
- Issue date Oct 5, 2021
- Keysight Technologies, Inc.
- Tie Qiu
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact voltage measurement device and diagnosis system
- Patent number 11,047,882
- Issue date Jun 29, 2021
- Hitachi, Ltd.
- Tetsuji Kato
- G01 - MEASURING TESTING
Information Patent Grant
Ground fault detection for PCB and isolation grounds
- Patent number 9,995,781
- Issue date Jun 12, 2018
- Texas Instruments Incorporated
- Evgeny Fomin
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed testing of through-body-vias
- Patent number 9,891,269
- Issue date Feb 13, 2018
- Intel Corporation
- Kalyan C. Kolluru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for the contactless tapping of communication signals
- Patent number 9,847,812
- Issue date Dec 19, 2017
- IFM Electronic GmbH
- Werner Hoch
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Capacitive opens testing of low profile components
- Patent number 9,778,314
- Issue date Oct 3, 2017
- Teradyne, Inc.
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Grant
Multidimensional structural access
- Patent number 9,696,372
- Issue date Jul 4, 2017
- FEI Company
- Jeffrey Blackwood
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for testing electrical connections on a printe...
- Patent number 9,638,742
- Issue date May 2, 2017
- Teradyne, Inc.
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Grant
Testing of electronic devices through capacitive interface
- Patent number 9,638,715
- Issue date May 2, 2017
- STMicroelectronics S.r.l.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for combined micro-scale and nano-scale C-V, Q...
- Patent number 9,551,743
- Issue date Jan 24, 2017
- DCG Systems, Inc.
- Andrew N. Erickson
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly and method for contactless electrical characterizati...
- Patent number 9,535,025
- Issue date Jan 3, 2017
- Northwestern University
- Matthew Grayson
- G01 - MEASURING TESTING
Information Patent Grant
Charge sharing testing of through-body-vias
- Patent number 9,513,330
- Issue date Dec 6, 2016
- Intel Corporation
- Mladenko Vukic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-channel probe plate for semiconductor package test systems
- Patent number 9,435,825
- Issue date Sep 6, 2016
- Infineon Technologies AG
- Ming Xue
- G01 - MEASURING TESTING
Information Patent Grant
Contactless capacitive distance sensor
- Patent number 9,410,999
- Issue date Aug 9, 2016
- Siemens Aktiengesellschaft
- Fatih Alatas
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a CMOS transistor
- Patent number 9,410,921
- Issue date Aug 9, 2016
- Micronas GmbH
- Oliver Kawaletz
- G01 - MEASURING TESTING
Information Patent Grant
Contactless measuring system for contactless decoupling of a signal...
- Patent number 9,291,644
- Issue date Mar 22, 2016
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Grant
Testing system with capacitively coupled probe for evaluating elect...
- Patent number 9,274,142
- Issue date Mar 1, 2016
- Apple Inc.
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Grant
Chip-to-chip signal transmission system and chip-to-chip capacitive...
- Patent number 9,274,167
- Issue date Mar 1, 2016
- I Shou University
- Yu-Jung Huang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
TESTING OF MICROELECTRONICS DEVICE AND METHOD
- Publication number 20240410940
- Publication date Dec 12, 2024
- NOKOMIS, INC.
- TODD ERIC CHORNENKY
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DOPING CHARACTERIZATION METHOD USING PHOTONEUTRALIZAT...
- Publication number 20240347399
- Publication date Oct 17, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM
- Publication number 20240044980
- Publication date Feb 8, 2024
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Application
Test Needle, Test Probe, and Flying Probe Tester for Testing Printe...
- Publication number 20230400509
- Publication date Dec 14, 2023
- ATG LUTHER & MAELZER GMBH
- Stefan Weiss
- G01 - MEASURING TESTING
Information Patent Application
MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM
- Publication number 20230079002
- Publication date Mar 16, 2023
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ELECTRIC FIELD DISTRIBUTIONS
- Publication number 20230063688
- Publication date Mar 2, 2023
- Hewlett-Packard Development Company, L.P.
- David Plaquin
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Die Crack Detection in a CMOS Bonded Array
- Publication number 20220108926
- Publication date Apr 7, 2022
- Western Digital Technologies, Inc.
- Jayavel Pachamuthu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING OF MICROELECTRONICS DEVICE AND METHOD
- Publication number 20220099734
- Publication date Mar 31, 2022
- NOKOMIS, INC.
- TODD ERIC CHORNENKY
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CURRENT MEASUREMENT SYSTEM
- Publication number 20220034962
- Publication date Feb 3, 2022
- Medtronic MiniMed, Inc.
- Seth N. Kazarians
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY DETECTION CIRCUITAND METHOD
- Publication number 20210141008
- Publication date May 13, 2021
- Grace Connection Microelectronics Limited
- PEI WEI CHEN
- G01 - MEASURING TESTING
Information Patent Application
Capacitive Test Needle for Measuring Electrically Conductive Layers...
- Publication number 20200348359
- Publication date Nov 5, 2020
- XCERRA CORPORATION
- Stefan Weiss
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT VOLTAGE MEASUREMENT DEVICE AND DIAGNOSIS SYSTEM
- Publication number 20200191833
- Publication date Jun 18, 2020
- Hitachi, Ltd.
- Tetsuji KATO
- G01 - MEASURING TESTING
Information Patent Application
MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM
- Publication number 20200003835
- Publication date Jan 2, 2020
- T-MOBILE USA, INC.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLEXED DLTS AND HSCV MEASUREMENT SYSTEM
- Publication number 20190377025
- Publication date Dec 12, 2019
- MIASOLÉ HI-TECH CORP.
- Robert Jeffrey Bailey
- G01 - MEASURING TESTING
Information Patent Application
Method For The Contactless Tapping Of Communication Signals
- Publication number 20170317716
- Publication date Nov 2, 2017
- ifm electronic gmbh
- Werner Hoch
- G01 - MEASURING TESTING
Information Patent Application
Capacitive Test Method, Apparatus and System for Semiconductor Pack...
- Publication number 20140361803
- Publication date Dec 11, 2014
- Ming Xue
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF ELECTRONIC DEVICES THROUGH CAPACITIVE INTERFACE
- Publication number 20140333336
- Publication date Nov 13, 2014
- Alberto PAGANI
- G01 - MEASURING TESTING
Information Patent Application
CONTACTLESS MEASURING SYSTEM
- Publication number 20140300381
- Publication date Oct 9, 2014
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
CONTACTLESS CAPACITIVE DISTANCE SENSOR
- Publication number 20140218056
- Publication date Aug 7, 2014
- SIEMENS AKTIENGESELLSCHAFT
- Fatih Alatas
- G01 - MEASURING TESTING
Information Patent Application
CHIP-TO-CHIP SIGNAL TRANSMISSION SYSTEM AND CHIP-TO-CHIP CAPACITIVE...
- Publication number 20140210496
- Publication date Jul 31, 2014
- I SHOU UNIVERSITY
- Yu-Jung Huang
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED LOW-NOISE SENSING CIRCUIT WITH EFFICIENT BIAS STABILIZATION
- Publication number 20140132284
- Publication date May 15, 2014
- National Tsing Hua University
- Yung-Jane HSU
- G01 - MEASURING TESTING
Information Patent Application
CHARGE SHARING TESTING OF THROUGH-BODY-VIAS
- Publication number 20140070838
- Publication date Mar 13, 2014
- Mladenko Vukic
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM AND TESTING METHOD FOR TOUCH DEVICE
- Publication number 20140043038
- Publication date Feb 13, 2014
- Mstar Semiconductor, Inc.
- Chien-Chuan Chen
- G01 - MEASURING TESTING
Information Patent Application
Capacitive Test Device and Method for Capacitive Testing a Component
- Publication number 20140009181
- Publication date Jan 9, 2014
- INFINEON TECHNOLOGIES AG
- Ming Xue
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING IMMUNITY OF ELECTRONIC EQUIPMENT AGAINST FLUC...
- Publication number 20130234749
- Publication date Sep 12, 2013
- TOKYO ELECTRONICS TRADING CO., LTD.
- Masamitsu Honda
- G01 - MEASURING TESTING
Information Patent Application
FILM SENSOR
- Publication number 20130120006
- Publication date May 16, 2013
- Nitto Denko Corporation
- Kuniaki Ishibashi
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE AND A METHOD FOR MEASURING A CHIP-TO-CHIP-CARRIER...
- Publication number 20130049766
- Publication date Feb 28, 2013
- INFINEON TECHNOLOGIES AG
- Franz Schoenberger
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE AND A METHOD FOR MEASURING A CHIP-TO-CHIP-CARRIER...
- Publication number 20130049792
- Publication date Feb 28, 2013
- INFINEON TECHNOLOGIES AG
- Ming Xue
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM WITH CAPACITIVELY COUPLED PROBE FOR EVALUATING ELECT...
- Publication number 20120274346
- Publication date Nov 1, 2012
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR COMBINED MICRO-SCALE AND NANO-SCALE C-V, Q...
- Publication number 20120146669
- Publication date Jun 14, 2012
- MULTIPROBE, INC.
- Andrew N. Erickson
- G01 - MEASURING TESTING

by capacitive methods

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor doping characterization method using photoneutralizat...

Modular wireless communication device testing system

Semiconductor doping characterization method using photoneutralizat...

Measuring container, measuring system and measuring method

Testing of microelectronics device and method

Determining electric field distributions

Modular wireless communication device testing system

Capacitive test needle for measuring electrically conductive layers...

Electrical current measurement system

Modular wireless communication device testing system

System and method for die crack detection in a CMOS bonded array

Frequency detection circuit and method

Contactless testing of electronic circuits

Non-contact voltage measurement device and diagnosis system

Ground fault detection for PCB and isolation grounds

Pulsed testing of through-body-vias

Method for the contactless tapping of communication signals

Capacitive opens testing of low profile components

Multidimensional structural access

Method and apparatus for testing electrical connections on a printe...

Testing of electronic devices through capacitive interface

Apparatus and method for combined micro-scale and nano-scale C-V, Q...

Probe assembly and method for contactless electrical characterizati...

Charge sharing testing of through-body-vias

Multi-channel probe plate for semiconductor package test systems

Contactless capacitive distance sensor

Method for testing a CMOS transistor

Contactless measuring system for contactless decoupling of a signal...

Testing system with capacitively coupled probe for evaluating elect...

Chip-to-chip signal transmission system and chip-to-chip capacitive...

Patents Applicationslast 30 patents

TESTING OF MICROELECTRONICS DEVICE AND METHOD

SEMICONDUCTOR DOPING CHARACTERIZATION METHOD USING PHOTONEUTRALIZAT...

MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM

Test Needle, Test Probe, and Flying Probe Tester for Testing Printe...

MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM

DETERMINING ELECTRIC FIELD DISTRIBUTIONS

System and Method for Die Crack Detection in a CMOS Bonded Array

TESTING OF MICROELECTRONICS DEVICE AND METHOD

ELECTRICAL CURRENT MEASUREMENT SYSTEM

FREQUENCY DETECTION CIRCUITAND METHOD

Capacitive Test Needle for Measuring Electrically Conductive Layers...

NON-CONTACT VOLTAGE MEASUREMENT DEVICE AND DIAGNOSIS SYSTEM

MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM

MULTIPLEXED DLTS AND HSCV MEASUREMENT SYSTEM

Method For The Contactless Tapping Of Communication Signals

Capacitive Test Method, Apparatus and System for Semiconductor Pack...

TESTING OF ELECTRONIC DEVICES THROUGH CAPACITIVE INTERFACE

CONTACTLESS MEASURING SYSTEM

CONTACTLESS CAPACITIVE DISTANCE SENSOR

CHIP-TO-CHIP SIGNAL TRANSMISSION SYSTEM AND CHIP-TO-CHIP CAPACITIVE...

INTEGRATED LOW-NOISE SENSING CIRCUIT WITH EFFICIENT BIAS STABILIZATION

CHARGE SHARING TESTING OF THROUGH-BODY-VIAS

TESTING SYSTEM AND TESTING METHOD FOR TOUCH DEVICE

Capacitive Test Device and Method for Capacitive Testing a Component

APPARATUS FOR TESTING IMMUNITY OF ELECTRONIC EQUIPMENT AGAINST FLUC...

FILM SENSOR

MEASURING DEVICE AND A METHOD FOR MEASURING A CHIP-TO-CHIP-CARRIER...

MEASURING DEVICE AND A METHOD FOR MEASURING A CHIP-TO-CHIP-CARRIER...

TESTING SYSTEM WITH CAPACITIVELY COUPLED PROBE FOR EVALUATING ELECT...

APPARATUS AND METHOD FOR COMBINED MICRO-SCALE AND NANO-SCALE C-V, Q...