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G01N23/207
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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
Current Industry
G01N23/207
by means of diffractometry using detectors
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Patents Grants
last 30 patents
Information
Patent Grant
Metal oxide film and method for forming metal oxide film
Patent number
11,978,742
Issue date
May 7, 2024
Semiconductor Energy Laboratory Co., Ltd.
Masahiro Takahashi
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method for improving an EBSD/TKD map
Patent number
11,940,396
Issue date
Mar 26, 2024
Bruker Nano GmbH
Daniel Radu Goran
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of determining the three-dimensional structure of molecules...
Patent number
11,933,748
Issue date
Mar 19, 2024
Bruker Axs GmbH
Clemens Richert
C30 - CRYSTAL GROWTH
Information
Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
Patent number
11,933,747
Issue date
Mar 19, 2024
University of Maryland, College Park
Peter Zavalij
B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information
Patent Grant
Sample mounting system for an X-ray analysis apparatus
Patent number
11,927,550
Issue date
Mar 12, 2024
Malvern Panalytical B.V.
Jaap Boksem
G01 - MEASURING TESTING
Information
Patent Grant
Sample holder unit for single-crystal X-ray structure analysis appa...
Patent number
11,921,060
Issue date
Mar 5, 2024
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Anti-frosting and anti-dew device for spectroscopic measurements
Patent number
11,921,062
Issue date
Mar 5, 2024
UNIVERSITE DE ROUEN NORMANDIE
Gérard Coquerel
G01 - MEASURING TESTING
Information
Patent Grant
Electron diffraction holography
Patent number
11,906,450
Issue date
Feb 20, 2024
FEI Company
Alexander Henstra
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
X-ray device having multiple beam paths
Patent number
11,906,448
Issue date
Feb 20, 2024
Anton Paar GmbH
Josef Gautsch
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Controlling process parameters by means of radiographic online dete...
Patent number
11,898,971
Issue date
Feb 13, 2024
SMS group GMBH
Christian Klinkenberg
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
X-ray sequential array wavelength dispersive spectrometer
Patent number
11,885,755
Issue date
Jan 30, 2024
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Grant
Source productivity assay integrating pyrolysis data and X-ray diff...
Patent number
11,885,790
Issue date
Jan 30, 2024
Saudi Arabian Oil Company
David Jacobi
G01 - MEASURING TESTING
Information
Patent Grant
Single-crystal X-ray structure analysis system
Patent number
11,879,857
Issue date
Jan 23, 2024
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Single-crystal X-ray structure analysis apparatus, and method therefor
Patent number
11,874,204
Issue date
Jan 16, 2024
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Single-crystal X-ray structure analysis apparatus and method, and s...
Patent number
11,874,238
Issue date
Jan 16, 2024
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for interpreting high energy interactions
Patent number
11,874,240
Issue date
Jan 16, 2024
Decision Tree, LLC
Brandon Lee Goodchild Drake
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for measuring a sample by x-ray reflectance scatt...
Patent number
11,874,237
Issue date
Jan 16, 2024
NOVA MEASURING INSTRUMENTS INC.
Heath Pois
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Advanced X-ray emission spectrometers
Patent number
11,874,239
Issue date
Jan 16, 2024
UChicago Argonne, LLC
Chengjun Sun
G01 - MEASURING TESTING
Information
Patent Grant
Determining ore characteristics
Patent number
11,867,608
Issue date
Jan 9, 2024
X Development LLC
Thomas Peter Hunt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wafer and method of manufacturing wafer
Patent number
11,862,685
Issue date
Jan 2, 2024
SENIC INC.
Jong Hwi Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Single-crystal X-ray structure analysis apparatus and sample holder
Patent number
11,846,594
Issue date
Dec 19, 2023
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Diffraction device and method for non-destructive testing of intern...
Patent number
11,846,595
Issue date
Dec 19, 2023
THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
Lin Zheng
G01 - MEASURING TESTING
Information
Patent Grant
Quantitative phase analysis device, quantitative phase analysis met...
Patent number
11,841,334
Issue date
Dec 12, 2023
Rigaku Corporation
Hideo Toraya
G01 - MEASURING TESTING
Information
Patent Grant
X-ray scattering apparatus
Patent number
11,835,474
Issue date
Dec 5, 2023
XENOCS SAS
Karsten Joensen
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Single-crystal X-ray structure analysis apparatus and sample holder...
Patent number
11,835,476
Issue date
Dec 5, 2023
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
X-ray examination device
Patent number
11,821,856
Issue date
Nov 21, 2023
Anton Paar GmbH
Josef Gautsch
G01 - MEASURING TESTING
Information
Patent Grant
Sample holder for single-crystal X-ray structure analysis apparatus...
Patent number
11,821,855
Issue date
Nov 21, 2023
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Data-driven solutions for inverse elemental modeling
Patent number
11,821,857
Issue date
Nov 21, 2023
Baker Hughes Oilfield Operations LLC
Robert Krumm
E21 - EARTH DRILLING MINING
Information
Patent Grant
Non-destructive detection of surface and near surface abnormalities...
Patent number
11,815,477
Issue date
Nov 14, 2023
The University of Sheffield
Matthew Brown
G01 - MEASURING TESTING
Information
Patent Grant
Method for identifying molecular structure
Patent number
11,815,475
Issue date
Nov 14, 2023
The University of Tokyo
Makoto Fujita
C30 - CRYSTAL GROWTH
Patents Applications
last 30 patents
Information
Patent Application
PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR APPLYING NON-...
Publication number
20240133829
Publication date
Apr 25, 2024
Rigaku Corporation
Takumi OTA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Systems And Methods For Interpreting High Energy Interactions
Publication number
20240125717
Publication date
Apr 18, 2024
DECISION TREE, LLC
Brandon Lee Goodchild Drake
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Small-angle x-ray scatterometry
Publication number
20240077435
Publication date
Mar 7, 2024
BRUKER TECHNOLOGIES LTD.
Alex Dikopoltsev
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DIFFRACTION METHOD FOR THE ANALYSIS OF AMORPHOUS AND SEMI-CRY...
Publication number
20240068966
Publication date
Feb 29, 2024
Danmarks Tekniske Universitet
Henning Friis Poulsen
G01 - MEASURING TESTING
Information
Patent Application
X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE
Publication number
20240044819
Publication date
Feb 8, 2024
NOVA LTD
Gilad Barak
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSIN...
Publication number
20240035989
Publication date
Feb 1, 2024
Security Matters Ltd.
Haggai ALON
G01 - MEASURING TESTING
Information
Patent Application
Analysis of X-ray Scatterometry Data using Deep Learning
Publication number
20240027374
Publication date
Jan 25, 2024
BRUKER TECHNOLOGIES LTD.
Andrei Baranovskiy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...
Publication number
20240027373
Publication date
Jan 25, 2024
Rigaku Corporation
Takashi SATO
G01 - MEASURING TESTING
Information
Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS, AND METHOD THEREFOR
Publication number
20240019385
Publication date
Jan 18, 2024
Rigaku Corporation
Takashi SATO
G01 - MEASURING TESTING
Information
Patent Application
METAL OXIDE FILM AND METHOD FOR FORMING METAL OXIDE FILM
Publication number
20230369341
Publication date
Nov 16, 2023
Semiconductor Energy Laboratory Co., Ltd.
Masahiro TAKAHASHI
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
COLLIMATOR
Publication number
20230358692
Publication date
Nov 9, 2023
ISTITUTO NAZIONALE DI FISICA NUCLEARE
Roberto BEDOGNI
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
ALPHA DIFFRACTOMETER
Publication number
20230341339
Publication date
Oct 26, 2023
Arion Diagnostics, Inc.
Alexander P. Lazarev
G01 - MEASURING TESTING
Information
Patent Application
DIFFRACTIVE ANALYZER OF PATIENT TISSUE
Publication number
20230341340
Publication date
Oct 26, 2023
Arion Diagnostics, Inc.
Alexander P. Lazarev
G01 - MEASURING TESTING
Information
Patent Application
MULTI-PHYSICAL FIELD MEASUREMENT DEVICE FOR METAL SOLIDIFICATION PR...
Publication number
20230314349
Publication date
Oct 5, 2023
SHANGHAI JIAOTONG UNIVERSITY
Jiao ZHANG
G01 - MEASURING TESTING
Information
Patent Application
CORRECTION APPARATUS, SYSTEM, METHOD, AND PROGRAM
Publication number
20230296539
Publication date
Sep 21, 2023
Rigaku Corporation
Masatsugu YOSHIMOTO
G01 - MEASURING TESTING
Information
Patent Application
EVALUATION DEVICE
Publication number
20230288351
Publication date
Sep 14, 2023
KIOXIA Corporation
Takehiro Nakai
G01 - MEASURING TESTING
Information
Patent Application
Advanced X-Ray Emission Spectrometers
Publication number
20230288352
Publication date
Sep 14, 2023
UChicago Argonne, LLC
Chengjun Sun
G01 - MEASURING TESTING
Information
Patent Application
Benzimidazole Derivative Compounds and Uses Thereof
Publication number
20230280220
Publication date
Sep 7, 2023
Pfizer Inc.
Scott William Bagley
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DIFFRACTION APPARATUS AND MEASUREMENT METHOD
Publication number
20230258586
Publication date
Aug 17, 2023
Rigaku Corporation
Hisashi KONAKA
G01 - MEASURING TESTING
Information
Patent Application
LABORATORY-BASED 3D SCANNING X-RAY LAUE MICRO-DIFFRACTION SYSTEM AN...
Publication number
20230251213
Publication date
Aug 10, 2023
Danmarks Tekniske Universitet
Yubin Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY-BASED TEST DEVICE AND METHOD FOR PLUGGING REMOVAL EFFECT OF S...
Publication number
20230194446
Publication date
Jun 22, 2023
SOUTHWEST PETROLEUM UNIVERSITY
Xiao GUO
G01 - MEASURING TESTING
Information
Patent Application
SOURCE PRODUCTIVITY ASSAY INTEGRATING PYROLYSIS DATA AND X-RAY DIFF...
Publication number
20230184737
Publication date
Jun 15, 2023
Saudi Arabian Oil Company
David Jacobi
G01 - MEASURING TESTING
Information
Patent Application
SMALL ANGLE X-RAY SCATTERING METHODS FOR CHARACTERIZING THE IRON CO...
Publication number
20230124114
Publication date
Apr 20, 2023
Amphastar Pharmaceuticals, Inc.
Jack Yongfeng ZHANG
G01 - MEASURING TESTING
Information
Patent Application
A SAMPLE INSPECTION SYSTEM
Publication number
20230118850
Publication date
Apr 20, 2023
Halo X Ray Technologies Limited
Anthony DICKEN
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING WEATHERING INDICES BY X-RAY DIFFRACTION
Publication number
20230105649
Publication date
Apr 6, 2023
Saudi Arabian Oil Company
Mohamed Soua
G01 - MEASURING TESTING
Information
Patent Application
SURFACE LOGGING WITH CUTTINGS-BASED ROCK PETROPHYSICS ANALYSIS
Publication number
20230105670
Publication date
Apr 6, 2023
Baker Hughes Oilfield Operations LLC
Yanhua Yao
E21 - EARTH DRILLING MINING
Information
Patent Application
RESIDUAL STRESS MEASUREMENT METHOD OF CURVED SURFACE BLOCK
Publication number
20230088293
Publication date
Mar 23, 2023
Metal Industries Research & Development Centre
Zong Rong LIU
G01 - MEASURING TESTING
Information
Patent Application
SILICON CARBIDE SINGLE CRYSTAL SUBSTRATE
Publication number
20230081506
Publication date
Mar 16, 2023
Sumitomo Electric Industries, Ltd.
Kyoko OKITA
C30 - CRYSTAL GROWTH
Information
Patent Application
Spot-size control in reflection-based and scatterometry-based X-ray...
Publication number
20230075421
Publication date
Mar 9, 2023
BRUKER TECHNOLOGIES LTD.
Alexander Krokhmal
G01 - MEASURING TESTING
Information
Patent Application
PROCESS FOR QUANTIFICATION OF METAL AMINO ACID CHELATES IN SOLUTION...
Publication number
20230071747
Publication date
Mar 9, 2023
Premex, Inc.
Paula Leon MONSALVE
G01 - MEASURING TESTING