by measuring back scattering

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CPC
G01N23/203

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/203by measuring back scattering

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for inspecting a structure across a cover layer c...
- Patent number 12,188,884
- Issue date Jan 7, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
X-ray backscatter imaging system for precise searching for containe...
- Patent number 12,181,428
- Issue date Dec 31, 2024
- KOREA INSTITUTE OF OCEAN SCIENCE & TECHNOLOGY
- Jongwon Park
- G01 - MEASURING TESTING
Information Patent Grant
Methods, systems, and computer program products for determining a p...
- Patent number 12,181,459
- Issue date Dec 31, 2024
- Troxler Electronic Laboratories INC.
- Robert Ernest Troxler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Radiation imaging apparatus and radiation imaging system
- Patent number 12,161,493
- Issue date Dec 10, 2024
- Canon Kabushiki Kaisha
- Misaki Kuriyama
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,166,006
- Issue date Dec 10, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual speed acquisition for drift corrected, fast, low dose, adaptiv...
- Patent number 12,136,532
- Issue date Nov 5, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,132,026
- Issue date Oct 29, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for electron backscatter diffraction sample c...
- Patent number 12,099,024
- Issue date Sep 24, 2024
- FEI Company
- Austin Penrose Day
- G01 - MEASURING TESTING
Information Patent Grant
Image contrast enhancement in sample inspection
- Patent number 12,087,542
- Issue date Sep 10, 2024
- ASML Netherlands B.V.
- Yixiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for temperature monitoring in cryo-electron microscopy
- Patent number 12,070,753
- Issue date Aug 27, 2024
- FEI Company
- Jakub Drahotsky
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Particle-induced x-ray emission (PIXE) using hydrogen and multi-spe...
- Patent number 12,061,159
- Issue date Aug 13, 2024
- FEI Company
- Daniel Totonjian
- G01 - MEASURING TESTING
Information Patent Grant
Multi-arm robot used for tunnel lining inspection and defect diagno...
- Patent number 12,031,922
- Issue date Jul 9, 2024
- Shandong University
- Bin Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-scale inspection and intelligent diagnosis system and method...
- Patent number 12,013,485
- Issue date Jun 18, 2024
- Shandong University
- Shucai Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device
- Patent number 11,977,036
- Issue date May 7, 2024
- ISHIDA CO., LTD.
- Makoto Nakatani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enclosed x-ray chopper wheel
- Patent number 11,940,395
- Issue date Mar 26, 2024
- Videray Technologies, LLC
- Paul Bradshaw
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Systems and methods for using backscatter imaging in precision agri...
- Patent number 11,927,551
- Issue date Mar 12, 2024
- American Science and Engineering, Inc.
- Aaron Couture
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector
- Patent number 11,918,394
- Issue date Mar 5, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Backscattered electron detector, apparatus of charged-particle beam...
- Patent number 11,854,763
- Issue date Dec 26, 2023
- BORRIES PTE. LTD.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical device, objective lens assembly, detector,...
- Patent number 11,821,859
- Issue date Nov 21, 2023
- ASML Netherlands B.V.
- Marco Jan-Jaco Wieland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for accurately characterizing crystal three-dimensional orie...
- Patent number 11,815,474
- Issue date Nov 14, 2023
- Dalian University of Technology
- Guoqing Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method of examining a sample using a charged particle beam apparatus
- Patent number 11,815,479
- Issue date Nov 14, 2023
- FEI Company
- Oleksii Kaplenko
- G01 - MEASURING TESTING
Information Patent Grant
Methods of inspecting samples with multiple beams of charged particles
- Patent number 11,815,473
- Issue date Nov 14, 2023
- ASML Netherlands B.V.
- Kuo-Feng Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection device, defect detection method, and defect observ...
- Patent number 11,802,841
- Issue date Oct 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuji Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for eliminating cross-talk signals in one or mo...
- Patent number 11,796,489
- Issue date Oct 24, 2023
- Rapiscan Systems, Inc.
- Neil Duncan Carrington
- G01 - MEASURING TESTING
Information Patent Grant
Device and method to position an end effector in a well
- Patent number 11,725,497
- Issue date Aug 15, 2023
- DARKVISION TECHNOLOGIES INC.
- Michael Halpenny-Mason
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Inspection system of wellbores and surrounding rock using penetrati...
- Patent number 11,719,852
- Issue date Aug 8, 2023
- Fermi Research Alliance, LLC
- Thomas K Kroc
- G02 - OPTICS
Information Patent Grant
Method and system for determining sample composition from spectral...
- Patent number 11,703,468
- Issue date Jul 18, 2023
- FEI Company
- Oleksii Kaplenko
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...
- Publication number 20250012742
- Publication date Jan 9, 2025
- VG SYSTEMS LIMITED
- Austin Penrose DAY
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...
- Publication number 20240418660
- Publication date Dec 19, 2024
- FEI Company
- Daniel TOTONJIAN
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...
- Publication number 20240393269
- Publication date Nov 28, 2024
- Carl Zeiss SMT GMBH
- Jens Oster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analysis Device and Analysis Method
- Publication number 20240385131
- Publication date Nov 21, 2024
- JEOL Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...
- Publication number 20240369500
- Publication date Nov 7, 2024
- Robert Koch
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...
- Publication number 20240369503
- Publication date Nov 7, 2024
- RTX Corporation
- Christopher Pelliccione
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DENOISING A REGION OF INTEREST OF A PATTERN
- Publication number 20240361262
- Publication date Oct 31, 2024
- ETROLOGY, LLC
- Vladislav Kaplan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DISLOCATION ANALYSIS
- Publication number 20240337611
- Publication date Oct 10, 2024
- Oxford Instruments Nanotechnology Tools Limited
- Aimo WINKELMANN
- G01 - MEASURING TESTING
Information Patent Application
3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREASED ACCURACY
- Publication number 20240331179
- Publication date Oct 3, 2024
- Carl Zeiss SMT GMBH
- Dmitry Klochkov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRON MICROSCOPE AND CRYSTAL EVALUATION METHOD
- Publication number 20240319122
- Publication date Sep 26, 2024
- KIOXIA Corporation
- Yuki OTSUKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR HIGH PHOTON ENERGIES IMAGING
- Publication number 20240288595
- Publication date Aug 29, 2024
- Bar Ilan University
- Eliahu COHEN
- G01 - MEASURING TESTING
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240290743
- Publication date Aug 29, 2024
- NIPPON MICROMETAL CORPORATION
- Daizo ODA
- G01 - MEASURING TESTING
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240290745
- Publication date Aug 29, 2024
- NIPPON MICROMETAL CORPORATION
- Daizo ODA
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE DETECTOR
- Publication number 20240280517
- Publication date Aug 22, 2024
- ASML NETHERLANDS B.V.
- Albertus Victor Gerardus MANGNUS
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOG...
- Publication number 20240272099
- Publication date Aug 15, 2024
- Carl Zeiss SMT GMBH
- Daniel Schwarz
- G01 - MEASURING TESTING
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240266313
- Publication date Aug 8, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro UNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROXIMITY SENSOR FOR ELECTRON BACKSCATTER DIFFRACTION SYSTEMS
- Publication number 20240241066
- Publication date Jul 18, 2024
- BRUKER NANO GMBH
- Daniel Radu Goran
- G01 - MEASURING TESTING
Information Patent Application
ENCLOSED X-RAY CHOPPER WHEEL
- Publication number 20240230560
- Publication date Jul 11, 2024
- VIDERAY TECHNOLOGIES, INC.
- PAUL Bradshaw
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
INFORMATION PROCESSING SYSTEM AND PHASE ANALYSIS SYSTEM
- Publication number 20240192152
- Publication date Jun 13, 2024
- Hitachi, Ltd
- Toshiaki TANIGAKI
- G01 - MEASURING TESTING
Information Patent Application
BACKSCATTER-BASED POSITIONING
- Publication number 20240172166
- Publication date May 23, 2024
- QUALCOMM Incorporated
- Mohammad Tarek Fahim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Laue Measurement System With Turntable And Method Of Operating The...
- Publication number 20240151662
- Publication date May 9, 2024
- PROTO PATENTS LTD.
- Mohammed BELASSEL
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...
- Publication number 20240060913
- Publication date Feb 22, 2024
- Rapiscan Systems, Inc.
- Neil Duncan Carrington
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE OPTICAL DEVICE, OBJECTIVE LENS ASSEMBLY, DETECTOR,...
- Publication number 20240044824
- Publication date Feb 8, 2024
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR AND METHOD FOR OBTAINING KIKUCHI IMAGES
- Publication number 20240047174
- Publication date Feb 8, 2024
- BRUKER NANO GMBH
- Uwe ROSSEK
- G01 - MEASURING TESTING
Information Patent Application
Rotational X-ray Inspection System and Method
- Publication number 20240044812
- Publication date Feb 8, 2024
- Viken Detection Corporation
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF INSPECTING SAMPLES WITH A BEAM OF CHARGED PARTICLES
- Publication number 20240044820
- Publication date Feb 8, 2024
- ASML NETHERLANDS B.V.
- Kuo-Feng TSENG
- G01 - MEASURING TESTING
Information Patent Application
Systems and a Method of Improved Material Classification Using Ener...
- Publication number 20240003834
- Publication date Jan 4, 2024
- Rapiscan Holdings, Inc.
- Mark Procter
- G01 - MEASURING TESTING
Information Patent Application
Methods and Means for the Measurement of Tubing, Casing, Perforatio...
- Publication number 20230392491
- Publication date Dec 7, 2023
- Philip Teague
- E21 - EARTH DRILLING MINING
Information Patent Application
Positive Electrode Active Material, and Positive Electrode and Lith...
- Publication number 20230387405
- Publication date Nov 30, 2023
- LG CHEM, LTD.
- Won Sig Jung
- H01 - BASIC ELECTRIC ELEMENTS

by measuring back scattering

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system for inspecting a structure across a cover layer c...

X-ray backscatter imaging system for precise searching for containe...

Methods, systems, and computer program products for determining a p...

Radiation imaging apparatus and radiation imaging system

Bonding wire for semiconductor devices

System, method, and apparatus for x-ray backscatter inspection of p...

Dual speed acquisition for drift corrected, fast, low dose, adaptiv...

Bonding wire for semiconductor devices

Methods and apparatus for electron backscatter diffraction sample c...

Image contrast enhancement in sample inspection

Method for temperature monitoring in cryo-electron microscopy

Rotational X-ray inspection system and method

Particle-induced x-ray emission (PIXE) using hydrogen and multi-spe...

Multi-arm robot used for tunnel lining inspection and defect diagno...

Multi-scale inspection and intelligent diagnosis system and method...

Inspection device

Method for improving an EBSD/TKD map

Enclosed x-ray chopper wheel

Systems and methods for using backscatter imaging in precision agri...

Radiation detector

Backscattered electron detector, apparatus of charged-particle beam...

Charged particle optical device, objective lens assembly, detector,...

Method for accurately characterizing crystal three-dimensional orie...

Method of examining a sample using a charged particle beam apparatus

Methods of inspecting samples with multiple beams of charged particles

Defect detection device, defect detection method, and defect observ...

Systems and methods for eliminating cross-talk signals in one or mo...

Device and method to position an end effector in a well

Inspection system of wellbores and surrounding rock using penetrati...

Method and system for determining sample composition from spectral...

Patents Applicationslast 30 patents

METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...

PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...

Analysis Device and Analysis Method

METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...

METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...

SYSTEM AND METHOD FOR DENOISING A REGION OF INTEREST OF A PATTERN

METHOD FOR DISLOCATION ANALYSIS

3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREASED ACCURACY

ELECTRON MICROSCOPE AND CRYSTAL EVALUATION METHOD

METHOD AND SYSTEM FOR HIGH PHOTON ENERGIES IMAGING

BONDING WIRE FOR SEMICONDUCTOR DEVICES

BONDING WIRE FOR SEMICONDUCTOR DEVICES

CHARGED PARTICLE DETECTOR

HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOG...

BONDING WIRE FOR SEMICONDUCTOR DEVICES

PROXIMITY SENSOR FOR ELECTRON BACKSCATTER DIFFRACTION SYSTEMS

ENCLOSED X-RAY CHOPPER WHEEL

INFORMATION PROCESSING SYSTEM AND PHASE ANALYSIS SYSTEM

BACKSCATTER-BASED POSITIONING

Laue Measurement System With Turntable And Method Of Operating The...

Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...

CHARGED PARTICLE OPTICAL DEVICE, OBJECTIVE LENS ASSEMBLY, DETECTOR,...

DETECTOR AND METHOD FOR OBTAINING KIKUCHI IMAGES

Rotational X-ray Inspection System and Method

METHODS OF INSPECTING SAMPLES WITH A BEAM OF CHARGED PARTICLES

Systems and a Method of Improved Material Classification Using Ener...

Methods and Means for the Measurement of Tubing, Casing, Perforatio...

Positive Electrode Active Material, and Positive Electrode and Lith...