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G01N23/203
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PHYSICS
G01
Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00
Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
Current Industry
G01N23/203
by measuring back scattering
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Patents Grants
last 30 patents
Information
Patent Grant
Inspection device
Patent number
11,977,036
Issue date
May 7, 2024
ISHIDA CO., LTD.
Makoto Nakatani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for improving an EBSD/TKD map
Patent number
11,940,396
Issue date
Mar 26, 2024
Bruker Nano GmbH
Daniel Radu Goran
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Enclosed x-ray chopper wheel
Patent number
11,940,395
Issue date
Mar 26, 2024
Videray Technologies, LLC
Paul Bradshaw
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Systems and methods for using backscatter imaging in precision agri...
Patent number
11,927,551
Issue date
Mar 12, 2024
American Science and Engineering, Inc.
Aaron Couture
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detector
Patent number
11,918,394
Issue date
Mar 5, 2024
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
Peiyan Cao
G01 - MEASURING TESTING
Information
Patent Grant
Backscattered electron detector, apparatus of charged-particle beam...
Patent number
11,854,763
Issue date
Dec 26, 2023
BORRIES PTE. LTD.
Wei Fang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle optical device, objective lens assembly, detector,...
Patent number
11,821,859
Issue date
Nov 21, 2023
ASML Netherlands B.V.
Marco Jan-Jaco Wieland
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for accurately characterizing crystal three-dimensional orie...
Patent number
11,815,474
Issue date
Nov 14, 2023
Dalian University of Technology
Guoqing Chen
G01 - MEASURING TESTING
Information
Patent Grant
Method of examining a sample using a charged particle beam apparatus
Patent number
11,815,479
Issue date
Nov 14, 2023
FEI Company
Oleksii Kaplenko
G01 - MEASURING TESTING
Information
Patent Grant
Methods of inspecting samples with multiple beams of charged particles
Patent number
11,815,473
Issue date
Nov 14, 2023
ASML Netherlands B.V.
Kuo-Feng Tseng
G01 - MEASURING TESTING
Information
Patent Grant
Defect detection device, defect detection method, and defect observ...
Patent number
11,802,841
Issue date
Oct 31, 2023
HITACHI HIGH-TECH CORPORATION
Yuji Takagi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for eliminating cross-talk signals in one or mo...
Patent number
11,796,489
Issue date
Oct 24, 2023
Rapiscan Systems, Inc.
Neil Duncan Carrington
G01 - MEASURING TESTING
Information
Patent Grant
Device and method to position an end effector in a well
Patent number
11,725,497
Issue date
Aug 15, 2023
DARKVISION TECHNOLOGIES INC.
Michael Halpenny-Mason
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Inspection system of wellbores and surrounding rock using penetrati...
Patent number
11,719,852
Issue date
Aug 8, 2023
Fermi Research Alliance, LLC
Thomas K Kroc
G02 - OPTICS
Information
Patent Grant
Method and system for determining sample composition from spectral...
Patent number
11,703,468
Issue date
Jul 18, 2023
FEI Company
Oleksii Kaplenko
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Segmented multi-channel, backside illuminated, solid state detector...
Patent number
11,699,607
Issue date
Jul 11, 2023
KLA Corporation
John Gerling
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
X-ray imaging apparatus and method
Patent number
11,681,068
Issue date
Jun 20, 2023
VIKEN DETECTION CORPORATION
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Grant
Method for scanning a sample by a charged particle beam system
Patent number
11,658,004
Issue date
May 23, 2023
ASML Netherlands B.V.
Adam Lyons
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scintillation detector
Patent number
11,650,338
Issue date
May 16, 2023
BAE Systems plc
Lionel William John Kent
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Offcut angle determination using electron channeling patterns
Patent number
11,650,171
Issue date
May 16, 2023
FEI Company
Han Han
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Back scattering inspection system and back scattering inspection me...
Patent number
11,614,413
Issue date
Mar 28, 2023
Jianmin Li
G01 - MEASURING TESTING
Information
Patent Grant
Method of examining a sample using a charged particle microscope
Patent number
11,598,733
Issue date
Mar 7, 2023
FEI Company
Tomas Tûma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Handheld backscatter imaging systems with primary and secondary det...
Patent number
11,579,327
Issue date
Feb 14, 2023
American Science and Engineering, Inc.
Aaron J. Couture
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Hand-held portable backscatter inspection system
Patent number
11,561,320
Issue date
Jan 24, 2023
Rapiscan Systems, Inc.
Edward James Morton
G01 - MEASURING TESTING
Information
Patent Grant
Additive manufacturing system with x-ray backscatter imaging system...
Patent number
11,554,544
Issue date
Jan 17, 2023
The Boeing Company
Gary E. Georgeson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and means for determining the existence of cement debonding...
Patent number
11,542,808
Issue date
Jan 3, 2023
VISURAY INTECH LTD (BVI)
Philip Teague
E21 - EARTH DRILLING MINING
Information
Patent Grant
Systems and methods for using backscatter imaging in precision agri...
Patent number
11,536,672
Issue date
Dec 27, 2022
American Science and Engineering, Inc.
Aaron Couture
G01 - MEASURING TESTING
Information
Patent Grant
Methods, systems, and computer program products for determining a p...
Patent number
11,531,019
Issue date
Dec 20, 2022
Troxler Electronic Laboratories, Inc.
Robert Ernest Troxler
G01 - MEASURING TESTING
Information
Patent Grant
Pass-through X-ray backscatter personnel scanner
Patent number
11,525,929
Issue date
Dec 13, 2022
VIKEN DETECTION CORPORATION
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Grant
Method, device and program for processing diffraction images of a c...
Patent number
11,526,980
Issue date
Dec 13, 2022
Electricite de France
Félix Latourte
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Laue Measurement System With Turntable And Method Of Operating The...
Publication number
20240151662
Publication date
May 9, 2024
PROTO PATENTS LTD.
Mohammed BELASSEL
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...
Publication number
20240060913
Publication date
Feb 22, 2024
Rapiscan Systems, Inc.
Neil Duncan Carrington
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE OPTICAL DEVICE, OBJECTIVE LENS ASSEMBLY, DETECTOR,...
Publication number
20240044824
Publication date
Feb 8, 2024
ASML NETHERLANDS B.V.
Marco Jan-Jaco WIELAND
G01 - MEASURING TESTING
Information
Patent Application
DETECTOR AND METHOD FOR OBTAINING KIKUCHI IMAGES
Publication number
20240047174
Publication date
Feb 8, 2024
BRUKER NANO GMBH
Uwe ROSSEK
G01 - MEASURING TESTING
Information
Patent Application
Rotational X-ray Inspection System and Method
Publication number
20240044812
Publication date
Feb 8, 2024
Viken Detection Corporation
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF INSPECTING SAMPLES WITH A BEAM OF CHARGED PARTICLES
Publication number
20240044820
Publication date
Feb 8, 2024
ASML NETHERLANDS B.V.
Kuo-Feng TSENG
G01 - MEASURING TESTING
Information
Patent Application
Systems and a Method of Improved Material Classification Using Ener...
Publication number
20240003834
Publication date
Jan 4, 2024
Rapiscan Holdings, Inc.
Mark Procter
G01 - MEASURING TESTING
Information
Patent Application
Methods and Means for the Measurement of Tubing, Casing, Perforatio...
Publication number
20230392491
Publication date
Dec 7, 2023
Philip Teague
E21 - EARTH DRILLING MINING
Information
Patent Application
Positive Electrode Active Material, and Positive Electrode and Lith...
Publication number
20230387405
Publication date
Nov 30, 2023
LG CHEM, LTD.
Won Sig Jung
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OBJECT DETECTION AND CHARACTERIZATION USING DUAL ENERGY BACKSCATTER...
Publication number
20230366839
Publication date
Nov 16, 2023
Battelle Memorial Institute
Wesley C. PIRKLE
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...
Publication number
20230341341
Publication date
Oct 26, 2023
FEI Company
Daniel TOTONJIAN
G01 - MEASURING TESTING
Information
Patent Application
Configurable Detector Panel for an X-Ray Imaging System
Publication number
20230314347
Publication date
Oct 5, 2023
Viken Detection Corporation
James P. Ryan
G01 - MEASURING TESTING
Information
Patent Application
COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...
Publication number
20230296540
Publication date
Sep 21, 2023
GATAN INC.
Johannes ÖSTERREICHER
G01 - MEASURING TESTING
Information
Patent Application
BACKSCATTER IMAGING DEVICE, CONTROL METHOD AND INSPECTION SYSTEM
Publication number
20230288350
Publication date
Sep 14, 2023
Nuctech Company Limited
Zhiqiang CHEN
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PREPARATION METHOD AND APPARATUS
Publication number
20230273136
Publication date
Aug 31, 2023
OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
John Lindsay
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
REDUCING BACKSCATTERED ELECTRON INDUCED ERRORS
Publication number
20230267574
Publication date
Aug 24, 2023
APPLIED MATERIALS ISRAEL LTD.
Lior Akerman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MATERIAL ANALYSIS WITH MULTIPLE DETECTORS
Publication number
20230258587
Publication date
Aug 17, 2023
OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Simon BURGESS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR INSPECTION PORTALS
Publication number
20230251209
Publication date
Aug 10, 2023
SMITHS DETECTION INC.
Joseph BENDAHAN
G01 - MEASURING TESTING
Information
Patent Application
Target X-Ray Inspection System and Method
Publication number
20230236140
Publication date
Jul 27, 2023
Viken Detection Corporation
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR REAL-TIME CONFIGURABLE BACKSCATTER SCANNERS
Publication number
20230236141
Publication date
Jul 27, 2023
SMITHS DETECTION INC.
Joseph BENDAHAN
G01 - MEASURING TESTING
Information
Patent Application
Handheld Backscatter Scanning Systems With Different Detector Panel...
Publication number
20230221457
Publication date
Jul 13, 2023
American Science and Engineering, Inc.
Aaron J. Couture
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods and Means for Identifying Fluid Type Inside a Conduit
Publication number
20230213459
Publication date
Jul 6, 2023
VISURAY INTECH LTD (BVI)
Kambiz Safinya
G01 - MEASURING TESTING
Information
Patent Application
1 MEV TO 3 MEV DEUTERON/PROTON CYCLOTRON FOR MATERIAL ANALYSIS
Publication number
20230204528
Publication date
Jun 29, 2023
Best Theratronics Ltd.
Richard Johnson
G01 - MEASURING TESTING
Information
Patent Application
Hand-Held Portable Backscatter Inspection System
Publication number
20230204812
Publication date
Jun 29, 2023
Rapiscan Systems, Inc.
Edward James Morton
G01 - MEASURING TESTING
Information
Patent Application
X-RAY BACKSCATTER IMAGING SYSTEM FOR PRECISE SEARCHING FOR CONTAINE...
Publication number
20230194444
Publication date
Jun 22, 2023
KOREA INSTITUTE OF OCEAN SCIENCE & TECHNOLOGY
Jongwon PARK
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR INSPECTING A STRUCTURE ACROSS A COVER LAYER C...
Publication number
20230184701
Publication date
Jun 15, 2023
INVERSA SYSTEMS LTD.
Peter Marc CABOT
G01 - MEASURING TESTING
Information
Patent Application
IMPROVED CAMERA FOR ELECTRON DIFFRACTION PATTERN ANALYSIS
Publication number
20230175991
Publication date
Jun 8, 2023
OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Robert MASTERS
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Using Backscatter Imaging in Precision Agri...
Publication number
20230152249
Publication date
May 18, 2023
American Science and Engineering, Inc.
Aaron Couture
G01 - MEASURING TESTING
Information
Patent Application
SNOW / WATER LEVEL DETECTION WITH DISTRIBUTED ACOUSTIC SENSING INTE...
Publication number
20230130862
Publication date
Apr 27, 2023
NEC Laboratories America, Inc.
Sarper OZHARAR
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION
Publication number
20230112447
Publication date
Apr 13, 2023
ASML NETHERLANDS B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS