by measuring secondary emission

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CPC
G01N23/22

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/22by measuring secondary emission

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Thin film damage detection function and charged particle beam device
- Patent number 12,265,041
- Issue date Apr 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Michio Hatano
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,265,042
- Issue date Apr 1, 2025
- Shimadzu Corporation
- Yasuyuki Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 12,265,043
- Issue date Apr 1, 2025
- NuFlare Technology, Inc.
- Riki Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Living cell microbeam directional and quantitative irradiation imag...
- Patent number 12,259,344
- Issue date Mar 25, 2025
- Harbin Institute of Technology
- Chenguang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method of preventing lamellar silica formation in glass container
- Patent number 12,251,743
- Issue date Mar 18, 2025
- Amgen Inc.
- Yasser Nashed-Samuel
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Grant
Polarized, energy dispersive x-ray fluorescence system and method
- Patent number 12,247,934
- Issue date Mar 11, 2025
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 12,247,935
- Issue date Mar 11, 2025
- Rigaku Corporation
- Yasuhiko Nagoshi
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus, and program for determining condition related to...
- Patent number 12,243,711
- Issue date Mar 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Extraterrestrial nanosecond neutron analysis and associated particl...
- Patent number 12,235,405
- Issue date Feb 25, 2025
- LUNAR HELIUM-3 MINING, LLC
- Chris Salvino
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Carbon-based optical sensor element for measuring greenhouse gas co...
- Patent number 12,235,230
- Issue date Feb 25, 2025
- NATIONAL INSTITUTE OF METEOROLOGICAL SCIENCES
- Young Suk Oh
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle beam device and inspection device
- Patent number 12,237,145
- Issue date Feb 25, 2025
- HITACHI HIGH-TECH CORPORATION
- Atsuko Shintani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometer
- Patent number 12,235,228
- Issue date Feb 25, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 12,235,229
- Issue date Feb 25, 2025
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Method for moisture measurement
- Patent number 12,228,530
- Issue date Feb 18, 2025
- Chrysos Corporation Limited
- James Tickner
- G01 - MEASURING TESTING
Information Patent Grant
Detecting downhole fluid composition utilizing photon emission
- Patent number 12,221,884
- Issue date Feb 11, 2025
- Halliburton Energy Services, Inc.
- Christopher Michael Jones
- G01 - MEASURING TESTING
Information Patent Grant
Insulating device
- Patent number 12,216,070
- Issue date Feb 4, 2025
- Kabushiki Kaisha Toshiba
- Takuo Kikuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Adsorbate analysis using optically stimulated electron emission
- Patent number 12,209,980
- Issue date Jan 28, 2025
- ANALYTICAL MECHANICS ASSOCIATES, INC.
- William T. Yost
- G01 - MEASURING TESTING
Information Patent Grant
Deposition system and method
- Patent number 12,211,756
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Hao Cheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Fabricating thin film liquid cells
- Patent number 12,209,979
- Issue date Jan 28, 2025
- Universiteit Leiden
- Pauline Marthe Gerardina Van Deursen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for voltage contrast defect detection
- Patent number 12,196,692
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Weiming Ren
- G01 - MEASURING TESTING
Information Patent Grant
Methods for growing crystals on QCM sensors
- Patent number 12,195,840
- Issue date Jan 14, 2025
- Saudi Arabian Oil Company
- Ayrat Gizzatov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Imaging systems and methods of operating the same
- Patent number 12,196,693
- Issue date Jan 14, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting microbial agents
- Patent number 12,188,886
- Issue date Jan 7, 2025
- Nanoscout Holdings Pty Ltd.
- Samuel Weitzman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for tissue section immobilization and retention
- Patent number 12,181,388
- Issue date Dec 31, 2024
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Utilize machine learning in selecting high quality averaged SEM ima...
- Patent number 12,182,983
- Issue date Dec 31, 2024
- ASML Netherlands B.V.
- Chen Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus to operate a quality control in industrial production lin...
- Patent number 12,181,429
- Issue date Dec 31, 2024
- DE.TEC.TOR S.r.l.
- Giuseppe Pitta'
- G01 - MEASURING TESTING
Information Patent Grant
Pattern measurement device and pattern measurement method
- Patent number 12,174,551
- Issue date Dec 24, 2024
- Hitachi High-Technologies Corporation
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CERAMIC SUBSTRATE, CERAMIC CIRCUIT BOARD, SEMICONDUCTOR DEVICE, MET...
- Publication number 20250113439
- Publication date Apr 3, 2025
- Kabushiki Kaisha Toshiba
- Yukihisa MATSUMOTO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS
- Publication number 20250102451
- Publication date Mar 27, 2025
- FEI Company
- Vojtech MAHEL
- G01 - MEASURING TESTING
Information Patent Application
DOWNHOLE LITHIUM DETECTION SYSTEMS AND METHODS
- Publication number 20250102699
- Publication date Mar 27, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Christian Stoller
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES
- Publication number 20250095955
- Publication date Mar 20, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBCELLULAR SELF-TRACER ION IMAGING AND LOCALIZATION METHOD OF META...
- Publication number 20250093285
- Publication date Mar 20, 2025
- Shandong Laboratory of Advanced Agricultural Sciences in Weifang
- Xiaohua HUANG
- G01 - MEASURING TESTING
Information Patent Application
XRF MEASUREMENTS OF MULTIPHASE OILFIELD FLUIDS
- Publication number 20250076228
- Publication date Mar 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Reda Karoum
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20250081534
- Publication date Mar 6, 2025
- SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Junichi KOEZUKA
- G01 - MEASURING TESTING
Information Patent Application
XRF AND CALCIMETRY EVALUATION OF MULTIPHASE OILFIELD FLUIDS
- Publication number 20250076229
- Publication date Mar 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Reda Karoum
- G01 - MEASURING TESTING
Information Patent Application
UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...
- Publication number 20250078244
- Publication date Mar 6, 2025
- ASML NETHERLANDS B.V.
- Chen ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS SYSTEM, ANALYSIS DEVICE, AND CONTROL METHOD
- Publication number 20250067690
- Publication date Feb 27, 2025
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR TISSUE SECTION IMMOBILIZATION AND RETENTION
- Publication number 20250067638
- Publication date Feb 27, 2025
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
PRODUCTION SOLUTIONS FOR HIGH-THROUGHPUT/PRECISION XPS METROLOGY US...
- Publication number 20250067691
- Publication date Feb 27, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TISSUE SECTION IMMOBILIZATION AND RETENTION
- Publication number 20250067639
- Publication date Feb 27, 2025
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY O...
- Publication number 20250062048
- Publication date Feb 20, 2025
- UNIVERSITAET HAMBURG
- Jonas BAUMANN
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Pattern Measurement Device and Pattern Measurement Method
- Publication number 20250060678
- Publication date Feb 20, 2025
- HITACHI HIGH-TECH CORPORATION
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION
- Publication number 20250060324
- Publication date Feb 20, 2025
- TOKYO ELECTRON LIMITED
- Francisco Machuca
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20250052704
- Publication date Feb 13, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Wei Ti LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR EVALUATING THE BENDING STIFFNESS OF HIGH ASPECT RATIO NA...
- Publication number 20250052703
- Publication date Feb 13, 2025
- IMEC vzw
- XiuMei Xu
- B82 - NANO-TECHNOLOGY
Information Patent Application
LITHIUM DETECTION TECHNIQUES USING NEUTRONS AND/OR ALPHA PARTICLES
- Publication number 20250044476
- Publication date Feb 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Shikha Prasad
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND FILM QUALITY INSPECTION METHOD
- Publication number 20250046569
- Publication date Feb 6, 2025
- Hitachi High-Tech Corporation
- Yasuhiro SHIRASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PREPARING GLASS NANOSTRUCTURES AND NANOSTRUCTURED SUBSTR...
- Publication number 20250034027
- Publication date Jan 30, 2025
- Corning Incorporated
- Eric Emil Leonhardt
- B82 - NANO-TECHNOLOGY
Information Patent Application
INSPECTION APPARATUS AND METHOD FOR GENERATING INSPECTION IMAGE
- Publication number 20250037269
- Publication date Jan 30, 2025
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELF-DIFFERENTIAL CONFOCAL TILT SENSOR FOR MEASURING LEVEL VARIATIO...
- Publication number 20250037966
- Publication date Jan 30, 2025
- ASML NETHERLANDS B.V.
- Jinmei YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR IMPROVED ANALYSIS OF ELECTROMAGNETIC SPECTRA
- Publication number 20250027892
- Publication date Jan 23, 2025
- Fusion Energy Solutions, Inc.
- Ian Shawn Horvath
- G01 - MEASURING TESTING
Information Patent Application
Spectrum Processing Device, Specimen Analyzing Device, and Spectrum...
- Publication number 20250029225
- Publication date Jan 23, 2025
- JEOL Ltd.
- Yuka Ebata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER AND POWER SUPPLY DEVICE
- Publication number 20250031293
- Publication date Jan 23, 2025
- Shimadzu Corporation
- Yohei UKAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...
- Publication number 20250028253
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- YEN-FONG CHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Adaptable X-Ray Analysis Apparatus
- Publication number 20250020601
- Publication date Jan 16, 2025
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Application
PHOTOELECTRON EMISSION MICROSCOPE
- Publication number 20250020604
- Publication date Jan 16, 2025
- HITACHI HIGH-TECH CORPORATION
- Momoyo ENYAMA
- G01 - MEASURING TESTING
Information Patent Application
Surface Analysis Method and Surface Analysis Apparatus
- Publication number 20250020603
- Publication date Jan 16, 2025
- Shimadzu Corporation
- Osamu FURUHASHI
- G01 - MEASURING TESTING

by measuring secondary emission

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Thin film damage detection function and charged particle beam device

X-ray fluorescence analyzer

Inspection apparatus

Living cell microbeam directional and quantitative irradiation imag...

Method of preventing lamellar silica formation in glass container

Polarized, energy dispersive x-ray fluorescence system and method

X-ray fluorescence spectrometer

Method, apparatus, and program for determining condition related to...

Inspection apparatus and inspection method

Extraterrestrial nanosecond neutron analysis and associated particl...

Carbon-based optical sensor element for measuring greenhouse gas co...

Charged particle beam device and inspection device

Spectrometer

X-ray fluorescence spectrometer

Method for moisture measurement

Detecting downhole fluid composition utilizing photon emission

Insulating device

X-ray detector system with at least two stacked flat Bragg diffractors

Adsorbate analysis using optically stimulated electron emission

Deposition system and method

Fabricating thin film liquid cells

Method for measuring distribution of pores in electrode for seconda...

Systems and methods for voltage contrast defect detection

Methods for growing crystals on QCM sensors

Imaging systems and methods of operating the same

System and method for detecting microbial agents

Device for tissue section immobilization and retention

Utilize machine learning in selecting high quality averaged SEM ima...

Apparatus to operate a quality control in industrial production lin...

Pattern measurement device and pattern measurement method

Patents Applicationslast 30 patents

CERAMIC SUBSTRATE, CERAMIC CIRCUIT BOARD, SEMICONDUCTOR DEVICE, MET...

SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS

DOWNHOLE LITHIUM DETECTION SYSTEMS AND METHODS

METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES

SUBCELLULAR SELF-TRACER ION IMAGING AND LOCALIZATION METHOD OF META...

XRF MEASUREMENTS OF MULTIPHASE OILFIELD FLUIDS

SEMICONDUCTOR DEVICE

XRF AND CALCIMETRY EVALUATION OF MULTIPHASE OILFIELD FLUIDS

UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...

ANALYSIS SYSTEM, ANALYSIS DEVICE, AND CONTROL METHOD

DEVICE FOR TISSUE SECTION IMMOBILIZATION AND RETENTION

PRODUCTION SOLUTIONS FOR HIGH-THROUGHPUT/PRECISION XPS METROLOGY US...

METHOD FOR TISSUE SECTION IMMOBILIZATION AND RETENTION

X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY O...

Pattern Measurement Device and Pattern Measurement Method

HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

METHOD FOR EVALUATING THE BENDING STIFFNESS OF HIGH ASPECT RATIO NA...

LITHIUM DETECTION TECHNIQUES USING NEUTRONS AND/OR ALPHA PARTICLES

INSPECTION DEVICE AND FILM QUALITY INSPECTION METHOD

METHOD FOR PREPARING GLASS NANOSTRUCTURES AND NANOSTRUCTURED SUBSTR...

INSPECTION APPARATUS AND METHOD FOR GENERATING INSPECTION IMAGE

SELF-DIFFERENTIAL CONFOCAL TILT SENSOR FOR MEASURING LEVEL VARIATIO...

SYSTEMS AND METHODS FOR IMPROVED ANALYSIS OF ELECTROMAGNETIC SPECTRA

Spectrum Processing Device, Specimen Analyzing Device, and Spectrum...

X-RAY FLUORESCENCE ANALYZER AND POWER SUPPLY DEVICE

METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...

Adaptable X-Ray Analysis Apparatus

PHOTOELECTRON EMISSION MICROSCOPE

Surface Analysis Method and Surface Analysis Apparatus