by measuring secondary emission

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CPC
G01N23/22

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/22by measuring secondary emission

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Inspection system, lithographic apparatus, and inspection method
- Patent number 12,313,980
- Issue date May 27, 2025
- ASML Netherlands B.V.
- Alexey Olegovich Polyakov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coincidence technique-based x-ray detection device and composition...
- Patent number 12,313,574
- Issue date May 27, 2025
- SHANDONG UNIVERSITY
- Chen Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for analyzing prostate biopsy
- Patent number 12,306,172
- Issue date May 20, 2025
- ProSight Ltd.
- Meir Weksler
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a sample by means of multiple c...
- Patent number 12,306,121
- Issue date May 20, 2025
- DELMIC IP B.V.
- Andries Pieter Johan Effting
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for biological analyte studying using x-ray fl...
- Patent number 12,306,120
- Issue date May 20, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for obtaining information about a sample
- Patent number 12,306,100
- Issue date May 20, 2025
- LAVCHIEFF Analytics GmbH
- Ventsislav Lavchiev
- G01 - MEASURING TESTING
Information Patent Grant
Device for tissue section immobilization and retention
- Patent number 12,298,211
- Issue date May 13, 2025
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Study method for chlorite growth pattern based on in-situ high-prec...
- Patent number 12,298,292
- Issue date May 13, 2025
- CHENGDU UNIVERSITY OF TECHNOLOGY
- Laixing Cai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for closing the input opening in the sample chamber in an x-...
- Patent number 12,298,262
- Issue date May 13, 2025
- Wolfgang Gehrlein
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for stress testing of materials using laser accel...
- Patent number 12,298,263
- Issue date May 13, 2025
- Institut National de la Recherche Scientifique
- Patrizio Antici
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,292,397
- Issue date May 6, 2025
- Shimadzu Corporation
- Yuji Morihisa
- G01 - MEASURING TESTING
Information Patent Grant
Highly selective chromatography-molecular rotational resonance spec...
- Patent number 12,292,399
- Issue date May 6, 2025
- BrightSpec, Inc.
- Justin L. Neill
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis system and method with multi-source design
- Patent number 12,292,396
- Issue date May 6, 2025
- SHENZHEN ANGSTROM EXCELLENCE TECHNOLOGY CO. LTD
- Xuena Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for interpreting high energy interactions
- Patent number 12,292,398
- Issue date May 6, 2025
- Veracio Ltd.
- Brandon Lee Goodchild Drake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and measuring device for measuring objects by means of x-ray...
- Patent number 12,287,302
- Issue date Apr 29, 2025
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Martin Leibfritz
- G01 - MEASURING TESTING
Information Patent Grant
Downhole lithium detection systems and methods
- Patent number 12,282,136
- Issue date Apr 22, 2025
- Schlumberger Technology Corporation
- Christian Stoller
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 12,281,893
- Issue date Apr 22, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid scanning electron microscopy and acousto-optic based metrology
- Patent number 12,278,085
- Issue date Apr 15, 2025
- Applied Materials Israel Ltd.
- Guy Shwartz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultrahigh surface area materials and methods of making the same
- Patent number 12,270,959
- Issue date Apr 8, 2025
- University of South Florida
- Jay A. Bieber
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,270,774
- Issue date Apr 8, 2025
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
X ray fluorescence analyzer
- Patent number 12,270,773
- Issue date Apr 8, 2025
- Shimadzu Corporation
- Yuji Morihisa
- G01 - MEASURING TESTING
Information Patent Grant
Thin film damage detection function and charged particle beam device
- Patent number 12,265,041
- Issue date Apr 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Michio Hatano
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,265,042
- Issue date Apr 1, 2025
- Shimadzu Corporation
- Yasuyuki Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 12,265,043
- Issue date Apr 1, 2025
- NuFlare Technology, Inc.
- Riki Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Living cell microbeam directional and quantitative irradiation imag...
- Patent number 12,259,344
- Issue date Mar 25, 2025
- Harbin Institute of Technology
- Chenguang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method of preventing lamellar silica formation in glass container
- Patent number 12,251,743
- Issue date Mar 18, 2025
- Amgen Inc.
- Yasser Nashed-Samuel
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Grant
Polarized, energy dispersive x-ray fluorescence system and method
- Patent number 12,247,934
- Issue date Mar 11, 2025
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 12,247,935
- Issue date Mar 11, 2025
- Rigaku Corporation
- Yasuhiko Nagoshi
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus, and program for determining condition related to...
- Patent number 12,243,711
- Issue date Mar 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR CALCULATING FILM THICKNESS OF GRAIN BOUNDARY OXIDE LAYER...
- Publication number 20250164422
- Publication date May 22, 2025
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Koji SASAKI
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
- Publication number 20250162487
- Publication date May 22, 2025
- Veracio Ltd
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Application
SPECTROMETER
- Publication number 20250164421
- Publication date May 22, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Application
DEEP LEARNING OF BISMUTH TELLURIDE CRYSTAL SIZE AND GRAIN BOUNDARIE...
- Publication number 20250164423
- Publication date May 22, 2025
- ATS IP, LLC
- Jake Perez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for evaluating suitability of a pharmaceutical container for...
- Publication number 20250164424
- Publication date May 22, 2025
- SCHOTT Pharma AG & Co. KGaA
- Matthias BICKER
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND DEVICE FOR PROCESSING DATA CONFORMING TO STATISTICAL DIS...
- Publication number 20250155389
- Publication date May 15, 2025
- Seoul National University R&DB Foundation
- Changyoung KIM
- G01 - MEASURING TESTING
Information Patent Application
PROMPT GAMMA NEUTRON ACTIVATION ANALYSIS APPARATUS
- Publication number 20250155388
- Publication date May 15, 2025
- Korea Atomic Energy Research Institute
- Sunghwan YUN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PREVENTING LAMELLAR SILICA FORMATION IN GLASS CONTAINER
- Publication number 20250153228
- Publication date May 15, 2025
- Amgen Inc.
- Yasser Nashed-Samuel
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Application
HIGH-CONTRAST EN-BLOC STAINING OF MOUSE WHOLE-BRAIN AND HUMAN BRAIN...
- Publication number 20250155336
- Publication date May 15, 2025
- Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
- Kun SONG
- G01 - MEASURING TESTING
Information Patent Application
MONITORING NANOPARTICLE ADDITIVES IN WELLBORE TREATMENT FLUID USING...
- Publication number 20250146918
- Publication date May 8, 2025
- Halliburton Energy Services, Inc.
- Preston Andrew May
- B82 - NANO-TECHNOLOGY
Information Patent Application
FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR...
- Publication number 20250147433
- Publication date May 8, 2025
- ASML NETHERLANDS B.V.
- Tsung-Pao FANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Ion Milling Device, and Inspection System
- Publication number 20250149288
- Publication date May 8, 2025
- Hitachi High-Tech Corporation
- Naohiro FUJITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...
- Publication number 20250146960
- Publication date May 8, 2025
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
IN-SITU OZONE GENERATION IN XPS INSTRUMENTS
- Publication number 20250137950
- Publication date May 1, 2025
- VG Systems Limited
- Paul Mack
- G01 - MEASURING TESTING
Information Patent Application
FAST NONDESTRUCTIVE METHOD TO EVALUATE THE CURATIVE SYSTEM OF RUBBE...
- Publication number 20250137949
- Publication date May 1, 2025
- CNPC USA Corp.
- Scott MENG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20250137947
- Publication date May 1, 2025
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ken GOTO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ANALYZING COMPOSITION AND METHOD THEREOF
- Publication number 20250137948
- Publication date May 1, 2025
- Hyundai Motor Company
- Jun Young Shin
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETEC...
- Publication number 20250130184
- Publication date Apr 24, 2025
- HORIBA, LTD.
- Shunsuke MURATA
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...
- Publication number 20250130185
- Publication date Apr 24, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Uri Hadar
- G01 - MEASURING TESTING
Information Patent Application
SPECTRA DELTA METROLOGY
- Publication number 20250123225
- Publication date Apr 17, 2025
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FRO...
- Publication number 20250116617
- Publication date Apr 10, 2025
- Yeda Research and Development Co. Ltd.
- Michael Elbaum
- G01 - MEASURING TESTING
Information Patent Application
CERAMIC SUBSTRATE, CERAMIC CIRCUIT BOARD, SEMICONDUCTOR DEVICE, MET...
- Publication number 20250113439
- Publication date Apr 3, 2025
- Kabushiki Kaisha Toshiba
- Yukihisa MATSUMOTO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS
- Publication number 20250102451
- Publication date Mar 27, 2025
- FEI Company
- Vojtech MAHEL
- G01 - MEASURING TESTING
Information Patent Application
DOWNHOLE LITHIUM DETECTION SYSTEMS AND METHODS
- Publication number 20250102699
- Publication date Mar 27, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Christian Stoller
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES
- Publication number 20250095955
- Publication date Mar 20, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBCELLULAR SELF-TRACER ION IMAGING AND LOCALIZATION METHOD OF META...
- Publication number 20250093285
- Publication date Mar 20, 2025
- Shandong Laboratory of Advanced Agricultural Sciences in Weifang
- Xiaohua HUANG
- G01 - MEASURING TESTING
Information Patent Application
XRF MEASUREMENTS OF MULTIPHASE OILFIELD FLUIDS
- Publication number 20250076228
- Publication date Mar 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Reda Karoum
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20250081534
- Publication date Mar 6, 2025
- SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Junichi KOEZUKA
- G01 - MEASURING TESTING
Information Patent Application
XRF AND CALCIMETRY EVALUATION OF MULTIPHASE OILFIELD FLUIDS
- Publication number 20250076229
- Publication date Mar 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Reda Karoum
- G01 - MEASURING TESTING
Information Patent Application
UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...
- Publication number 20250078244
- Publication date Mar 6, 2025
- ASML NETHERLANDS B.V.
- Chen ZHANG
- G06 - COMPUTING CALCULATING COUNTING

by measuring secondary emission

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Inspection system, lithographic apparatus, and inspection method

Coincidence technique-based x-ray detection device and composition...

Method and system for analyzing prostate biopsy

Method and apparatus for inspecting a sample by means of multiple c...

Apparatus and method for biological analyte studying using x-ray fl...

Measurement system and method for obtaining information about a sample

Device for tissue section immobilization and retention

Study method for chlorite growth pattern based on in-situ high-prec...

Device for closing the input opening in the sample chamber in an x-...

Method and system for stress testing of materials using laser accel...

X-ray fluorescence analyzer

Highly selective chromatography-molecular rotational resonance spec...

X-ray analysis system and method with multi-source design

Systems and methods for interpreting high energy interactions

Method and measuring device for measuring objects by means of x-ray...

Downhole lithium detection systems and methods

Characterizing and measuring in small boxes using XPS with multiple...

Hybrid scanning electron microscopy and acousto-optic based metrology

Ultrahigh surface area materials and methods of making the same

System to inspect, modify or analyze a region of interest of a samp...

X ray fluorescence analyzer

Thin film damage detection function and charged particle beam device

X-ray fluorescence analyzer

Inspection apparatus

Living cell microbeam directional and quantitative irradiation imag...

Method of preventing lamellar silica formation in glass container

Polarized, energy dispersive x-ray fluorescence system and method

X-ray fluorescence spectrometer

Method, apparatus, and program for determining condition related to...

Inspection apparatus and inspection method

Patents Applicationslast 30 patents

METHOD FOR CALCULATING FILM THICKNESS OF GRAIN BOUNDARY OXIDE LAYER...

Systems And Methods For Analyzing Core Using X-Ray Fluorescence

SPECTROMETER

DEEP LEARNING OF BISMUTH TELLURIDE CRYSTAL SIZE AND GRAIN BOUNDARIE...

Method for evaluating suitability of a pharmaceutical container for...

METHOD AND DEVICE FOR PROCESSING DATA CONFORMING TO STATISTICAL DIS...

PROMPT GAMMA NEUTRON ACTIVATION ANALYSIS APPARATUS

METHOD OF PREVENTING LAMELLAR SILICA FORMATION IN GLASS CONTAINER

HIGH-CONTRAST EN-BLOC STAINING OF MOUSE WHOLE-BRAIN AND HUMAN BRAIN...

MONITORING NANOPARTICLE ADDITIVES IN WELLBORE TREATMENT FLUID USING...

FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR...

Ion Milling Device, and Inspection System

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...

IN-SITU OZONE GENERATION IN XPS INSTRUMENTS

FAST NONDESTRUCTIVE METHOD TO EVALUATE THE CURATIVE SYSTEM OF RUBBE...

X-RAY ANALYSIS APPARATUS

APPARATUS FOR ANALYZING COMPOSITION AND METHOD THEREOF

SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETEC...

NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...

SPECTRA DELTA METROLOGY

SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FRO...

CERAMIC SUBSTRATE, CERAMIC CIRCUIT BOARD, SEMICONDUCTOR DEVICE, MET...

SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS

DOWNHOLE LITHIUM DETECTION SYSTEMS AND METHODS

METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES

SUBCELLULAR SELF-TRACER ION IMAGING AND LOCALIZATION METHOD OF META...

XRF MEASUREMENTS OF MULTIPHASE OILFIELD FLUIDS

SEMICONDUCTOR DEVICE

XRF AND CALCIMETRY EVALUATION OF MULTIPHASE OILFIELD FLUIDS

UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...