CPC
G01N23/22
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Topcon Corporation
Shigenori Nagano
G01 - MEASURING TESTING
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PROTERIAL, LTD.
Shunsuke Goto
G01 - MEASURING TESTING
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X-Centric Sciences Inc.
Roozbeh Ravansari
G01 - MEASURING TESTING
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Semiconductor Energy Laboratory Co., Ltd.
Junichi Koezuka
G01 - MEASURING TESTING
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Sigray, Inc.
Wenbing Yun
H01 - BASIC ELECTRIC ELEMENTS
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Taiwan Semiconductor Manufacturing Company, Ltd
Chia-Hsi Wang
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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The Regents of the University of California
Feng Wang
H01 - BASIC ELECTRIC ELEMENTS
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Redlen Technologies, Inc.
Krzysztof Iniewski
G01 - MEASURING TESTING
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Samsung Electronics Co., Ltd.
Eunkyu Lee
H01 - BASIC ELECTRIC ELEMENTS
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Shimadzu Corporation
Yuta Saito
G01 - MEASURING TESTING
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HITACHI HIGH-TECH CORPORATION
Wei Chean Tan
H01 - BASIC ELECTRIC ELEMENTS
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Shanghai Jiaotong University
Jiao Zhang
G01 - MEASURING TESTING
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Schlumberger Technology Corporation
Sergey Mikhailovich Makarychev-Mikhailov
G01 - MEASURING TESTING
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GM Global Technology Operations LLC
Hassan Ghassemi-Armaki
G06 - COMPUTING CALCULATING COUNTING
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Komatsu Ltd.
Yuichi Kodama
E21 - EARTH DRILLING MINING
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NuFlare Technology, Inc.
Koichi Ishii
G01 - MEASURING TESTING
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Honeywell Federal Manufacturing & Technologies, LLC
Joseph Sang Kim
G01 - MEASURING TESTING
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University of Electronic Science and Technology of China
Fang Huang
B64 - AIRCRAFT AVIATION COSMONAUTICS
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Core Laboratories LP
Derek Raymond Beckett
G01 - MEASURING TESTING
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Nippon Micrometal Corporation
Tomohiro Uno
H01 - BASIC ELECTRIC ELEMENTS
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FEI Company
Darius Koĉár
G06 - COMPUTING CALCULATING COUNTING
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The University of Tokyo
Shik Shin
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
HITACHI HIGH-TECH CORPORATION
U Oh
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Schlumberger Technology Corporation
Shikha Prasad
E21 - EARTH DRILLING MINING
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Patent Grant
Shanghai Institute of Measurement and Testing Technology
Lihua Lei
G01 - MEASURING TESTING
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COZAI LTD
Hagai Cohen
G01 - MEASURING TESTING
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FEI Company
Yuchen Deng
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
ORGANTECH, INC.
Takashi Tsuji
G01 - MEASURING TESTING
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Patent Grant
GM Global Technology Operations LLC
Shaomao Xu
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Veracio Ltd.
Peter Kanck
B60 - VEHICLES IN GENERAL
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Patent Application
Purdue Research Foundation
Aaron James Specht
G01 - MEASURING TESTING
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Patent Application
SAMSUNG DISPLAY CO., LTD.
Won Hyuk JANG
G01 - MEASURING TESTING
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Patent Application
FEI Company
Marek Vanatka
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
Samsung Electronics Co., Ltd.
Doyoung Yoon
G01 - MEASURING TESTING
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Patent Application
FEI Company
Jan Trojek
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
IXRF, Inc.
Robert Tisdale
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
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Patent Application
ASML NETHERLANDS B.V.
Benoit Herve GAURY
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
Yurun LIU
G01 - MEASURING TESTING
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Patent Application
APPLIED MATERIALS ISRAEL LTD.
Doron Girmonsky
G01 - MEASURING TESTING
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Patent Application
HORIBA, LTD.
Koji ISHIKURA
G01 - MEASURING TESTING
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Patent Application
Singular Genomics Systems, Inc.
Yuji Ishitsuka
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
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Patent Application
HORIBA, LTD.
Daisuke MATSUNAGA
G01 - MEASURING TESTING
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Patent Application
Samsung Electronics Co., Ltd.
Minsu Kim
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
Samsung Electronics Co., Ltd.
Soobin SINN
G01 - MEASURING TESTING
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Patent Application
APPLIED MATERIALS ISRAEL LTD.
Ron MEIRY
G01 - MEASURING TESTING
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Patent Application
APPLIED MATERIALS ISRAEL LTD.
Uri Hadar
G01 - MEASURING TESTING
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Patent Application
Hitachi High-Tech Corporation
Keiichi TANAKA
G01 - MEASURING TESTING
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Patent Application
PROTERIAL, LTD.
Shiho Fukumoto
G01 - MEASURING TESTING
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Patent Application
ASML NETHERLANDS B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Rigaku Corporation
Yuji HATAYAMA
G01 - MEASURING TESTING
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Patent Application
B.G. NEGEV TECHNOLOGIES AND APPLICATIONS LTD., at BEN-GURION UNIVERSITY
Lotem GOTNAYER
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Patent Application
Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
Bruno Schroth
G01 - MEASURING TESTING
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Patent Application
NGK Insulators, Ltd.
Yoshitaka KURAOKA
C30 - CRYSTAL GROWTH
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Patent Application
SGM MAGNETICS S.P.A.
Stefano DANESI
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
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Patent Application
LUNAR HELIUM-3 MINING, LLC
Chris Salvino
B60 - VEHICLES IN GENERAL
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Patent Application
FEI Company
Sean M. Kellogg
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
DIAMATEX S.R.L.
Danilo PACELLA
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Hitachi High-Tech Corporation
Keiichi TANAKA
G01 - MEASURING TESTING
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Patent Application
IXRF, Inc.
Robert Clayton Tisdale
G01 - MEASURING TESTING
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Patent Application
Chevron U.S.A. Inc.
Eliza MATHIA
G01 - MEASURING TESTING
