by measuring secondary emission

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CPC
G01N23/22

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/22by measuring secondary emission

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus
- Patent number 12,169,182
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Wei Chean Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,166,006
- Issue date Dec 10, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Seal element for a pipeline pig
- Patent number 12,163,591
- Issue date Dec 10, 2024
- Rosen Swiss AG
- Patrik Rosen
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 12,165,834
- Issue date Dec 10, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam delayering system and method, topographically enhanced del...
- Patent number 12,165,840
- Issue date Dec 10, 2024
- Techinsights Inc.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 12,165,863
- Issue date Dec 10, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
XPS metrology for process control in selective deposition
- Patent number 12,158,437
- Issue date Dec 3, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Charles Larson
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Identification of mycotoxin absorption materials in clay deposits
- Patent number 12,158,461
- Issue date Dec 3, 2024
- Halliburton Energy Services, Inc.
- Marina Carbo
- G01 - MEASURING TESTING
Information Patent Grant
Manipulating and detecting biological samples
- Patent number 12,158,402
- Issue date Dec 3, 2024
- Singular Genomics Systems, Inc.
- Yuji Ishitsuka
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Cell analysis apparatus and cell analysis method
- Patent number 12,146,846
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Akiko Hisada
- G01 - MEASURING TESTING
Information Patent Grant
Self-differential confocal tilt sensor for measuring level variatio...
- Patent number 12,142,456
- Issue date Nov 12, 2024
- ASML Netherlands B.V.
- Jinmei Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
Dual speed acquisition for drift corrected, fast, low dose, adaptiv...
- Patent number 12,136,532
- Issue date Nov 5, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single cell analysis using secondary ion mass spectrometry
- Patent number 12,135,300
- Issue date Nov 5, 2024
- The Board of Trustees of the Leland Stanford Junior University
- Garry P. Nolan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,132,026
- Issue date Oct 29, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for projecting an array of multiple charged pa...
- Patent number 12,123,841
- Issue date Oct 22, 2024
- DELMIC IP B.V.
- Andries Pieter Johan Effting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for handling melt samples in a steelworks laboratory, and st...
- Patent number 12,123,862
- Issue date Oct 22, 2024
- thyssenkrupp Polysius GmbH
- Reinhard Teutenberg
- G01 - MEASURING TESTING
Information Patent Grant
Serial arrangement having multiple plies of asymmetric filter media...
- Patent number 12,115,502
- Issue date Oct 15, 2024
- Sartorius Stedim Biotech GmbH
- Volkmar Thom
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Charged particle detection for spectroscopic techniques
- Patent number 12,117,406
- Issue date Oct 15, 2024
- VG Systems Limited
- Bryan Barnard
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for determining the mineralogy of drill solids
- Patent number 12,111,273
- Issue date Oct 8, 2024
- Schlumberger Technology Corporation
- Jonathan Mitchell
- E21 - EARTH DRILLING MINING
Information Patent Grant
Sample preparation method and sample preparing apparatus
- Patent number 12,111,264
- Issue date Oct 8, 2024
- Nikon Corporation
- Ichiro Sase
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
System for estimating the occurrence of defects, and computer-reada...
- Patent number 12,111,272
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for measuring fast neutron fluence for a nuclear reactor, as...
- Patent number 12,111,432
- Issue date Oct 8, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Jonathan Dumazert
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray spectrometer and pulse height prediction program
- Patent number 12,105,035
- Issue date Oct 1, 2024
- Rigaku Corporation
- Tsutomu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for monitoring beam profile and power
- Patent number 12,105,036
- Issue date Oct 1, 2024
- ASML Netherlands B.V.
- Jian Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample fixation mechanism for test with nano-probe, apparatus for t...
- Patent number 12,099,076
- Issue date Sep 24, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jiabao Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Construction method for photocathode indirect competition sensor an...
- Patent number 12,092,601
- Issue date Sep 17, 2024
- Oil Crops Research Institute of Chinese Academy of Agricultural Sciences
- Zhaowei Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Scanning charged-particle-beam microscopy with energy-dispersive x-...
- Patent number 12,094,684
- Issue date Sep 17, 2024
- Mochii, Inc.
- Christopher Su-Yan Own
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement of metal or alloy coating
- Patent number 12,092,594
- Issue date Sep 17, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Image contrast enhancement in sample inspection
- Patent number 12,087,542
- Issue date Sep 10, 2024
- ASML Netherlands B.V.
- Yixiang Wang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND SYSTEM FOR DETECTING RADIATION EMITTED BY A SAMPLE IRRAD...
- Publication number 20240418659
- Publication date Dec 19, 2024
- Politecnico Di Milano
- Carlo Ettore FIORINI
- G01 - MEASURING TESTING
Information Patent Application
Magnetic Deflector and Methods of Use Thereof
- Publication number 20240418662
- Publication date Dec 19, 2024
- University of North Texas
- Gary Alan Glass
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...
- Publication number 20240418660
- Publication date Dec 19, 2024
- FEI Company
- Daniel TOTONJIAN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20240418661
- Publication date Dec 19, 2024
- Rigaku Corporation
- Yoshiyuki KATAOKA
- G01 - MEASURING TESTING
Information Patent Application
FRICTION REGULATION METHOD, APPARATUS AND SYSTEM FOR MOLYBDENUM DIS...
- Publication number 20240410916
- Publication date Dec 12, 2024
- Tsinghua University
- Dameng Liu
- C10 - PETROLEUM, GAS OR COKE INDUSTRIES TECHNICAL GASES CONTAINING CARBON MON...
Information Patent Application
SYSTEMS AND METHODS FOR MONITORING SLOPE STABILITY
- Publication number 20240410842
- Publication date Dec 12, 2024
- Muon Vision Inc.
- Tancredi Botto
- E21 - EARTH DRILLING MINING
Information Patent Application
MULTI-BEAM PARTICLE MICROSCOPE FOR REDUCING PARTICLE BEAM-INDUCED T...
- Publication number 20240402104
- Publication date Dec 5, 2024
- Carl Zeiss MultiSEM GmbH
- Gero Storeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY ANALYZER
- Publication number 20240402101
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Tetsuya YONEDA
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
- Publication number 20240401940
- Publication date Dec 5, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INV...
- Publication number 20240404786
- Publication date Dec 5, 2024
- Carl Zeiss SMT GMBH
- Ivo IHRKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS
- Publication number 20240402102
- Publication date Dec 5, 2024
- FEI Company
- Scott Connors
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR THREE-DIMENSIONAL TOMOGRAPHY OF ELONGATED SAMPLES
- Publication number 20240402103
- Publication date Dec 5, 2024
- FEI Company
- Erik Michiel Franken
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CHARACTERIZING A NETWORK TO BE ANALYSED COMPRISING PERIO...
- Publication number 20240394867
- Publication date Nov 28, 2024
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Lucas JALOUSTRE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analysis System
- Publication number 20240393270
- Publication date Nov 28, 2024
- Hitachi High-Tech Corporation
- Azusa KONNO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...
- Publication number 20240393269
- Publication date Nov 28, 2024
- Carl Zeiss SMT GMBH
- Jens Oster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER
- Publication number 20240393268
- Publication date Nov 28, 2024
- Shimadzu Corporation
- Yuji MORIHISA
- G01 - MEASURING TESTING
Information Patent Application
SiC CRYSTAL SUBSTRATE, METHOD OF MANUFACTURING SiC CRYSTAL SUBSTRAT...
- Publication number 20240387640
- Publication date Nov 21, 2024
- Sumitomo Electric Industries, Ltd.
- Issei SATOH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MODELLING AND PREDICTION OF VIRTUAL QUALITY CONTROL DATA INCORPORAT...
- Publication number 20240387295
- Publication date Nov 21, 2024
- SANDISK TECHNOLOGIES, INC.
- Tsuyoshi Sendoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AN X-RAY FLUORESCENCE SYSTEM
- Publication number 20240385129
- Publication date Nov 21, 2024
- Commonwealth Scientific and Industrial Research Organisation
- Brianna Ganly
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER AND X-RAY APERTURE MEMBER
- Publication number 20240385130
- Publication date Nov 21, 2024
- Shimadzu Corporation
- Goshi AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
Analysis Device and Analysis Method
- Publication number 20240385131
- Publication date Nov 21, 2024
- JEOL Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING
Information Patent Application
Small-Angle X-Ray Scatterometry
- Publication number 20240377342
- Publication date Nov 14, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONVERTING METROLOGY DATA
- Publication number 20240377343
- Publication date Nov 14, 2024
- ASML NETHERLANDS B.V.
- Yunbo GUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CORRECTING AGE OF COLUMBITE-TANTALITE BY USING DOUBLE-RE...
- Publication number 20240377344
- Publication date Nov 14, 2024
- INSTITUTE OF GEOLOGY AND GEOPHYSICS CHINESE ACADEMY OF SCIENCES
- Xiaoxiao LING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
INTEGRATED FESEM AND LDI-TOF-MS ANALYSIS SYSTEM
- Publication number 20240369504
- Publication date Nov 7, 2024
- LG ENERGY SOLUTION, LTD.
- Soeun KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS
- Publication number 20240369505
- Publication date Nov 7, 2024
- FEI Company
- Garrett Budnik
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR CHEMICAL MECHANICAL POLISHING
- Publication number 20240363447
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Te-Chien HOU
- B24 - GRINDING POLISHING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240361261
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING

by measuring secondary emission

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Charged particle beam apparatus

Bonding wire for semiconductor devices

Seal element for a pipeline pig

Method and apparatus for Schottky TFE inspection

Ion beam delayering system and method, topographically enhanced del...

Systems and approaches for semiconductor metrology and surface anal...

XPS metrology for process control in selective deposition

Identification of mycotoxin absorption materials in clay deposits

Manipulating and detecting biological samples

Cell analysis apparatus and cell analysis method

Self-differential confocal tilt sensor for measuring level variatio...

X-ray fluorescence analyzer

Dual speed acquisition for drift corrected, fast, low dose, adaptiv...

Single cell analysis using secondary ion mass spectrometry

Bonding wire for semiconductor devices

Apparatus and method for projecting an array of multiple charged pa...

Method for handling melt samples in a steelworks laboratory, and st...

Serial arrangement having multiple plies of asymmetric filter media...

Charged particle detection for spectroscopic techniques

Systems and methods for determining the mineralogy of drill solids

Sample preparation method and sample preparing apparatus

System for estimating the occurrence of defects, and computer-reada...

System for measuring fast neutron fluence for a nuclear reactor, as...

X-ray spectrometer and pulse height prediction program

Method and apparatus for monitoring beam profile and power

Sample fixation mechanism for test with nano-probe, apparatus for t...

Construction method for photocathode indirect competition sensor an...

Scanning charged-particle-beam microscopy with energy-dispersive x-...

Measurement of metal or alloy coating

Image contrast enhancement in sample inspection

Patents Applicationslast 30 patents

COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...

DEVICE AND SYSTEM FOR DETECTING RADIATION EMITTED BY A SAMPLE IRRAD...

Magnetic Deflector and Methods of Use Thereof

PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...

X-RAY FLUORESCENCE SPECTROMETER

FRICTION REGULATION METHOD, APPARATUS AND SYSTEM FOR MOLYBDENUM DIS...

SYSTEMS AND METHODS FOR MONITORING SLOPE STABILITY

MULTI-BEAM PARTICLE MICROSCOPE FOR REDUCING PARTICLE BEAM-INDUCED T...

X-RAY ANALYZER

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...

METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INV...

AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS

METHODS FOR THREE-DIMENSIONAL TOMOGRAPHY OF ELONGATED SAMPLES

METHOD FOR CHARACTERIZING A NETWORK TO BE ANALYSED COMPRISING PERIO...

Analysis System

METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...

X-RAY FLUORESCENCE ANALYZER

SiC CRYSTAL SUBSTRATE, METHOD OF MANUFACTURING SiC CRYSTAL SUBSTRAT...

MODELLING AND PREDICTION OF VIRTUAL QUALITY CONTROL DATA INCORPORAT...

AN X-RAY FLUORESCENCE SYSTEM

X-RAY FLUORESCENCE ANALYZER AND X-RAY APERTURE MEMBER

Analysis Device and Analysis Method

Small-Angle X-Ray Scatterometry

METHOD FOR CONVERTING METROLOGY DATA

METHOD FOR CORRECTING AGE OF COLUMBITE-TANTALITE BY USING DOUBLE-RE...

INSPECTION APPARATUS AND INSPECTION METHOD

INTEGRATED FESEM AND LDI-TOF-MS ANALYSIS SYSTEM

METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS

APPARATUS AND METHODS FOR CHEMICAL MECHANICAL POLISHING

X-RAY ANALYZER