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PHYSICS
G01
Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
Current Industry
G01N23/22
by measuring secondary emission
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Patents Grants
last 30 patents
Information
Patent Grant
Adaptive specimen image acquisition
Patent number
11,982,634
Issue date
May 14, 2024
FEI Company
Pavel Potocek
G01 - MEASURING TESTING
Information
Patent Grant
Material properties from two-dimensional image
Patent number
11,982,635
Issue date
May 14, 2024
BP Corporation North America Inc.
Glen L. Gettemy
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor structure inspection using a high atomic number material
Patent number
11,984,365
Issue date
May 14, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Pei-Hsuan Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system to mimic a random structural pattern
Patent number
11,981,789
Issue date
May 14, 2024
UNM Rainforest Innovations
Sang Eon Han
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Methods and systems for determining variability of cryo-EM protein...
Patent number
11,977,039
Issue date
May 7, 2024
Ali Punjani
G01 - MEASURING TESTING
Information
Patent Grant
Inspection method and inspection apparatus
Patent number
11,978,195
Issue date
May 7, 2024
Kioxia Corporation
Keisuke Chiba
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,977,038
Issue date
May 7, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method of examining a sample using a charged particle microscope
Patent number
11,971,372
Issue date
Apr 30, 2024
FEI Company
Jan Klusácek
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,971,370
Issue date
Apr 30, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Determination method, elimination method and apparatus for electron...
Patent number
11,971,368
Issue date
Apr 30, 2024
SOUTH CHINA AGRICULTURAL UNIVERSITY
Fang Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for monitoring slope stability
Patent number
11,971,373
Issue date
Apr 30, 2024
Muon Vision Inc.
Tancredi Botto
E21 - EARTH DRILLING MINING
Information
Patent Grant
Enhanced security threat detection
Patent number
11,966,004
Issue date
Apr 23, 2024
VIKEN DETECTION CORPORATION
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Grant
Portable assessment kit and method for measuring metal content of a...
Patent number
11,965,838
Issue date
Apr 23, 2024
3AWater Oy
Tuomo Nissinen
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for acquiring elastic modulus of rock containing...
Patent number
11,965,839
Issue date
Apr 23, 2024
INST. OF GEOL. & GEOPHYS., CN ACAD. OF SCIENCES
Beixiu Huang
G01 - MEASURING TESTING
Information
Patent Grant
Surface analyzer
Patent number
11,965,841
Issue date
Apr 23, 2024
Shimadzu Corporation
Akira Ogoshi
G01 - MEASURING TESTING
Information
Patent Grant
System for optimization of hydrocarbon production
Patent number
11,965,413
Issue date
Apr 23, 2024
GRANT PRIDECO, INC.
Salim Deshmukh
E21 - EARTH DRILLING MINING
Information
Patent Grant
Charge-resistant epoxy resins for electron microscopy applications
Patent number
11,965,840
Issue date
Apr 23, 2024
The Regents of the University of California
Thomas Deerinck
G01 - MEASURING TESTING
Information
Patent Grant
Manufacturing method of sample collection component
Patent number
11,959,834
Issue date
Apr 16, 2024
Materials Analysis Technology Inc.
Pin Chang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ore component analysis device and method
Patent number
11,953,455
Issue date
Apr 9, 2024
SHANDONG UNIVERSITY
Chen Liu
G01 - MEASURING TESTING
Information
Patent Grant
Geometry based three dimensional reconstruction of a semiconductor...
Patent number
11,953,316
Issue date
Apr 9, 2024
Applied Materials Israel Ltd.
Rafael Bistritzer
G01 - MEASURING TESTING
Information
Patent Grant
Biological imaging method using X-ray fluorescence
Patent number
11,946,884
Issue date
Apr 2, 2024
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
Peiyan Cao
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
Patent number
11,942,303
Issue date
Mar 26, 2024
ASML Netherlands B.V.
Yan Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method to determine relative thermal maturity from porosities measu...
Patent number
11,940,398
Issue date
Mar 26, 2024
Saudi Arabian Oil Company
Shannon Lee Eichmann
E21 - EARTH DRILLING MINING
Information
Patent Grant
Method for improving an EBSD/TKD map
Patent number
11,940,396
Issue date
Mar 26, 2024
Bruker Nano GmbH
Daniel Radu Goran
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radiation detection device, recording medium, and positioning method
Patent number
11,940,397
Issue date
Mar 26, 2024
Horiba, Ltd.
Tomoki Aoyama
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,940,394
Issue date
Mar 26, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method for the detection and quantification of nano or micro plasti...
Patent number
11,933,740
Issue date
Mar 19, 2024
The European Union, Represented by the European Commission
Andrea Valsesia
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device
Patent number
11,935,963
Issue date
Mar 19, 2024
Semiconductor Energy Laboratory Co., Ltd.
Junichi Koezuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Nondestructive sensing device and method for inspection and measuri...
Patent number
11,933,749
Issue date
Mar 19, 2024
Texas Research International, Inc.
Doyle T. Motes
G01 - MEASURING TESTING
Information
Patent Grant
Sample mounting system for an X-ray analysis apparatus
Patent number
11,927,550
Issue date
Mar 12, 2024
Malvern Panalytical B.V.
Jaap Boksem
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SUBSTRATE INSPECTION APPARATUS AND A METHOD OF INSPECTING A SUBSTRA...
Publication number
20240151664
Publication date
May 9, 2024
Samsung Electronics Co., Ltd.
Kwang-Eun KIM
G01 - MEASURING TESTING
Information
Patent Application
DETECTION METHOD, SURFACE DENSITY DEVICE, DETECTION MEANS, AND STOR...
Publication number
20240151521
Publication date
May 9, 2024
CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Qiangjun WANG
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM
Publication number
20240151665
Publication date
May 9, 2024
Hitachi High-Tech Corporation
Yohei NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALIBRATING PARAMETER ERROR OF ELECTRON PROBE MICROANALY...
Publication number
20240151666
Publication date
May 9, 2024
Shanghai Institute of Measurement and Testing Technology
Lihua LEI
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF CALCULATING THICKNESS OF GRAPHENE LAYER AND METHOD OF MEA...
Publication number
20240151522
Publication date
May 9, 2024
Samsung Electronics Co., Ltd.
Eunkyu LEE
G01 - MEASURING TESTING
Information
Patent Application
ELECTRON MICROSCOPE, DEVICE FOR MEASURING ELECTRON-PHOTON CORRELATI...
Publication number
20240153736
Publication date
May 9, 2024
Japan Science and Technology Agency
Takumi SANNOMIYA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Analyzing Method and Analyzer
Publication number
20240142395
Publication date
May 2, 2024
JEOL Ltd.
Koki Kato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CORRECTION TECHNIQUES FOR MATERIAL CLASSIFICATION
Publication number
20240133830
Publication date
Apr 25, 2024
Sortera Technologies Inc.
Lakshmi Chellappan
G01 - MEASURING TESTING
Information
Patent Application
LUBRICATING OIL ANALYSIS
Publication number
20240133859
Publication date
Apr 25, 2024
ExxonMobil Technology and Engineering Company
Andrew SATTERFIELD
G01 - MEASURING TESTING
Information
Patent Application
Systems And Methods For Interpreting High Energy Interactions
Publication number
20240125717
Publication date
Apr 18, 2024
DECISION TREE, LLC
Brandon Lee Goodchild Drake
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE
Publication number
20240125718
Publication date
Apr 18, 2024
Silanna UV Technologies Pte Ltd
Petar Atanackovic
G01 - MEASURING TESTING
Information
Patent Application
Inspection System and Non-Transitory Computer-Readable Medium
Publication number
20240127417
Publication date
Apr 18, 2024
HITACHI HIGH-TECH CORPORATION
Takehiro HIRAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT DETECTION DEVICE AND METHOD THEREOF
Publication number
20240127425
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
Sungwook HWANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
XPS SAMPLE HOLDER, APPARATUS FOR X-RAY PHOTOELECTRON SPECTROSCOPY I...
Publication number
20240125716
Publication date
Apr 18, 2024
Korea Institute of Science and Technology
Soohyung PARK
G01 - MEASURING TESTING
Information
Patent Application
Dynamic Data Driven Detector Tuning for Improved Investigation of S...
Publication number
20240110880
Publication date
Apr 4, 2024
FEI Company
Maurice PEEMEN
G01 - MEASURING TESTING
Information
Patent Application
Systems And Methods For Detecting Beam Displacement
Publication number
20240110881
Publication date
Apr 4, 2024
FEI Company
James B. McGinn
G01 - MEASURING TESTING
Information
Patent Application
ANGLE-RESOLVING PHOTOELECTRON SPECTROMETER AND METHOD
Publication number
20240110882
Publication date
Apr 4, 2024
SCIENTA OMICRON AB
Mikael OLOFSSON
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTROSTATIC IMAGE DEVELOPER, PROCESS CARTRIDGE, IMAGE FORMING APP...
Publication number
20240103391
Publication date
Mar 28, 2024
FUJIFILM Business Innovation Corp.
Yosuke TSURUMI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...
Publication number
20240102950
Publication date
Mar 28, 2024
Industrial Technology Research Institute
Chun-Ting LIU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
Publication number
20240093603
Publication date
Mar 21, 2024
Talgat Shokanov
E21 - EARTH DRILLING MINING
Information
Patent Application
ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK
Publication number
20240094151
Publication date
Mar 21, 2024
FEI Company
Pavel Potocek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
Publication number
20240094150
Publication date
Mar 21, 2024
APPLIED MATERIALS ISRAEL LTD.
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SIGNAL PROCESSING DEVICE FOR X-RAY ANALYSIS
Publication number
20240094149
Publication date
Mar 21, 2024
Shimadzu Corporation
Yuta SAITO
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE ANALYSIS DEVICE
Publication number
20240085353
Publication date
Mar 14, 2024
Shimadzu Corporation
Yuta SAITO
G01 - MEASURING TESTING
Information
Patent Application
Z-PROFILING OF WAFERS BASED ON X-RAY MEASUREMENTS
Publication number
20240085356
Publication date
Mar 14, 2024
APPLIED MATERIALS ISRAEL LTD.
Doron Girmonsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Scanning Electron Microscope and Map Display Method for Absorption...
Publication number
20240085357
Publication date
Mar 14, 2024
JEOL Ltd.
Hideyuki Takahashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTIPLE PLASMA ION SOURCE FOR INLINE SECONDARY ION MASS SPECTROMETRY
Publication number
20240090111
Publication date
Mar 14, 2024
Ming Hong YANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
Publication number
20240085174
Publication date
Mar 14, 2024
NOVA MEASURING INSTRUMENTS INC.
Heath POIS
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
Publication number
20240087869
Publication date
Mar 14, 2024
NOVA MEASURING INSTRUMENTS INC.
David A. REED
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Thin Film Damage Detection Function and Charged Particle Beam Device
Publication number
20240085352
Publication date
Mar 14, 2024
Hitachi High-Tech Corporation
Michio HATANO
G01 - MEASURING TESTING