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G01B11/25

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

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G01B11/25by projecting a pattern

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Optimal parameter selection for structured light metrology
- Patent number 12,247,829
- Issue date Mar 11, 2025
- Lawrence Livermore National Security, LLC
- Brian Giera
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method for sheet layer
- Patent number 12,247,928
- Issue date Mar 11, 2025
- Kawasaki Jukogyo Kabushiki Kaisha
- Masataka Koyama
- G01 - MEASURING TESTING
Information Patent Grant
Image processing system
- Patent number 12,236,663
- Issue date Feb 25, 2025
- FANUC CORPORATION
- Yuta Namiki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wood optimization system, method of optimizing wood products and wo...
- Patent number 12,233,568
- Issue date Feb 25, 2025
- TIMBER TECHNOLOGY INC.
- Marc-Antoine Paquet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for measuring tools
- Patent number 12,226,868
- Issue date Feb 18, 2025
- Dr. Johannes Heidenhain GmbH
- Michael Butzhammer
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for measuring surface characteristics in optically distortin...
- Patent number 12,228,392
- Issue date Feb 18, 2025
- Electric Power Research Institute, Inc.
- David Stoutamire
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tire tread depth estimation system and method
- Patent number 12,228,473
- Issue date Feb 18, 2025
- Nissan North America, Inc.
- Vikram Krishnamurthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for determining a bending angle on a bending machine
- Patent number 12,214,403
- Issue date Feb 4, 2025
- Bystronic Laser AG
- Kevin Scharfenberg
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Line-scanning three-dimensional sensing system
- Patent number 12,215,967
- Issue date Feb 4, 2025
- Hong Kong Applied Science and Technology Research Institute Company Limited
- Jinbo Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Method, module and system for projecting onto a workpiece and image...
- Patent number 12,212,898
- Issue date Jan 28, 2025
- Dassault Systémes
- Christophe Montandon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Projection apparatus, collection apparatus, and three-dimensional s...
- Patent number 12,209,855
- Issue date Jan 28, 2025
- SHINING3D TECHNOLOGY CO., LTD.
- Chao Ma
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for the additive manufacture of a workpiece
- Patent number 12,202,205
- Issue date Jan 21, 2025
- Intom GmbH
- Martin Simon
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Detection device, detection system, detection method, and storage m...
- Patent number 12,203,744
- Issue date Jan 21, 2025
- Nikon Corporation
- Yoshihiro Nakagawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology for additive manufacturing
- Patent number 12,203,745
- Issue date Jan 21, 2025
- Nikon Corporation
- Eric Peter Goodwin
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Bone and tool tracking in robotized computer-assisted surgery
- Patent number 12,201,383
- Issue date Jan 21, 2025
- ORTHOSOFT ULC
- Louis-Philippe Amiot
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for superresolution optical measurement using sin...
- Patent number 12,203,741
- Issue date Jan 21, 2025
- BioAxial SAS
- Gabriel Y. Sirat
- G01 - MEASURING TESTING
Information Patent Grant
Phase shift-based three-dimensional measurement system with multipl...
- Patent number 12,196,542
- Issue date Jan 14, 2025
- Industrial Technology Research Institute
- Jhe-Ruei Li
- G01 - MEASURING TESTING
Information Patent Grant
System for in-process inspection of fused-filament fabricated parts...
- Patent number 12,196,543
- Issue date Jan 14, 2025
- The Boeing Company
- Zachary Renwick
- G01 - MEASURING TESTING
Information Patent Grant
Dot projector including hybrid refractive-diffractive optical elements
- Patent number 12,188,763
- Issue date Jan 7, 2025
- Lumentum Operations LLC
- John Michael Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Augmented reality ready optical tracking system
- Patent number 12,186,026
- Issue date Jan 7, 2025
- Smith & Nephew, Inc.
- Gaëtan Marti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Depth imaging method and device and computer-readable storage medium
- Patent number 12,188,759
- Issue date Jan 7, 2025
- ORBBEC INC.
- Yuhua Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional measurement device
- Patent number 12,181,273
- Issue date Dec 31, 2024
- Hamamatsu Photonics K.K.
- Kazuyoshi Hirose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hand-held tire scanner and method for obtaining a three-dimensional...
- Patent number 12,174,007
- Issue date Dec 24, 2024
- Snap-on Equipment SRL a Unico Socio
- Andrew Pryce
- B60 - VEHICLES IN GENERAL
Information Patent Grant
User interface for three-dimensional measurement device
- Patent number 12,169,121
- Issue date Dec 17, 2024
- Faro Technologies, Inc.
- Daniel Döring
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of detecting a distortion of a light pattern defining a code...
- Patent number 12,163,775
- Issue date Dec 10, 2024
- VITRONIC Dr.-Ing. Stein Bildverarbeitungssysteme GmbH
- Konstantin Ott
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring a three-dimensional shape
- Patent number 12,163,776
- Issue date Dec 10, 2024
- Koh Young Technology Inc.
- Seung-Jun Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Light irradiation device and sensor
- Patent number 12,164,130
- Issue date Dec 10, 2024
- FUJIFILM Corporation
- Hiroshi Sato
- G02 - OPTICS
Information Patent Grant
Specifying method, specifying system which accurately specifies the...
- Patent number 12,167,181
- Issue date Dec 10, 2024
- Seiko Epson Corporation
- Ippei Kurota
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intraoral scanning apparatus
- Patent number 12,155,812
- Issue date Nov 26, 2024
- 3Shape A/S
- Rune Fisker
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Laser irradiation apparatus, laser irradiation method, container, a...
- Patent number 12,152,873
- Issue date Nov 26, 2024
- Ricoh Company, Ltd.
- Kazuhiro Fujita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Three-Dimensional Information Measurement Apparatus, Measurement Me...
- Publication number 20250076036
- Publication date Mar 6, 2025
- Huawei Technologies Co., Ltd
- Hai Chen
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DISPLACEMENT METER
- Publication number 20250076033
- Publication date Mar 6, 2025
- KEYENCE CORPORATION
- Akira FUYUNO
- G01 - MEASURING TESTING
Information Patent Application
TOPOGRAPHICAL INSPECTION
- Publication number 20250076207
- Publication date Mar 6, 2025
- SPIRIT AEROSYSTEMS, INC
- Mark Haynes
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DISPLACEMENT METER
- Publication number 20250076032
- Publication date Mar 6, 2025
- KEYENCE CORPORATION
- Akira FUYUNO
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION METHOD, PROJECTOR, AND NON-TRANSITORY COMPUTER-READABLE...
- Publication number 20250080706
- Publication date Mar 6, 2025
- SEIKO EPSON CORPORATION
- Shiki Furui
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD FOR 3D PROFILE MEASUREMENTS USING COLOR FRINGE PR...
- Publication number 20250078297
- Publication date Mar 6, 2025
- NATIONAL SUN YAT-SEN UNIVERSITY
- Wei-hung SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL DISPLACEMENT METER
- Publication number 20250076034
- Publication date Mar 6, 2025
- KEYENCE CORPORATION
- Yoshitaka TSUCHIDA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DISPLACEMENT METER
- Publication number 20250076035
- Publication date Mar 6, 2025
- KEYENCE CORPORATION
- Tatsuro HOMMA
- G01 - MEASURING TESTING
Information Patent Application
FOCUS SCANNING APPARATUS RECORDING COLOR
- Publication number 20250064560
- Publication date Feb 27, 2025
- 3SHAPE A/S
- Bo ESBECH
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
HAND-HELD TIRE SCANNER AND METHOD FOR OBTAINING A THREE-DIMENSIONAL...
- Publication number 20250067558
- Publication date Feb 27, 2025
- SNAP-ON EQUIPMENT S.R.L. A UNICO SOCIO
- Andrew Pryce
- B60 - VEHICLES IN GENERAL
Information Patent Application
APPARATUS AND METHOD FOR MEASURING A THREE DIMENSIONAL SHAPE
- Publication number 20250067559
- Publication date Feb 27, 2025
- KOH YOUNG TECHNOLOGY INC.
- Seung-Jun LEE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CAMERA DEVICE
- Publication number 20250052564
- Publication date Feb 13, 2025
- LG Innotek Co., Ltd.
- Young Sik SONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INCREASING SPECKLE SPOT DENSITY, DIFFRACTIVE OPTICAL ELE...
- Publication number 20250053023
- Publication date Feb 13, 2025
- Jiaxing UPhoton Optoelectronics Technology Co., Ltd.
- Peng CHEN
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL GEOMETRY MEASUREMENT APPARATUS, THREEDIMENSIONAL...
- Publication number 20250045943
- Publication date Feb 6, 2025
- MITUTOYO CORPORATION
- Kaoru MIYATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTRAORAL SCANNER
- Publication number 20250044079
- Publication date Feb 6, 2025
- Dentlytec G.P.L. LTD.
- Benny PESACH
- G01 - MEASURING TESTING
Information Patent Application
DEFLECTOMETRY MEASUREMENT METHOD
- Publication number 20250035432
- Publication date Jan 30, 2025
- WYSE LIGHT
- SURREL Yves
- G01 - MEASURING TESTING
Information Patent Application
MEASURING UNIT AND METHOD FOR OPTICALLY MEASURING OBJECTS
- Publication number 20250035433
- Publication date Jan 30, 2025
- Carl Zeiss GOM Metrology GmbH
- Michael Jörck
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION JIG, CALIBRATION METHOD, AND MEASUREMENT SYSTEM
- Publication number 20250035430
- Publication date Jan 30, 2025
- MITUTOYO CORPORATION
- Ryosuke TANAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CALIBRATION JIG
- Publication number 20250035431
- Publication date Jan 30, 2025
- MITUTOYO CORPORATION
- Ryosuke TANAKA
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION OF SCANNING 3-D PERCEPTION SYSTEMS
- Publication number 20250027765
- Publication date Jan 23, 2025
- Summer Robotics, Inc.
- Brian Alexander Paden
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT
- Publication number 20250027766
- Publication date Jan 23, 2025
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AN INSPECTION TOOL FOR INSPECTING A CONCRETE SURFACE
- Publication number 20250020627
- Publication date Jan 16, 2025
- HUSQVARNA AB
- Andreas Jonsson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEPTH SENSOR DEVICE AND METHOD FOR OPERATING A DEPTH SENSOR DEVICE
- Publication number 20250020455
- Publication date Jan 16, 2025
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Marc OSSWALD
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR OPTICALLY MEASURING TECHNICAL SURFACES, AND DEVICE FOR C...
- Publication number 20250012564
- Publication date Jan 9, 2025
- Breitmeier Messtechnik GmbH
- Mark Alexander WEBER
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT
- Publication number 20250012565
- Publication date Jan 9, 2025
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Spatial Light System
- Publication number 20250016292
- Publication date Jan 9, 2025
- Apple Inc.
- Felipe Bacim de Araujo e Silva
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DISTANCE MEASURING DEVICE
- Publication number 20250012559
- Publication date Jan 9, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Masaharu FUKAKUSA
- G01 - MEASURING TESTING
Information Patent Application
OFF-AXIS MOTION CHARACTERIZATION OF A LINEAR ACTUATOR
- Publication number 20250003737
- Publication date Jan 2, 2025
- Applied Materials, Inc.
- Andrew Thomas Koll
- G01 - MEASURING TESTING
Information Patent Application
HANDHELD SCANNER FOR MEASURING THREE-DIMENSIONAL COORDINATES
- Publication number 20250008071
- Publication date Jan 2, 2025
- FARO TECHNOLOGIES, INC.
- Paul C. Atwell
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
STRUCTURED LIGHT CODING METHOD AND SYSTEM FOR THREE-DIMENSIONAL INF...
- Publication number 20250003740
- Publication date Jan 2, 2025
- Alliedstar (Shanghai) Medical Technology Co., Ltd.
- Houhang Wu
- G06 - COMPUTING CALCULATING COUNTING

by projecting a pattern

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optimal parameter selection for structured light metrology

Inspection device and inspection method for sheet layer

Image processing system

Wood optimization system, method of optimizing wood products and wo...

Device and method for measuring tools

Method for measuring surface characteristics in optically distortin...

Tire tread depth estimation system and method

Method and device for determining a bending angle on a bending machine

Line-scanning three-dimensional sensing system

Method, module and system for projecting onto a workpiece and image...

Projection apparatus, collection apparatus, and three-dimensional s...

Device and method for the additive manufacture of a workpiece

Detection device, detection system, detection method, and storage m...

Metrology for additive manufacturing

Bone and tool tracking in robotized computer-assisted surgery

Method and device for superresolution optical measurement using sin...

Phase shift-based three-dimensional measurement system with multipl...

System for in-process inspection of fused-filament fabricated parts...

Dot projector including hybrid refractive-diffractive optical elements

Augmented reality ready optical tracking system

Depth imaging method and device and computer-readable storage medium

Three-dimensional measurement device

Hand-held tire scanner and method for obtaining a three-dimensional...

User interface for three-dimensional measurement device

Method of detecting a distortion of a light pattern defining a code...

Apparatus and method for measuring a three-dimensional shape

Light irradiation device and sensor

Specifying method, specifying system which accurately specifies the...

Intraoral scanning apparatus

Laser irradiation apparatus, laser irradiation method, container, a...

Patents Applicationslast 30 patents

Three-Dimensional Information Measurement Apparatus, Measurement Me...

OPTICAL DISPLACEMENT METER

TOPOGRAPHICAL INSPECTION

OPTICAL DISPLACEMENT METER

CORRECTION METHOD, PROJECTOR, AND NON-TRANSITORY COMPUTER-READABLE...

SYSTEM AND METHOD FOR 3D PROFILE MEASUREMENTS USING COLOR FRINGE PR...

OPTICAL DISPLACEMENT METER

OPTICAL DISPLACEMENT METER

FOCUS SCANNING APPARATUS RECORDING COLOR

HAND-HELD TIRE SCANNER AND METHOD FOR OBTAINING A THREE-DIMENSIONAL...

APPARATUS AND METHOD FOR MEASURING A THREE DIMENSIONAL SHAPE

CAMERA DEVICE

METHOD FOR INCREASING SPECKLE SPOT DENSITY, DIFFRACTIVE OPTICAL ELE...

THREE-DIMENSIONAL GEOMETRY MEASUREMENT APPARATUS, THREEDIMENSIONAL...

INTRAORAL SCANNER

DEFLECTOMETRY MEASUREMENT METHOD

MEASURING UNIT AND METHOD FOR OPTICALLY MEASURING OBJECTS

CALIBRATION JIG, CALIBRATION METHOD, AND MEASUREMENT SYSTEM

CALIBRATION JIG

CALIBRATION OF SCANNING 3-D PERCEPTION SYSTEMS

APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT

AN INSPECTION TOOL FOR INSPECTING A CONCRETE SURFACE

DEPTH SENSOR DEVICE AND METHOD FOR OPERATING A DEPTH SENSOR DEVICE

METHOD FOR OPTICALLY MEASURING TECHNICAL SURFACES, AND DEVICE FOR C...

APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT

Spatial Light System

DISTANCE MEASURING DEVICE

OFF-AXIS MOTION CHARACTERIZATION OF A LINEAR ACTUATOR

HANDHELD SCANNER FOR MEASURING THREE-DIMENSIONAL COORDINATES

STRUCTURED LIGHT CODING METHOD AND SYSTEM FOR THREE-DIMENSIONAL INF...