by projecting a pattern

Industry

CPC
G01B11/25

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/25by projecting a pattern

Industries

Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus, image capturing apparatus, measurement syste...
- Patent number 12,320,631
- Issue date Jun 3, 2025
- Canon Kabushiki Kaisha
- Akinari Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for inspecting a surface with artifical intellige...
- Patent number 12,320,759
- Issue date Jun 3, 2025
- Virtek Vision International Inc.
- Ahmed Elhossini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated 3-D modeling of shoe parts
- Patent number 12,313,395
- Issue date May 27, 2025
- Nike, Inc.
- Patrick C. Regan
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Light source for structured light, structured light projection appa...
- Patent number 12,313,397
- Issue date May 27, 2025
- Prophesee
- Xavier Lagorce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional object scanning device and method
- Patent number 12,313,398
- Issue date May 27, 2025
- Tencent America LLC
- Yu Ji
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Freeform surface metrology and deflectometry
- Patent number 12,313,396
- Issue date May 27, 2025
- Arizona Board of Regents on behalf of the University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement apparatus, system, and production method
- Patent number 12,313,399
- Issue date May 27, 2025
- Canon Kabushiki Kaisha
- Akihiro Yamada
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
MOE-based illumination projector
- Patent number 12,313,812
- Issue date May 27, 2025
- Apple Inc.
- Roei Remez
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional scanning system and method for controlling the same
- Patent number 12,305,975
- Issue date May 20, 2025
- MEDIT CORP.
- Beom Sik Suh
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical assembly for three-dimensional measurement device and three...
- Patent number 12,306,456
- Issue date May 20, 2025
- Omron Corporation
- Takeshi Inoda
- G01 - MEASURING TESTING
Information Patent Grant
Diffractive optical element with undiffracted light expansion for e...
- Patent number 12,305,974
- Issue date May 20, 2025
- Microsoft Technology Licensing, LLC
- Andreas Georgiou
- G01 - MEASURING TESTING
Information Patent Grant
Employing patterned light to determine relative poses
- Patent number 12,307,706
- Issue date May 20, 2025
- Varjo Technologies Oy
- Ari Antti Erik Peuhkurinen
- G01 - MEASURING TESTING
Information Patent Grant
Operation accuracy measuring method
- Patent number 12,298,126
- Issue date May 13, 2025
- Disco Corporation
- Atsushi Oda
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Single nanostructure-integrated metalens
- Patent number 12,298,469
- Issue date May 13, 2025
- Hong Kong Applied Science and Technology Research Institute Co., Ltd.
- Yunhe Lai
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the mudguard edge of a vehicle on a test bench
- Patent number 12,281,890
- Issue date Apr 22, 2025
- Dürr Assembly Products GmbH
- Thomas Tentrup
- G01 - MEASURING TESTING
Information Patent Grant
Resilient dynamic projection mapping system and methods
- Patent number 12,283,059
- Issue date Apr 22, 2025
- Nike, Inc.
- Robert G. LeGaye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for characterizing objects using a light-emitt...
- Patent number 12,276,493
- Issue date Apr 15, 2025
- Markem-Imaje Corporation
- Peter W. Goodenough
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Systems and methods for creating duplicate keys
- Patent number 12,276,494
- Issue date Apr 15, 2025
- IKEYLESS, LLC
- Douglas Robertson
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Active optical compressive sensing
- Patent number 12,270,637
- Issue date Apr 8, 2025
- Lockheed Martin Corporation
- Joseph Robert Buck
- G02 - OPTICS
Information Patent Grant
Properties measurement device
- Patent number 12,268,367
- Issue date Apr 8, 2025
- DENTLYTEC G.P.L. LTD.
- Benny Pesach
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measurement system and measurement method
- Patent number 12,270,638
- Issue date Apr 8, 2025
- Industrial Technology Research Institute
- Hsiang-Chun Wei
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact vehicle orientation and alignment sensor and method
- Patent number 12,270,639
- Issue date Apr 8, 2025
- BPG Sales and Technology Investments, LLC
- Frank J. Bretl
- G01 - MEASURING TESTING
Information Patent Grant
Moving robot and controlling method for the moving robot
- Patent number 12,266,128
- Issue date Apr 1, 2025
- LG Electronics Inc.
- Juno Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Type of device(s) for automatically monitoring a coating and/or str...
- Patent number 12,264,909
- Issue date Apr 1, 2025
- QUISS QUALITAETS-INSPEKTIONSSYSTEME UND SERVICE GMBH
- Bernhard Gruber
- G01 - MEASURING TESTING
Information Patent Grant
Structured-light 3D scanning system and method
- Patent number 12,266,124
- Issue date Apr 1, 2025
- Himax Technologies Limited
- Hsueh-Tsung Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for increasing speckle spot density, diffractive optical ele...
- Patent number 12,265,233
- Issue date Apr 1, 2025
- Jiaxing UPhoton Optoelectronics Technology Co., Ltd.
- Peng Chen
- G01 - MEASURING TESTING
Information Patent Grant
Multi-mode three-dimensional scanning method and system
- Patent number 12,260,595
- Issue date Mar 25, 2025
- SCANTECH (HANGZHOU) CO., LTD.
- Jun Zheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intraoral scanner
- Patent number 12,259,231
- Issue date Mar 25, 2025
- DENTLYTEC G.P.L. LTD.
- Benny Pesach
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for controlling a light projector in a constructi...
- Patent number 12,259,243
- Issue date Mar 25, 2025
- LIGHTYX SYSTEMS LTD.
- Uri Yehuday
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and inspection device for optically inspecting a surface
- Patent number 12,259,232
- Issue date Mar 25, 2025
- ISRA VISION GMBH
- Stefan Leute
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC CALIBRATION OF INTRAORAL 3D SCANNER
- Publication number 20250184464
- Publication date Jun 5, 2025
- Align Technology, Inc.
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIUS OF CURVATURE (ROC) DETERMINATIONS BASED ON ROC-DEPENDENT OPT...
- Publication number 20250180348
- Publication date Jun 5, 2025
- VIAVI SOLUTIONS INC.
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATING DEVICE
- Publication number 20250168511
- Publication date May 22, 2025
- Qisda Corporation
- Ching-Tze Huang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ARRANGEMENT FOR OPTICAL MEASUREMENTS AND RELATED METHOD
- Publication number 20250146812
- Publication date May 8, 2025
- HEXAGON METROLOGY NORDIC AB
- Petri LEHTONEN
- G01 - MEASURING TESTING
Information Patent Application
COLLIMATING ARRAY FOR AN OPTICAL SENSING DEVICE
- Publication number 20250137775
- Publication date May 1, 2025
- SPECTRICITY
- Jonathan Borremans
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and System for Ply Boundary Detection
- Publication number 20250139784
- Publication date May 1, 2025
- The Boeing Company
- William Ko
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SCANNING METHOD AND SYSTEM
- Publication number 20250137774
- Publication date May 1, 2025
- Shining 3D Tech Co., Ltd.
- Xiaobo ZHAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INK JET PRINTER
- Publication number 20250128524
- Publication date Apr 24, 2025
- KEYENCE CORPORATION
- Mamoru Idaka
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL CONTOUR SHAPE MEASURING SYSTEM
- Publication number 20250131595
- Publication date Apr 24, 2025
- YOUNG OPTICS INC.
- Ching-Chao TSAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INK JET PRINTER
- Publication number 20250128523
- Publication date Apr 24, 2025
- KEYENCE CORPORATION
- Mamoru Idaka
- G01 - MEASURING TESTING
Information Patent Application
WAFER BOW METROLOGY SYSTEM
- Publication number 20250132180
- Publication date Apr 24, 2025
- TOKYO ELECTRON LIMITED
- Hoyoung KANG
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY FOR ADDITIVE MANUFACTURING
- Publication number 20250130037
- Publication date Apr 24, 2025
- Nikon Corporation
- Eric Peter Goodwin
- B22 - CASTING POWDER METALLURGY
Information Patent Application
INK JET PRINTER
- Publication number 20250128525
- Publication date Apr 24, 2025
- KEYENCE CORPORATION
- Mamoru Idaka
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR STRUCTURE AND SYSTEM FOR MANUFACTURING THE SAME
- Publication number 20250123570
- Publication date Apr 17, 2025
- NANYA TECHNOLOGY CORPORATION
- Cheng-Wei WANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ALIGNMENT OF OPTICAL COMPONENTS OF A PROJECTOR
- Publication number 20250123543
- Publication date Apr 17, 2025
- trinamiX GmbH
- Christian BONSIGNORE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR IN-PROCESS INSPECTION OF FUSED-FILAMENT FABRICATED PARTS...
- Publication number 20250102294
- Publication date Mar 27, 2025
- The Boeing Company
- Zachary Renwick
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
BONE AND TOOL TRACKING IN ROBOTIZED COMPUTER-ASSISTED SURGERY
- Publication number 20250099188
- Publication date Mar 27, 2025
- ORTHOSOFT ULC
- Louis-Philippe AMIOT
- G01 - MEASURING TESTING
Information Patent Application
INTRAORAL SCANNING APPARATUS
- Publication number 20250106373
- Publication date Mar 27, 2025
- 3SHAPE A/S
- Rune FISKER
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
FEATURE CORRELATION
- Publication number 20250085103
- Publication date Mar 13, 2025
- QUALCOMM Incorporated
- Kalin Mitkov ATANASSOV
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Three-Dimensional Information Measurement Apparatus, Measurement Me...
- Publication number 20250076036
- Publication date Mar 6, 2025
- Huawei Technologies Co., Ltd
- Hai Chen
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DISPLACEMENT METER
- Publication number 20250076033
- Publication date Mar 6, 2025
- KEYENCE CORPORATION
- Akira FUYUNO
- G01 - MEASURING TESTING
Information Patent Application
TOPOGRAPHICAL INSPECTION
- Publication number 20250076207
- Publication date Mar 6, 2025
- SPIRIT AEROSYSTEMS, INC
- Mark Haynes
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION METHOD, PROJECTOR, AND NON-TRANSITORY COMPUTER-READABLE...
- Publication number 20250080706
- Publication date Mar 6, 2025
- SEIKO EPSON CORPORATION
- Shiki Furui
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD FOR 3D PROFILE MEASUREMENTS USING COLOR FRINGE PR...
- Publication number 20250078297
- Publication date Mar 6, 2025
- NATIONAL SUN YAT-SEN UNIVERSITY
- Wei-hung SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL DISPLACEMENT METER
- Publication number 20250076032
- Publication date Mar 6, 2025
- KEYENCE CORPORATION
- Akira FUYUNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DISPLACEMENT METER
- Publication number 20250076034
- Publication date Mar 6, 2025
- KEYENCE CORPORATION
- Yoshitaka TSUCHIDA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DISPLACEMENT METER
- Publication number 20250076035
- Publication date Mar 6, 2025
- KEYENCE CORPORATION
- Tatsuro HOMMA
- G01 - MEASURING TESTING
Information Patent Application
FOCUS SCANNING APPARATUS RECORDING COLOR
- Publication number 20250064560
- Publication date Feb 27, 2025
- 3SHAPE A/S
- Bo ESBECH
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
HAND-HELD TIRE SCANNER AND METHOD FOR OBTAINING A THREE-DIMENSIONAL...
- Publication number 20250067558
- Publication date Feb 27, 2025
- SNAP-ON EQUIPMENT S.R.L. A UNICO SOCIO
- Andrew Pryce
- B60 - VEHICLES IN GENERAL
Information Patent Application
APPARATUS AND METHOD FOR MEASURING A THREE DIMENSIONAL SHAPE
- Publication number 20250067559
- Publication date Feb 27, 2025
- KOH YOUNG TECHNOLOGY INC.
- Seung-Jun LEE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

by projecting a pattern

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Measurement apparatus, image capturing apparatus, measurement syste...

Method and system for inspecting a surface with artifical intellige...

Automated 3-D modeling of shoe parts

Light source for structured light, structured light projection appa...

Three-dimensional object scanning device and method

Freeform surface metrology and deflectometry

Three-dimensional measurement apparatus, system, and production method

MOE-based illumination projector

Three-dimensional scanning system and method for controlling the same

Optical assembly for three-dimensional measurement device and three...

Diffractive optical element with undiffracted light expansion for e...

Employing patterned light to determine relative poses

Operation accuracy measuring method

Single nanostructure-integrated metalens

Method for measuring the mudguard edge of a vehicle on a test bench

Resilient dynamic projection mapping system and methods

Method and apparatus for characterizing objects using a light-emitt...

Systems and methods for creating duplicate keys

Active optical compressive sensing

Properties measurement device

Measurement system and measurement method

Non-contact vehicle orientation and alignment sensor and method

Moving robot and controlling method for the moving robot

Type of device(s) for automatically monitoring a coating and/or str...

Structured-light 3D scanning system and method

Method for increasing speckle spot density, diffractive optical ele...

Multi-mode three-dimensional scanning method and system

Intraoral scanner

System and method for controlling a light projector in a constructi...

Method and inspection device for optically inspecting a surface

Patents Applicationslast 30 patents

AUTOMATIC CALIBRATION OF INTRAORAL 3D SCANNER

RADIUS OF CURVATURE (ROC) DETERMINATIONS BASED ON ROC-DEPENDENT OPT...

ILLUMINATING DEVICE

ARRANGEMENT FOR OPTICAL MEASUREMENTS AND RELATED METHOD

COLLIMATING ARRAY FOR AN OPTICAL SENSING DEVICE

Method and System for Ply Boundary Detection

THREE-DIMENSIONAL SCANNING METHOD AND SYSTEM

INK JET PRINTER

THREE-DIMENSIONAL CONTOUR SHAPE MEASURING SYSTEM

INK JET PRINTER

WAFER BOW METROLOGY SYSTEM

METROLOGY FOR ADDITIVE MANUFACTURING

INK JET PRINTER

SEMICONDUCTOR STRUCTURE AND SYSTEM FOR MANUFACTURING THE SAME

METHOD FOR ALIGNMENT OF OPTICAL COMPONENTS OF A PROJECTOR

SYSTEM FOR IN-PROCESS INSPECTION OF FUSED-FILAMENT FABRICATED PARTS...

BONE AND TOOL TRACKING IN ROBOTIZED COMPUTER-ASSISTED SURGERY

INTRAORAL SCANNING APPARATUS

FEATURE CORRELATION

Three-Dimensional Information Measurement Apparatus, Measurement Me...

OPTICAL DISPLACEMENT METER

TOPOGRAPHICAL INSPECTION

CORRECTION METHOD, PROJECTOR, AND NON-TRANSITORY COMPUTER-READABLE...

SYSTEM AND METHOD FOR 3D PROFILE MEASUREMENTS USING COLOR FRINGE PR...

OPTICAL DISPLACEMENT METER

OPTICAL DISPLACEMENT METER

OPTICAL DISPLACEMENT METER

FOCUS SCANNING APPARATUS RECORDING COLOR

HAND-HELD TIRE SCANNER AND METHOD FOR OBTAINING A THREE-DIMENSIONAL...

APPARATUS AND METHOD FOR MEASURING A THREE DIMENSIONAL SHAPE