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H01F10/3277
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H
ELECTRICITY
H01
Electric elements
H01F
MAGNETS INDUCTANCES TRANSFORMERS SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
H01F10/00
Thin magnetic films
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H01F10/3277
by use of artificial ferrimagnets [AFI] only
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last 30 patents
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Patent Grant
Logic computing
Patent number
11,647,679
Issue date
May 9, 2023
Fudan University
Jiang Xiao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic memory element and memory device
Patent number
9,818,464
Issue date
Nov 14, 2017
Kabushiki Kaisha Toshiba
Daisuke Saida
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic tunnel junction structure having free layer with oblique m...
Patent number
8,338,004
Issue date
Dec 25, 2012
Korea Institute of Science and Technology
Kyung Ho Shin
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Ferromagnetic preferred grain growth promotion seed layer for amorp...
Patent number
8,278,123
Issue date
Oct 2, 2012
Canon Anelva Corporation
Young-suk Choi
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Magnetoresistive effect device and magnetic memory
Patent number
8,223,533
Issue date
Jul 17, 2012
Kabushiki Kaisha Toshiba
Jyunichi Ozeki
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Memory device and memory
Patent number
8,194,443
Issue date
Jun 5, 2012
Sony Corporation
Kazutaka Yamane
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Spin-torque oscillator, a magnetic sensor and a magnetic recording...
Patent number
8,174,798
Issue date
May 8, 2012
Kabushiki Kaisha Toshiba
Tazumi Nagasawa
B82 - NANO-TECHNOLOGY
Information
Patent Grant
MTJ sensor including domain stable free layer
Patent number
8,089,265
Issue date
Jan 3, 2012
MagIC Technologies, Inc.
Yimin Guo
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Magnetic sensing element and method for manufacturing the same
Patent number
8,009,391
Issue date
Aug 30, 2011
TDK Corporation
Kenichi Tanaka
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Tunneling magnetic sensor including platinum layer and method for p...
Patent number
7,916,436
Issue date
Mar 29, 2011
TDK Corporation
Masahiko Ishizone
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Magnetoresistance element employing Heusler alloy as magnetic layer
Patent number
7,760,473
Issue date
Jul 20, 2010
TDK Corporation
Yosuke Ide
G11 - INFORMATION STORAGE
Information
Patent Grant
MTJ sensor based method to measure an electric current
Patent number
7,750,620
Issue date
Jul 6, 2010
MagIC Technologies, Inc.
Yimin Guo
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetoresistive effect element and magnetic memory device
Patent number
7,700,982
Issue date
Apr 20, 2010
Sony Corporation
Masanori Hosomi
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic detecting element having free layer formed of NiFe alloy a...
Patent number
7,616,410
Issue date
Nov 10, 2009
TDK Corporation
Masahiko Ishizone
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic sensing element with improved magnetic sensitivity stabili...
Patent number
7,567,412
Issue date
Jul 28, 2009
Alps Electric Co., Ltd.
Ryo Nakabayashi
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic detecting element with diffusion-preventing layer between...
Patent number
7,567,413
Issue date
Jul 28, 2009
TDK Corporation
Yosuke Ide
G11 - INFORMATION STORAGE
Information
Patent Grant
MTJ sensor including domain stable free layer
Patent number
7,483,295
Issue date
Jan 27, 2009
Mag IC Technologies, Inc.
Yimin Guo
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic detector including antiferromagnetic layer, amorphous barr...
Patent number
7,443,635
Issue date
Oct 28, 2008
Alps Electric Co., Ltd.
Kenichi Tanaka
G11 - INFORMATION STORAGE
Information
Patent Grant
CPP-type giant manetoresistance effect element and magnetic compone...
Patent number
7,385,790
Issue date
Jun 10, 2008
Japan Science and Technology Agency
Kouichiro Inomata
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic sensing element containing half-metallic alloy
Patent number
7,336,451
Issue date
Feb 26, 2008
Alps Electric Co., Ltd.
Masamichi Saito
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetoresistive effect element and magnetic memory device
Patent number
7,315,053
Issue date
Jan 1, 2008
Sony Corporation
Masanori Hosomi
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic sensing element comprising a pinned magnetic layer, a free...
Patent number
7,312,960
Issue date
Dec 25, 2007
Alps Electric Co., Ltd.
Kazumi Matsuzaka
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic detecting element having pinned magnetic layers disposed o...
Patent number
7,229,706
Issue date
Jun 12, 2007
Alps Electric Co., Ltd.
Naoya Hasegawa
G11 - INFORMATION STORAGE
Information
Patent Grant
Stability-enhancing underlayer for exchange-coupled magnetic struct...
Patent number
7,116,532
Issue date
Oct 3, 2006
Hitachi Global Storage Technologies Netherlands B.V.
Matthew Joseph Carey
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetoresistive effect element and magnetic memory device
Patent number
7,034,348
Issue date
Apr 25, 2006
Sony Corporation
Kazuhiro Ohba
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetoresistive effect element and magnetic memory device
Patent number
6,999,288
Issue date
Feb 14, 2006
Sony Corporation
Takeyuki Sone
G11 - INFORMATION STORAGE
Information
Patent Grant
Exchange-coupled magnetoresistive sensor with a coercive ferrite la...
Patent number
6,992,866
Issue date
Jan 31, 2006
Hitachi Global Storage Technologies Netherlands B.V.
Matthew Joseph Carey
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetoresistive effect element and magnetic memory device
Patent number
6,992,868
Issue date
Jan 31, 2006
Sony Corporation
Takeyuki Sone
G11 - INFORMATION STORAGE
Information
Patent Grant
Spin-valve type magnetoresistive sensor and method of manufacturing...
Patent number
6,913,836
Issue date
Jul 5, 2005
Alps Electric Co., Ltd.
Naoya Hasegawa
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetoresistive device and magnetic memory device
Patent number
6,879,473
Issue date
Apr 12, 2005
Sony Corporation
Takeyuki Sone
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
SUPERPARAMAGNETIC TUNNEL JUNCTION ELEMENT AND COMPUTING SYSTEM
Publication number
20240212907
Publication date
Jun 27, 2024
TOHOKU UNIVERSITY
Keito KOBAYASHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LOGIC COMPUTING
Publication number
20210367141
Publication date
Nov 25, 2021
Fudan University
Jiang XIAO
G11 - INFORMATION STORAGE
Information
Patent Application
FERROMAGNETIC PREFERRED GRAIN GROWTH PROMOTION SEED LAYER FOR AMORP...
Publication number
20110318848
Publication date
Dec 29, 2011
Canon ANELVA Corporation
Young-suk Choi
G01 - MEASURING TESTING
Information
Patent Application
MAGNETORESISTIVE EFFECT ELEMENT
Publication number
20110254114
Publication date
Oct 20, 2011
Makoto NAGAMINE
G01 - MEASURING TESTING
Information
Patent Application
MEMORY DEVICE AND MEMORY
Publication number
20100314673
Publication date
Dec 16, 2010
SONY CORPORATION
Kazutaka Yamane
G11 - INFORMATION STORAGE
Information
Patent Application
MAGNETIC TUNNEL JUNCTION STRUCTURE HAVING FREE LAYER WITH OBLIQUE M...
Publication number
20100109111
Publication date
May 6, 2010
Kyung Ho SHIN
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
MAGNETORESISTIVE EFFECT DEVICE AND MAGNETIC MEMORY
Publication number
20100080050
Publication date
Apr 1, 2010
Kabushiki Kaisha Toshiba
Jyunichi OZEKI
G11 - INFORMATION STORAGE
Information
Patent Application
SPIN-TORQUE OSCILLATOR, A MAGNETIC SENSOR AND A MAGNETIC RECORDING...
Publication number
20100079919
Publication date
Apr 1, 2010
Kabushiki Kaisha Toshiba
Tazumi Nagasawa
G01 - MEASURING TESTING
Information
Patent Application
MTJ sensor based method to measure an electric current
Publication number
20090201018
Publication date
Aug 13, 2009
MagIC Technologies, Inc.
Yimin Guo
G01 - MEASURING TESTING
Information
Patent Application
MTJ sensor including domain stable free layer
Publication number
20090184704
Publication date
Jul 23, 2009
MagIC Technologies, Inc.
Yimin Guo
G01 - MEASURING TESTING
Information
Patent Application
Tunneling magnetic sensor including platinum layer and method for p...
Publication number
20080291586
Publication date
Nov 27, 2008
Alps Electric Co., Ltd.
Masahiko Ishizone
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSING ELEMENT AND METHOD FOR MANUFACTURING THE SAME
Publication number
20080285180
Publication date
Nov 20, 2008
Kenichi Tanaka
G01 - MEASURING TESTING
Information
Patent Application
MTJ sensor including domain stable free layer
Publication number
20080258721
Publication date
Oct 23, 2008
MagIC Technologies, Inc.
Yimin Guo
G01 - MEASURING TESTING
Information
Patent Application
MAGNETORESISTIVE EFFECT ELEMENT
Publication number
20080253039
Publication date
Oct 16, 2008
Makoto NAGAMINE
G01 - MEASURING TESTING
Information
Patent Application
MAGNETORESISTIVE EFFECT ELEMENT AND MAGNETIC MEMORY DEVICE
Publication number
20080006860
Publication date
Jan 10, 2008
SONY CORPORATION
Masanori Hosomi
G01 - MEASURING TESTING
Information
Patent Application
MAGNETORESISTANCE EFFECT DEVICE, MAGNETIC HEAD, MAGNETIC RECORDING...
Publication number
20070230067
Publication date
Oct 4, 2007
FUJITSU LIMITED
Arata Jogo
G01 - MEASURING TESTING
Information
Patent Application
MAGNETORESISTANCE ELEMENT EMPLOYING HEUSLER ALLOY AS MAGNETIC LAYER
Publication number
20070201169
Publication date
Aug 30, 2007
Alps Electric Co., Ltd.
Yosuke Ide
G01 - MEASURING TESTING
Information
Patent Application
TUNNEL TYPE MAGNETIC DETECTION ELEMENT IN WHICH FE COMPOSITION OF T...
Publication number
20070171580
Publication date
Jul 26, 2007
Alps Electric Co., Ltd.
Kazumasa Nishimura
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSING ELEMENT INCLUDING FREE LAYER CONTAINING HALF-METAL
Publication number
20060285258
Publication date
Dec 21, 2006
Kazumasa Nishimura
G01 - MEASURING TESTING
Information
Patent Application
Magnetic detecting element with diffusion-preventing layer between...
Publication number
20060227467
Publication date
Oct 12, 2006
Alps Electric Co., Ltd.
Yosuke Ide
G11 - INFORMATION STORAGE
Information
Patent Application
Magnetic detecting element having free layer formed of NiFe alloy a...
Publication number
20060198060
Publication date
Sep 7, 2006
Alps Electric Co., Ltd.
Masahiko Ishizone
G01 - MEASURING TESTING
Information
Patent Application
Cpp-type giant manetoresistance effect element and magnetic compone...
Publication number
20060139817
Publication date
Jun 29, 2006
Kouichiro Inomata
G01 - MEASURING TESTING
Information
Patent Application
Magnetic sensing element with improved magnetic sensitivity stabili...
Publication number
20060110625
Publication date
May 25, 2006
Alps Electric Co., Ltd.
Ryo Nakabayashi
G01 - MEASURING TESTING
Information
Patent Application
Magnetic detector including antiferromagnetic layer, amorphous barr...
Publication number
20060077597
Publication date
Apr 13, 2006
Alps Electric Co., Ltd.
Kenichi Tanaka
G01 - MEASURING TESTING
Information
Patent Application
Magnetic sensing element pinning magnetization of pinned magnetic l...
Publication number
20050207072
Publication date
Sep 22, 2005
Alps Electric Co., Ltd.
Kazumi Matsuzaka
G11 - INFORMATION STORAGE
Information
Patent Application
Magnetoresistive effect element and magnetic memory device
Publication number
20050162904
Publication date
Jul 28, 2005
Sony Corporation
Takeyuki Sone
G01 - MEASURING TESTING
Information
Patent Application
Magnetoresistive effect element and magnetic memory device
Publication number
20050162905
Publication date
Jul 28, 2005
Sony Corporation
Takeyuki Sone
G01 - MEASURING TESTING
Information
Patent Application
Stability-enhancing underlayer for exchange-coupled magnetic struct...
Publication number
20050122636
Publication date
Jun 9, 2005
Matthew Joseph Carey
G01 - MEASURING TESTING
Information
Patent Application
Stability-enhancing underlayer for exchange-coupled magnetic struct...
Publication number
20050036244
Publication date
Feb 17, 2005
Matthew Joseph Carey
G01 - MEASURING TESTING
Information
Patent Application
Stability-enhancing underlayer for exchange-coupled magnetic struct...
Publication number
20050030674
Publication date
Feb 10, 2005
Matthew Joseph Carey
G01 - MEASURING TESTING