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Calibrating; Standards or reference devices
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G01R35/005
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R35/00
Testing or calibrating of apparatus covered by the preceding groups
Current Industry
G01R35/005
Calibrating; Standards or reference devices
Industries
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Parallel plate capacitor system for determining impedance character...
Patent number
11,965,873
Issue date
Apr 23, 2024
TransTech Systems, Inc.
Manfred Geier
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid digital and analog signal generation systems and methods
Patent number
11,959,991
Issue date
Apr 16, 2024
Lake Shore Cryotronics, Inc.
Houston Fortney
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Active noise source design
Patent number
11,953,535
Issue date
Apr 9, 2024
Teknologian tutkimuskeskus VTT Oy
Mikko Varonen
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Synchronization of unstable signal sources for use in a phase stabl...
Patent number
11,946,994
Issue date
Apr 2, 2024
Tektronix, Inc.
Alexander Krauska
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
IMU calibration
Patent number
11,946,995
Issue date
Apr 2, 2024
TechMah Medical LLC
Mohamed R. Mahfouz
G01 - MEASURING TESTING
Information
Patent Grant
Self-calibration method for self-powered single CT current sensor
Patent number
11,946,957
Issue date
Apr 2, 2024
Siemens Aktiengesellschaft
Shou Qi Xu
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Method for determining a switching state of a valve, and solenoid v...
Patent number
11,940,059
Issue date
Mar 26, 2024
Continental Teves AG & Co. oHG
Alexander Michel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test system
Patent number
11,921,154
Issue date
Mar 5, 2024
TeraView Limited
Bryan Edward Cole
G01 - MEASURING TESTING
Information
Patent Grant
System voltage calibration
Patent number
11,899,045
Issue date
Feb 13, 2024
S&C Electric Company
David G. Porter
G01 - MEASURING TESTING
Information
Patent Grant
Frequency characteristic measurement apparatus
Patent number
11,892,534
Issue date
Feb 6, 2024
Rohm Co., Ltd.
Kenji Hamachi
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for making time domain measurements of periodic r...
Patent number
11,885,839
Issue date
Jan 30, 2024
Keysight Technologies, Inc.
Andrew Michael Owen
G01 - MEASURING TESTING
Information
Patent Grant
Auto-calibration for coreless current sensors
Patent number
11,885,866
Issue date
Jan 30, 2024
ALLEGRO MICROSYSTEMS, LLC
Yannick Vuillermet
G01 - MEASURING TESTING
Information
Patent Grant
Methods, devices, and systems for nip calibration
Patent number
11,879,918
Issue date
Jan 23, 2024
Stowe Woodward Licensco LLC
Wesley C. Van Pelt
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
High power dual probe tuner and method
Patent number
11,879,920
Issue date
Jan 23, 2024
Christos Tsironis
G01 - MEASURING TESTING
Information
Patent Grant
Self-correcting electrical current measuring devices
Patent number
11,874,361
Issue date
Jan 16, 2024
Vutility, Inc.
Micheal M. Austin
G01 - MEASURING TESTING
Information
Patent Grant
Accuracy for phasor measurement units (synchrophasors) in utility d...
Patent number
11,874,309
Issue date
Jan 16, 2024
S&C Electric Company
Michael John Meisinger
G01 - MEASURING TESTING
Information
Patent Grant
Detecting radio frequency electromagnetic radiation using vapor cel...
Patent number
11,874,311
Issue date
Jan 16, 2024
Quantum Valley Ideas Laboratories
Katelyn Dixon
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for full cycle error correction of inductor curre...
Patent number
11,867,788
Issue date
Jan 9, 2024
RENESAS ELECTRONICS AMERICA INC.
Michael Ding
G01 - MEASURING TESTING
Information
Patent Grant
Load pull system using waveguide tuner
Patent number
11,867,736
Issue date
Jan 9, 2024
Christos Tsironis
G01 - MEASURING TESTING
Information
Patent Grant
Active impedance tuner for base-band load pull
Patent number
11,863,148
Issue date
Jan 2, 2024
Christos Tsironis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Tester and method for calibrating probe card and device under testi...
Patent number
11,852,657
Issue date
Dec 26, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
You-Hsien Lin
G01 - MEASURING TESTING
Information
Patent Grant
Remote multiport modular vector analyzer system and method of use
Patent number
11,846,663
Issue date
Dec 19, 2023
Anritsu Company
Donald Anthony Bradley
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor sensitivity matching calibration
Patent number
11,828,827
Issue date
Nov 28, 2023
Melexis Technologies NV
Samuel Huber Lindenberger
G01 - MEASURING TESTING
Information
Patent Grant
Differential capacitor device and method for calibrating differenti...
Patent number
11,815,369
Issue date
Nov 14, 2023
Industrial Technology Research Institute
Lu-Po Liao
G01 - MEASURING TESTING
Information
Patent Grant
Magnetometer calibration or setting
Patent number
11,808,826
Issue date
Nov 7, 2023
Tissot SA
Edoardo Franzi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pre-screening and tuning heterojunctions for topological quantum co...
Patent number
11,808,796
Issue date
Nov 7, 2023
Microsoft Technology Licensing, LLC
Dmitry Pikulin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for analyte sensing with reduced signal inaccuracy
Patent number
11,802,843
Issue date
Oct 31, 2023
KNOW LABS, INC.
Phillip Bosua
G01 - MEASURING TESTING
Information
Patent Grant
Calibration of Rogowski sensor
Patent number
11,796,622
Issue date
Oct 24, 2023
Sagemcom Energy & Telecom SAS
Henri Teboulle
G01 - MEASURING TESTING
Information
Patent Grant
Fast convergence method for cross-correlation based modulation qual...
Patent number
11,796,621
Issue date
Oct 24, 2023
National Instruments Corporation
Sartaj Chaudhary
G01 - MEASURING TESTING
Information
Patent Grant
Electric field sensor
Patent number
11,782,081
Issue date
Oct 10, 2023
MBDA UK Limited
Andrew Michael Chugg
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ELECTRIC CIRCUIT ARRANGEMENT AND METHOD FOR THE GALVANICALLY SEPARA...
Publication number
20240151748
Publication date
May 9, 2024
BENDER GMBH & CO. KG
Pascal Becker
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION OF MAGNETOMETERS
Publication number
20240151799
Publication date
May 9, 2024
Dolby Laboratories Licensing Corporation
David S. MCGRATH
G01 - MEASURING TESTING
Information
Patent Application
SELF-CORRECTING ELECTRICAL CURRENT MEASURING DEVICES
Publication number
20240151798
Publication date
May 9, 2024
Vutility, Inc.
Micheal Austin
G01 - MEASURING TESTING
Information
Patent Application
FAST RF POWER MEASUREMENT APPARATUS FOR PRODUCTION TESTING
Publication number
20240069140
Publication date
Feb 29, 2024
Silicon Laboratories Inc.
Anant Verma
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT CORRECTION METHOD AND APPARATUS FOR SENSOR, AND SERVER...
Publication number
20240061061
Publication date
Feb 22, 2024
INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD
Mingwei WU
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TESTING IMAGE SENSOR AND OPERATING METHOD THEREOF
Publication number
20240053391
Publication date
Feb 15, 2024
Samsung Electronics Co., Ltd.
Seongkwan Lee
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED THIN-FILM RESISTIVE SENSOR WITH INTEGRATED HEATER AND ME...
Publication number
20240053425
Publication date
Feb 15, 2024
Cirrus Logic International Semiconductor Ltd.
Vamsikrishna Parupalli
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC VERTICAL SIGNAL CALIBRATION IN A TEST AND MEASUREMENT INSTR...
Publication number
20240036143
Publication date
Feb 1, 2024
Tektronix, Inc.
Shubha B
G01 - MEASURING TESTING
Information
Patent Application
Detecting Radio Frequency Electromagnetic Radiation Using Vapor Cel...
Publication number
20240036094
Publication date
Feb 1, 2024
Quantum Valley Ideas Laboratories
Katelyn Dixon
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALIBRATING GRADIENT AMPLIFIERS OF A MAGNETIC RESONANCE...
Publication number
20240027553
Publication date
Jan 25, 2024
Siemens Healthcare GmbH
Michael Köhler
G01 - MEASURING TESTING
Information
Patent Application
AUTO-CALIBRATION FOR CORELESS CURRENT SENSORS
Publication number
20240027560
Publication date
Jan 25, 2024
ALLEGRO MICROSYSTEMS, LLC
Yannick Vuillermet
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED MEASUREMENT SYSTEMS AND METHODS FOR SYNCHRONOUS, ACCURAT...
Publication number
20240019517
Publication date
Jan 18, 2024
Lake Shore Cryotronics, Inc.
Houston Fortney
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
CALIBRATION SYSTEM AND CALIBRATION METHOD FOR A VECTOR NETWORK ANAL...
Publication number
20240019471
Publication date
Jan 18, 2024
ROHDE & SCHWARZ GMBH & CO. KG
Maximilian FRIESINGER
G01 - MEASURING TESTING
Information
Patent Application
AUTO-CALIBRATION FOR CORELESS CURRENT SENSORS
Publication number
20240004016
Publication date
Jan 4, 2024
ALLEGRO MICROSYSTEMS, LLC
Yannick Vuillermet
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...
Publication number
20230417826
Publication date
Dec 28, 2023
Advantest Corporation
Matthias Werner
G01 - MEASURING TESTING
Information
Patent Application
AGING COMPENSATION FOR POLY-RESISTOR BASED CURRENT SENSE AMPLIFIER
Publication number
20230417854
Publication date
Dec 28, 2023
Ryan Desrosiers
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
CAPACITANCE DETECTION DEVICE, CAPACITANCE DETECTION METHOD, AND INP...
Publication number
20230408565
Publication date
Dec 21, 2023
ALPS ALPINE CO., LTD.
Kiyoshi SASAI
G01 - MEASURING TESTING
Information
Patent Application
PARTIAL DISCHARGE MEASUREMENT APPARATUS, PARTIAL DISCHARGE MEASUREM...
Publication number
20230408570
Publication date
Dec 21, 2023
Kabushiki Kaisha Toshiba
Akira FUJIMOTO
G01 - MEASURING TESTING
Information
Patent Application
ESTIMATION OF UNKNOWN ELECTRONIC LOAD
Publication number
20230393213
Publication date
Dec 7, 2023
KEITHLEY INSTRUMENTS, LLC
William C. Weeman
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR PRODUCING A SET OF CALIBRATION PADS, CALIBRATION PAD AND...
Publication number
20230393226
Publication date
Dec 7, 2023
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Marie-Noëlle AMIOT
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Calibrating a Measurement Device
Publication number
20230366969
Publication date
Nov 16, 2023
Solaredge Technologies Ltd.
David Braginsky
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHODS FOR DETERMINING FORCE APPLIED TO THE TIP OF A...
Publication number
20230355178
Publication date
Nov 9, 2023
THE UNIVERSITY OF SHEFFIELD
Dilichukwu ANUMBA
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
SYSTEM AND METHOD OF DIRECTIONAL SENSOR CALIBRATION
Publication number
20230349723
Publication date
Nov 2, 2023
Bench Tree Group, LLC
Jian-Qun Wu
E21 - EARTH DRILLING MINING
Information
Patent Application
DOUBLE-BALANCE ELECTRONIC TEST APPARATUS AND MEASURING INDUCTANCE,...
Publication number
20230349961
Publication date
Nov 2, 2023
Government of the United States of America, as Represented by the Secretary o...
Yicheng Wang
G01 - MEASURING TESTING
Information
Patent Application
ARRANGEMENT AND METHOD FOR CALIBRATING HIGH-VOLTAGE ELECTRONICS
Publication number
20230341496
Publication date
Oct 26, 2023
dSPACE GmbH
Manuel Fischer
G01 - MEASURING TESTING
Information
Patent Application
DETECTION UNIT, SEMICONDUCTOR FILM LAYER INSPECTION APPARATUS INCLU...
Publication number
20230341438
Publication date
Oct 26, 2023
ENGION CO., LTD.
Hyoung Sik KIM
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR MONITORING POWER LINES
Publication number
20230333191
Publication date
Oct 19, 2023
NUGRID POWER CORP.
Patrick Pablo CHAVEZ
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT CALIBRATION SYSTEMS
Publication number
20230333192
Publication date
Oct 19, 2023
HAMILTON SUNDSTRAND CORPORATION
Rajkumar Perumal
G01 - MEASURING TESTING
Information
Patent Application
BATTERY MONITORING APPARATUS
Publication number
20230333173
Publication date
Oct 19, 2023
DENSO CORPORATION
Yuuki HORI
G01 - MEASURING TESTING
Information
Patent Application
MITIGATING AN INFLUENCE OF A MISMATCH LOSS IN A MEASUREMENT SETUP
Publication number
20230324453
Publication date
Oct 12, 2023
Advantest Corporation
Matthias BURCZYK
G01 - MEASURING TESTING