Calibration

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Patents Grantslast 30 patents

Information Patent Grant
Method for calibrating nano measurement scale and standard material...
- Patent number 11,852,581
- Issue date Dec 26, 2023
- KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
- Kyung Joong Kim
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 11,796,563
- Issue date Oct 24, 2023
- Carl Zeiss SMT GmbH
- Ulrich Matejka
- G01 - MEASURING TESTING
Information Patent Grant
Method of imaging a surface using a scanning probe microscope
- Patent number 11,733,265
- Issue date Aug 22, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
- Patent number 11,680,963
- Issue date Jun 20, 2023
- Carl Zeiss SMT GmbH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Grant
Reference-standard device for calibration of measurements of length...
- Patent number 11,592,289
- Issue date Feb 28, 2023
- Istituto Nazionale di Ricerca Metrologica
- Luca Boarino
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System and method of performing scanning probe microscopy on a subs...
- Patent number 11,320,457
- Issue date May 3, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 11,237,185
- Issue date Feb 1, 2022
- Carl Zeiss SMT GmbH
- Ulrich Matejka
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
- Patent number 11,237,187
- Issue date Feb 1, 2022
- Carl Zeiss SMT GmbH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,928,418
- Issue date Feb 23, 2021
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Torsional and lateral stiffness measurement
- Patent number 10,900,878
- Issue date Jan 26, 2021
- University Court of the University of St Andrews
- Georg Haehner
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method of tuning parameter settings for performing acoustic scannin...
- Patent number 10,746,702
- Issue date Aug 18, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Method for estimating a stiffness of a deformable part
- Patent number 10,718,697
- Issue date Jul 21, 2020
- Centre National de la Recherche Scientifique
- Ludovic Bellon
- G01 - MEASURING TESTING
Information Patent Grant
Alignment system and method
- Patent number 10,663,874
- Issue date May 26, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 10,648,801
- Issue date May 12, 2020
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-contact velocity measurement instruments and systems, and relat...
- Patent number 10,620,100
- Issue date Apr 14, 2020
- Battelle Energy Alliance, LLC
- Jeffrey M. Lacy
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Calibrating tip-enhanced Raman microscopes
- Patent number 10,605,826
- Issue date Mar 31, 2020
- International Business Machines Corporation
- Michael Engel
- G01 - MEASURING TESTING
Information Patent Grant
Determining interaction forces in a dynamic mode AFM during imaging
- Patent number 10,578,643
- Issue date Mar 3, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Thermal measurements using multiple frequency atomic force microscopy
- Patent number 10,556,793
- Issue date Feb 11, 2020
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanoprocessing and heterostructuring of silk
- Patent number 10,493,558
- Issue date Dec 3, 2019
- Indian Institute of Science Education and Research
- Kamal Priya Singh
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of calibrating a nanometrology instrument
- Patent number 10,473,692
- Issue date Nov 12, 2019
- The Government of the United States of America, as represented by the Secreta...
- Marc Christophersen
- G01 - MEASURING TESTING
Information Patent Grant
Automatic calibration and tuning of feedback systems
- Patent number 10,444,259
- Issue date Oct 15, 2019
- Technion Research & Development Foundation Limited
- Uri Sivan
- G01 - MEASURING TESTING
Information Patent Grant
AM/FM measurements using multiple frequency atomic force microscopy
- Patent number 10,444,258
- Issue date Oct 15, 2019
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Probe calibration or measurement routine
- Patent number 10,254,306
- Issue date Apr 9, 2019
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating and imaging using multi-tip scanning probe m...
- Patent number 10,139,429
- Issue date Nov 27, 2018
- FEI Company
- Sean Dale Zumwalt
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy of scanning and image processing
- Patent number 10,126,326
- Issue date Nov 13, 2018
- Seagate Technology LLC
- Lin Zhou
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Measurement system
- Patent number 10,107,834
- Issue date Oct 23, 2018
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Nanometer standard prototype and method for manufacturing nanometer...
- Patent number 10,012,675
- Issue date Jul 3, 2018
- KWANSEI GAKUIN EDUCATIONAL FOUNDATION
- Tadaaki Kaneko
- C30 - CRYSTAL GROWTH
Information Patent Grant
Automated atomic force microscope and the operation thereof
- Patent number 9,921,242
- Issue date Mar 20, 2018
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Calibration of a contact probe
- Patent number 9,863,766
- Issue date Jan 9, 2018
- Renishaw plc
- David S Wallace
- B82 - NANO-TECHNOLOGY
Information Patent Grant
AM/FM measurements using multiple frequency of atomic force microscopy
- Patent number 9,841,436
- Issue date Dec 12, 2017
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR SCANNING A SAMPLE WITH A PROBE
- Publication number 20240426869
- Publication date Dec 26, 2024
- INFINITESIMA LIMITED
- Andrew David Laver Humphris
- G01 - MEASURING TESTING
Information Patent Application
POSITIONING SYSTEM AND METHOD
- Publication number 20240295583
- Publication date Sep 5, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR PERFORMING ATOMIC FORCE MICROSCOPY, INCLUDING A GRID PLA...
- Publication number 20240241151
- Publication date Jul 18, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF REMOVING DEFECT OF MASK
- Publication number 20240219826
- Publication date Jul 4, 2024
- Samsung Electronics Co., Ltd.
- Yoonki HWANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY...
- Publication number 20240210443
- Publication date Jun 27, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTI...
- Publication number 20240210442
- Publication date Jun 27, 2024
- Nearfield Instruments B.V.
- Taras PISKUNOV
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope, Sample Observation Processing System, an...
- Publication number 20240168052
- Publication date May 23, 2024
- Hitachi High-Tech Corporation
- Toru AISO
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE
- Publication number 20240118310
- Publication date Apr 11, 2024
- Paris Sciences et Lettres
- Antoine Niguès
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...
- Publication number 20240110939
- Publication date Apr 4, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSESSMENT METHOD AND SPM
- Publication number 20240069064
- Publication date Feb 29, 2024
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
STANDARD SAMPLE AND MANUFACTURING METHOD THEREOF
- Publication number 20230228792
- Publication date Jul 20, 2023
- NTT ADVANCED TECHNOLOGY CORPORATION
- Akira KODAIRA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...
- Publication number 20230194567
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- Kwangeun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE
- Publication number 20230030991
- Publication date Feb 2, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR EXAMINING A MEASURING TIP OF A SCANNING PR...
- Publication number 20220107340
- Publication date Apr 7, 2022
- Carl Zeiss SMT GMBH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF PERFORMING SCANNING PROBE MICROSCOPY ON A SUBS...
- Publication number 20210318353
- Publication date Oct 14, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Roelof Willem HERFST
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE-STANDARD DEVICE FOR CALIBRATION OF MEASUREMENTS OF LENGTH...
- Publication number 20200318957
- Publication date Oct 8, 2020
- Istituto Nazionale di Ricerca Metrologica
- Luca BOARINO
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20200141970
- Publication date May 7, 2020
- INFINITESIMA LIMITED
- Andrew HUMPHRIS
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR A SCANNING PROBE MICROSCOPE
- Publication number 20200025796
- Publication date Jan 23, 2020
- Carl Zeiss SMT GMBH
- Ulrich Matejka
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATING TIP-ENHANCED RAMAN MICROSCOPES
- Publication number 20190383854
- Publication date Dec 19, 2019
- International Business Machines Corporation
- Michael Engel
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT SYSTEM AND METHOD
- Publication number 20190250524
- Publication date Aug 15, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
- Publication number 20190186909
- Publication date Jun 20, 2019
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF TUNING PARAMETER SETTINGS FOR PERFORMING ACOUSTIC SCANNIN...
- Publication number 20190154636
- Publication date May 23, 2019
- Nederlandse Organisatie voor toegepast-natuurwetep -pelijk Onderzoe TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING INTERACTION FORCES IN A DYNAMIC MODE AFM DURING IMAGING
- Publication number 20190025340
- Publication date Jan 24, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ESTIMATING A STIFFNESS OF A DEFORMABLE PART
- Publication number 20190011343
- Publication date Jan 10, 2019
- CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Ludovic BELLON
- G01 - MEASURING TESTING
Information Patent Application
NANOPROCESSING AND HETEROSTRUCTURING OF SILK
- Publication number 20180354066
- Publication date Dec 13, 2018
- Indian Institute of Science Education and Research
- Kamal Priya SINGH
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
AM/FM MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MICROSCOPY
- Publication number 20180292432
- Publication date Oct 11, 2018
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING AND IMAGING USING MULTI-TIP SCANNING PROBE M...
- Publication number 20180275165
- Publication date Sep 27, 2018
- FEI Company
- Sean Dale Zumwalt
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM
- Publication number 20180267081
- Publication date Sep 20, 2018
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC CALIBRATION AND TUNING OF FEEDBACK SYSTEMS
- Publication number 20180217180
- Publication date Aug 2, 2018
- Technion Research & Development Foundation Limited
- Uri SIVAN
- G01 - MEASURING TESTING
Information Patent Application
Electrostatic force balance microscopy
- Publication number 20180136252
- Publication date May 17, 2018
- Yemaya Candace Bordain
- G01 - MEASURING TESTING

Calibration

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Method for calibrating nano measurement scale and standard material...

Apparatus and method for a scanning probe microscope

Method of imaging a surface using a scanning probe microscope

Method and apparatus for examining a measuring tip of a scanning pr...

Reference-standard device for calibration of measurements of length...

System and method of performing scanning probe microscopy on a subs...

Apparatus and method for a scanning probe microscope

Method and apparatus for examining a measuring tip of a scanning pr...

Scanning probe microscope

Torsional and lateral stiffness measurement

Method of tuning parameter settings for performing acoustic scannin...

Method for estimating a stiffness of a deformable part

Alignment system and method

System and method for generating and analyzing roughness measuremen...

Non-contact velocity measurement instruments and systems, and relat...

Calibrating tip-enhanced Raman microscopes

Determining interaction forces in a dynamic mode AFM during imaging

Thermal measurements using multiple frequency atomic force microscopy

Nanoprocessing and heterostructuring of silk

Method of calibrating a nanometrology instrument

Automatic calibration and tuning of feedback systems

AM/FM measurements using multiple frequency atomic force microscopy

Probe calibration or measurement routine

Method for calibrating and imaging using multi-tip scanning probe m...

Atomic force microscopy of scanning and image processing

Measurement system

Nanometer standard prototype and method for manufacturing nanometer...

Automated atomic force microscope and the operation thereof

Calibration of a contact probe

AM/FM measurements using multiple frequency of atomic force microscopy

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR SCANNING A SAMPLE WITH A PROBE

POSITIONING SYSTEM AND METHOD

SYSTEM FOR PERFORMING ATOMIC FORCE MICROSCOPY, INCLUDING A GRID PLA...

METHOD OF REMOVING DEFECT OF MASK

FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY...

METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTI...

Scanning Probe Microscope, Sample Observation Processing System, an...

DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE

AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...

PROBE ASSESSMENT METHOD AND SPM

STANDARD SAMPLE AND MANUFACTURING METHOD THEREOF

METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...

METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE

METHOD AND APPARATUS FOR EXAMINING A MEASURING TIP OF A SCANNING PR...

SYSTEM AND METHOD OF PERFORMING SCANNING PROBE MICROSCOPY ON A SUBS...

REFERENCE-STANDARD DEVICE FOR CALIBRATION OF MEASUREMENTS OF LENGTH...

SCANNING PROBE MICROSCOPE

APPARATUS AND METHOD FOR A SCANNING PROBE MICROSCOPE

CALIBRATING TIP-ENHANCED RAMAN MICROSCOPES

ALIGNMENT SYSTEM AND METHOD

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...

METHOD OF TUNING PARAMETER SETTINGS FOR PERFORMING ACOUSTIC SCANNIN...

DETERMINING INTERACTION FORCES IN A DYNAMIC MODE AFM DURING IMAGING

METHOD FOR ESTIMATING A STIFFNESS OF A DEFORMABLE PART

NANOPROCESSING AND HETEROSTRUCTURING OF SILK

AM/FM MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MICROSCOPY

METHOD FOR CALIBRATING AND IMAGING USING MULTI-TIP SCANNING PROBE M...

MEASUREMENT SYSTEM

AUTOMATIC CALIBRATION AND TUNING OF FEEDBACK SYSTEMS

Electrostatic force balance microscopy