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PHYSICS
G01
Measuring instruments
G01Q
SCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES
Current Industry
G01Q40/00
Calibration
Sub Industries
G01Q40/02
Calibration standards and methods of fabrication thereof
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Patents Grants
last 30 patents
Information
Patent Grant
Method for calibrating nano measurement scale and standard material...
Patent number
11,852,581
Issue date
Dec 26, 2023
KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
Kyung Joong Kim
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Apparatus and method for a scanning probe microscope
Patent number
11,796,563
Issue date
Oct 24, 2023
Carl Zeiss SMT GmbH
Ulrich Matejka
G01 - MEASURING TESTING
Information
Patent Grant
Method of imaging a surface using a scanning probe microscope
Patent number
11,733,265
Issue date
Aug 22, 2023
INFINITESIMA LIMITED
Andrew Humphris
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
Patent number
11,680,963
Issue date
Jun 20, 2023
Carl Zeiss SMT GmbH
Kinga Kornilov
G01 - MEASURING TESTING
Information
Patent Grant
Reference-standard device for calibration of measurements of length...
Patent number
11,592,289
Issue date
Feb 28, 2023
Istituto Nazionale di Ricerca Metrologica
Luca Boarino
B82 - NANO-TECHNOLOGY
Information
Patent Grant
System and method of performing scanning probe microscopy on a subs...
Patent number
11,320,457
Issue date
May 3, 2022
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Roelof Willem Herfst
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for a scanning probe microscope
Patent number
11,237,185
Issue date
Feb 1, 2022
Carl Zeiss SMT GmbH
Ulrich Matejka
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
Patent number
11,237,187
Issue date
Feb 1, 2022
Carl Zeiss SMT GmbH
Kinga Kornilov
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope
Patent number
10,928,418
Issue date
Feb 23, 2021
INFINITESIMA LIMITED
Andrew Humphris
G01 - MEASURING TESTING
Information
Patent Grant
Torsional and lateral stiffness measurement
Patent number
10,900,878
Issue date
Jan 26, 2021
University Court of the University of St Andrews
Georg Haehner
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method of tuning parameter settings for performing acoustic scannin...
Patent number
10,746,702
Issue date
Aug 18, 2020
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Hamed Sadeghian Marnani
G01 - MEASURING TESTING
Information
Patent Grant
Method for estimating a stiffness of a deformable part
Patent number
10,718,697
Issue date
Jul 21, 2020
Centre National de la Recherche Scientifique
Ludovic Bellon
G01 - MEASURING TESTING
Information
Patent Grant
Alignment system and method
Patent number
10,663,874
Issue date
May 26, 2020
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Hamed Sadeghian Marnani
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
System and method for generating and analyzing roughness measuremen...
Patent number
10,648,801
Issue date
May 12, 2020
Fractilia, LLC
Chris Mack
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Non-contact velocity measurement instruments and systems, and relat...
Patent number
10,620,100
Issue date
Apr 14, 2020
Battelle Energy Alliance, LLC
Jeffrey M. Lacy
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Calibrating tip-enhanced Raman microscopes
Patent number
10,605,826
Issue date
Mar 31, 2020
International Business Machines Corporation
Michael Engel
G01 - MEASURING TESTING
Information
Patent Grant
Determining interaction forces in a dynamic mode AFM during imaging
Patent number
10,578,643
Issue date
Mar 3, 2020
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Hamed Sadeghian Marnani
G01 - MEASURING TESTING
Information
Patent Grant
Thermal measurements using multiple frequency atomic force microscopy
Patent number
10,556,793
Issue date
Feb 11, 2020
Oxford Instruments Asylum Research Inc
Roger Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Nanoprocessing and heterostructuring of silk
Patent number
10,493,558
Issue date
Dec 3, 2019
Indian Institute of Science Education and Research
Kamal Priya Singh
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method of calibrating a nanometrology instrument
Patent number
10,473,692
Issue date
Nov 12, 2019
The Government of the United States of America, as represented by the Secreta...
Marc Christophersen
G01 - MEASURING TESTING
Information
Patent Grant
Automatic calibration and tuning of feedback systems
Patent number
10,444,259
Issue date
Oct 15, 2019
Technion Research & Development Foundation Limited
Uri Sivan
G01 - MEASURING TESTING
Information
Patent Grant
AM/FM measurements using multiple frequency atomic force microscopy
Patent number
10,444,258
Issue date
Oct 15, 2019
Oxford Instruments Asylum Research Inc
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Grant
Probe calibration or measurement routine
Patent number
10,254,306
Issue date
Apr 9, 2019
INFINITESIMA LIMITED
Andrew Humphris
G01 - MEASURING TESTING
Information
Patent Grant
Method for calibrating and imaging using multi-tip scanning probe m...
Patent number
10,139,429
Issue date
Nov 27, 2018
FEI Company
Sean Dale Zumwalt
G01 - MEASURING TESTING
Information
Patent Grant
Atomic force microscopy of scanning and image processing
Patent number
10,126,326
Issue date
Nov 13, 2018
Seagate Technology LLC
Lin Zhou
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Measurement system
Patent number
10,107,834
Issue date
Oct 23, 2018
INFINITESIMA LIMITED
Andrew Humphris
G01 - MEASURING TESTING
Information
Patent Grant
Nanometer standard prototype and method for manufacturing nanometer...
Patent number
10,012,675
Issue date
Jul 3, 2018
KWANSEI GAKUIN EDUCATIONAL FOUNDATION
Tadaaki Kaneko
C30 - CRYSTAL GROWTH
Information
Patent Grant
Automated atomic force microscope and the operation thereof
Patent number
9,921,242
Issue date
Mar 20, 2018
Oxford Instruments Asylum Research Inc
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Grant
Calibration of a contact probe
Patent number
9,863,766
Issue date
Jan 9, 2018
Renishaw plc
David S Wallace
B82 - NANO-TECHNOLOGY
Information
Patent Grant
AM/FM measurements using multiple frequency of atomic force microscopy
Patent number
9,841,436
Issue date
Dec 12, 2017
Oxford Instruments Asylum Research Inc
Roger Proksch
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE
Publication number
20240118310
Publication date
Apr 11, 2024
Paris Sciences et Lettres
Antoine Niguès
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...
Publication number
20240110939
Publication date
Apr 4, 2024
Nearfield Instruments B.V.
Hamed SADEGHIAN MARNANI
G01 - MEASURING TESTING
Information
Patent Application
PROBE ASSESSMENT METHOD AND SPM
Publication number
20240069064
Publication date
Feb 29, 2024
Shimadzu Corporation
Hiroshi ARAI
G01 - MEASURING TESTING
Information
Patent Application
STANDARD SAMPLE AND MANUFACTURING METHOD THEREOF
Publication number
20230228792
Publication date
Jul 20, 2023
NTT ADVANCED TECHNOLOGY CORPORATION
Akira KODAIRA
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...
Publication number
20230194567
Publication date
Jun 22, 2023
Samsung Electronics Co., Ltd.
Kwangeun Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE
Publication number
20230030991
Publication date
Feb 2, 2023
INFINITESIMA LIMITED
Andrew Humphris
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR EXAMINING A MEASURING TIP OF A SCANNING PR...
Publication number
20220107340
Publication date
Apr 7, 2022
Carl Zeiss SMT GMBH
Kinga Kornilov
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF PERFORMING SCANNING PROBE MICROSCOPY ON A SUBS...
Publication number
20210318353
Publication date
Oct 14, 2021
NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
Roelof Willem HERFST
G01 - MEASURING TESTING
Information
Patent Application
REFERENCE-STANDARD DEVICE FOR CALIBRATION OF MEASUREMENTS OF LENGTH...
Publication number
20200318957
Publication date
Oct 8, 2020
Istituto Nazionale di Ricerca Metrologica
Luca BOARINO
B82 - NANO-TECHNOLOGY
Information
Patent Application
SCANNING PROBE MICROSCOPE
Publication number
20200141970
Publication date
May 7, 2020
INFINITESIMA LIMITED
Andrew HUMPHRIS
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR A SCANNING PROBE MICROSCOPE
Publication number
20200025796
Publication date
Jan 23, 2020
Carl Zeiss SMT GMBH
Ulrich Matejka
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATING TIP-ENHANCED RAMAN MICROSCOPES
Publication number
20190383854
Publication date
Dec 19, 2019
International Business Machines Corporation
Michael Engel
G01 - MEASURING TESTING
Information
Patent Application
ALIGNMENT SYSTEM AND METHOD
Publication number
20190250524
Publication date
Aug 15, 2019
NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
Hamed Sadeghian Marnani
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
Publication number
20190186909
Publication date
Jun 20, 2019
FRACTILIA, LLC
Chris MACK
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF TUNING PARAMETER SETTINGS FOR PERFORMING ACOUSTIC SCANNIN...
Publication number
20190154636
Publication date
May 23, 2019
Nederlandse Organisatie voor toegepast-natuurwetep -pelijk Onderzoe TNO
Hamed Sadeghian Marnani
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING INTERACTION FORCES IN A DYNAMIC MODE AFM DURING IMAGING
Publication number
20190025340
Publication date
Jan 24, 2019
NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
Hamed Sadeghian Marnani
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ESTIMATING A STIFFNESS OF A DEFORMABLE PART
Publication number
20190011343
Publication date
Jan 10, 2019
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
Ludovic BELLON
G01 - MEASURING TESTING
Information
Patent Application
NANOPROCESSING AND HETEROSTRUCTURING OF SILK
Publication number
20180354066
Publication date
Dec 13, 2018
Indian Institute of Science Education and Research
Kamal Priya SINGH
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Application
AM/FM MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MICROSCOPY
Publication number
20180292432
Publication date
Oct 11, 2018
Oxford Instruments Asylum Research, Inc.
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALIBRATING AND IMAGING USING MULTI-TIP SCANNING PROBE M...
Publication number
20180275165
Publication date
Sep 27, 2018
FEI Company
Sean Dale Zumwalt
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM
Publication number
20180267081
Publication date
Sep 20, 2018
INFINITESIMA LIMITED
Andrew Humphris
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC CALIBRATION AND TUNING OF FEEDBACK SYSTEMS
Publication number
20180217180
Publication date
Aug 2, 2018
Technion Research & Development Foundation Limited
Uri SIVAN
G01 - MEASURING TESTING
Information
Patent Application
Electrostatic force balance microscopy
Publication number
20180136252
Publication date
May 17, 2018
Yemaya Candace Bordain
G01 - MEASURING TESTING
Information
Patent Application
NON-CONTACT VELOCITY MEASUREMENT INSTRUMENTS AND SYSTEMS, AND RELAT...
Publication number
20180031459
Publication date
Feb 1, 2018
Battelle Energy Alliance, LLC
Jeffrey M. Lacy
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Thermal Measurements Using Multiple Frequency Atomic Force Microscopy
Publication number
20170313583
Publication date
Nov 2, 2017
ASYLUM RESEARCH CORPORATION
Roger Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Application
DEVICE AND METHOD FOR CHARACTERIZING A SAMPLE USING LOCALIZED MEASU...
Publication number
20170310871
Publication date
Oct 26, 2017
HORIBA JOBIN YVON SAS
Olivier Acher
G02 - OPTICS
Information
Patent Application
CALIBRATION STANDARD WITH PRE-DETERMINED FEATURES
Publication number
20160069929
Publication date
Mar 10, 2016
SEAGATE TECHNOLOGY LLC
Gennady Gauzner
G01 - MEASURING TESTING
Information
Patent Application
ATOMIC FORCE MICROSCOPY OF SCANNING AND IMAGE PROCESSING
Publication number
20160025772
Publication date
Jan 28, 2016
Seagate Technology LLC
Lin Zhou
G01 - MEASURING TESTING
Information
Patent Application
Microscope Having A Multimode Local Probe, Tip-Enhanced Raman Micro...
Publication number
20160003866
Publication date
Jan 7, 2016
ECOLE POLYTECHNIQUE
Marc Chaigneau
G01 - MEASURING TESTING
Information
Patent Application
AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy
Publication number
20150309071
Publication date
Oct 29, 2015
Oxford Instruments Asylum Research, Inc.
Roger Proksch
G01 - MEASURING TESTING