Calibration

Industry

CPC
G01R31/3191

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/3191Calibration

Industries

Patents Grantslast 30 patents

Information Patent Grant
Electronic instrument for analyzing a DUT
- Patent number 12,196,809
- Issue date Jan 14, 2025
- Rohde & Schwarz GmbH & Co. KG
- Mathias Hellwig
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for controlling actions of testbench components w...
- Patent number 12,188,983
- Issue date Jan 7, 2025
- HCL America Inc.
- Manickam Muthiah
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for performing multiple tests on a device under test
- Patent number 12,181,515
- Issue date Dec 31, 2024
- NANYA TECHNOLOGY CORPORATION
- Chien-Hwa Su
- G01 - MEASURING TESTING
Information Patent Grant
Delay measurement system and measurement method
- Patent number 12,169,222
- Issue date Dec 17, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Shang Hsien Yang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Tester channel multiplexing in test equipment
- Patent number 12,136,958
- Issue date Nov 5, 2024
- Yangtze Memory Technologies Co., Ltd.
- Yangyang Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Virtual machine testing of electrical machines using physical domai...
- Patent number 12,117,482
- Issue date Oct 15, 2024
- Vestas Wind Systems A/S
- Peter Mongeau
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for automatic time domain reflectometer measure...
- Patent number 12,117,491
- Issue date Oct 15, 2024
- Advantest Corporation
- Siegfried Podolski
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for transferring data from one clock domain to another
- Patent number 12,092,688
- Issue date Sep 17, 2024
- Advantest Corporation
- Andreas Beermann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for storing calibration data of a test system f...
- Patent number 12,085,613
- Issue date Sep 10, 2024
- Advantest Corporation
- Shoji Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining parameters in on-wafer calibration piece model
- Patent number 11,971,451
- Issue date Apr 30, 2024
- THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- Aihua Wu
- G01 - MEASURING TESTING
Information Patent Grant
Electronic tester and testing method
- Patent number 11,971,450
- Issue date Apr 30, 2024
- Rohde & Schwarz GmbH & Co. KG
- Yi Jin
- G01 - MEASURING TESTING
Information Patent Grant
Data recorder
- Patent number 11,953,547
- Issue date Apr 9, 2024
- Bae Systems Controls Inc.
- Thomas J. Cummings
- G01 - MEASURING TESTING
Information Patent Grant
Module and method for initializing and calibrating a product during...
- Patent number 11,953,551
- Issue date Apr 9, 2024
- Continental Automotive Technologies GmbH
- Eduardo Lopez Arce Vivas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device test method, apparatus, and system, medium, and elect...
- Patent number 11,867,755
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu Yu
- G01 - MEASURING TESTING
Information Patent Grant
Test method for control chip and related device
- Patent number 11,867,758
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chuanqi Shi
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method of over-the-air testing of a device under test
- Patent number 11,828,801
- Issue date Nov 28, 2023
- Rohde & Schwarz GmbH & Co. KG
- Mert Celik
- G01 - MEASURING TESTING
Information Patent Grant
Methods of producing augmented probe system images and associated p...
- Patent number 11,821,912
- Issue date Nov 21, 2023
- FormFactor, Inc.
- Anthony James Lord
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for controlling unit specific junction tempera...
- Patent number 11,808,813
- Issue date Nov 7, 2023
- Intel Corporation
- Mahesh Deshmane
- G01 - MEASURING TESTING
Information Patent Grant
Compiler-based code generation for post-silicon validation
- Patent number 11,796,593
- Issue date Oct 24, 2023
- Synopsys, Inc.
- Hillel Mendelson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of monitoring chip process variation and perfo...
- Patent number 11,789,076
- Issue date Oct 17, 2023
- Mediatek Inc.
- Ko-Ching Su
- G01 - MEASURING TESTING
Information Patent Grant
Test systems for executing self-testing in deployed automotive plat...
- Patent number 11,768,241
- Issue date Sep 26, 2023
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for protecting a reconfigurable digital integrated circuit a...
- Patent number 11,762,722
- Issue date Sep 19, 2023
- Thales
- Yann Oster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic test equipment apparatus and methods of operating thereof
- Patent number 11,740,278
- Issue date Aug 29, 2023
- Infineon Technologies AG
- Kevin Roche
- G01 - MEASURING TESTING
Information Patent Grant
Two-port on-wafer calibration piece circuit model and method for de...
- Patent number 11,733,298
- Issue date Aug 22, 2023
- THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- Yibang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing artificial intelligence chip, devi...
- Patent number 11,714,128
- Issue date Aug 1, 2023
- KUNLUNXIN TECHNOLOGY (BEIJING) COMPANY LIMITED
- Ziyu Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Self diagnostic apparatus for electronic device
- Patent number 11,686,772
- Issue date Jun 27, 2023
- PHOSPHIL INC.
- Byung Kyu Kim
- G01 - MEASURING TESTING
Information Patent Grant
Path loss compensation for comparator
- Patent number 11,686,773
- Issue date Jun 27, 2023
- Analog Devices, Inc.
- Christopher C. McQuilkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, apparatus and method for functional testing of one or more...
- Patent number 11,686,767
- Issue date Jun 27, 2023
- Intel Corporation
- Lakshminarayana Pappu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Converting formal verification testbench drivers with nondeterminis...
- Patent number 11,675,009
- Issue date Jun 13, 2023
- International Business Machines Corporation
- Bradley Donald Bingham
- G01 - MEASURING TESTING
Information Patent Grant
Noise-compensated jitter measurement instrument and methods
- Patent number 11,624,781
- Issue date Apr 11, 2023
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTER CHANNEL MULTIPLEXING IN TEST EQUIPMENT
- Publication number 20250023646
- Publication date Jan 16, 2025
- Yangtze Memory Technologies Co., Ltd.
- Yangyang Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
VIRTUAL MACHINE TESTING OF ELECTRICAL MACHINES USING PHYSICAL DOMAI...
- Publication number 20250004040
- Publication date Jan 2, 2025
- VESTAS WIND SYSTEMS A/S
- Peter Mongeau
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...
- Publication number 20240418774
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TESTING BLOCKS WITHIN DEVICE UNDER TEST (DUT)...
- Publication number 20240418778
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
MIXED SIGNAL CIRCUIT, METHODS AND DEVICES FOR TESTING MIXED SIGNAL...
- Publication number 20240402251
- Publication date Dec 5, 2024
- Intel Corporation
- Aryeh FARBER
- G01 - MEASURING TESTING
Information Patent Application
METHOD, CENTRAL TEST CONTROL UNIT, MEASUREMENT SYSTEM
- Publication number 20240241175
- Publication date Jul 18, 2024
- Rohde& Schwarz GmbH & Co. KG
- Thomas BRAUNSTORFINGER
- G01 - MEASURING TESTING
Information Patent Application
CLOCK RECOVERY UNIT ADJUSTMENT
- Publication number 20240243896
- Publication date Jul 18, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Marlin E. Viss
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST SYSTEM THAT CONVERTS COMMAND SYNTAXES
- Publication number 20240241173
- Publication date Jul 18, 2024
- Teradyne, Inc.
- Richard W. FANNING
- G01 - MEASURING TESTING
Information Patent Application
DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC...
- Publication number 20240175907
- Publication date May 30, 2024
- SAMSUNG DISPLAY CO., LTD.
- YOUNG JE CHO
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSTIC RING OSCILLATOR CIRCUIT FOR DC AND TRANSIENT CHARACTERIZ...
- Publication number 20240133952
- Publication date Apr 25, 2024
- Intel NDTM US LLC
- Andreas KERBER
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ELECTRIC COMPONENT COMPARISON APPARATUS, SYSTEM, AND RELATED METHODS
- Publication number 20240125869
- Publication date Apr 18, 2024
- COILCRAFT, INCORPORATED
- Leonard Crane
- G01 - MEASURING TESTING
Information Patent Application
Serial Protocol-Based Event Trigger
- Publication number 20240061042
- Publication date Feb 22, 2024
- NXP USA, Inc.
- Tiefei Zang
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT FOR CONTROLLING CALIBRATION, ELECTRONIC DEVICE, AND METHOD...
- Publication number 20230349973
- Publication date Nov 2, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Kai TIAN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC INSTRUMENT FOR ANALYZING A DUT
- Publication number 20230333164
- Publication date Oct 19, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Mathias HELLWIG
- G01 - MEASURING TESTING
Information Patent Application
IN-CIRCUIT EMULATOR DEVICE
- Publication number 20230314513
- Publication date Oct 5, 2023
- LAPIS Technology Co., Ltd.
- Hiroshi YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF OVER-THE-AIR TESTING OF A DEVICE UNDER TEST
- Publication number 20230305056
- Publication date Sep 28, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Mert Celik
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CONTROLLING UNIT SPECIFIC JUNCTION TEMPERA...
- Publication number 20230288480
- Publication date Sep 14, 2023
- Intel Corporation
- Mahesh DESHMANE
- G01 - MEASURING TESTING
Information Patent Application
DELAY MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20230258721
- Publication date Aug 17, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- SHANG HSIEN YANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DATA RECORDER
- Publication number 20230204665
- Publication date Jun 29, 2023
- BAE Systems Controls Inc.
- Thomas J. Cummings
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPRATUS FOR PERFORMING MULTIPLE TESTS ON A DEVICE UNDER TEST
- Publication number 20230184821
- Publication date Jun 15, 2023
- NANYA TECHNOLOGY CORPORATION
- Chien-Hwa SU
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC TESTER AND TESTING METHOD
- Publication number 20230176124
- Publication date Jun 8, 2023
- Rohde& Schwarz GmbH & Co. KG
- Yi JIN
- G01 - MEASURING TESTING
Information Patent Application
VIRTUAL MACHINE TESTING OF ELECTRICAL MACHINES USING PHYSICAL DOMAI...
- Publication number 20230176125
- Publication date Jun 8, 2023
- VESTAS WIND SYSTEMS A/S
- Peter Mongeau
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED VERIFICATION OF INTEGRATED CIRCUITS
- Publication number 20230076636
- Publication date Mar 9, 2023
- Celera, Inc.
- Calum MacRae
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROTECTING A RECONFIGURABLE DIGITAL INTEGRATED CIRCUIT A...
- Publication number 20230051943
- Publication date Feb 16, 2023
- THALES
- Yann OSTER
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Software-Defined Synthesizable Testbench
- Publication number 20230052788
- Publication date Feb 16, 2023
- Intel Corporation
- Sheran Rashel Cardoza
- G01 - MEASURING TESTING
Information Patent Application
TROJAN DETECTION VIA DISTORTIONS, NITROGEN-VACANCY DIAMOND (NVD) SE...
- Publication number 20230019995
- Publication date Jan 19, 2023
- SRI International
- Michael Locasto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USAGE-AWARE COMPRESSION FOR STREAMING DATA FROM A TEST AND MEASUREM...
- Publication number 20230012393
- Publication date Jan 12, 2023
- Tektronix, Inc.
- Keith D. Rule
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONTROLLING DROP TEST EQUIPMENT
- Publication number 20220397606
- Publication date Dec 15, 2022
- Konepaja-Heinä Oy
- Ilkka HEINÄ
- G01 - MEASURING TESTING
Information Patent Application
COMPILER-BASED CODE GENERATION FOR POST-SILICON VALIDATION
- Publication number 20220381824
- Publication date Dec 1, 2022
- International Business Machines Corporation
- Hillel Mendelson
- G01 - MEASURING TESTING
Information Patent Application
SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT
- Publication number 20220373598
- Publication date Nov 24, 2022
- Tektronix, Inc.
- Kan TAN
- G01 - MEASURING TESTING

Calibration

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electronic instrument for analyzing a DUT

Method and system for controlling actions of testbench components w...

Apparatus for performing multiple tests on a device under test

Delay measurement system and measurement method

Tester channel multiplexing in test equipment

Virtual machine testing of electrical machines using physical domai...

Systems and methods for automatic time domain reflectometer measure...

Circuit for transferring data from one clock domain to another

Systems and methods for storing calibration data of a test system f...

Method for determining parameters in on-wafer calibration piece model

Electronic tester and testing method

Data recorder

Module and method for initializing and calibrating a product during...

Memory device test method, apparatus, and system, medium, and elect...

Test method for control chip and related device

System and method of over-the-air testing of a device under test

Methods of producing augmented probe system images and associated p...

Apparatus and method for controlling unit specific junction tempera...

Compiler-based code generation for post-silicon validation

Apparatus and method of monitoring chip process variation and perfo...

Test systems for executing self-testing in deployed automotive plat...

Method for protecting a reconfigurable digital integrated circuit a...

Electronic test equipment apparatus and methods of operating thereof

Two-port on-wafer calibration piece circuit model and method for de...

Method and apparatus for testing artificial intelligence chip, devi...

Self diagnostic apparatus for electronic device

Path loss compensation for comparator

System, apparatus and method for functional testing of one or more...

Converting formal verification testbench drivers with nondeterminis...

Noise-compensated jitter measurement instrument and methods

Patents Applicationslast 30 patents

TESTER CHANNEL MULTIPLEXING IN TEST EQUIPMENT

VIRTUAL MACHINE TESTING OF ELECTRICAL MACHINES USING PHYSICAL DOMAI...

METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...

METHOD AND SYSTEM FOR TESTING BLOCKS WITHIN DEVICE UNDER TEST (DUT)...

MIXED SIGNAL CIRCUIT, METHODS AND DEVICES FOR TESTING MIXED SIGNAL...

METHOD, CENTRAL TEST CONTROL UNIT, MEASUREMENT SYSTEM

CLOCK RECOVERY UNIT ADJUSTMENT

TEST SYSTEM THAT CONVERTS COMMAND SYNTAXES

DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC...

DIAGNOSTIC RING OSCILLATOR CIRCUIT FOR DC AND TRANSIENT CHARACTERIZ...

ELECTRIC COMPONENT COMPARISON APPARATUS, SYSTEM, AND RELATED METHODS

Serial Protocol-Based Event Trigger

CIRCUIT FOR CONTROLLING CALIBRATION, ELECTRONIC DEVICE, AND METHOD...

ELECTRONIC INSTRUMENT FOR ANALYZING A DUT

IN-CIRCUIT EMULATOR DEVICE

SYSTEM AND METHOD OF OVER-THE-AIR TESTING OF A DEVICE UNDER TEST

APPARATUS AND METHOD FOR CONTROLLING UNIT SPECIFIC JUNCTION TEMPERA...

DELAY MEASUREMENT SYSTEM AND MEASUREMENT METHOD

DATA RECORDER

APPRATUS FOR PERFORMING MULTIPLE TESTS ON A DEVICE UNDER TEST

ELECTRONIC TESTER AND TESTING METHOD

VIRTUAL MACHINE TESTING OF ELECTRICAL MACHINES USING PHYSICAL DOMAI...

AUTOMATED VERIFICATION OF INTEGRATED CIRCUITS

METHOD FOR PROTECTING A RECONFIGURABLE DIGITAL INTEGRATED CIRCUIT A...

Software-Defined Synthesizable Testbench

TROJAN DETECTION VIA DISTORTIONS, NITROGEN-VACANCY DIAMOND (NVD) SE...

USAGE-AWARE COMPRESSION FOR STREAMING DATA FROM A TEST AND MEASUREM...

METHOD FOR CONTROLLING DROP TEST EQUIPMENT

COMPILER-BASED CODE GENERATION FOR POST-SILICON VALIDATION

SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT