Cat eye

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CPC
G01B2290/15

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02

Current Industry

G01B2290/15Cat eye

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Spatial accuracy correction method and apparatus
- Patent number 11,366,447
- Issue date Jun 21, 2022
- Mitutoyo Corporation
- Shinichiro Yanaka
- G05 - CONTROLLING REGULATING
Information Patent Grant
Interferometric position sensor
- Patent number 10,928,192
- Issue date Feb 23, 2021
- MBDA UK Limited
- Ross Matthew Williams
- G01 - MEASURING TESTING
Information Patent Grant
Gradiometer and method of changing an optical path length to direct...
- Patent number 9,547,103
- Issue date Jan 17, 2017
- Micro-g Lacoste, Inc.
- Timothy M. Niebauer
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric heterodyne optical encoder system
- Patent number 9,140,537
- Issue date Sep 22, 2015
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Method and arrangement for robust interferometry for detecting a fe...
- Patent number 8,934,104
- Issue date Jan 13, 2015
- Universitaet Stuttgart
- Klaus Koerner
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric heterodyne optical encoder system
- Patent number 8,885,172
- Issue date Nov 11, 2014
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and distance calculation method therefor
- Patent number 8,724,114
- Issue date May 13, 2014
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Grant
Optical system, in particular in a microlithographic projection exp...
- Patent number 8,654,345
- Issue date Feb 18, 2014
- Carl Zeiss SMT GmbH
- Albrecht Hof
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring a shape of an optical surface based on computat...
- Patent number 8,593,642
- Issue date Nov 26, 2013
- Carl Zeiss SMT GmbH
- Rolf Freimann
- G01 - MEASURING TESTING
Information Patent Grant
Optical distance-measuring device
- Patent number 8,537,340
- Issue date Sep 17, 2013
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer system for measuring roll angle
- Patent number 8,325,348
- Issue date Dec 4, 2012
- University of Shanghai for Science and Technology
- Wenmei Hou
- G01 - MEASURING TESTING
Information Patent Grant
Surface deformation measuring system with a retro-reflective surfac...
- Patent number 8,269,982
- Issue date Sep 18, 2012
- Exelis, Inc.
- Gene Olczak
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer
- Patent number 8,253,943
- Issue date Aug 28, 2012
- The University of Birmingham
- Clive C. Speake
- G01 - MEASURING TESTING
Information Patent Grant
Tilting mirror controlled using null-based interferometric sensing
- Patent number 8,174,705
- Issue date May 8, 2012
- SA Photonics, Inc.
- James F. Coward
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measuring instrument and displacement measuring method
- Patent number 8,081,315
- Issue date Dec 20, 2011
- Mitutoyo Corporation
- Kaoru Miyata
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography implementation apparatus and method of...
- Patent number 7,929,148
- Issue date Apr 19, 2011
- Volcano Corporation
- Nathaniel J. Kemp
- G01 - MEASURING TESTING
Information Patent Grant
Method for estimating distance between tracking type laser interfer...
- Patent number 7,920,273
- Issue date Apr 5, 2011
- Mitutoyo Corporation
- Shinichi Hara
- G01 - MEASURING TESTING
Information Patent Grant
Method and assembly for confocal, chromatic, interferometric and sp...
- Patent number 7,876,446
- Issue date Jan 25, 2011
- Universitat Stuttgart
- Klaus Körner
- G11 - INFORMATION STORAGE
Information Patent Grant
Tracking type laser interferometer and method for resetting the same
- Patent number 7,872,733
- Issue date Jan 18, 2011
- Mitutoyo Corporation
- Naoyuki Taketomi
- G01 - MEASURING TESTING
Information Patent Grant
Homodyne laser interferometer probe and displacement measurement sy...
- Patent number 7,847,953
- Issue date Dec 7, 2010
- Japan Science and Technology Agency
- Hideki Kawakatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Interferometer system for monitoring an object
- Patent number 7,826,064
- Issue date Nov 2, 2010
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing an optical element
- Patent number 7,738,117
- Issue date Jun 15, 2010
- Carl Zeiss SMT AG
- Michael Altenberger
- G01 - MEASURING TESTING
Information Patent Grant
Position-measuring device for determining the position of two objec...
- Patent number 7,639,366
- Issue date Dec 29, 2009
- Dr. Johannes Heidenhain GmbH
- Erwin Spanner
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer system for monitoring an object
- Patent number 7,639,367
- Issue date Dec 29, 2009
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer system for monitoring an object
- Patent number 7,636,166
- Issue date Dec 22, 2009
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method and measurement apparatus using tracking type la...
- Patent number 7,583,374
- Issue date Sep 1, 2009
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer using integrated retarders to reduce physical volume
- Patent number 7,561,278
- Issue date Jul 14, 2009
- Zygo Corporation
- Andrew Eric Carlson
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measurement sensor head and system having measurement...
- Patent number 7,561,280
- Issue date Jul 14, 2009
- Agilent Technologies, Inc.
- William Clay Schluchter
- G01 - MEASURING TESTING
Information Patent Grant
Multi-axis interferometers and methods and systems using multi-axis...
- Patent number 7,548,322
- Issue date Jun 16, 2009
- Zygo Corporation
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus sensitive to rotational but not translational o...
- Patent number 7,460,243
- Issue date Dec 2, 2008
- Claude R. Phipps
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Relative intensity noise Cat's-eye swept source laser for OCT and s...
- Publication number 20240418497
- Publication date Dec 19, 2024
- KineoLabs, Inc.
- Walid A. Atia
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD OF MEASURING A SHAPE OF AN OPTICAL SURFACE BASED ON COMPUTAT...
- Publication number 20140078513
- Publication date Mar 20, 2014
- Carl Zeiss SMT GMBH
- Rolf FREIMANN
- G02 - OPTICS
Information Patent Application
METHOD AND ARRANGEMENT FOR ROBUST INTERFEROMETRY
- Publication number 20120307258
- Publication date Dec 6, 2012
- UNIVERSITAET STUTTGART
- Klaus Koerner
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING A SHAPE OF AN OPTICAL SURFACE AND INTERFEROMETR...
- Publication number 20120229814
- Publication date Sep 13, 2012
- Carl Zeiss SMT GMBH
- Rolf FREIMANN
- G02 - OPTICS
Information Patent Application
APPARATUS AND METHOD OF MEASURING SHAPE
- Publication number 20120212747
- Publication date Aug 23, 2012
- Canon Kabushiki Kaisha
- Hiroyuki Yuki
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC HETERODYNE OPTICAL ENCODER SYSTEM
- Publication number 20120194824
- Publication date Aug 2, 2012
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM, IN PARTICULAR IN A MICROLITHOGRAPHIC PROJECTION EXP...
- Publication number 20120140241
- Publication date Jun 7, 2012
- Carl Zeiss SMT GMBH
- Albrecht Hof
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER AND DISTANCE CALCULATION METHOD THEREFOR
- Publication number 20120127477
- Publication date May 24, 2012
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Application
Optical Distance-Measuring Device
- Publication number 20120002188
- Publication date Jan 5, 2012
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
Rotary Interferometer
- Publication number 20110157595
- Publication date Jun 30, 2011
- William S. Yerazunis
- G01 - MEASURING TESTING
Information Patent Application
Interferometer
- Publication number 20100238456
- Publication date Sep 23, 2010
- Clive Christopher Speake
- G01 - MEASURING TESTING
Information Patent Application
LASER INTERFEROMETER SYSTEM FOR MEASURING ROLL ANGLE
- Publication number 20100141957
- Publication date Jun 10, 2010
- University of Shanghai for Science and Technology
- Wenmei HOU
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM FOR MONITORING AN OBJECT
- Publication number 20100091296
- Publication date Apr 15, 2010
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
Displacement measuring instrument and displacement measuring method
- Publication number 20100027026
- Publication date Feb 4, 2010
- Mitutoyo Corporation
- Kaoru Miyata
- G01 - MEASURING TESTING
Information Patent Application
Optical member, interferometer system, stage apparatus, exposure ap...
- Publication number 20090310105
- Publication date Dec 17, 2009
- Nikon Corporation
- Yosuke Kuriyama
- G02 - OPTICS
Information Patent Application
Method for estimating distance between tracking type laser interfer...
- Publication number 20090237674
- Publication date Sep 24, 2009
- Mitutoyo Corporation
- Shinichi Hara
- G01 - MEASURING TESTING
Information Patent Application
Interferometric Gravity Sensor
- Publication number 20090219546
- Publication date Sep 3, 2009
- Lockheed Martin Corporation
- Vincent P. Benischek
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Reducing Nonlinearity in an Interferometer
- Publication number 20090135430
- Publication date May 28, 2009
- Miao Zhu
- G01 - MEASURING TESTING
Information Patent Application
HOMODYNE LASER INTERFEROMETER PROBE AND DISPLACEMENT MEASUREMENT SY...
- Publication number 20090079990
- Publication date Mar 26, 2009
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Application
TRACKING TYPE LASER INTERFEROMETER AND METHOD FOR RESETTING THE SAME
- Publication number 20080316497
- Publication date Dec 25, 2008
- Mitutoyo Corporation
- Naoyuki Taketomi
- G01 - MEASURING TESTING
Information Patent Application
DISPLACEMENT MEASUREMENT SENSOR HEAD AND SYSTEM HAVING MEASUREMENT...
- Publication number 20080304079
- Publication date Dec 11, 2008
- William Clay Schluchter
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND MEASUREMENT APPARATUS USING TRACKING TYPE LA...
- Publication number 20080259311
- Publication date Oct 23, 2008
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY IMPLEMENTATION
- Publication number 20080180683
- Publication date Jul 31, 2008
- Volcano Corporation
- Nathaniel J. Kemp
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM FOR MONITORING AN OBJECT
- Publication number 20080165347
- Publication date Jul 10, 2008
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Application
Method and Assembly for Confocal, Chromatic, Interferometric and Sp...
- Publication number 20080151253
- Publication date Jun 26, 2008
- Universitat Stuttgart
- Klaus Korner
- G02 - OPTICS
Information Patent Application
Method of manufacturing an optical element
- Publication number 20080117436
- Publication date May 22, 2008
- Carl Zeiss SMT AG
- Michael Altenberger
- G01 - MEASURING TESTING
Information Patent Application
Multi-Axis Interferometers and Methods and Systems Using Multi-Axis...
- Publication number 20080117428
- Publication date May 22, 2008
- Zygo Corporation
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Application
Precise rotational motion sensor
- Publication number 20080062433
- Publication date Mar 13, 2008
- Photonic Associates
- Claude R. Phipps
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL-AXIS DEFLECTION TYPE LASER INTERFEROMETER, CALIBRATION METH...
- Publication number 20080049211
- Publication date Feb 28, 2008
- Mitutoyo Corporation
- Yasushi Ueshima
- G01 - MEASURING TESTING
Information Patent Application
Interferometer system for monitoring an object
- Publication number 20070171425
- Publication date Jul 26, 2007
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Spatial accuracy correction method and apparatus

Interferometric position sensor

Gradiometer and method of changing an optical path length to direct...

Interferometric heterodyne optical encoder system

Method and arrangement for robust interferometry for detecting a fe...

Interferometric heterodyne optical encoder system

Interferometer and distance calculation method therefor

Optical system, in particular in a microlithographic projection exp...

Method of measuring a shape of an optical surface based on computat...

Optical distance-measuring device

Laser interferometer system for measuring roll angle

Surface deformation measuring system with a retro-reflective surfac...

Interferometer

Tilting mirror controlled using null-based interferometric sensing

Displacement measuring instrument and displacement measuring method

Optical coherence tomography implementation apparatus and method of...

Method for estimating distance between tracking type laser interfer...

Method and assembly for confocal, chromatic, interferometric and sp...

Tracking type laser interferometer and method for resetting the same

Homodyne laser interferometer probe and displacement measurement sy...

Interferometer system for monitoring an object

Method of manufacturing an optical element

Position-measuring device for determining the position of two objec...

Interferometer system for monitoring an object

Interferometer system for monitoring an object

Measurement method and measurement apparatus using tracking type la...

Interferometer using integrated retarders to reduce physical volume

Displacement measurement sensor head and system having measurement...

Multi-axis interferometers and methods and systems using multi-axis...

Measuring apparatus sensitive to rotational but not translational o...

Patents Applicationslast 30 patents

Relative intensity noise Cat's-eye swept source laser for OCT and s...

METHOD OF MEASURING A SHAPE OF AN OPTICAL SURFACE BASED ON COMPUTAT...

METHOD AND ARRANGEMENT FOR ROBUST INTERFEROMETRY

METHOD OF MEASURING A SHAPE OF AN OPTICAL SURFACE AND INTERFEROMETR...

APPARATUS AND METHOD OF MEASURING SHAPE

INTERFEROMETRIC HETERODYNE OPTICAL ENCODER SYSTEM

OPTICAL SYSTEM, IN PARTICULAR IN A MICROLITHOGRAPHIC PROJECTION EXP...

INTERFEROMETER AND DISTANCE CALCULATION METHOD THEREFOR

Optical Distance-Measuring Device

Rotary Interferometer

Interferometer

LASER INTERFEROMETER SYSTEM FOR MEASURING ROLL ANGLE

INTERFEROMETER SYSTEM FOR MONITORING AN OBJECT

Displacement measuring instrument and displacement measuring method

Optical member, interferometer system, stage apparatus, exposure ap...

Method for estimating distance between tracking type laser interfer...

Interferometric Gravity Sensor

Systems and Methods for Reducing Nonlinearity in an Interferometer

HOMODYNE LASER INTERFEROMETER PROBE AND DISPLACEMENT MEASUREMENT SY...

TRACKING TYPE LASER INTERFEROMETER AND METHOD FOR RESETTING THE SAME

DISPLACEMENT MEASUREMENT SENSOR HEAD AND SYSTEM HAVING MEASUREMENT...

MEASUREMENT METHOD AND MEASUREMENT APPARATUS USING TRACKING TYPE LA...

OPTICAL COHERENCE TOMOGRAPHY IMPLEMENTATION

INTERFEROMETER SYSTEM FOR MONITORING AN OBJECT

Method and Assembly for Confocal, Chromatic, Interferometric and Sp...

Method of manufacturing an optical element

Multi-Axis Interferometers and Methods and Systems Using Multi-Axis...

Precise rotational motion sensor

OPTICAL-AXIS DEFLECTION TYPE LASER INTERFEROMETER, CALIBRATION METH...

Interferometer system for monitoring an object