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G01B9/02076
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
Current Industry
G01B9/02076
Caused by motion
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for motion compensation in interferometric sen...
Patent number
11,193,751
Issue date
Dec 7, 2021
Intuitive Surgical Operations, Inc.
Mark E. Froggatt
G01 - MEASURING TESTING
Information
Patent Grant
Fiber-coupled phased array of photonic integrated circuit imagers
Patent number
10,663,282
Issue date
May 26, 2020
Lockheed Martin Corporation
Chad Elliott Ogden
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for calculating a height map of a surface of an o...
Patent number
10,636,157
Issue date
Apr 28, 2020
Mitutoyo Corporation
Johannes Anna Quaedackers
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for measuring blood flow of vessels
Patent number
10,456,033
Issue date
Oct 29, 2019
SHENZHEN CERTAINN TECHNOLOGY CO., LTD.
Shuguang Guo
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Optical measurement device having a plurality of rotary shafts and...
Patent number
10,422,621
Issue date
Sep 24, 2019
Adamant Namiki Precision Jewel Co., Ltd.
Hiroshi Yamazaki
G02 - OPTICS
Information
Patent Grant
Method and apparatus for motion compensation in interferometric sen...
Patent number
10,054,420
Issue date
Aug 21, 2018
Intuitive Surgical Operations, Inc.
Mark E. Froggatt
G01 - MEASURING TESTING
Information
Patent Grant
In-line inspection of ophthalmic device with auto-alignment system...
Patent number
9,995,570
Issue date
Jun 12, 2018
Johnson & Johnson Vision Care, Inc.
Catie A. Morley
G02 - OPTICS
Information
Patent Grant
Method and apparatus for compensating for a time-varying disturbanc...
Patent number
9,841,269
Issue date
Dec 12, 2017
Intuitive Surgical Operations, Inc.
Mark E. Froggatt
G01 - MEASURING TESTING
Information
Patent Grant
Method for taking tomographic image of eye
Patent number
9,795,292
Issue date
Oct 24, 2017
Nidek Co., Ltd.
Yuji Murase
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Optical coherence tomography (OCT) system with improved motion cont...
Patent number
9,763,569
Issue date
Sep 19, 2017
University of Southern California
Jeffrey P. Fingler
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Optical inner surface measuring device
Patent number
9,709,388
Issue date
Jul 18, 2017
Namiki Seimitsu Houseki Kabushiki Kaisha
Hiroshi Yamazaki
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method for calibrating and correcting the scanning distortion of an...
Patent number
9,593,933
Issue date
Mar 14, 2017
Consejo Superior de Investigaciones Cientificas (CSIC)
Sergio Oritz Egea
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Three-dimensional shape measuring device, method for acquiring holo...
Patent number
9,494,411
Issue date
Nov 15, 2016
3DRAGONS, LLC
Hideyoshi Horimai
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Ophthalmic apparatus and ophthalmic method
Patent number
9,232,887
Issue date
Jan 12, 2016
Canon Kabushiki Kaisha
Atsushi Goto
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Interferometric heterodyne optical encoder system
Patent number
9,140,537
Issue date
Sep 22, 2015
Zygo Corporation
Peter J. de Groot
G01 - MEASURING TESTING
Information
Patent Grant
Method for reducing wafer shape and thickness measurement errors re...
Patent number
9,121,684
Issue date
Sep 1, 2015
KLA-Tencor Corporation
Shouhong Tang
G01 - MEASURING TESTING
Information
Patent Grant
Motion-compensated optical coherence tomography system
Patent number
9,115,974
Issue date
Aug 25, 2015
The Johns Hopkins University
Jin U. Kang
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Recording a spectrally resolved image by reading out several partia...
Patent number
9,086,319
Issue date
Jul 21, 2015
Bruker Optik GmbH
Roland Harig
G01 - MEASURING TESTING
Information
Patent Grant
Measurement apparatus for measuring shape of test object and measur...
Patent number
9,052,189
Issue date
Jun 9, 2015
Canon Kabushiki Kaisha
Yuya Nishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Atom interferometry having spatially resolved phase
Patent number
9,018,579
Issue date
Apr 28, 2015
The Board of Trustees of the Leland Stanford Junior University
Mark A. Kasevich
G01 - MEASURING TESTING
Information
Patent Grant
Grazing incidence interferometer
Patent number
8,913,250
Issue date
Dec 16, 2014
Mitutoyo Corporation
Reiya Ootao
G01 - MEASURING TESTING
Information
Patent Grant
Interferometric heterodyne optical encoder system
Patent number
8,885,172
Issue date
Nov 11, 2014
Zygo Corporation
Peter J. de Groot
G01 - MEASURING TESTING
Information
Patent Grant
Measurement apparatus
Patent number
8,830,480
Issue date
Sep 9, 2014
Canon Kabushiki Kaisha
Taro Tezuka
G01 - MEASURING TESTING
Information
Patent Grant
Topographical profiling with coherence scanning interferometry
Patent number
8,780,334
Issue date
Jul 15, 2014
Zygo Corporation
Peter de Groot
G01 - MEASURING TESTING
Information
Patent Grant
Displacement measurement method and apparatus thereof, stage appara...
Patent number
8,629,985
Issue date
Jan 14, 2014
Hitachi, Ltd.
Toshihiko Nakata
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Displacement measurement method and apparatus thereof, stage appara...
Patent number
8,284,406
Issue date
Oct 9, 2012
Hitachi, Ltd.
Toshihiko Nakata
B82 - NANO-TECHNOLOGY
Information
Patent Grant
White light scanning interferometer with simultaneous phase-shiftin...
Patent number
8,269,980
Issue date
Sep 18, 2012
Engineering Synthesis Design, Inc.
Piotr Szwaykowski
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer actuator
Patent number
8,259,300
Issue date
Sep 4, 2012
Chemometec A/S
Börkur Arnvidarson
G01 - MEASURING TESTING
Information
Patent Grant
Vibration-insensitive interferometer using high-speed camera and co...
Patent number
8,144,335
Issue date
Mar 27, 2012
Korea Advanced Institute of Science and Technology
Seung-Woo Kim
G01 - MEASURING TESTING
Information
Patent Grant
Interference microscope with scan motion detection using fringe mot...
Patent number
8,107,084
Issue date
Jan 31, 2012
Zygo Corporation
Mark Davidson
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MONITORING OBJECTS IN AQUEOUS MEDIA USING OPTICAL COHERENCE TOMOGRAPHY
Publication number
20240410685
Publication date
Dec 12, 2024
ChromoLogic LLC
Matthew BREHOVE
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MOTION COMPENSATION IN INTERFEROMETRIC SEN...
Publication number
20180356203
Publication date
Dec 13, 2018
Intuitive Surgical Operations, Inc.
Mark E. FROGGATT
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MOTION COMPENSATION IN INTERFEROMETRIC SEN...
Publication number
20180058838
Publication date
Mar 1, 2018
Intuitive Surgical Operations, Inc.
Mark E. FROGGATT
G01 - MEASURING TESTING
Information
Patent Application
DRIFT-CORRECTED, HIGH-RESOLUTION OPTICAL TRAP AND HIGH-SENSITIVITY...
Publication number
20160027545
Publication date
Jan 28, 2016
The Regents of the University of California
Carlos J. Bustamante
G02 - OPTICS
Information
Patent Application
Atom interferometry having spatially resolved phase
Publication number
20140375998
Publication date
Dec 25, 2014
Mark A. Kasevich
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MOTION COMPENSATION IN INTERFEROMETRIC SEN...
Publication number
20140336973
Publication date
Nov 13, 2014
Mark E. Froggatt
G01 - MEASURING TESTING
Information
Patent Application
Shape Measuring Apparatus
Publication number
20140320866
Publication date
Oct 30, 2014
Konica Minolta, Inc.
Hironobu Mikoshiba
G01 - MEASURING TESTING
Information
Patent Application
Ophthalmic Apparatus and Ophthalmic Method
Publication number
20140198300
Publication date
Jul 17, 2014
Canon Kabushiki Kaisha
Atsushi GOTO
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALIBRATING AND CORRECTING THE SCANNING DISTORTION OF AN...
Publication number
20140107960
Publication date
Apr 17, 2014
Sergio Oritz Egea
G01 - MEASURING TESTING
Information
Patent Application
MOTION-COMPENSATED OPTICAL COHERENCE TOMOGRAPHY SYSTEM
Publication number
20140078512
Publication date
Mar 20, 2014
The Johns Hopkins University
Jin U. Kang
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPARATUS FOR MEASURING SHAPE OF TEST OBJECT AND MEASUR...
Publication number
20130229664
Publication date
Sep 5, 2013
Canon Kabushiki Kaisha
Yuya Nishikawa
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR TAKING TOMOGRAPHIC IMAGE OF EYE
Publication number
20130222566
Publication date
Aug 29, 2013
NIDEK CO., LTD.
Yuji MURASE
F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information
Patent Application
Method for Reducing Wafer Shape and Thickness Measurement Errors Re...
Publication number
20130182262
Publication date
Jul 18, 2013
KLA-Tencor Corporation
Shouhong Tang
G01 - MEASURING TESTING
Information
Patent Application
Recording a spectrally resolved image by reading out several partia...
Publication number
20130120755
Publication date
May 16, 2013
Bruker Optik GmbH
Roland Harig
G01 - MEASURING TESTING
Information
Patent Application
Displacement Measurement Method and Apparatus Thereof, Stage Appara...
Publication number
20120327429
Publication date
Dec 27, 2012
Toshihiko Nakata
B82 - NANO-TECHNOLOGY
Information
Patent Application
GRAZING INCIDENCE INTERFEROMETER
Publication number
20120327425
Publication date
Dec 27, 2012
Mitutoyo Corporation
Reiya Ootao
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETRIC HETERODYNE OPTICAL ENCODER SYSTEM
Publication number
20120194824
Publication date
Aug 2, 2012
Zygo Corporation
Peter de Groot
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPARATUS
Publication number
20120116718
Publication date
May 10, 2012
Canon Kabushiki Kaisha
Taro TEZUKA
G01 - MEASURING TESTING
Information
Patent Application
VIBRATION-INSENSITIVE INTERFEROMETER USING HIGH-SPEED CAMERA AND CO...
Publication number
20100259762
Publication date
Oct 14, 2010
Seung-Woo Kim
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETER WITH SCAN MOTION DETECTION
Publication number
20100195112
Publication date
Aug 5, 2010
Zygo Corporation
Mark Davidson
G02 - OPTICS
Information
Patent Application
INTERFEROMETER ACTUATOR
Publication number
20100149542
Publication date
Jun 17, 2010
CHEMOMETEC A/S
Börkur Arnvidarson
G01 - MEASURING TESTING
Information
Patent Application
Multi-Phase Interferometer
Publication number
20090213385
Publication date
Aug 27, 2009
Avraham Aharoni
G01 - MEASURING TESTING
Information
Patent Application
Displacement Measurement Method and Apparatus Thereof, Stage Appara...
Publication number
20090210971
Publication date
Aug 20, 2009
Toshihiko Nakata
G01 - MEASURING TESTING
Information
Patent Application
Vibration Resistant Interferometry
Publication number
20080266571
Publication date
Oct 30, 2008
Leslie L. Deck
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for reducing effects of coherent artifacts and...
Publication number
20070121115
Publication date
May 31, 2007
Zetetic Institute
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Methods for Reduction and Compensation of Effects of...
Publication number
20070058174
Publication date
Mar 15, 2007
Zetetic Institute
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Vibration-insensitive interferometer
Publication number
20060039007
Publication date
Feb 23, 2006
Seung Woo Kim
G01 - MEASURING TESTING
Information
Patent Application
Vibration resistant interferometry
Publication number
20050237534
Publication date
Oct 27, 2005
Leslie L. Deck
G01 - MEASURING TESTING
Information
Patent Application
Vibration resistant interferometry
Publication number
20050237535
Publication date
Oct 27, 2005
Leslie L. Deck
G01 - MEASURING TESTING
Information
Patent Application
Square wafer chuck with mirror
Publication number
20040145751
Publication date
Jul 29, 2004
Michael B. Binnard
G01 - MEASURING TESTING