Caused by motion

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CPC
G01B9/02076

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02076Caused by motion

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for motion compensation in interferometric sen...
- Patent number 11,193,751
- Issue date Dec 7, 2021
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Grant
Fiber-coupled phased array of photonic integrated circuit imagers
- Patent number 10,663,282
- Issue date May 26, 2020
- Lockheed Martin Corporation
- Chad Elliott Ogden
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for calculating a height map of a surface of an o...
- Patent number 10,636,157
- Issue date Apr 28, 2020
- Mitutoyo Corporation
- Johannes Anna Quaedackers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for measuring blood flow of vessels
- Patent number 10,456,033
- Issue date Oct 29, 2019
- SHENZHEN CERTAINN TECHNOLOGY CO., LTD.
- Shuguang Guo
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical measurement device having a plurality of rotary shafts and...
- Patent number 10,422,621
- Issue date Sep 24, 2019
- Adamant Namiki Precision Jewel Co., Ltd.
- Hiroshi Yamazaki
- G02 - OPTICS
Information Patent Grant
Method and apparatus for motion compensation in interferometric sen...
- Patent number 10,054,420
- Issue date Aug 21, 2018
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Grant
In-line inspection of ophthalmic device with auto-alignment system...
- Patent number 9,995,570
- Issue date Jun 12, 2018
- Johnson & Johnson Vision Care, Inc.
- Catie A. Morley
- G02 - OPTICS
Information Patent Grant
Method and apparatus for compensating for a time-varying disturbanc...
- Patent number 9,841,269
- Issue date Dec 12, 2017
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Grant
Method for taking tomographic image of eye
- Patent number 9,795,292
- Issue date Oct 24, 2017
- Nidek Co., Ltd.
- Yuji Murase
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical coherence tomography (OCT) system with improved motion cont...
- Patent number 9,763,569
- Issue date Sep 19, 2017
- University of Southern California
- Jeffrey P. Fingler
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical inner surface measuring device
- Patent number 9,709,388
- Issue date Jul 18, 2017
- Namiki Seimitsu Houseki Kabushiki Kaisha
- Hiroshi Yamazaki
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for calibrating and correcting the scanning distortion of an...
- Patent number 9,593,933
- Issue date Mar 14, 2017
- Consejo Superior de Investigaciones Cientificas (CSIC)
- Sergio Oritz Egea
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Three-dimensional shape measuring device, method for acquiring holo...
- Patent number 9,494,411
- Issue date Nov 15, 2016
- 3DRAGONS, LLC
- Hideyoshi Horimai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Ophthalmic apparatus and ophthalmic method
- Patent number 9,232,887
- Issue date Jan 12, 2016
- Canon Kabushiki Kaisha
- Atsushi Goto
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Interferometric heterodyne optical encoder system
- Patent number 9,140,537
- Issue date Sep 22, 2015
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Method for reducing wafer shape and thickness measurement errors re...
- Patent number 9,121,684
- Issue date Sep 1, 2015
- KLA-Tencor Corporation
- Shouhong Tang
- G01 - MEASURING TESTING
Information Patent Grant
Motion-compensated optical coherence tomography system
- Patent number 9,115,974
- Issue date Aug 25, 2015
- The Johns Hopkins University
- Jin U. Kang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Recording a spectrally resolved image by reading out several partia...
- Patent number 9,086,319
- Issue date Jul 21, 2015
- Bruker Optik GmbH
- Roland Harig
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus for measuring shape of test object and measur...
- Patent number 9,052,189
- Issue date Jun 9, 2015
- Canon Kabushiki Kaisha
- Yuya Nishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Atom interferometry having spatially resolved phase
- Patent number 9,018,579
- Issue date Apr 28, 2015
- The Board of Trustees of the Leland Stanford Junior University
- Mark A. Kasevich
- G01 - MEASURING TESTING
Information Patent Grant
Grazing incidence interferometer
- Patent number 8,913,250
- Issue date Dec 16, 2014
- Mitutoyo Corporation
- Reiya Ootao
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric heterodyne optical encoder system
- Patent number 8,885,172
- Issue date Nov 11, 2014
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus
- Patent number 8,830,480
- Issue date Sep 9, 2014
- Canon Kabushiki Kaisha
- Taro Tezuka
- G01 - MEASURING TESTING
Information Patent Grant
Topographical profiling with coherence scanning interferometry
- Patent number 8,780,334
- Issue date Jul 15, 2014
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measurement method and apparatus thereof, stage appara...
- Patent number 8,629,985
- Issue date Jan 14, 2014
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Displacement measurement method and apparatus thereof, stage appara...
- Patent number 8,284,406
- Issue date Oct 9, 2012
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
White light scanning interferometer with simultaneous phase-shiftin...
- Patent number 8,269,980
- Issue date Sep 18, 2012
- Engineering Synthesis Design, Inc.
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer actuator
- Patent number 8,259,300
- Issue date Sep 4, 2012
- Chemometec A/S
- Börkur Arnvidarson
- G01 - MEASURING TESTING
Information Patent Grant
Vibration-insensitive interferometer using high-speed camera and co...
- Patent number 8,144,335
- Issue date Mar 27, 2012
- Korea Advanced Institute of Science and Technology
- Seung-Woo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Interference microscope with scan motion detection using fringe mot...
- Patent number 8,107,084
- Issue date Jan 31, 2012
- Zygo Corporation
- Mark Davidson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MONITORING OBJECTS IN AQUEOUS MEDIA USING OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20240410685
- Publication date Dec 12, 2024
- ChromoLogic LLC
- Matthew BREHOVE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MOTION COMPENSATION IN INTERFEROMETRIC SEN...
- Publication number 20180356203
- Publication date Dec 13, 2018
- Intuitive Surgical Operations, Inc.
- Mark E. FROGGATT
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MOTION COMPENSATION IN INTERFEROMETRIC SEN...
- Publication number 20180058838
- Publication date Mar 1, 2018
- Intuitive Surgical Operations, Inc.
- Mark E. FROGGATT
- G01 - MEASURING TESTING
Information Patent Application
DRIFT-CORRECTED, HIGH-RESOLUTION OPTICAL TRAP AND HIGH-SENSITIVITY...
- Publication number 20160027545
- Publication date Jan 28, 2016
- The Regents of the University of California
- Carlos J. Bustamante
- G02 - OPTICS
Information Patent Application
Atom interferometry having spatially resolved phase
- Publication number 20140375998
- Publication date Dec 25, 2014
- Mark A. Kasevich
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MOTION COMPENSATION IN INTERFEROMETRIC SEN...
- Publication number 20140336973
- Publication date Nov 13, 2014
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Application
Shape Measuring Apparatus
- Publication number 20140320866
- Publication date Oct 30, 2014
- Konica Minolta, Inc.
- Hironobu Mikoshiba
- G01 - MEASURING TESTING
Information Patent Application
Ophthalmic Apparatus and Ophthalmic Method
- Publication number 20140198300
- Publication date Jul 17, 2014
- Canon Kabushiki Kaisha
- Atsushi GOTO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING AND CORRECTING THE SCANNING DISTORTION OF AN...
- Publication number 20140107960
- Publication date Apr 17, 2014
- Sergio Oritz Egea
- G01 - MEASURING TESTING
Information Patent Application
MOTION-COMPENSATED OPTICAL COHERENCE TOMOGRAPHY SYSTEM
- Publication number 20140078512
- Publication date Mar 20, 2014
- The Johns Hopkins University
- Jin U. Kang
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS FOR MEASURING SHAPE OF TEST OBJECT AND MEASUR...
- Publication number 20130229664
- Publication date Sep 5, 2013
- Canon Kabushiki Kaisha
- Yuya Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TAKING TOMOGRAPHIC IMAGE OF EYE
- Publication number 20130222566
- Publication date Aug 29, 2013
- NIDEK CO., LTD.
- Yuji MURASE
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
Method for Reducing Wafer Shape and Thickness Measurement Errors Re...
- Publication number 20130182262
- Publication date Jul 18, 2013
- KLA-Tencor Corporation
- Shouhong Tang
- G01 - MEASURING TESTING
Information Patent Application
Recording a spectrally resolved image by reading out several partia...
- Publication number 20130120755
- Publication date May 16, 2013
- Bruker Optik GmbH
- Roland Harig
- G01 - MEASURING TESTING
Information Patent Application
Displacement Measurement Method and Apparatus Thereof, Stage Appara...
- Publication number 20120327429
- Publication date Dec 27, 2012
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Application
GRAZING INCIDENCE INTERFEROMETER
- Publication number 20120327425
- Publication date Dec 27, 2012
- Mitutoyo Corporation
- Reiya Ootao
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC HETERODYNE OPTICAL ENCODER SYSTEM
- Publication number 20120194824
- Publication date Aug 2, 2012
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS
- Publication number 20120116718
- Publication date May 10, 2012
- Canon Kabushiki Kaisha
- Taro TEZUKA
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION-INSENSITIVE INTERFEROMETER USING HIGH-SPEED CAMERA AND CO...
- Publication number 20100259762
- Publication date Oct 14, 2010
- Seung-Woo Kim
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER WITH SCAN MOTION DETECTION
- Publication number 20100195112
- Publication date Aug 5, 2010
- Zygo Corporation
- Mark Davidson
- G02 - OPTICS
Information Patent Application
INTERFEROMETER ACTUATOR
- Publication number 20100149542
- Publication date Jun 17, 2010
- CHEMOMETEC A/S
- Börkur Arnvidarson
- G01 - MEASURING TESTING
Information Patent Application
Multi-Phase Interferometer
- Publication number 20090213385
- Publication date Aug 27, 2009
- Avraham Aharoni
- G01 - MEASURING TESTING
Information Patent Application
Displacement Measurement Method and Apparatus Thereof, Stage Appara...
- Publication number 20090210971
- Publication date Aug 20, 2009
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
Vibration Resistant Interferometry
- Publication number 20080266571
- Publication date Oct 30, 2008
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for reducing effects of coherent artifacts and...
- Publication number 20070121115
- Publication date May 31, 2007
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Methods for Reduction and Compensation of Effects of...
- Publication number 20070058174
- Publication date Mar 15, 2007
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Application
Vibration-insensitive interferometer
- Publication number 20060039007
- Publication date Feb 23, 2006
- Seung Woo Kim
- G01 - MEASURING TESTING
Information Patent Application
Vibration resistant interferometry
- Publication number 20050237534
- Publication date Oct 27, 2005
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
Vibration resistant interferometry
- Publication number 20050237535
- Publication date Oct 27, 2005
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
Square wafer chuck with mirror
- Publication number 20040145751
- Publication date Jul 29, 2004
- Michael B. Binnard
- G01 - MEASURING TESTING

Caused by motion

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and apparatus for motion compensation in interferometric sen...

Fiber-coupled phased array of photonic integrated circuit imagers

Method and system for calculating a height map of a surface of an o...

Apparatus and method for measuring blood flow of vessels

Optical measurement device having a plurality of rotary shafts and...

Method and apparatus for motion compensation in interferometric sen...

In-line inspection of ophthalmic device with auto-alignment system...

Method and apparatus for compensating for a time-varying disturbanc...

Method for taking tomographic image of eye

Optical coherence tomography (OCT) system with improved motion cont...

Optical inner surface measuring device

Method for calibrating and correcting the scanning distortion of an...

Three-dimensional shape measuring device, method for acquiring holo...

Ophthalmic apparatus and ophthalmic method

Interferometric heterodyne optical encoder system

Method for reducing wafer shape and thickness measurement errors re...

Motion-compensated optical coherence tomography system

Recording a spectrally resolved image by reading out several partia...

Measurement apparatus for measuring shape of test object and measur...

Atom interferometry having spatially resolved phase

Grazing incidence interferometer

Interferometric heterodyne optical encoder system

Measurement apparatus

Topographical profiling with coherence scanning interferometry

Displacement measurement method and apparatus thereof, stage appara...

Displacement measurement method and apparatus thereof, stage appara...

White light scanning interferometer with simultaneous phase-shiftin...

Interferometer actuator

Vibration-insensitive interferometer using high-speed camera and co...

Interference microscope with scan motion detection using fringe mot...

Patents Applicationslast 30 patents

MONITORING OBJECTS IN AQUEOUS MEDIA USING OPTICAL COHERENCE TOMOGRAPHY

METHOD AND APPARATUS FOR MOTION COMPENSATION IN INTERFEROMETRIC SEN...

METHOD AND APPARATUS FOR MOTION COMPENSATION IN INTERFEROMETRIC SEN...

DRIFT-CORRECTED, HIGH-RESOLUTION OPTICAL TRAP AND HIGH-SENSITIVITY...

Atom interferometry having spatially resolved phase

METHOD AND APPARATUS FOR MOTION COMPENSATION IN INTERFEROMETRIC SEN...

Shape Measuring Apparatus

Ophthalmic Apparatus and Ophthalmic Method

METHOD FOR CALIBRATING AND CORRECTING THE SCANNING DISTORTION OF AN...

MOTION-COMPENSATED OPTICAL COHERENCE TOMOGRAPHY SYSTEM

MEASUREMENT APPARATUS FOR MEASURING SHAPE OF TEST OBJECT AND MEASUR...

METHOD FOR TAKING TOMOGRAPHIC IMAGE OF EYE

Method for Reducing Wafer Shape and Thickness Measurement Errors Re...

Recording a spectrally resolved image by reading out several partia...

Displacement Measurement Method and Apparatus Thereof, Stage Appara...

GRAZING INCIDENCE INTERFEROMETER

INTERFEROMETRIC HETERODYNE OPTICAL ENCODER SYSTEM

MEASUREMENT APPARATUS

VIBRATION-INSENSITIVE INTERFEROMETER USING HIGH-SPEED CAMERA AND CO...

INTERFEROMETER WITH SCAN MOTION DETECTION

INTERFEROMETER ACTUATOR

Multi-Phase Interferometer

Displacement Measurement Method and Apparatus Thereof, Stage Appara...

Vibration Resistant Interferometry

Apparatus and method for reducing effects of coherent artifacts and...

Apparatus and Methods for Reduction and Compensation of Effects of...

Vibration-insensitive interferometer

Vibration resistant interferometry

Vibration resistant interferometry

Square wafer chuck with mirror