Chambers or ovens; Tanks

Industry

CPC
G01R31/2862

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2862Chambers or ovens; Tanks

Industries

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for testing a semiconductor package
- Patent number 12,169,219
- Issue date Dec 17, 2024
- TSE CO., LTD.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor package test apparatus and method
- Patent number 12,072,370
- Issue date Aug 27, 2024
- Samsung Electronics Co., Ltd.
- Sung Ok Kim
- G01 - MEASURING TESTING
Information Patent Grant
Thermoelectric device with Seebeck effect
- Patent number 12,025,648
- Issue date Jul 2, 2024
- Hutchinson
- Fabrice Chopard
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in board seating
- Patent number 12,007,434
- Issue date Jun 11, 2024
- Micro Control Company
- Aidan Michael Fawcett
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, transfer method, chamber and frame for semiconductor bur...
- Patent number 11,982,706
- Issue date May 14, 2024
- MSV SYSTEMS & SERVICES PTE LTD
- Teck Huat Tan
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test device including temperature control module and...
- Patent number 11,927,623
- Issue date Mar 12, 2024
- SK Hynix Inc.
- Nack Hyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Cryogenic wafer testing system
- Patent number 11,927,621
- Issue date Mar 12, 2024
- High Precision Devices, Inc.
- Michael Snow
- G01 - MEASURING TESTING
Information Patent Grant
Elevator unit for transferring tray and test handler including same
- Patent number 11,892,500
- Issue date Feb 6, 2024
- Semes Co., Ltd.
- Jin Ho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method of testing a semiconductor device
- Patent number 11,885,846
- Issue date Jan 30, 2024
- SK hynix Inc.
- Gyung Jin Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of testing an object within a dry gas environment
- Patent number 11,860,083
- Issue date Jan 2, 2024
- Samsung Electronics Co, Ltd.
- Dahm Yu
- G01 - MEASURING TESTING
Information Patent Grant
Test system
- Patent number 11,852,677
- Issue date Dec 26, 2023
- Tokyo Electron Limited
- Kentaro Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing apparatus for wafer probing testing and final...
- Patent number 11,835,574
- Issue date Dec 5, 2023
- TEST21 TAIWAN CORPORATION
- Shun-Bon Ho
- G01 - MEASURING TESTING
Information Patent Grant
Allocation of test resources to perform a test of memory components
- Patent number 11,808,806
- Issue date Nov 7, 2023
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Grant
Test site configuration in an automated test system
- Patent number 11,754,596
- Issue date Sep 12, 2023
- Teradyne, Inc.
- Michael O. McKenna
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in board and burn-in apparatus
- Patent number 11,719,741
- Issue date Aug 8, 2023
- Advantest Corporation
- Hiroaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for conducting burn-in testing of semiconducto...
- Patent number 11,719,743
- Issue date Aug 8, 2023
- Kes Systems, Inc.
- Ballson Gopal
- G01 - MEASURING TESTING
Information Patent Grant
Planar ring radiation barrier for cryogenic wafer test system
- Patent number 11,639,957
- Issue date May 2, 2023
- Northrop Grumman Systems Corporation
- Kelsey McCusker
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor package test system and semiconductor package fabrica...
- Patent number 11,592,478
- Issue date Feb 28, 2023
- Samsung Electronics Co., Ltd.
- Jaehong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method of testing a semiconductor device
- Patent number 11,543,450
- Issue date Jan 3, 2023
- SK hynix Inc.
- Gyung Jin Kim
- G01 - MEASURING TESTING
Information Patent Grant
EMC test system and EMC test method using LiFi
- Patent number 11,506,699
- Issue date Nov 22, 2022
- Rohde & Schwarz GmbH & Co. KG
- Erik Araojo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Integrated-circuit-level test system and method
- Patent number 11,408,931
- Issue date Aug 9, 2022
- NANYA TECHNOLOGY CORPORATION
- Cheng-Sung Lai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and temperature control meihod
- Patent number 11,385,280
- Issue date Jul 12, 2022
- Tokyo Electron Limited
- Shigeru Kasai
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing the hermetic seal of a package
- Patent number 11,353,503
- Issue date Jun 7, 2022
- STMicroelectronics S.r.l.
- Paolo Aranzulla
- G01 - MEASURING TESTING
Information Patent Grant
Feedback burn-in device of burn-in oven
- Patent number 11,353,498
- Issue date Jun 7, 2022
- Hongbang Automation Co., Ltd.
- Kuo-Ching Hsiao
- G01 - MEASURING TESTING
Information Patent Grant
Testing device includes radiation shields for testing integrated ci...
- Patent number 11,181,574
- Issue date Nov 23, 2021
- Afore Oy
- Aki Junes
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and cleaning method of inspection apparatus
- Patent number 11,181,573
- Issue date Nov 23, 2021
- Tokyo Electron Limited
- Tomoya Endo
- G01 - MEASURING TESTING
Information Patent Grant
Allocation of test resources to perform a test of memory components
- Patent number 11,131,705
- Issue date Sep 28, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Grant
Environment control apparatus and chip testing system
- Patent number 11,119,147
- Issue date Sep 14, 2021
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in test apparatus for semiconductor devices
- Patent number 11,061,069
- Issue date Jul 13, 2021
- Kes Systems, Inc.
- Ballson Gopal
- G01 - MEASURING TESTING
Information Patent Grant
Adjustment method of inspection system and auxiliary element therefor
- Patent number 11,016,142
- Issue date May 25, 2021
- Tokyo Electron Limited
- Minoru Uchida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...
- Publication number 20240353491
- Publication date Oct 24, 2024
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES
- Publication number 20240329121
- Publication date Oct 3, 2024
- KIUTRA GMBH
- Jan Spallek
- G01 - MEASURING TESTING
Information Patent Application
DEVICE COOLING ENCLOSURE AND ADAPTER FOR HOUSING DEVICES OF DIFFERE...
- Publication number 20240302430
- Publication date Sep 12, 2024
- Advantest Corporation
- Brad EMBERGER
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR BURN-IN BOARD ALIGNMENT AND SEALING BETWEE...
- Publication number 20240053397
- Publication date Feb 15, 2024
- MSV SYSTEMS & SERVICES PTE LTD
- Teck Huat TAN
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN SYSTEM WITH MULTIPLE PLUGS ON THE TEST BOARD
- Publication number 20240003966
- Publication date Jan 4, 2024
- Meritech Co., Ltd.
- BYUNG GOOK CHANG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING A SEMICONDUCTOR PACKAGE
- Publication number 20230384364
- Publication date Nov 30, 2023
- TSE CO., LTD.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE TEST DEVICE AND ELECTROMAGNETIC WAVE TEST METHOD
- Publication number 20230296665
- Publication date Sep 21, 2023
- TDK Corporation
- Shotaro HAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, TRANSFER METHOD, CHAMBER AND FRAME FOR SEMICONDUCTOR BUR...
- Publication number 20230251305
- Publication date Aug 10, 2023
- MSV SYSTEMS & SERVICES PTE LTD
- Teck Huat TAN
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND METHOD OF DRIVING THE SAME
- Publication number 20230133368
- Publication date May 4, 2023
- SK HYNIX INC.
- Nack Hyun KIM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF TESTING A SEMICONDUCTOR DEVICE
- Publication number 20230122944
- Publication date Apr 20, 2023
- SK HYNIX INC.
- Gyung Jin KIM
- G01 - MEASURING TESTING
Information Patent Application
THERMAL MEASUREMENT OF MATERIALS
- Publication number 20230091586
- Publication date Mar 23, 2023
- Western Digital Technologies, Inc.
- Rohan Shirsat
- G01 - MEASURING TESTING
Information Patent Application
Cryogenic Wafer Testing System
- Publication number 20230014966
- Publication date Jan 19, 2023
- High Precision Devices, Inc.
- Michael Snow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELEVATOR UNIT FOR TRANSFERRING TRAY AND TEST HANDLER INCLUDING SAME
- Publication number 20230010924
- Publication date Jan 12, 2023
- SEMES CO., LTD.
- Jin Ho KANG
- B66 - HOISTING LIFTING HAULING
Information Patent Application
RADIATION BARRIER FOR CRYOGENIC WAFER TEST SYSTEM
- Publication number 20230003791
- Publication date Jan 5, 2023
- Northrop Grumman Systems Corporation
- KELSEY McCUSKER
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN BOARD AND BURN-IN APPARATUS
- Publication number 20220334173
- Publication date Oct 20, 2022
- Advantest Corporation
- Hiroaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING APPARATUS FOR WAFER PROBING TESTING AND FINAL...
- Publication number 20220291279
- Publication date Sep 15, 2022
- TEST21 TAIWAN CORPORATION
- Shun-Bon HO
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20220276298
- Publication date Sep 1, 2022
- TOKYO ELECTRON LIMITED
- Kentaro KONISHI
- G01 - MEASURING TESTING
Information Patent Application
THERMOELECTRIC DEVICE WITH SEEBECK EFFECT
- Publication number 20220155362
- Publication date May 19, 2022
- HUTCHINSON
- Fabrice CHOPARD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST SITE CONFIGURATON IN AN AUTOMATED TEST SYSTEM
- Publication number 20220128597
- Publication date Apr 28, 2022
- Teradyne, Inc.
- Michael O. McKenna
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN BOARD SEATING
- Publication number 20220120808
- Publication date Apr 21, 2022
- Micro Control Company
- Aidan Michael Fawcett
- G05 - CONTROLLING REGULATING
Information Patent Application
SEMICONDUCTOR PACKAGE TEST APPARATUS AND METHOD
- Publication number 20220057444
- Publication date Feb 24, 2022
- Samsung Electronics Co., Ltd.
- Sung Ok KIM
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PACKAGE TEST SYSTEM AND SEMICONDUCTOR PACKAGE FABRICA...
- Publication number 20220026488
- Publication date Jan 27, 2022
- Samsung Electronics Co., Ltd.
- Jaehong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALLOCATION OF TEST RESOURCES TO PERFORM A TEST OF MEMORY COMPONENTS
- Publication number 20210373072
- Publication date Dec 2, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN TEST APPARATUS FOR SEMICONDUCTOR DEVICES
- Publication number 20210293877
- Publication date Sep 23, 2021
- KES Systems, Inc.
- Ballson GOPAL
- G01 - MEASURING TESTING
Information Patent Application
FEEDBACK BURN-IN DEVICE OF BURN-IN OVEN
- Publication number 20210247439
- Publication date Aug 12, 2021
- HONGBANG AUTOMATION CO., LTD.
- KUO-CHING HSIAO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND TEMPERATURE CONTROL METHOD
- Publication number 20210208194
- Publication date Jul 8, 2021
- TOKYO ELECTRON LIMITED
- Shigeru KASAI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF TESTING A SEMICONDUCTOR DEVICE
- Publication number 20210190857
- Publication date Jun 24, 2021
- SK HYNIX INC.
- Gyung Jin KIM
- G01 - MEASURING TESTING
Information Patent Application
WET LEAKAGE CURRENT TEST SYSTEM FOR PHOTOVOLTAIC COMPONENT
- Publication number 20210175848
- Publication date Jun 10, 2021
- Miasolé Equipment Integration (Fujian) Co., Ltd.
- Shengtao MA
- G01 - MEASURING TESTING
Information Patent Application
EMC TEST SYSTEM AND EMC TEST METHOD USING LIFI
- Publication number 20210165031
- Publication date Jun 3, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Erik ARAOJO
- G01 - MEASURING TESTING
Information Patent Application
ENVIRONMENT CONTROL APPARATUS AND CHIP TESTING SYSTEM
- Publication number 20210132142
- Publication date May 6, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING

Chambers or ovens; Tanks

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus for testing a semiconductor package

Semiconductor package test apparatus and method

Thermoelectric device with Seebeck effect

Burn-in board seating

Apparatus, transfer method, chamber and frame for semiconductor bur...

Semiconductor test device including temperature control module and...

Cryogenic wafer testing system

Elevator unit for transferring tray and test handler including same

System and method of testing a semiconductor device

Apparatus and method of testing an object within a dry gas environment

Test system

Semiconductor testing apparatus for wafer probing testing and final...

Allocation of test resources to perform a test of memory components

Test site configuration in an automated test system

Burn-in board and burn-in apparatus

Method and apparatus for conducting burn-in testing of semiconducto...

Planar ring radiation barrier for cryogenic wafer test system

Semiconductor package test system and semiconductor package fabrica...

System and method of testing a semiconductor device

EMC test system and EMC test method using LiFi

Integrated-circuit-level test system and method

Inspection apparatus and temperature control meihod

Method for testing the hermetic seal of a package

Feedback burn-in device of burn-in oven

Testing device includes radiation shields for testing integrated ci...

Inspection apparatus and cleaning method of inspection apparatus

Allocation of test resources to perform a test of memory components

Environment control apparatus and chip testing system

Burn-in test apparatus for semiconductor devices

Adjustment method of inspection system and auxiliary element therefor

Patents Applicationslast 30 patents

OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...

APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES

DEVICE COOLING ENCLOSURE AND ADAPTER FOR HOUSING DEVICES OF DIFFERE...

APPARATUS AND METHOD FOR BURN-IN BOARD ALIGNMENT AND SEALING BETWEE...

BURN-IN SYSTEM WITH MULTIPLE PLUGS ON THE TEST BOARD

APPARATUS FOR TESTING A SEMICONDUCTOR PACKAGE

ELECTROMAGNETIC WAVE TEST DEVICE AND ELECTROMAGNETIC WAVE TEST METHOD

APPARATUS, TRANSFER METHOD, CHAMBER AND FRAME FOR SEMICONDUCTOR BUR...

SEMICONDUCTOR TEST DEVICE AND METHOD OF DRIVING THE SAME

SYSTEM AND METHOD OF TESTING A SEMICONDUCTOR DEVICE

THERMAL MEASUREMENT OF MATERIALS

Cryogenic Wafer Testing System

ELEVATOR UNIT FOR TRANSFERRING TRAY AND TEST HANDLER INCLUDING SAME

RADIATION BARRIER FOR CRYOGENIC WAFER TEST SYSTEM

BURN-IN BOARD AND BURN-IN APPARATUS

SEMICONDUCTOR TESTING APPARATUS FOR WAFER PROBING TESTING AND FINAL...

TEST SYSTEM

THERMOELECTRIC DEVICE WITH SEEBECK EFFECT

TEST SITE CONFIGURATON IN AN AUTOMATED TEST SYSTEM

BURN-IN BOARD SEATING

SEMICONDUCTOR PACKAGE TEST APPARATUS AND METHOD

SEMICONDUCTOR PACKAGE TEST SYSTEM AND SEMICONDUCTOR PACKAGE FABRICA...

ALLOCATION OF TEST RESOURCES TO PERFORM A TEST OF MEMORY COMPONENTS

BURN-IN TEST APPARATUS FOR SEMICONDUCTOR DEVICES

FEEDBACK BURN-IN DEVICE OF BURN-IN OVEN

INSPECTION APPARATUS AND TEMPERATURE CONTROL METHOD

SYSTEM AND METHOD OF TESTING A SEMICONDUCTOR DEVICE

WET LEAKAGE CURRENT TEST SYSTEM FOR PHOTOVOLTAIC COMPONENT

EMC TEST SYSTEM AND EMC TEST METHOD USING LIFI

ENVIRONMENT CONTROL APPARATUS AND CHIP TESTING SYSTEM