characterised by the reflectron

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CPC
H01J49/405

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/405characterised by the reflectron

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Multi-turn time-of-flight mass spectrometer
- Patent number 12,154,778
- Issue date Nov 26, 2024
- Shimadzu Corporation
- Yoshihiro Ueno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bench-top time of flight mass spectrometer
- Patent number 12,123,421
- Issue date Oct 22, 2024
- Micromass UK Limited
- Cedric Marsh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mirror for multi-reflecting mass spectrometers
- Patent number 12,125,694
- Issue date Oct 22, 2024
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bench-top Time of Flight mass spectrometer
- Patent number 12,027,359
- Issue date Jul 2, 2024
- Micromass UK Limited
- Peter Carney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bench-top time of flight mass spectrometer
- Patent number 11,879,470
- Issue date Jan 23, 2024
- Micromass UK Limited
- Cedric Marsh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal acceleration time-of-flight mass spectrometer
- Patent number 11,862,451
- Issue date Jan 2, 2024
- Shimadzu Corporation
- Takuya Suzumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accelerator for multi-pass mass spectrometers
- Patent number 11,817,303
- Issue date Nov 14, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mirror for multi-reflecting mass spectrometers
- Patent number 11,756,782
- Issue date Sep 12, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bench-top time of flight mass spectrometer
- Patent number 11,621,154
- Issue date Apr 4, 2023
- Micromass UK Limited
- Ruth Wamsley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,587,780
- Issue date Feb 21, 2023
- Shimadzu Corporation
- Yusuke Tateishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-pass mass spectrometer with high duty cycle
- Patent number 11,587,779
- Issue date Feb 21, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 11,538,676
- Issue date Dec 27, 2022
- Micromass UK Limited
- Peter Carney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bench-top time of flight mass spectrometer
- Patent number 11,437,226
- Issue date Sep 6, 2022
- Micromass UK Limited
- Peter Carney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gridless ion mirrors with smooth fields
- Patent number 11,367,608
- Issue date Jun 21, 2022
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Printed circuit ion mirror with compensation
- Patent number 11,295,944
- Issue date Apr 5, 2022
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,295,945
- Issue date Apr 5, 2022
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,257,666
- Issue date Feb 22, 2022
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analytical device, analysis method and program
- Patent number 11,244,817
- Issue date Feb 8, 2022
- Shimadzu Corporation
- Tomoyuki Oshiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mirror for multi-reflecting mass spectrometers
- Patent number 11,239,067
- Issue date Feb 1, 2022
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual mode mass spectrometer
- Patent number 11,094,521
- Issue date Aug 17, 2021
- Micromass UK Limited
- Jeffery Mark Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power connector for mass spectrometer
- Patent number 11,081,333
- Issue date Aug 3, 2021
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide within pulsed converters
- Patent number 11,081,332
- Issue date Aug 3, 2021
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide-range high mass resolution in reflector time-of-flight mass sp...
- Patent number 10,937,642
- Issue date Mar 2, 2021
- Sebastian Böhm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 10,790,132
- Issue date Sep 29, 2020
- Shimadzu Corporation
- Yusuke Sakagoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-and-a-half channel detection system for time-of-flight (TOF) ma...
- Patent number 10,784,098
- Issue date Sep 22, 2020
- DH Technologies Development Pte. Ltd.
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting TOF mass spectrometer
- Patent number 10,741,376
- Issue date Aug 11, 2020
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method for time-of-flight mass spectrometry
- Patent number 10,727,039
- Issue date Jul 28, 2020
- Thermo Fisher Scientific (Bremen) GmbH
- Stewart Hamish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging mass spectrometer
- Patent number 10,629,425
- Issue date Apr 21, 2020
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multimode ion mirror prism and energy filtering apparatus and syste...
- Patent number 10,622,203
- Issue date Apr 14, 2020
- The Board of Trustees of the University of Illinois
- Igor Vladimirovich Veryovkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide-range high mass resolution in reflector time-of-flight mass sp...
- Patent number 10,615,022
- Issue date Apr 7, 2020
- Sebastian Böhm
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF MASS SPECTROMETRY, A MASS SPECTROMETER AND COMPUTER SOFT...
- Publication number 20240393303
- Publication date Nov 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL
- Publication number 20240355610
- Publication date Oct 24, 2024
- Bruker Daltonics GmbH & Co. KG
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER
- Publication number 20240084805
- Publication date Mar 14, 2024
- Micromass UK Limited
- Cedric Marsh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS
- Publication number 20240030018
- Publication date Jan 25, 2024
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR MULTISTAGE MASS SPECTROMETRY UTILIZING AN E...
- Publication number 20230402272
- Publication date Dec 14, 2023
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS
- Publication number 20230170204
- Publication date Jun 1, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20230022148
- Publication date Jan 26, 2023
- Shimadzu Corporation
- Takuya SUZUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-TURN TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20220285143
- Publication date Sep 8, 2022
- SHIMADZU CORPORATION
- Yoshihiro UENO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20220189758
- Publication date Jun 16, 2022
- Shimadzu Corporation
- Yusuke TATEISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS
- Publication number 20220148872
- Publication date May 12, 2022
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fourier Transform Electrostatic Linear Ion Trap and Reflectron Time...
- Publication number 20220013348
- Publication date Jan 13, 2022
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20210384024
- Publication date Dec 9, 2021
- Micromass UK Limited
- Peter Carney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20210249248
- Publication date Aug 12, 2021
- SHIMADZU CORPORATION
- Tomoya KUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20210249249
- Publication date Aug 12, 2021
- SHIMADZU CORPORATION
- Tomoya KUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GRIDLESS ION MIRRORS WITH SMOOTH FIELDS
- Publication number 20210242007
- Publication date Aug 5, 2021
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYTICAL DEVICE, ANALYSIS METHOD AND PROGRAM
- Publication number 20210210316
- Publication date Jul 8, 2021
- SHIMADZU CORPORATION
- Tomoyuki OSHIRO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER
- Publication number 20210207608
- Publication date Jul 8, 2021
- Micromass UK Limited
- Cedric Marsh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER
- Publication number 20210210322
- Publication date Jul 8, 2021
- Micromass UK Limited
- Ruth Wamsley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER
- Publication number 20210210329
- Publication date Jul 8, 2021
- Micromass UK Limited
- Peter Carney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER
- Publication number 20210202222
- Publication date Jul 1, 2021
- Micromass UK Limited
- Peter Carney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-PASS MASS SPECTROMETER WITH HIGH DUTY CYCLE
- Publication number 20210134581
- Publication date May 6, 2021
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS
- Publication number 20200373143
- Publication date Nov 26, 2020
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS
- Publication number 20200373145
- Publication date Nov 26, 2020
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRINTED CIRCUIT ION MIRROR WITH COMPENSATION
- Publication number 20200373142
- Publication date Nov 26, 2020
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD FOR TIME-OF-FLIGHT MASS SPECTROMETRY
- Publication number 20200357625
- Publication date Nov 12, 2020
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20200219714
- Publication date Jul 9, 2020
- SHIMADZU CORPORATION
- Yusuke SAKAGOSHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDE WITHIN PULSED CONVERTERS
- Publication number 20200168447
- Publication date May 28, 2020
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIDE-RANGE HIGH MASS RESOLUTION IN REFLECTOR TIME-OF-FLIGHT MASS SP...
- Publication number 20200152439
- Publication date May 14, 2020
- Bruker Daltonik GmbH
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20200075305
- Publication date Mar 5, 2020
- Shimadzu Corporation
- Tomoya KUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Two-and-a-Half Channel Detection System for Time-of-Flight (TOF) Ma...
- Publication number 20200020517
- Publication date Jan 16, 2020
- DH Technologies Development Pte. Ltd.
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS

characterised by the reflectron

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multi-turn time-of-flight mass spectrometer

Bench-top time of flight mass spectrometer

Ion mirror for multi-reflecting mass spectrometers

Bench-top Time of Flight mass spectrometer

Bench-top time of flight mass spectrometer

Orthogonal acceleration time-of-flight mass spectrometer

Accelerator for multi-pass mass spectrometers

Ion mirror for multi-reflecting mass spectrometers

Bench-top time of flight mass spectrometer

Time-of-flight mass spectrometer

Multi-pass mass spectrometer with high duty cycle

Mass spectrometer

Bench-top time of flight mass spectrometer

Gridless ion mirrors with smooth fields

Printed circuit ion mirror with compensation

Time-of-flight mass spectrometer

Time-of-flight mass spectrometer

Analytical device, analysis method and program

Ion mirror for multi-reflecting mass spectrometers

Dual mode mass spectrometer

Power connector for mass spectrometer

Ion guide within pulsed converters

Wide-range high mass resolution in reflector time-of-flight mass sp...

Time-of-flight mass spectrometer

Two-and-a-half channel detection system for time-of-flight (TOF) ma...

Multi-reflecting TOF mass spectrometer

Mass spectrometer and method for time-of-flight mass spectrometry

Imaging mass spectrometer

Multimode ion mirror prism and energy filtering apparatus and syste...

Wide-range high mass resolution in reflector time-of-flight mass sp...

Patents Applicationslast 30 patents

METHODS OF MASS SPECTROMETRY, A MASS SPECTROMETER AND COMPUTER SOFT...

DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL

BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER

ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS

SYSTEMS AND METHODS FOR MULTISTAGE MASS SPECTROMETRY UTILIZING AN E...

ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS

ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETER

MULTI-TURN TIME-OF-FLIGHT MASS SPECTROMETER

TIME-OF-FLIGHT MASS SPECTROMETER

ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS

Fourier Transform Electrostatic Linear Ion Trap and Reflectron Time...

MASS SPECTROMETER

TIME-OF-FLIGHT MASS SPECTROMETER

TIME-OF-FLIGHT MASS SPECTROMETER

GRIDLESS ION MIRRORS WITH SMOOTH FIELDS

ANALYTICAL DEVICE, ANALYSIS METHOD AND PROGRAM

BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER

BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER

BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER

BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER

MULTI-PASS MASS SPECTROMETER WITH HIGH DUTY CYCLE

ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS

ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS

PRINTED CIRCUIT ION MIRROR WITH COMPENSATION

MASS SPECTROMETER AND METHOD FOR TIME-OF-FLIGHT MASS SPECTROMETRY

TIME-OF-FLIGHT MASS SPECTROMETER

ION GUIDE WITHIN PULSED CONVERTERS

WIDE-RANGE HIGH MASS RESOLUTION IN REFLECTOR TIME-OF-FLIGHT MASS SP...

MASS SPECTROMETER

Two-and-a-Half Channel Detection System for Time-of-Flight (TOF) Ma...