Characterising or performance testing

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CPC
G01R31/2837

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2837Characterising or performance testing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Ultra-compact and micropower circuit to monitor process, voltage, a...
- Patent number 12,352,807
- Issue date Jul 8, 2025
- Avago Technologies International Sales Pte. Limited
- Alberto Grassi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Pluggable load module to test a voltage regulator
- Patent number 12,345,775
- Issue date Jul 1, 2025
- LOGIICDEV GMBH
- Deepak V Katkoria
- G01 - MEASURING TESTING
Information Patent Grant
Removing test equipment noise from power spectral density measurements
- Patent number 12,332,299
- Issue date Jun 17, 2025
- LITEPOINT CORPORATION
- Chen Cao
- G01 - MEASURING TESTING
Information Patent Grant
Multiparameter noninvasive arching discharge anomaly monitoring dev...
- Patent number 12,320,864
- Issue date Jun 3, 2025
- EATON INTELLIGENT POWER LIMITED
- Maebh Larkin
- G01 - MEASURING TESTING
Information Patent Grant
System for characterizing a transistor circuit
- Patent number 12,282,054
- Issue date Apr 22, 2025
- Melexis Technologies NV
- Francois Piette
- G01 - MEASURING TESTING
Information Patent Grant
Testing method and testing system
- Patent number 12,237,029
- Issue date Feb 25, 2025
- NANYA TECHNOLOGY CORPORATION
- Bo Jung Peng
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device inspection method and semiconductor device ins...
- Patent number 12,222,387
- Issue date Feb 11, 2025
- Hamamatsu Photonics K.K.
- Norimichi Chinone
- G01 - MEASURING TESTING
Information Patent Grant
Measurement instrument, measurement system, and testing method of t...
- Patent number 12,216,151
- Issue date Feb 4, 2025
- Rohde & Schwarz GmbH & Co. KG
- Paul Gareth Lloyd
- G01 - MEASURING TESTING
Information Patent Grant
Onboard circuits and methods to predict the health of critical elem...
- Patent number 12,174,237
- Issue date Dec 24, 2024
- University of Houston System
- Harish Krishnamoorthy
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring the vitality of devices of a distributed system
- Patent number 12,169,403
- Issue date Dec 17, 2024
- Pilz GmbH & Co. KG
- Christoph Weishaar
- G01 - MEASURING TESTING
Information Patent Grant
Electronic control device and method for diagnosing wake-up circuit
- Patent number 12,164,354
- Issue date Dec 10, 2024
- Hitachi Astemo, Ltd.
- Kenho Ko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Troubleshooting system and method for current sensors
- Patent number 12,105,176
- Issue date Oct 1, 2024
- Delta Electronics, Inc.
- Kuo-Heng Chao
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Input sensor short-circuit inspection module and input sensor short...
- Patent number 12,074,427
- Issue date Aug 27, 2024
- Samsung Display Co., Ltd.
- Min-Hong Kim
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Sensor device for detecting electrical defects based on resonance f...
- Patent number 12,055,582
- Issue date Aug 6, 2024
- Keysight Technologies, Inc.
- Tie Qiu
- G01 - MEASURING TESTING
Information Patent Grant
Detecting asymmetry in a bidirectional semiconductor device
- Patent number 12,050,246
- Issue date Jul 30, 2024
- BIOSENSE WEBSTER (ISRAEL) LTD.
- Michael Levin
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Program burning device and current-protection detection method thereof
- Patent number 12,044,766
- Issue date Jul 23, 2024
- Delta Electronics, Inc.
- Kuo-Heng Chao
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Artificial intelligence-based constrained random verification metho...
- Patent number 12,025,653
- Issue date Jul 2, 2024
- Mediatek Inc.
- Chung-An Wang
- G01 - MEASURING TESTING
Information Patent Grant
Multipurpose front-end board to characterize solid-state sensors fo...
- Patent number 11,988,787
- Issue date May 21, 2024
- University of Kansas
- Christophe Royon
- G01 - MEASURING TESTING
Information Patent Grant
Motor inverter
- Patent number 11,982,729
- Issue date May 14, 2024
- Delta Electronics, Inc.
- Kuo-Heng Chao
- G01 - MEASURING TESTING
Information Patent Grant
Power efficiency and power performance embedded recognition
- Patent number 11,929,675
- Issue date Mar 12, 2024
- Cisco Technology, Inc.
- Spencer A. Beery
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
System and method for physically detecting counterfeit electronics
- Patent number 11,908,811
- Issue date Feb 20, 2024
- NOKOMIS, INC.
- Walter J. Keller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods to detect cell-internal defects
- Patent number 11,837,308
- Issue date Dec 5, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lifetime estimating system and method for heating source, and inspe...
- Patent number 11,796,400
- Issue date Oct 24, 2023
- Tokyo Electron Limited
- Masahito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing crosstalk of a quantum computing system based on spa...
- Patent number 11,775,854
- Issue date Oct 3, 2023
- International Business Machines Corporation
- Prakash Murali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ground monitor with smart frequency selection
- Patent number 11,662,394
- Issue date May 30, 2023
- Intermountain Electronics, Inc.
- Dale V. Curtis
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Display device and inspecting method thereof
- Patent number 11,645,959
- Issue date May 9, 2023
- Samsung Display Co., Ltd.
- Kwang Sae Lee
- G01 - MEASURING TESTING
Information Patent Grant
Runtime measurement of process variations and supply voltage charac...
- Patent number 11,585,854
- Issue date Feb 21, 2023
- Xilinx, Inc.
- Da Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and devices for non-invasive root phenotyping
- Patent number 11,555,809
- Issue date Jan 17, 2023
- HI FIDELITY GENETICS, INC.
- Philip Benfey
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Testing electrode quality
- Patent number 11,555,846
- Issue date Jan 17, 2023
- BIOSENSE WEBSTER (ISRAEL) LTD.
- Michael Levin
- G01 - MEASURING TESTING
Information Patent Grant
Sensor unit, display device including the sensor unit and method fo...
- Patent number 11,499,936
- Issue date Nov 15, 2022
- Samsung Display Co., Ltd.
- Il Hun Jeong
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DIAGNOSIS DEVICE
- Publication number 20250237692
- Publication date Jul 24, 2025
- Toyota Jidosha Kabushiki Kaisha
- Minoru HIDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MONITORING A STATE OF A CONTROL DEVICE
- Publication number 20250237693
- Publication date Jul 24, 2025
- ROBERT BOSCH GmbH
- Marcel Rudolph
- G01 - MEASURING TESTING
Information Patent Application
DETERIORATION CORRECTION CIRCUITRY
- Publication number 20250231831
- Publication date Jul 17, 2025
- Micron Technology, Inc.
- Leon Zlotnik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHOTONIC INTEGRATED CHIP, ARRAY AND TESTING METHOD THEREOF
- Publication number 20250224306
- Publication date Jul 10, 2025
- SILITH TECHNOLOGY PTE. LTD.
- Xiaojun SHI
- G01 - MEASURING TESTING
Information Patent Application
POSITIONING APPARATUS FOR POSITIONING A DEVICE UNDER TEST
- Publication number 20250189569
- Publication date Jun 12, 2025
- Rohde& Schwarz GmbH & Co. KG
- Constantin Schwerdtfeger
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING PERFORMANCE OF FINGERPRINT SENSOR AND ELECTRON...
- Publication number 20250189575
- Publication date Jun 12, 2025
- Samsung Electronics Co., Ltd.
- Jeonghoo KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PLUGGABLE LOAD MODULE TO TEST A VOLTAGE REGULATOR
- Publication number 20250164575
- Publication date May 22, 2025
- LOGIICDEV GMBH
- Deepak V KATKORIA
- G01 - MEASURING TESTING
Information Patent Application
TESTING METHOD AND MEMORY MODULE UNDER TEST
- Publication number 20250157557
- Publication date May 15, 2025
- NANYA TECHNOLOGY CORPORATION
- Bo Jung PENG
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING CIRCUIT AND MEASUREMENT SYSTEM
- Publication number 20250138072
- Publication date May 1, 2025
- ROHDE &SCHWARZ GMBH & CO. KG
- Christian KUHN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Systems and Methods for Wireless Test Modules of a Wireless Harness...
- Publication number 20250093401
- Publication date Mar 20, 2025
- Lockheed Martin Corporation
- Kevin Bell
- G01 - MEASURING TESTING
Information Patent Application
TIME DOMAIN PERFORMANCE TESTING FOR DIGITAL DEVICES
- Publication number 20250068538
- Publication date Feb 27, 2025
- STMicroelectronics International N.V.
- Sharad Gupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PREDICTION OF BATTERY FAILURE THROUGH THERMAL SIGNATURES
- Publication number 20250046891
- Publication date Feb 6, 2025
- National Technology & Engineering Solutions of Sandia, LLC
- Wyatt Lea Hodges
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THE...
- Publication number 20240410918
- Publication date Dec 12, 2024
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PIXEL DETECTION DEVICE AND PIXEL DETECTION METHOD
- Publication number 20240377452
- Publication date Nov 14, 2024
- AUO Corporation
- Wen-Chiuan SU
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND TESTING METHOD OF T...
- Publication number 20240361377
- Publication date Oct 31, 2024
- ROHDE &SCHWARZ GMBH & CO. KG
- Paul Gareth LLOYD
- G01 - MEASURING TESTING
Information Patent Application
REMOVING TEST EQUIPMENT NOISE FROM POWER SPECTRAL DENSITY MEASUREMENTS
- Publication number 20240361376
- Publication date Oct 31, 2024
- LitePoint Corporation
- Chen CAO
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CURRENT MONITOR
- Publication number 20240353475
- Publication date Oct 24, 2024
- NVIDIA Corporation
- Miguel Rodriguez
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ULTRA-COMPACT AND MICROPOWER CIRCUIT TO MONITOR PROCESS, VOLTAGE, A...
- Publication number 20240329112
- Publication date Oct 3, 2024
- Avago Technologies International Sales Pte. Limited
- Alberto Grassi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEM FOR ESTIMATING POWER DISSIPATION AND/OR EFFICIENCY
- Publication number 20240288477
- Publication date Aug 29, 2024
- Cirrus Logic International Semiconductor Ltd.
- Alastair M. BOOMER
- G01 - MEASURING TESTING
Information Patent Application
TEST ARRANGEMENT FOR TESTING A POWER ELECTRONICS CONTROLLER
- Publication number 20240255566
- Publication date Aug 1, 2024
- dSPACE GmbH
- Daniel EPPING
- G01 - MEASURING TESTING
Information Patent Application
UNIFIED MEASUREMENT SYSTEM FOR STATIC AND DYNAMIC CHARACTERIZATION...
- Publication number 20240248131
- Publication date Jul 25, 2024
- KEITHLEY INSTRUMENTS, LLC
- Gregory Sobolewski
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM FOR DETECTING FAULTS IN MULTIPLE DEVICES OF THE SAME TYPE
- Publication number 20240219453
- Publication date Jul 4, 2024
- NXP B.V.
- Jan-Peter Schat
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE FOR PERFORMING MEASUREMENTS WITH RESPECT TO A DUT
- Publication number 20240219442
- Publication date Jul 4, 2024
- ROHDE & SCHWARZ GMBH & CO. KG
- Florian RAMIAN
- G01 - MEASURING TESTING
Information Patent Application
TEST ARRANGEMENT AND METHOD FOR EMULATING THE PHASE CURRENTS OF AN...
- Publication number 20240201248
- Publication date Jun 20, 2024
- dSPACE GmbH
- Daniel EPPING
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SYSTEM FOR CHARACTERIZING A TRANSISTOR CIRCUIT
- Publication number 20240159820
- Publication date May 16, 2024
- MELEXIS TECHNOLOGIES NV
- Francois PIETTE
- G01 - MEASURING TESTING
Information Patent Application
TESTING METHOD AND TESTING SYSTEM
- Publication number 20240161847
- Publication date May 16, 2024
- NANYA TECHNOLOGY CORPORATION
- Bo Jung PENG
- G11 - INFORMATION STORAGE
Information Patent Application
SPEED DETECTION CIRCUIT AND ASSOCIATED CHIP
- Publication number 20230384362
- Publication date Nov 30, 2023
- Realtek Semiconductor Corp.
- Chih-Chiang Chang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Electronic Control Device and Method for Diagnosing Wake-up Circuit
- Publication number 20230288975
- Publication date Sep 14, 2023
- Hitachi Astemo, Ltd.
- Kenho KO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COUPLER SENSING BASED VOLTAGE-STANDING-WAVE-RATIO IMPEDANCE AND POW...
- Publication number 20230280395
- Publication date Sep 7, 2023
- Georgia Tech Research Corporation
- David J. Munzer
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY DEVICE AND INSPECTING METHOD THEREOF
- Publication number 20230252923
- Publication date Aug 10, 2023
- SAMSUNG DISPLAY CO., LTD.
- Kwang Sae LEE
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

Characterising or performance testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Ultra-compact and micropower circuit to monitor process, voltage, a...

Pluggable load module to test a voltage regulator

Removing test equipment noise from power spectral density measurements

Multiparameter noninvasive arching discharge anomaly monitoring dev...

System for characterizing a transistor circuit

Testing method and testing system

Semiconductor device inspection method and semiconductor device ins...

Measurement instrument, measurement system, and testing method of t...

Onboard circuits and methods to predict the health of critical elem...

Method for monitoring the vitality of devices of a distributed system

Electronic control device and method for diagnosing wake-up circuit

Troubleshooting system and method for current sensors

Input sensor short-circuit inspection module and input sensor short...

Sensor device for detecting electrical defects based on resonance f...

Detecting asymmetry in a bidirectional semiconductor device

Program burning device and current-protection detection method thereof

Artificial intelligence-based constrained random verification metho...

Multipurpose front-end board to characterize solid-state sensors fo...

Motor inverter

Power efficiency and power performance embedded recognition

System and method for physically detecting counterfeit electronics

Systems and methods to detect cell-internal defects

Lifetime estimating system and method for heating source, and inspe...

Characterizing crosstalk of a quantum computing system based on spa...

Ground monitor with smart frequency selection

Display device and inspecting method thereof

Runtime measurement of process variations and supply voltage charac...

Methods and devices for non-invasive root phenotyping

Testing electrode quality

Sensor unit, display device including the sensor unit and method fo...

Patents Applicationslast 30 patents

DIAGNOSIS DEVICE

METHOD FOR MONITORING A STATE OF A CONTROL DEVICE

DETERIORATION CORRECTION CIRCUITRY

PHOTONIC INTEGRATED CHIP, ARRAY AND TESTING METHOD THEREOF

POSITIONING APPARATUS FOR POSITIONING A DEVICE UNDER TEST

METHOD FOR DETECTING PERFORMANCE OF FINGERPRINT SENSOR AND ELECTRON...

PLUGGABLE LOAD MODULE TO TEST A VOLTAGE REGULATOR

TESTING METHOD AND MEMORY MODULE UNDER TEST

SIGNAL PROCESSING CIRCUIT AND MEASUREMENT SYSTEM

Systems and Methods for Wireless Test Modules of a Wireless Harness...

TIME DOMAIN PERFORMANCE TESTING FOR DIGITAL DEVICES

PREDICTION OF BATTERY FAILURE THROUGH THERMAL SIGNATURES

PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THE...

PIXEL DETECTION DEVICE AND PIXEL DETECTION METHOD

MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND TESTING METHOD OF T...

REMOVING TEST EQUIPMENT NOISE FROM POWER SPECTRAL DENSITY MEASUREMENTS

INTEGRATED CURRENT MONITOR

ULTRA-COMPACT AND MICROPOWER CIRCUIT TO MONITOR PROCESS, VOLTAGE, A...

SYSTEM FOR ESTIMATING POWER DISSIPATION AND/OR EFFICIENCY

TEST ARRANGEMENT FOR TESTING A POWER ELECTRONICS CONTROLLER

UNIFIED MEASUREMENT SYSTEM FOR STATIC AND DYNAMIC CHARACTERIZATION...

TEST SYSTEM FOR DETECTING FAULTS IN MULTIPLE DEVICES OF THE SAME TYPE

MEASUREMENT DEVICE FOR PERFORMING MEASUREMENTS WITH RESPECT TO A DUT

TEST ARRANGEMENT AND METHOD FOR EMULATING THE PHASE CURRENTS OF AN...

SYSTEM FOR CHARACTERIZING A TRANSISTOR CIRCUIT

TESTING METHOD AND TESTING SYSTEM

SPEED DETECTION CIRCUIT AND ASSOCIATED CHIP

Electronic Control Device and Method for Diagnosing Wake-up Circuit

COUPLER SENSING BASED VOLTAGE-STANDING-WAVE-RATIO IMPEDANCE AND POW...

DISPLAY DEVICE AND INSPECTING METHOD THEREOF